JPH0457749U - - Google Patents

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Publication number
JPH0457749U
JPH0457749U JP9954890U JP9954890U JPH0457749U JP H0457749 U JPH0457749 U JP H0457749U JP 9954890 U JP9954890 U JP 9954890U JP 9954890 U JP9954890 U JP 9954890U JP H0457749 U JPH0457749 U JP H0457749U
Authority
JP
Japan
Prior art keywords
probes
ray
fluorescent
rays
control means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9954890U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9954890U priority Critical patent/JPH0457749U/ja
Publication of JPH0457749U publication Critical patent/JPH0457749U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の一実施例を示す蛍光Ｘ線分
析装置の概略構成図、第２図はＸ線通過制御手段
の変形例を示す正面図である。 １１〜１３……プローブ（半導体検出器）、２
０……Ｘ線通過制御手段、３１〜３３……計測器
、Ｂ１〜Ｂ３……蛍光Ｘ線、Ｗ……試料、ａ，ａ
１……Ｘ線検出信号。 FIG. 1 is a schematic configuration diagram of a fluorescent X-ray analyzer showing an embodiment of this invention, and FIG. 2 is a front view showing a modification of the X-ray passage control means. 11-13...Probe (semiconductor detector), 2
0... X-ray passage control means, 31-33... Measuring instrument, B1-B3... Fluorescent X-ray, W... Sample, a, a
1...X-ray detection signal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料からの蛍光Ｘ線を検出する複数のプローブ
と、これらの各プローブにそれぞれ接続され、上
記各プローブからのＸ線検出信号を受けてＸ線強
度を計測する複数の計測器と、上記各プローブに
入射する蛍光Ｘ線の波長帯域を上記各プローブご
とに異ならせるＸ線通過制御手段とを備えた蛍光
Ｘ線分析装置。 A plurality of probes that detect fluorescent X-rays from a sample, a plurality of measuring instruments that are connected to each of these probes and measure X-ray intensity by receiving an X-ray detection signal from each of the probes, and each of the above probes. and an X-ray passage control means for varying the wavelength band of fluorescent X-rays incident on each of the probes.
JP9954890U 1990-09-21 1990-09-21 Pending JPH0457749U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9954890U JPH0457749U (en) 1990-09-21 1990-09-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9954890U JPH0457749U (en) 1990-09-21 1990-09-21

Publications (1)

Publication Number Publication Date
JPH0457749U true JPH0457749U (en) 1992-05-18

Family

ID=31841555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9954890U Pending JPH0457749U (en) 1990-09-21 1990-09-21

Country Status (1)

Country Link
JP (1) JPH0457749U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003519381A (en) * 2000-01-05 2003-06-17 エイビービー インコーポレイテッド Method and apparatus for estimating mineral content in sheet material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003519381A (en) * 2000-01-05 2003-06-17 エイビービー インコーポレイテッド Method and apparatus for estimating mineral content in sheet material

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