JPH0459464U - - Google Patents
Info
- Publication number
- JPH0459464U JPH0459464U JP10175090U JP10175090U JPH0459464U JP H0459464 U JPH0459464 U JP H0459464U JP 10175090 U JP10175090 U JP 10175090U JP 10175090 U JP10175090 U JP 10175090U JP H0459464 U JPH0459464 U JP H0459464U
- Authority
- JP
- Japan
- Prior art keywords
- support
- holes
- equal intervals
- ferromagnetic material
- contact needles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 239000003302 ferromagnetic material Substances 0.000 claims 2
- 239000000696 magnetic material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10175090U JPH0749417Y2 (ja) | 1990-09-28 | 1990-09-28 | 電気抵抗探傷用探触子 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10175090U JPH0749417Y2 (ja) | 1990-09-28 | 1990-09-28 | 電気抵抗探傷用探触子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0459464U true JPH0459464U (en:Method) | 1992-05-21 |
| JPH0749417Y2 JPH0749417Y2 (ja) | 1995-11-13 |
Family
ID=31845459
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10175090U Expired - Lifetime JPH0749417Y2 (ja) | 1990-09-28 | 1990-09-28 | 電気抵抗探傷用探触子 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0749417Y2 (en:Method) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013051675A1 (ja) * | 2011-10-07 | 2013-04-11 | 日本発條株式会社 | プローブユニット |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE202018006696U1 (de) | 2017-05-15 | 2022-04-01 | Ouster, Inc. | Optischer Bildübertrager mit Helligkeitsverbesserung |
| US11353556B2 (en) | 2017-12-07 | 2022-06-07 | Ouster, Inc. | Light ranging device with a multi-element bulk lens system |
| US10760957B2 (en) | 2018-08-09 | 2020-09-01 | Ouster, Inc. | Bulk optics for a scanning array |
| US10739189B2 (en) | 2018-08-09 | 2020-08-11 | Ouster, Inc. | Multispectral ranging/imaging sensor arrays and systems |
-
1990
- 1990-09-28 JP JP10175090U patent/JPH0749417Y2/ja not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013051675A1 (ja) * | 2011-10-07 | 2013-04-11 | 日本発條株式会社 | プローブユニット |
| JPWO2013051675A1 (ja) * | 2011-10-07 | 2015-03-30 | 日本発條株式会社 | プローブユニット |
| US9291645B2 (en) | 2011-10-07 | 2016-03-22 | Nhk Spring Co., Ltd. | Probe unit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0749417Y2 (ja) | 1995-11-13 |