JPH0453257B2 - - Google Patents

Info

Publication number
JPH0453257B2
JPH0453257B2 JP59259655A JP25965584A JPH0453257B2 JP H0453257 B2 JPH0453257 B2 JP H0453257B2 JP 59259655 A JP59259655 A JP 59259655A JP 25965584 A JP25965584 A JP 25965584A JP H0453257 B2 JPH0453257 B2 JP H0453257B2
Authority
JP
Japan
Prior art keywords
signal
defect
inspection
recording means
recording
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59259655A
Other languages
Japanese (ja)
Other versions
JPS61137058A (en
Inventor
Yoshikatsu Kyohara
Hiroyuki Nitsuta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP59259655A priority Critical patent/JPS61137058A/en
Publication of JPS61137058A publication Critical patent/JPS61137058A/en
Publication of JPH0453257B2 publication Critical patent/JPH0453257B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013Arrangements for scanning
    • G01N27/902Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Closed-Circuit Television Systems (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は金属表面等に存在するクラツク、腐食
等の表面欠陥を検出するべく、テレビカメラ等の
撮像機によつて全検査面を撮影しVTR等の記録
手段に録画した後、欠陥が存在する検査面の画像
信号のみを他の記録手段に自動的に録画、編集す
る為の装置に関する。
[Detailed Description of the Invention] (Industrial Application Field) The present invention uses an imaging device such as a television camera to photograph the entire inspection surface in order to detect surface defects such as cracks and corrosion existing on metal surfaces. The present invention relates to a device for automatically recording and editing only the image signal of an inspection surface where a defect exists on another recording means after recording it on a recording means such as a VTR.

(従来の技術) 出願人は以前に管内面の異常を検査するため、
第2図に示す如く走行機構10を具えて管中を移
動する自走車1の前部に、往復揺動可能に揺動腕
44を配備し、該揺動腕44の下端に渦流探傷器
4を取付けて、自走車を毎分約4mの速度で移行
させつつ揺動腕を高速で往復揺動させ、探傷器4
によつて管内面を走査し検査する装置を提案した
(特開昭58−26256)。
(Prior Art) The applicant previously inspected the inner surface of a tube for abnormalities.
As shown in FIG. 2, a swinging arm 44 is provided at the front of the self-propelled vehicle 1 equipped with a traveling mechanism 10 and moving in a pipe so that it can swing back and forth, and an eddy current flaw detector is attached to the lower end of the swinging arm 44. 4, and while moving the self-propelled vehicle at a speed of approximately 4 m/min, swing the swinging arm back and forth at high speed,
proposed a device that scans and inspects the inner surface of tubes using the method (Japanese Unexamined Patent Publication No. 1983-26256).

該装置は、更に前部にテレビカメラ5を装備す
ることが可能で、これによつて検査箇所を撮影
し、渦流探傷器4の検査信号及びテレビカメラ5
の画像信号は、自走車1に積載された信号処理部
6によつて信号処理を施した後、伝送ケーブル2
を介してモニター部3へ送りペンレコーダ83及
びVTR81に記録すると共にモニターテレビ8
2によつて検査面の状況を直接に監視する。
The device can further be equipped with a television camera 5 at the front, which photographs the inspection area and transmits the inspection signal of the eddy current flaw detector 4 and the television camera 5.
The image signal is subjected to signal processing by the signal processing unit 6 mounted on the self-propelled vehicle 1, and then sent to the transmission cable 2.
It is sent to the monitor unit 3 via the pen recorder 83 and recorded on the VTR 81, and is also sent to the monitor TV 8.
2 directly monitors the condition of the inspection surface.

伝送ケーブル2は、弾性樹脂製のテーブル本体
中に電力線、光フアイバー及び補強線を埋設した
ものである。
The transmission cable 2 has a power line, an optical fiber, and a reinforcing wire embedded in a table body made of elastic resin.

渦流探傷器4は第3図に示す如く、小径の欠陥
検出コイル41と、該コイルよりも大径の励磁コ
イル40とを同心に配備し、夫々ホルダー43,
42に固定して一体化したものである。
As shown in FIG. 3, the eddy current flaw detector 4 has a defect detection coil 41 with a small diameter and an excitation coil 40 with a larger diameter than the coil arranged concentrically.
It is fixed and integrated with 42.

