JPH0472164B2 - - Google Patents

Info

Publication number
JPH0472164B2
JPH0472164B2 JP11494382A JP11494382A JPH0472164B2 JP H0472164 B2 JPH0472164 B2 JP H0472164B2 JP 11494382 A JP11494382 A JP 11494382A JP 11494382 A JP11494382 A JP 11494382A JP H0472164 B2 JPH0472164 B2 JP H0472164B2
Authority
JP
Japan
Prior art keywords
workpieces
small
groups
master
average
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11494382A
Other languages
Japanese (ja)
Other versions
JPS595909A (en
Inventor
Shozo Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP11494382A priority Critical patent/JPS595909A/en
Publication of JPS595909A publication Critical patent/JPS595909A/en
Publication of JPH0472164B2 publication Critical patent/JPH0472164B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/10Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring diameters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【発明の詳細な説明】 この発明は多数個の同一設計寸法の物体を連続
して測定する際の比較測定における高精度、自動
マスター合せ方法と装置に係るものである。例え
ば差動変圧器による電気マイクロメータ方式、も
しくは空気圧によるエアーマイクロメータ方式に
よる比較測定においては、基準寸法の大範小範を
用いて測定装置の零点と倍率を調整する、いわゆ
るマスター合せを行つて測定を開始する必要があ
り、測定の信頼性の向上をはかろうとすれば測定
装置側の状態の変化、すなわち、零点ドリフト及
び倍率変化等々によつて発生する測定値の誤差を
補正するために、前記マスター合せの操作を頻繁
に繰り返えし行う必要がある。そのために従来は
その設計寸法に合せて本範・小範のマスターピー
スを正確に多数製作し、その値をマスター値とし
て記憶し、これによつて手作業により、もしくは
自動的にマスター合せを行つていた。そのため一
つの設計寸法に対して高精度に作られた多数のマ
スターピースを準備し、かつこれを保管、管理す
る必要があり、費用がかかり、かつ取り扱いに手
数を要した。また稼動中の測定機を一旦停止させ
た状態でマスター合せを行うため、果して稼動中
の状態における必要な補正と一致して行われてい
るか否かの疑問があつた。すなわち、マスター形
状による寸法誤差及び機械固有の繰り返し誤差が
そのまま含まれるマスター合せであつた。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a high precision, automatic master alignment method and apparatus for comparative measurement when successively measuring a large number of objects having the same design dimensions. For example, in comparative measurements using an electric micrometer method using a differential transformer or an air micrometer method using pneumatic pressure, so-called master alignment is performed in which the zero point and magnification of the measuring device are adjusted using large and small ranges of reference dimensions. When it is necessary to start a measurement and to improve the reliability of the measurement, it is necessary to correct errors in the measurement value caused by changes in the state of the measurement device, such as zero point drift and changes in magnification. , it is necessary to frequently repeat the master matching operation. To do this, conventionally, a large number of main and small master pieces were manufactured accurately according to the design dimensions, the values were memorized as master values, and master matching was performed manually or automatically using this. was. Therefore, it was necessary to prepare, store, and manage a large number of master pieces made with high precision for one design dimension, which was expensive and required trouble to handle. Furthermore, since the master alignment is performed with the measuring machine in operation temporarily stopped, there was a question as to whether or not the correction was performed in accordance with the necessary correction while the measuring machine was in operation. In other words, the master alignment included dimensional errors due to the master shape and repetition errors inherent in the machine.

本発明はこの点を改善し、かつマスターピース
の設計製作を必要とせず、測定機の稼動状態と全
く同じ条件でマスター合せを行い補正するもので
ある。
The present invention improves this point and makes correction by performing master alignment under exactly the same conditions as the operating conditions of the measuring machine, without requiring the design and manufacture of a master piece.

