JPH0467340U - - Google Patents

Info

Publication number
JPH0467340U
JPH0467340U JP11034790U JP11034790U JPH0467340U JP H0467340 U JPH0467340 U JP H0467340U JP 11034790 U JP11034790 U JP 11034790U JP 11034790 U JP11034790 U JP 11034790U JP H0467340 U JPH0467340 U JP H0467340U
Authority
JP
Japan
Prior art keywords
lead
stopper
ics
movable rail
bending
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11034790U
Other languages
English (en)
Japanese (ja)
Other versions
JP2546611Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990110347U priority Critical patent/JP2546611Y2/ja
Publication of JPH0467340U publication Critical patent/JPH0467340U/ja
Application granted granted Critical
Publication of JP2546611Y2 publication Critical patent/JP2546611Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Lead Frames For Integrated Circuits (AREA)
JP1990110347U 1990-10-22 1990-10-22 Ｉｃ試験装置 Expired - Lifetime JP2546611Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990110347U JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0467340U true JPH0467340U (sv) 1992-06-15
JP2546611Y2 JP2546611Y2 (ja) 1997-09-03

Family

ID=31857668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990110347U Expired - Lifetime JP2546611Y2 (ja) 1990-10-22 1990-10-22 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2546611Y2 (sv)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57149745A (en) * 1981-03-11 1982-09-16 Tokyo Seimitsu Co Ltd Selector for semiconductor element, etc.
JPS62103254U (sv) * 1985-12-19 1987-07-01
JPS62167486A (ja) * 1986-01-13 1987-07-23 Shimadzu Corp Ｃａｎ型ｉｃ用自動検査装置
JPS6454334U (sv) * 1987-09-30 1989-04-04
JPH0167580U (sv) * 1987-10-26 1989-05-01
JPH0231226U (sv) * 1988-06-30 1990-02-27

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57149745A (en) * 1981-03-11 1982-09-16 Tokyo Seimitsu Co Ltd Selector for semiconductor element, etc.
JPS62103254U (sv) * 1985-12-19 1987-07-01
JPS62167486A (ja) * 1986-01-13 1987-07-23 Shimadzu Corp Ｃａｎ型ｉｃ用自動検査装置
JPS6454334U (sv) * 1987-09-30 1989-04-04
JPH0167580U (sv) * 1987-10-26 1989-05-01
JPH0231226U (sv) * 1988-06-30 1990-02-27

Also Published As

Publication number Publication date
JP2546611Y2 (ja) 1997-09-03

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