信号処理部6は励磁コイル40に高周波励磁電
流を供給すると共に、検査面の走査によつて検出
コイル41に生じるインピーダンスの変化を検出
し、更に検出信号に対して位相検波を施し探傷器
4と検査面9との距離(リフトオフ)の変動に起
因するリフトオフ信号Vxと検査面9上の欠陥9
1の存在に起因する傷信号Vyとを出力するもの
である。
The signal processing unit 6 supplies a high-frequency excitation current to the excitation coil 40, detects changes in impedance that occur in the detection coil 41 by scanning the inspection surface, and further performs phase detection on the detection signal to connect the flaw detector 4 and Lift-off signal Vx caused by variation in distance (lift-off) from inspection surface 9 and defect 9 on inspection surface 9
It outputs a flaw signal Vy caused by the presence of 1.

上記リフトオフ信号Vxと傷信号Vyはモニター
部3のペンレコーダ83に記録され、これによつ
て管内面の欠陥が発見される。欠陥のある検査面
の状態はVTR81によつて記録された磁気テー
プを再生し、前記ペンレコーダ83のチヤートと
比較することにより確認することが出来る。
The lift-off signal V x and the flaw signal V y are recorded on the pen recorder 83 of the monitor section 3, thereby allowing defects on the inner surface of the tube to be discovered. The state of the defective inspection surface can be confirmed by playing back the magnetic tape recorded by the VTR 81 and comparing it with the chart of the pen recorder 83.

(解決しようとする問題点) 上記装置に於ては、テレビカメラ5及びVTR
81は走査期間中連続作動しているから、VTR
81には欠陥の無い正常な検査面まで記録され
る。
(Problem to be solved) In the above device, the TV camera 5 and the VTR
81 operates continuously during the scanning period, so the VTR
In 81, even normal inspection surfaces with no defects are recorded.

例えば検査依頼人に対して検査結果を報告する
際、検査全体の画像が必要であることも多いが場
合によつては正常な箇所の画像は不要なこともあ
る。そこで前記VTR81に編集用の他のVTRを
接続し、欠陥の存在する検査面の画像のみを該
VTRに編集、記録することが行なわれる。
For example, when reporting test results to a test client, images of the entire test are often required, but in some cases, images of normal areas may not be necessary. Therefore, another VTR for editing is connected to the VTR 81, and only the image of the inspection surface where the defect exists is selected.
Editing and recording are done on a VTR.

ところが、上記編集作業に於てはペンレコーダ
83の記録チヤートとVTR81の再生画面とを
照合しつつ、手作業で編集用のVTRのON−
OFFを行なわなければならず、時間と手間がか
かる問題があつた。
However, in the editing work mentioned above, while checking the recording chart of the pen recorder 83 and the playback screen of the VTR 81, the VTR for editing is manually turned on.
I had to turn it off, which was a problem that took time and effort.

(問題点を解決する為の手段) 本発明は上記問題を解決するべく、検査面の全
ての画像を記録した第1の記録手段に対し、編集
記録用の第2の記録手段を接続し、第2の記録手
段のON−OFFを自動的に行なう様にした。
(Means for solving the problem) In order to solve the above problem, the present invention connects a second recording means for editing and recording to the first recording means that records all images of the inspection surface, The second recording means is automatically turned on and off.

第1の記録手段には、検査信号、画像信号及び
検査面上の走査位置を示す位置信号が記録されて
おり、該記録手段を再生して得られる検査信号は
信号処理回路に入力されて検査面の欠陥の存在を
示す欠陥信号に変換される。
The first recording means records an inspection signal, an image signal, and a position signal indicating the scanning position on the inspection surface, and the inspection signal obtained by reproducing the recording means is input to a signal processing circuit for inspection. This is converted into a defect signal indicating the presence of surface defects.

第2の記録手段はON−OFF制御信号によつて
制御が可能であり、前記欠陥信号がON制御信号
として入力されている。
The second recording means can be controlled by an ON-OFF control signal, and the defect signal is input as the ON control signal.