本発明においては、多数個の加工完成品(以下
ワークピースと称す)をマスターピースとして使
う。そしてまずその中から大範マスターの寸法に
近いものを大範グループとして、小範マスターの
寸法に近いものを小範グループとしてランダムに
複数個選び出し、その各々を信頼できる測定機で
測定し、大範グループとして複数個、小範グルー
プとして複数個準備し、連設収納する。例えば直
径を測定するとき設計上のほぼ中心寸法Pに対
し、上限寸法P+α、下限寸法P−αとすると、
P+αに近い値のもの複数個を大範グループと
し、P−αに近い値のもの複数を小範グループと
する。このようにして選び出された大範グループ
のもの、例えば10個、小範グループのもの10個の
各々の平均値をD1,D2とする。そして実際に稼
動している連続寸法測定装置にこの連設収納され
ている大・小範グループのワークピースを連続し
て送り込み、その各々10個を大・小範分離測定
し、大・小範それぞれの測定値の10個の平均を演
算させD1′,D2′を作る。つぎに上記のようにして
設定された基準の大・小範平均値D1,D2とD1′,
D2′との比較を行い、(D1′−D1)、(D2′−D2)の
演算結果によつて測定装置の測定回路系の補正を
行う。
In the present invention, a large number of processed finished products (hereinafter referred to as workpieces) are used as master pieces. First, from among them, we randomly select multiple items that are close to the dimensions of the large master as a large group, and those that are close to the dimensions of the small master as a small group, and measure each of them with a reliable measuring machine. Prepare multiple units as a general group and multiple units as a small group, and store them in series. For example, when measuring the diameter, let the upper limit dimension P + α and the lower limit dimension P - α for the approximately central design dimension P,
A plurality of values close to P+α are defined as a large range group, and a plurality of values close to P−α are defined as a small range group. Let D 1 and D 2 be the average values of the large group, for example, 10 items selected in this way, and the 10 items of the small group. Then, the workpieces of the large and small groups that are stored in series are continuously fed into the continuous dimension measuring device that is actually in operation, and each of the 10 workpieces is measured separately for the large and small groups. Calculate the average of the 10 measured values to create D 1 ′ and D 2 ′. Next, the large and small range average values D 1 , D 2 and D 1 ′ of the standards set as above,
A comparison is made with D 2 ′, and the measurement circuit system of the measurement device is corrected based on the calculation results of (D 1 ′−D 1 ) and (D 2 ′−D 2 ).

第1,2図は上記の方法を実施する場合の具体
的装置の一例を選別装置によつて示すもので、図
のAはワークピースの供給部であつて、ワークピ
ースは第1図のAの円周内にある12本のくし棒に
縦に重ねられて供給され、順次、図示しない管制
部により回転し、くし棒に供給されているワーク
ピーを1本ずつ測定する。その中の任意のくし棒
に大・小範マスターピースを連設供給して置き管
制部の指令により随時マスター合せが行なえる。
図ではEに前述により選ばれた大・小範のグルー
プのマスターピースが大・小範グループ毎に連設
収容されている。尚、大・小範の区別は図示しな
い管制部でカウント判断して区別している。Bは
ワークピースの取り出し、受け渡し装置で供給部
からのワークピースを1個ずつ取り出して測定部
Cに移し、測定完了のワークピースを分類選別部
Dに渡す。選別部は測定値によつて分類されるワ
ークピースを所定分類位置に収容する。このよう
な構成において、マスター合せの必要なときには
稼働中に随時連設収容されている大・小範グルー
プの収容部Eを取り出し部に位置させ、順次大・
小範グループ毎に測定部に送り出す。そして通常
の測定を行うとともに管制部(図示しない)に内
蔵された大・小範判定回路、平均値演算回路、比
較補正回路を作動させる。一方、選別部Dには
大・小範グループのみを受け取り収容する位置F
を定めて、これをその間受け取り位置に決め、
大・小範グループのワークピースのみを受け取
る。そして、大・小範が測定部を通過して
(D1′−D1)、(D2′−D2)により補正が完了すると
通常の測定選別の稼動が続行される。なおFに収
容された大・小範グループのワークピースは稼動
中に供給部のEに人手により、もしくは自動的
(図示せず)に移される。
Figures 1 and 2 show an example of a specific device for carrying out the above method using a sorting device. The work pieces are stacked vertically and supplied to 12 comb bars located within the circumference of the comb bar, and are sequentially rotated by a control unit (not shown) to measure the workpieces being fed to the comb bars one by one. Large and small master pieces are connected and supplied to any of the comb rods, and master matching can be performed at any time according to instructions from the control unit.
In the figure, the master pieces of the large and small groups selected as described above are housed in series E for each large and small group. It should be noted that the distinction between large and small ranges is made by a control unit (not shown) by counting. B is a workpiece takeout/delivery device that takes out workpieces one by one from the supply section and transfers them to the measurement section C, and transfers the workpieces for which measurement has been completed to the classification and sorting section D. The sorting section accommodates workpieces to be sorted according to the measured values at predetermined sorting positions. In such a configuration, when master matching is required, the storage section E for the large and small groups, which are accommodated in series at any time during operation, is positioned in the take-out section, and the large and small groups are sequentially stored.
Send each small group to the measurement department. Then, while performing normal measurements, the large/small range judgment circuit, average value calculation circuit, and comparison correction circuit built into the control section (not shown) are activated. On the other hand, in the sorting section D, there is a position F where only the large and small groups are received and accommodated.
and set it at the receiving position during that time,
Receive only large and small group workpieces. Then, when the large and small ranges pass through the measuring section (D 1 '-D 1 ) and the correction is completed by (D 2 '-D 2 ), normal measurement and sorting operations are continued. The large and small group workpieces stored in F are transferred to E in the supply section manually or automatically (not shown) during operation.

