JPH0463138U - - Google Patents

Info

Publication number
JPH0463138U
JPH0463138U JP10371590U JP10371590U JPH0463138U JP H0463138 U JPH0463138 U JP H0463138U JP 10371590 U JP10371590 U JP 10371590U JP 10371590 U JP10371590 U JP 10371590U JP H0463138 U JPH0463138 U JP H0463138U
Authority
JP
Japan
Prior art keywords
comparator
handler
ics
control circuit
compares
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10371590U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10371590U priority Critical patent/JPH0463138U/ja
Publication of JPH0463138U publication Critical patent/JPH0463138U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10371590U 1990-10-02 1990-10-02 Pending JPH0463138U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10371590U JPH0463138U (enExample) 1990-10-02 1990-10-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10371590U JPH0463138U (enExample) 1990-10-02 1990-10-02

Publications (1)

Publication Number Publication Date
JPH0463138U true JPH0463138U (enExample) 1992-05-29

Family

ID=31848694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10371590U Pending JPH0463138U (enExample) 1990-10-02 1990-10-02

Country Status (1)

Country Link
JP (1) JPH0463138U (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63253276A (ja) * 1987-04-10 1988-10-20 Nec Corp Ｉｃ試験システム
JPH0224577A (ja) * 1988-07-13 1990-01-26 Mitsubishi Electric Corp 半導体装置の検査用搬送装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63253276A (ja) * 1987-04-10 1988-10-20 Nec Corp Ｉｃ試験システム
JPH0224577A (ja) * 1988-07-13 1990-01-26 Mitsubishi Electric Corp 半導体装置の検査用搬送装置

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