(作用) 正常な検査面を走査して得られた検査信号、画
像信号及び位置信号が第1の記録手段によつて再
生されている場合、信号処理回路からレベルの高
い欠陥信号が出力されることはなく、第2の記録
手段は駆動されず停止状態のままである。
(Function) When the inspection signal, image signal, and position signal obtained by scanning a normal inspection surface are being reproduced by the first recording means, a high-level defect signal is output from the signal processing circuit. This does not occur, and the second recording means remains in a stopped state without being driven.

検査面の欠陥箇所を走査して得られた検査信
号、画像信号、位置信号が第1の記録手段によつ
て再生されたとき、信号処理回路からの欠陥信号
のレベルは所定値を上回り、第2の記録手段へ
ON制御信号が送られる。
When the inspection signal, image signal, and position signal obtained by scanning the defect location on the inspection surface are reproduced by the first recording means, the level of the defect signal from the signal processing circuit exceeds a predetermined value, and the level of the defect signal from the signal processing circuit exceeds a predetermined value. Go to 2. Recording method
ON control signal is sent.

これによつて第2の記録手段は駆動され、第1
の記録手段から入力される画像信号及び位置信号
の記録を開始する。
As a result, the second recording means is driven, and the first recording means is driven.
Recording of the image signal and position signal input from the recording means is started.

前記欠陥信号が発生してから一定時間経過後、
或は信号レベルが所定値よりも低下したとき、第
2の記録手段は動作を停止する。
After a certain period of time has passed since the defect signal was generated,
Alternatively, when the signal level drops below a predetermined value, the second recording means stops operating.

(発明の効果) 第2の記録手段には検査面の欠陥箇所のみの画
像信号が記録されるから、検査終了後の検査面の
欠陥状態の確認は迅速に行なうことが出来る。又
欠陥の位置は欠陥の存在する検査面の映像と共に
記録された位置信号によつて知ることが出来る。
(Effects of the Invention) Since the second recording means records the image signal of only the defective location on the inspection surface, the defect state of the inspection surface can be quickly confirmed after the inspection is completed. Further, the position of the defect can be known from the position signal recorded together with the image of the inspection surface where the defect exists.

(実施例) 第2図は前述の如く出願人が提案する管内面検
査装置の概略図であつて、オイルタンカーに設備
された貨油管90の内部へ自走車1を配置して走
行させ、甲板92上のモニター部3より自走車1
の走行を制御すると共に、検査信号及び画像信号
はモニター部3に送つて監視する状況を示してい
る。
(Example) FIG. 2 is a schematic diagram of a pipe inner surface inspection device proposed by the applicant as described above, in which a self-propelled vehicle 1 is placed inside a cargo oil pipe 90 installed in an oil tanker and runs. Self-propelled vehicle 1 from monitor section 3 on deck 92
The inspection signal and the image signal are sent to the monitor section 3 for monitoring.

自走車1は無端ベルト及び複数のローラからな
る走行機構10を両側に具え、電動機或はパルス
モータ等の駆動装置(図示省略)を各走行機構1
0に連繋しており、前記駆動装置はモニター部3
の走行制御部7からの信号に制御されて、自走車
1の移動を前進、停止、後進等に切り替えること
が出来る。
The self-propelled vehicle 1 is equipped with a running mechanism 10 consisting of an endless belt and a plurality of rollers on both sides, and a driving device (not shown) such as an electric motor or a pulse motor is connected to each running mechanism 1.
0, and the drive device is connected to the monitor section 3.
The movement of the self-propelled vehicle 1 can be switched to forward, stopped, backward, etc. under the control of a signal from the travel control section 7.

自走車1の前部には前述の如く、揺動腕44に
よつて支持された渦流探傷器4と、探傷器4の走
査範囲を撮影するテレビカメラ5及び照明灯50
とが装備されている。
As described above, at the front of the self-propelled vehicle 1, there are the eddy current flaw detector 4 supported by the swinging arm 44, the television camera 5 for photographing the scanning range of the flaw detector 4, and the illumination light 50.
It is equipped with.

渦流探傷器4は第3図に示す相互誘導型のプロ
ーブであるが、自己誘導型のプローブも使用可能
である。
The eddy current flaw detector 4 is a mutual induction type probe shown in FIG. 3, but a self-induction type probe can also be used.

更に自走車1には後述の信号処理部6が積載さ
れている。
Furthermore, the self-propelled vehicle 1 is loaded with a signal processing section 6, which will be described later.