自動搬送測定選別機には色々な形のものがある
が、他の例として傾斜シユートに沿つて移動する
方式のものについて、第3図により説明する。こ
こでAは供給部で、ワークピース1は傾斜シユー
ト2の中を搬送される。シユートには別に大・小
範用ケース3が連結され、シユート及びケースの
出口にはストツパー4,5が設けられる。また搬
送部にも選別部Dに向かうシユート6の途中にケ
ース7が分岐して設けられ、分岐部に方向切換板
8を設ける。なおケース7は大・小範グループの
収容ケースとする。そして常時はストツパー5を
閉じ、4を開いて、ワークピース1を測定部Cに
供給してワークピースを測定し、選別分類部へ通
路Cに送り出す。そしてマスター合せの必要なと
きにはストツパー4を閉じ、5を開いて大・小範
グループのワークピースを測定部に送り、測定を
終つたものは板8を上げることによつて大・小範
グループの収容ケース7に入れる。そしてマスタ
ー合せ完了後はケース7とケース3とを人手を用
い、もしくは自動的(図示せず)に交換して次の
マスター合わせに備える。
There are various types of automatic conveyance measuring and sorting machines, and as another example, one that moves along an inclined chute will be explained with reference to FIG. Here, A is a supply section, in which the workpiece 1 is conveyed through an inclined chute 2. A large and small case 3 is separately connected to the chute, and stoppers 4 and 5 are provided at the outlet of the chute and the case. Further, a case 7 is also provided in the conveying section in a branched manner in the middle of the chute 6 heading toward the sorting section D, and a direction switching plate 8 is provided at the branching section. Case 7 will be used to accommodate large and small groups. Normally, the stopper 5 is closed, the stopper 4 is opened, the workpiece 1 is supplied to the measuring section C, the workpiece is measured, and the workpiece is sent to the passage C to the sorting and sorting section. When master alignment is required, stopper 4 is closed and stopper 5 is opened to send the workpieces of the large and small groups to the measuring section.When the measurement has been completed, the workpieces of the large and small groups are moved by raising the plate 8. Place it in storage case 7. After the master alignment is completed, the cases 7 and 3 are replaced manually or automatically (not shown) in preparation for the next master alignment.

以上のように本発明によれば、信頼できる測定
機によつて複数個のワークピースを測定して得た
値をマスター値として記憶し、随時、装置の実際
の稼動と同じ状態・要領で前記マスターの測定を
行い、その測定値と前記マスター値の差を求め、
この差を器差として本装置の零点、倍率の補正を
行うので常に高精度の測定、選別を行うことがで
きるとともに、装置の稼動を停止することなく、
マスターピース供給後は人手を要しない。また、
複数個のグループの平均値をそれぞれ大範、およ
び小範のマスター値として用いるので信頼性が一
層高まる。さらにワークピースの中から抽出した
ものをマスターピースとして用いるのでマスター
ピースの設計、製作が不要となり、保管、管理が
簡略化できるので経済的である等、極めて大きな
効果が得られる。
As described above, according to the present invention, the values obtained by measuring a plurality of workpieces with a reliable measuring machine are stored as master values, and the values obtained by measuring a plurality of workpieces with a reliable measuring machine are stored at any time in the same state and manner as the actual operation of the device. Perform a master measurement, find the difference between the measured value and the master value,
Since this difference is used as an instrumental error to correct the zero point and magnification of this device, it is possible to always perform highly accurate measurement and sorting, and without stopping the operation of the device.
No human intervention is required after the Master Piece is supplied. Also,
Since the average values of a plurality of groups are used as master values for the large range and the small range, reliability is further increased. Furthermore, since the material extracted from the workpiece is used as the master piece, there is no need to design or manufacture a master piece, and storage and management can be simplified, resulting in economical effects, and other great effects.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施の一例を示す平面説明
図、第2図はその側面設計図、第3図は他の実施
例を示す説明図。 1……ワークピース、2……傾斜ケース、3,
7……大・小範グループケース、4,5……スト
ツパー、8……切換板。
FIG. 1 is an explanatory plan view showing an example of the implementation of the present invention, FIG. 2 is a side design drawing thereof, and FIG. 3 is an explanatory view showing another embodiment. 1... Workpiece, 2... Inclined case, 3,
7... Large/small group case, 4, 5... Stopper, 8... Switching plate.

