JPH04505215A - Symmetric carrier frequency interferometer - Google Patents

Symmetric carrier frequency interferometer

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Publication number
JPH04505215A
JPH04505215A JP50207091A JP50207091A JPH04505215A JP H04505215 A JPH04505215 A JP H04505215A JP 50207091 A JP50207091 A JP 50207091A JP 50207091 A JP50207091 A JP 50207091A JP H04505215 A JPH04505215 A JP H04505215A
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Japan
Prior art keywords
carrier frequency
mirror
layer
symmetrical
deflection
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JP50207091A
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Japanese (ja)
Inventor
コウル マッシアス
ネトゼル マリオ
Original Assignee
ジェノプティク カール ザイス ジェナ ゲゼルシャフト ミット ベシュレンクテル ハフツング
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Publication of JPH04505215A publication Critical patent/JPH04505215A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007Two or more frequencies or sources used for interferometric measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02017Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02018Multipass interferometers, e.g. double-pass
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Abstract

A symmetrical carrier frequency interferometer for measuring length, distance and speed comprises beam-deflecting and beam-splitting elements, a stationary reference mirror (8) and a movable measuring mirror (7). The optically active surfaces, which are arranged after a first polarizing layer (2), are disposed with their axes symmetrical about this layer (2). In one of the two optical paths, a lambda /2 plate (3) is located in front of a second polarizing layer inclined at 45 DEG , and a lambda /4 plate (6), the stationary reference mirror (8) and the movable measuring mirror (7) are located behind this layer in the direction of transmission. At least one reversing element (9, 10) is present in the direction of reflection.

Description

【発明の詳細な説明】 発明の名称 対称形搬送周波数干渉計 技術分野 本発明は長さ、距離および速度を測定するために種々の工業分野において利用す ることができる搬送周波数干渉計に関するものである1本発明の搬送周波数干渉 計はとくに、高い物体速度、例えば1回転および並進運動が超精密作動機械にお いて高い増加解像度に際して生じる場合に好都合に使用可能である。[Detailed description of the invention] Title of the invention: Symmetrical carrier frequency interferometer Technical field The present invention can be used in various industrial fields to measure length, distance and velocity. 1. Carrier frequency interferometer of the present invention, which is related to a carrier frequency interferometer capable of The meter is particularly suitable for applications where high object velocities, e.g. rotational and translational movements, occur in ultra-precise working machines. It can be advantageously used in cases where high resolution increases occur.

従来の技術 一流の測定装置製造業者は伝統的に非対称形の搬送周波数干渉計を利用している (S P T E第480巻第78頁乃至第83頁、1984年5月発行、米国 特許第4711547号明細賽、米国特許第4752133号明細$)、基準お よび測定チャンネルはここでは非対称に基づいて異なる温度依存であり、そのこ とはナノメータ測定装置に不適切である。基準ビームに対する測定ビームの対角 線ビーム出現は測定ミラーの運動通路の外部または上方への基準ミラーの配置を 許容しない、光源への復帰強度により、光源の安定性が損なわれる。1次ビーム の考え得る傾斜はさらに測定信号に影響をおよぼす測定および基準ビームのビー ム拡散を導く。Conventional technology Leading measurement equipment manufacturers traditionally utilize asymmetric carrier frequency interferometers. (SPT E Vol. 480, pp. 78-83, published May 1984, USA Patent No. 4,711,547, US Pat. No. 4,752,133), standards and The measurement and measurement channels here have different temperature dependence due to the asymmetry, which is inappropriate for nanometer measuring devices. Diagonal of measurement beam relative to reference beam Line beam appearance allows placement of the reference mirror outside or above the movement path of the measuring mirror. Unacceptable return intensity to the light source compromises the stability of the light source. primary beam The possible tilt of the measurement and reference beams further affects the measurement signal. lead to the spread of music.

発明の開示 本発明の目的は、簡単な手段により、距離、長さおよび速度を非常に精密に測定 することができる搬送周波数干渉計を提供することにある。Disclosure of invention The object of the invention is to measure distances, lengths and velocities with great precision by simple means. An object of the present invention is to provide a carrier frequency interferometer capable of performing a carrier frequency interferometer.

本発明はフィードバックのない温度不変の搬送周波数干渉計を開発することに基 礎を置いている。The invention is based on developing a temperature-invariant carrier frequency interferometer with no feedback. laying the foundation.