伝送ケーブル2は一端が自走車1に接続され、
管中へ繰り出す長さ分が甲板92上のドラム21
に巻装されており、更に該ドラム21とモニター
部3とはコード20によつて接続されている。
The transmission cable 2 has one end connected to the self-propelled vehicle 1,
The length of the drum 21 on the deck 92 that is fed out into the pipe is
Further, the drum 21 and the monitor section 3 are connected by a cord 20.

管90の端部にはケーブル案内具22を固定し
て、ドラム21から繰り出されるケーブル2を管
中へ案内する。
A cable guide 22 is fixed to the end of the tube 90 to guide the cable 2 fed out from the drum 21 into the tube.

甲板92上に設置されたモニター部3は、自走
車1の前後進及び停止をコントロールする制御部
7と、テレビカメラ5からの画像信号に対し検査
結果等の数字或は文字データをスーパーインポー
ズする画像合成回路70と、信号表示記録装置8
とから構成される。信号表示記録装置8は検査結
果を記録するデータレコーダ80及びペンレコー
ダ83と、テレビカメラ5がとらえた画像信号を
表示するモニターテレビ82と、全ての画像信号
を前記検査結果と共に記録する第1のVTR81
とから構成される。
The monitor unit 3 installed on the deck 92 superimposes numerical or character data such as inspection results on the image signals from the control unit 7 that controls the forward and backward movement and stopping of the self-propelled vehicle 1 and the television camera 5. Pause image synthesis circuit 70 and signal display recording device 8
It consists of The signal display and recording device 8 includes a data recorder 80 and a pen recorder 83 for recording test results, a monitor television 82 for displaying image signals captured by the television camera 5, and a first monitor for recording all image signals together with the test results. VTR81
It consists of

第4図は第2図に示す装置に装備される電気回
路のブロツク図であつて、以下該ブロツク図の各
構成要素について詳述する。
FIG. 4 is a block diagram of an electric circuit installed in the apparatus shown in FIG. 2, and each component of the block diagram will be described in detail below.

渦流探傷器4からの出力信号V0が入力される
信号処理部6は、第5図に示す如く渦流探傷器4
の励磁コイル40に高周波励磁電流を供給する発
振器60と、検出コイル41のインピーダンス変
化を検出して検査信号Vdを出力する差動増幅器
63と、夫々一対の移相器61,62及び同期検
波器64,65とを具えている。
The signal processing unit 6 to which the output signal V 0 from the eddy current flaw detector 4 is input is connected to the eddy current flaw detector 4 as shown in FIG.
an oscillator 60 that supplies a high-frequency excitation current to the excitation coil 40, a differential amplifier 63 that detects impedance changes of the detection coil 41 and outputs a test signal Vd, a pair of phase shifters 61 and 62, and a synchronous detector, respectively. 64 and 65.

励磁コイル40に高周波電流を通じ、該コイル
を検査面9上に接近させると、コイルから生じる
高周波交番磁界が金属壁に渦電流を生起させ、こ
の渦電流の影響によつてコイルに生じる誘起逆起
電力を差動増幅器63等によつて検出する。検査
面の欠陥位置では渦電流が乱れてこれが誘起逆起
電力の変化となつて現われるから検査面9の欠陥
91を検出することが出来るのである。
When a high-frequency current is passed through the excitation coil 40 and the coil is brought close to the inspection surface 9, the high-frequency alternating magnetic field generated by the coil generates an eddy current in the metal wall, and the induced back emf generated in the coil due to the influence of this eddy current. The power is detected by a differential amplifier 63 or the like. The defect 91 on the inspection surface 9 can be detected because the eddy current is disturbed at the defect location on the inspection surface and this appears as a change in the induced back electromotive force.

ところが上記渦流探傷器4を用いた探傷法では
検出コイル41の出力信号にリフトオフ変化が少
なからず影響を及ぼすから、この影響を除去し傷
信号のみを得るべく、従来より位相解析回路が用
いられている。
However, in the flaw detection method using the eddy current flaw detector 4, the lift-off change has a considerable influence on the output signal of the detection coil 41, so a phase analysis circuit has conventionally been used in order to remove this effect and obtain only the flaw signal. There is.