Claims (1)

【特許請求の範囲】 1 予め基準となる測定装置をもつて測定され
た、大範寸法に近いワークグループ(平均寸法
D1)と小範寸法に近いワークグループ(平均寸
法D2)とに分類されたワークピースを各グルー
プ毎に複数個連設準備し、連続測定装置の稼動工
程中にこの大・小範グループのワークピースをグ
ループ毎に連続して測定部に送り込み、各々大・
小範グループのワークピースを順次測定し、これ
を一般のワークピース測定の経路から分離して収
容し、かつ大・小範グループのその装置における
測定値の平均値D1′,D2′を作り(D1′−D1)、
(D2′−D2)をもつてその装置の誤差補正を行う
高精度マスター合せ方法。 2 予め基準となる測定装置をもつて測定され
た、大範寸法に近いワークグループ(平均寸法
D1)と小範寸法に近いワークグループ(平均寸
法D2)とに分類されたワークピースを各グルー
プ毎に複数個連設準備したマスターワーク収容装
置と、稼動中の測定装置における一般にワークピ
ースのみを収容する収容装置とを有し、かつマス
ター合せの際は稼動中の一般ワークピースの搬送
を中止して連設収容されている大・小範マスター
ピースを稼動中の測定装置に順次送り込む切り換
え装置と、送り込まれたマスターピースの各々の
寸法を測定し、これを一般のワークピースの経路
から分離収容する装置とを有し、大・小範グルー
プの各々の測定値の平均D1′,D2′を算出する演算
回路と、基準となる測定装置をもつて測定された
大・小範のワークグループの基準平均値D1,D2
との比較により測定系回路の補正を行う比較補正
回路とを有する高精度マスター合せ装置。
[Scope of Claims] 1 Work groups with approximate dimensions (average dimensions) measured in advance using a measuring device as a reference.
A plurality of workpieces classified into workpiece groups with average dimensions (D 1 ) and workpieces with average dimensions (D 2 ) are prepared for each group, and during the operation process of the continuous measuring device, these large and small groups are separated. The workpieces are successively fed into the measurement section in groups, and each
Measure the workpieces of the small group one after another, store them separately from the general workpiece measurement path, and calculate the average values D 1 ′, D 2 ′ of the measured values of the large and small groups on the equipment. Making (D 1 ′−D 1 ),
(D 2 ′−D 2 ) is a high-precision master matching method that corrects the error of the device. 2 Work groups with approximate dimensions (average dimensions) that have been measured in advance using a standard measuring device.
D 1 ) and workpiece groups close to the small size (average size D 2 ), each group is prepared with a plurality of workpieces arranged in series, and the workpieces in the measuring device in operation are generally stored. and a storage device that only accommodates the master pieces, and when performing master alignment, the transfer of the general workpieces in operation is stopped and the large and small master pieces stored in series are sequentially fed into the measuring device in operation. and a device that measures the dimensions of each master piece fed in and stores it separately from the path of the general workpiece, and calculates the average of the measured values of each of the large and small groups D 1 ′, D Standard average values D 1 , D 2 of large and small work groups measured using a calculation circuit that calculates 2 ′ and a measuring device that serves as a reference.
A high-precision master matching device that has a comparison correction circuit that corrects the measurement system circuit by comparing with the
JP11494382A 1982-07-01 1982-07-01 Highly accurate method and device for aligning master Granted JPS595909A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11494382A JPS595909A (en) 1982-07-01 1982-07-01 Highly accurate method and device for aligning master

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11494382A JPS595909A (en) 1982-07-01 1982-07-01 Highly accurate method and device for aligning master

Publications (2)

Publication Number Publication Date
JPS595909A JPS595909A (en) 1984-01-12
JPH0472164B2 true JPH0472164B2 (en) 1992-11-17

Family

ID=14650487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11494382A Granted JPS595909A (en) 1982-07-01 1982-07-01 Highly accurate method and device for aligning master

Country Status (1)

Country Link
JP (1) JPS595909A (en)

Also Published As

Publication number Publication date
JPS595909A (en) 1984-01-12

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