JPH0455584U - - Google Patents
Info
- Publication number
- JPH0455584U JPH0455584U JP9863690U JP9863690U JPH0455584U JP H0455584 U JPH0455584 U JP H0455584U JP 9863690 U JP9863690 U JP 9863690U JP 9863690 U JP9863690 U JP 9863690U JP H0455584 U JPH0455584 U JP H0455584U
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- under test
- electrical characteristics
- casing
- measuring electrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9863690U JPH0455584U (en:Method) | 1990-09-18 | 1990-09-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9863690U JPH0455584U (en:Method) | 1990-09-18 | 1990-09-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0455584U true JPH0455584U (en:Method) | 1992-05-13 |
Family
ID=31839956
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9863690U Pending JPH0455584U (en:Method) | 1990-09-18 | 1990-09-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0455584U (en:Method) |
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1990
- 1990-09-18 JP JP9863690U patent/JPH0455584U/ja active Pending