第5図に示す実施例では、夫々一対の移相器6
1,62及び同期検波器64,65によつて前記
位相解析回路が構成されている。該回路によつて
検査信号Vdに対し位相解析が施される様子を第
5図及び第8図を用いて説明する。尚、第8図は
発振器60からの励磁高周波信号Fpを位相基準信
号としてR軸にとり、これに直交する方向の信号
をJ軸とするインピーダス平面である。
In the embodiment shown in FIG.
1 and 62 and synchronous detectors 64 and 65 constitute the phase analysis circuit. How the circuit performs phase analysis on the test signal V d will be explained with reference to FIGS. 5 and 8. FIG. 8 is an impedance plane in which the excitation high-frequency signal F p from the oscillator 60 is taken as a phase reference signal on the R axis, and the signal in the direction perpendicular to this is taken as the J axis.

位相解析の原理は、第8図に於て欠陥のない検
査面を探傷器が走査しているときのリフトオフの
変動のみに起因するコイルの出力Vlは、R軸から
位相θだけずれた標準位相の方向に生じるが、検
査面に欠陥があるときのコイル出力Vdは位相が
微小角度dθだけ偏倚することを利用するもので
ある。
The principle of phase analysis is that, as shown in Figure 8, the coil output V l , which is caused only by lift-off fluctuations when the flaw detector is scanning a defect-free inspection surface, is a standard deviation from the R axis by phase θ. Although it occurs in the phase direction, the coil output V d when there is a defect on the inspection surface utilizes the fact that the phase is shifted by a minute angle dθ.

検出コイル41によつて検出された差動増幅器
63によつて増幅された検査信号Vdは、第1同
期検波器64及び第2同期検波器65に入力され
る。発振器60からの高周波信号Fpは360度移相
器61及び90度移相器62に導かれる。360度移
相器61は高周波信号Fpを位相基準信号として、
標準位相方向(X軸方向)の制御信号を出力し、
又90度移相器62は標準位相より90゜進相した方
向(Y軸方向)の制御信号を出力する様に予め設
定されている。第1同期検波器64は90度移相器
62の設定によつて検査信号Vdの制御信号方向
の成分、即ち傷信号Vyを出力する。第2同期検
波器65は360度移相器61の設定によつて検査
信号Vdの制御信号方向の成分、即ちリフトオフ
信号Vxを出力する。
The test signal V d detected by the detection coil 41 and amplified by the differential amplifier 63 is input to a first synchronous detector 64 and a second synchronous detector 65 . The high frequency signal F p from the oscillator 60 is guided to a 360 degree phase shifter 61 and a 90 degree phase shifter 62 . The 360 degree phase shifter 61 uses the high frequency signal F p as a phase reference signal,
Outputs a control signal in the standard phase direction (X-axis direction),
Further, the 90 degree phase shifter 62 is set in advance to output a control signal in a direction (Y-axis direction) that is 90 degrees ahead of the standard phase. The first synchronous detector 64 outputs a component of the inspection signal V d in the control signal direction, that is, a flaw signal V y according to the settings of the 90-degree phase shifter 62 . The second synchronous detector 65 outputs a component of the test signal V d in the control signal direction, that is, a lift-off signal V x according to the settings of the 360-degree phase shifter 61 .

前記傷信号Vy及びリフトオフ信号Vxは伝送ケ
ーブル2を介して甲板92上のモニター部3へ送
られ、データレコーダ80及びペンレコーダ83
に全データが記録される。
The scratch signal V y and the lift-off signal V
All data will be recorded.

第4図に示す位置検出器11は自走車1を走行
駆動するパルスモータの回転数に応じてパルスa
を出力するロータリエンコーダであつて、該パル
スaはカウンター60に入力されて走行距離がカ
ウントされる。カウンター60から得られる距離
信号bはデータレコーダ80に入力されると共
に、後述の合成回路51に入力される。
The position detector 11 shown in FIG.
The pulse a is input to a counter 60 to count the distance traveled. A distance signal b obtained from the counter 60 is input to a data recorder 80, and is also input to a synthesis circuit 51, which will be described later.

テレビカメラ5によつてとらえた画像信号cは
前記距離信号bと共に合成回路51に入力され、
これによつて両信号b及びcはスーパーインポー
ズされ画像信号dとして第1VTR81の記録信号
入力端子へ接続される。
The image signal c captured by the television camera 5 is input to the synthesis circuit 51 together with the distance signal b,
As a result, both signals b and c are superimposed and connected to the recording signal input terminal of the first VTR 81 as an image signal d.

