JPH0467339U - - Google Patents

Info

Publication number
JPH0467339U
JPH0467339U JP11008390U JP11008390U JPH0467339U JP H0467339 U JPH0467339 U JP H0467339U JP 11008390 U JP11008390 U JP 11008390U JP 11008390 U JP11008390 U JP 11008390U JP H0467339 U JPH0467339 U JP H0467339U
Authority
JP
Japan
Prior art keywords
image input
inspection
handler
input device
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11008390U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0650985Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11008390U priority Critical patent/JPH0650985Y2/ja
Publication of JPH0467339U publication Critical patent/JPH0467339U/ja
Application granted granted Critical
Publication of JPH0650985Y2 publication Critical patent/JPH0650985Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11008390U 1990-10-20 1990-10-20 Ｉｃリードピン検査装置 Expired - Lifetime JPH0650985Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11008390U JPH0650985Y2 (ja) 1990-10-20 1990-10-20 Ｉｃリードピン検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11008390U JPH0650985Y2 (ja) 1990-10-20 1990-10-20 Ｉｃリードピン検査装置

Publications (2)

Publication Number Publication Date
JPH0467339U true JPH0467339U (enrdf_load_stackoverflow) 1992-06-15
JPH0650985Y2 JPH0650985Y2 (ja) 1994-12-21

Family

ID=31857367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11008390U Expired - Lifetime JPH0650985Y2 (ja) 1990-10-20 1990-10-20 Ｉｃリードピン検査装置

Country Status (1)

Country Link
JP (1) JPH0650985Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118191552A (zh) * 2023-12-06 2024-06-14 北京伽略电子股份有限公司 一种基于变电流的芯片引脚悬空检测电路及检测方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118191552A (zh) * 2023-12-06 2024-06-14 北京伽略电子股份有限公司 一种基于变电流的芯片引脚悬空检测电路及检测方法

Also Published As

Publication number Publication date
JPH0650985Y2 (ja) 1994-12-21

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