上記装置によつて検査面を走査し、データレコ
ーダ80及び第1VTR81に検査結果を記録した
後、第1図に示す本発明の表面欠陥記録装置によ
つて欠陥が存在する検査面のみの画像信号及び検
査データを第2VTR82へ編集記録する。
After the inspection surface is scanned by the above device and the inspection results are recorded on the data recorder 80 and the first VTR 81, an image signal of only the inspection surface where defects exist is scanned by the surface defect recording device of the present invention shown in FIG. and edit and record the inspection data to the second VTR 82.

データレコーダ80を再生して得られるリフト
オフ信号Vx及び傷信号Vyは欠陥信号作成回路7
2へ入力され、距離信号bは制御回路85へ入力
される。
The lift-off signal V x and flaw signal V y obtained by reproducing the data recorder 80 are generated by the defect signal generation circuit 7
2, and the distance signal b is input to the control circuit 85.

制御回路85は前記距離信号bから同期信号g
を作成する。該同期信号gは再生モードの第
1VTR81へ駆動制御信号として送られ、第
1VTR81に記録されている距離信号との位相差
がゼロとなる様に再生速度の同期が図られる。第
1VTR81を再生して得られる画像信号hは第
2VTR84の記録信号入力端子に接続されてい
る。
The control circuit 85 receives the synchronization signal g from the distance signal b.
Create. The synchronization signal g is the first synchronization signal in the playback mode.
1Sent as a drive control signal to VTR81,
The playback speed is synchronized so that the phase difference with the distance signal recorded in the 1VTR 81 becomes zero. No.
1The image signal h obtained by reproducing VTR81 is
Connected to the recording signal input terminal of 2VTR84.

欠陥信号作成回路72は第6図に示す如く、
夫々一対のフイルタ74,75及び波形整形回路
76,77と、論理積回路78とから構成され
る。リフトオフ信号Vx及び傷信号Vyは、夫々フ
イルタ74,75に入力されて渦流探傷器4の揺
動に基づくリフトオフ変動の低周波成分が取り除
かれ、更に波形整形回路76,77によつて矩形
波Vx′,Vy′に整形される。両矩形波Vx′,Vy′は
論理積回路78に入力され互いの論理積がとられ
る。検査面9に欠陥91が存在した場合、リフト
オフ信号Vy及び傷信号Vxには同時にピークが現
われるから、矩形波Vx′,Vy′は共にHレベルと
なり、論理積回路78からはパルス状の欠陥信号
Vpが得られる。
The defect signal generation circuit 72 is as shown in FIG.
They each include a pair of filters 74 and 75, waveform shaping circuits 76 and 77, and an AND circuit 78. The lift-off signal V x and the flaw signal V y are input to filters 74 and 75, respectively, to remove low frequency components of lift-off fluctuations caused by the swinging of the eddy current flaw detector 4, and are further processed into rectangular shapes by waveform shaping circuits 76 and 77. It is shaped into waves V x ′ and V y ′. Both rectangular waves V x ′ and V y ′ are input to an AND circuit 78 and are ANDed with each other. When a defect 91 exists on the inspection surface 9, peaks appear simultaneously in the lift-off signal V y and the flaw signal V x , so the rectangular waves V x ′ and V y ′ both become H level, and the AND circuit 78 outputs a pulse. defect signal
You can get Vp.

尚、欠陥信号作成回路72は他の電気回路によ
つて構成することも可能であり、更にマイクロコ
ンピユータのソフトウエアに置き変えることも出
来るのは勿論である。
It should be noted that the defect signal generation circuit 72 can be constructed from other electric circuits, and can of course be replaced by microcomputer software.

制御信号作成回路73は第7図に示す如く、リ
トリガブルモノマルチ73aを具えたワンシヨツ
トマルチバイブレータであつて、前記欠陥信号
Vpが入力されると抵抗R及びコンデンサCの値
で規定される特定数Tのパルス信号が端子Qから
得られ、反転出力端子から得られる信号が制御
信号Vcとして第2VTR84のポーズ入力端子へ
入力される。
As shown in FIG. 7, the control signal generation circuit 73 is a one-shot multivibrator equipped with a retriggerable monomulti 73a, and is configured to generate the defect signal.
When V p is input, a specific number T of pulse signals defined by the values of the resistor R and capacitor C are obtained from the terminal Q, and the signal obtained from the inverted output terminal is used as the control signal V c to the pause input terminal of the second VTR 84. is input to.

第2VTR84はポーズモードに設定維持されて
おり、前記制御信号Vcが入力されることにより、
該信号VcがLレベルの間、ポーズモードが解除
されて録画モードとなる。
The second VTR 84 is set and maintained in pause mode, and when the control signal V c is input,
While the signal V c is at L level, the pause mode is canceled and the recording mode is entered.

斯くして第2VTR84には欠陥が存在する検査
面の映像と、検査開始位置から該欠陥が存在する
位置までの距離を示す数字がスーパーインポーズ
されて記録される。従つて検査終了後に該VTR
84を再生することにより、欠陥状況を迅速に把
握することが出来る。
In this way, the second VTR 84 records a superimposed image of the inspection surface where the defect exists and a number indicating the distance from the inspection start position to the position where the defect exists. Therefore, after the inspection is completed, the VTR
By reproducing 84, the defect situation can be quickly grasped.

尚、本発明に係る表面欠陥検出装置は図示した
実施例に限らず、特許請求の範囲に記載された技
術範囲内で種々の変形が可能であるのは勿論であ
る。例えば上記実施例では、傷信号Vy及びリフ
トオフ信号Vxはデータレコーダ80に、画像信
号dはVTR81に記録しているが、検査信号と
画像信号とを同時収録出来るビジユアルデータレ
コーダにこれらの信号を記録することも可能であ
る。
It should be noted that the surface defect detection device according to the present invention is not limited to the illustrated embodiment, and it goes without saying that various modifications can be made within the technical scope described in the claims. For example, in the embodiment described above, the flaw signal V y and lift-off signal V It is also possible to record the signal.

又、上記実施例では第1図に示す欠陥記録装置
と第4図に示す欠陥検出装置とが分離独立して構
成されているが、両装置をオンラインで接続し、
全検査面の録画と欠陥箇所のみの編集録画とを同
時に行なうことも可能である。
Furthermore, in the above embodiment, the defect recording device shown in FIG. 1 and the defect detection device shown in FIG. 4 are configured separately and independently, but the two devices are connected online.
It is also possible to record the entire inspection surface and edit and record only the defective area at the same time.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る表面欠陥記録装置のブロ
ツク図、第2図は管内面検査装置の概略図、第3
図は渦流探傷器の断面図、第4図は第2図の検査
装置に装備される電気回路のブロツク図、第5図
は信号処理部のブロツク図、第6図は欠陥信号作
成回路のブロツク図、第7図は制御信号作成回路
のブロツク図、第8図は位相解析の原理を説明す
るインピーダンス平面図である。 1……自走車、4……渦流探傷器、5……テレ
ビカメラ、80……データレコーダ、81……第
1VTR、84……第2VTR。
FIG. 1 is a block diagram of a surface defect recording device according to the present invention, FIG. 2 is a schematic diagram of a tube inner surface inspection device, and FIG.
The figure is a cross-sectional view of the eddy current flaw detector, Figure 4 is a block diagram of the electric circuit installed in the inspection device shown in Figure 2, Figure 5 is a block diagram of the signal processing section, and Figure 6 is a block diagram of the defect signal generation circuit. 7 is a block diagram of the control signal generation circuit, and FIG. 8 is an impedance plan view explaining the principle of phase analysis. 1...Self-propelled vehicle, 4...Eddy current flaw detector, 5...TV camera, 80...Data recorder, 81...No.
1VTR, 84...2nd VTR.

Claims (1)

【特許請求の範囲】 1 検査面上を欠陥検出器により走査して得られ
た検査信号と、該検出器の走査箇所を撮影する撮
像機によつて得られた画像信号と、検査面上の走
査位置を示す位置信号とが記録されている第1の
記録手段に対し、ON−OFF制御信号により制御
可能な第2の記録手段を接続して、第1の記録手
段の再生信号の内、少なくとも画像信号と位置信
号とを第2の記録手段に入力し、検査信号は信号
処理回路に入力されて検査面の欠陥の存在を示す
欠陥信号に変換され、該欠陥信号は前記第2の記
録手段をON制御する信号として前記第2の記録
手段に接続されている表面欠陥記録装置。 2 欠陥検出器は渦流探傷器4である特許請求の
範囲第1項記載の表面欠陥記録装置。 3 第1の記録手段は検査信号及び位置信号が記
録されているデータレコーダ80と、画像信号が
記録されている第1VTR81とからなる特許請求
の範囲第1項又は第2項に記載の表面欠陥記録装
置。 4 第2の記録手段は第2VTR84である特許請
求の範囲第3項に記載の表面欠陥記録装置。 5 第1の記録手段に記録されている検査信号
は、渦流探傷器4と検査面9との距離の変動に基
づくリフトオフ信号Vxと、検査面上の欠陥91
に基づく傷信号Vyとからなり、信号処理回路は、
前記両信号Vx及びVyから欠陥の存在を示すパル
スを発生する欠陥信号作成回路72と、該パルス
の発生と同時に出力レベルが切り替わり所定時間
中該レベルが維持される制御信号作成回路73と
からなる特許請求の範囲第2項に記載の表面欠陥
記録装置。
[Claims] 1. An inspection signal obtained by scanning the inspection surface with a defect detector, an image signal obtained by an imaging device that photographs the scanned area of the detector, and an inspection signal obtained by scanning the inspection surface with a defect detector, A second recording means that can be controlled by an ON-OFF control signal is connected to the first recording means in which a position signal indicating a scanning position is recorded, and a second recording means is connected to the first recording means in which a position signal indicating a scanning position is recorded. At least an image signal and a position signal are input to the second recording means, and the inspection signal is input to a signal processing circuit and converted into a defect signal indicating the presence of a defect on the inspection surface, and the defect signal is input to the second recording means. A surface defect recording device connected to the second recording means as a signal for ON-controlling the means. 2. The surface defect recording device according to claim 1, wherein the defect detector is an eddy current flaw detector 4. 3. The first recording means comprises a data recorder 80 on which inspection signals and position signals are recorded, and a first VTR 81 on which image signals are recorded. Recording device. 4. The surface defect recording device according to claim 3, wherein the second recording means is a second VTR 84. 5 The inspection signals recorded in the first recording means include a lift-off signal Vx based on a change in the distance between the eddy current flaw detector 4 and the inspection surface 9, and a defect 91 on the inspection surface.
The signal processing circuit consists of a flaw signal Vy based on
It consists of a defect signal generation circuit 72 that generates a pulse indicating the presence of a defect from both the signals Vx and Vy, and a control signal generation circuit 73 whose output level is switched at the same time as the generation of the pulse and the level is maintained for a predetermined period of time. A surface defect recording device according to claim 2.
JP59259655A 1984-12-06 1984-12-06 Apparatus for recording surface flaw Granted JPS61137058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59259655A JPS61137058A (en) 1984-12-06 1984-12-06 Apparatus for recording surface flaw

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59259655A JPS61137058A (en) 1984-12-06 1984-12-06 Apparatus for recording surface flaw

Publications (2)

Publication Number Publication Date
JPS61137058A JPS61137058A (en) 1986-06-24
JPH0453257B2 true JPH0453257B2 (en) 1992-08-26

Family

ID=17337065

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59259655A Granted JPS61137058A (en) 1984-12-06 1984-12-06 Apparatus for recording surface flaw

Country Status (1)

Country Link
JP (1) JPS61137058A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0715379B2 (en) * 1987-02-18 1995-02-22 株式会社日立製作所 In-pipe traveling device
JPH0750039B2 (en) * 1988-06-08 1995-05-31 株式会社四国総合研究所 Conveyor belt damage detector
JPH0351756A (en) * 1989-07-19 1991-03-06 P-Puru:Kk Apparatus for detecting corrosion condition of bottom plate of pool
JP5267789B2 (en) * 2008-09-26 2013-08-21 オムロン株式会社 Appearance inspection apparatus and program
JP6768990B1 (en) * 2019-02-21 2020-10-14 株式会社テイエルブイ probe

Also Published As

Publication number Publication date
JPS61137058A (en) 1986-06-24

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