本発明によれば、この課題は、ビーム偏向部材およびビーム分割部材、ならびに 固定基準ミラーおよび可動聞定ミ?−を備えた対称形搬送周波数干渉計によって 解決され、該搬送周波数干渉計は第1偏向分割層に続いて配置させた光学的に有 効な面をミラ一対称に配置させ、第2の45°だけ傾斜さぜた偏向分割層の前方 の両ビーム通路の一方にλ/2のプレートを配置させ、他の部分ビーム通路にお ける対応する等しい位置に光学的レンズ通路の調整用プレートを備え、前記第2 の偏向分割層の後ろにその通過方向にλ/4のプレートと、固定基準ミラーと、 可動測定ミラーとを配置し、一方反射方向に少なくとも】つの逆転部材を備えた ことを特徴とするものである。According to the invention, this problem is solved by providing a beam deflection member and a beam splitting member; Fixed reference mirror and movable reference mirror? – by a symmetric carrier frequency interferometer with The carrier frequency interferometer includes an optically significant The front side of the deflection dividing layer whose effective surfaces are arranged mirror-symmetrically and tilted by a second angle of 45° A λ/2 plate is placed in one of both beam paths, and a plate of λ/2 is placed in the other partial beam path. a plate for adjusting the optical lens passage in a correspondingly equal position to a plate of λ/4 in its passing direction behind the deflection splitting layer and a fixed reference mirror; a movable measuring mirror, and at least ] reversing members in the direction of reflection. It is characterized by this.

好都合には、偏向分割層は薄い誘電性材料からなり、光学的レンズの調整用プレ ートは石英ガラスからなる6測定ミラーはビーム方向において1次元的に可動に 配置される。逆転部材としてトリプルプリズムを備えることができる。Conveniently, the polarization splitting layer is made of a thin dielectric material and is used as a tuning plate for the optical lens. The six measurement mirrors made of quartz glass are movable one-dimensionally in the beam direction. Placed. A triple prism can be provided as the reversing member.

この搬送周波数干渉計の特別な利点は本発明に基づいてその温度不変および光源 への光線の最小のフィードバックである。The special advantages of this carrier frequency interferometer according to the invention are its temperature invariance and light source. is the minimum feedback of the ray to.

発明を実施するための最良の形態 本発明の搬送周波数干渉計の好適な実施例は図面によれば、@】偏向分割層2を 有する偏向装w1と、偏向装置1の出口面に相次いで並置させたλ/2プレート およびプレート4と、光通路方向においてλ/4プレート6および可動測定ミラ ーのそばに固定基準ミラー8が続いて配置される第2偏向分割層を備えた偏向分 割立方体5と、および逆転部材として第1および第2トリプルプリズム9,10 とを備えている。偏向分割層は薄い誘電性材料からなり、プレート4は石英ガラ スからなる。?8!定ミラー7はビーム方向に直線的に移動配置されている。BEST MODE FOR CARRYING OUT THE INVENTION According to the drawings, a preferred embodiment of the carrier frequency interferometer of the present invention has a polarization splitting layer 2. and a λ/2 plate successively arranged on the exit surface of the deflection device 1. and plate 4 and a λ/4 plate 6 and a movable measuring mirror in the optical path direction. a deflection component with a second deflection splitting layer followed by a fixed reference mirror 8; A split cube 5, and first and second triple prisms 9, 10 as reversing members It is equipped with The deflection dividing layer is made of a thin dielectric material, and the plate 4 is made of quartz glass. Consists of ? 8! The fixed mirror 7 is arranged to move linearly in the beam direction.

すべての部材は固定基準ミラー8および可動測定ミラー7から見て、コンパクト な、堅固に接続されたユニットを具現する。All components are compact when viewed from the fixed reference mirror 8 and the movable measuring mirror 7. Realizes a solidly connected unit.

測定を実施するためにレーザが利用され、該レーザは異なる周波数の2つの垂直 に互いに偏向されたモードを放出する。偏向装置に発生する平行なレーザ光線は 偏向分割層2においてその成分A′およびA’ (その際A′は垂直にかつA′ は水平に直線的に偏向される)に分解され、それらは互いに平行なビーム通路と して本発明による搬送周波数干渉計を通過する3垂直に偏向された成分A′はλ /2プレート3を通過し、その際90″だけ回転され、偏向分割立方体5および λ/4プレート6を通過し、固定基準ミラー8において反射される。λ/4プレ ート6を再度通過した後にA′の偏向平面90°だけ回転され、それゆえ偏向立 方体5の分割層におし)て全体的に反射される7第1のトリプルプリズム9はビ ームを2倍のビーム直径のまわllに移動しかつそれを偏向分割立方体5の分割 層に戻す。ビームはかくして固定基準ミラー8により2度反射されモしてλ/4 プレート6の2回の通過により90°だけ回転され、その結果A′に習して偏向 分割立方体5は透過となる。λ/2プレート3はその元の偏向平面にA′を回転 させる。偏向装置1においてA′が反射されかつ再び入射ビームA (f t  f z)に対して横方向に平行に出る。A laser is utilized to perform the measurements, and the laser has two perpendicular beams of different frequencies. emits modes that are deflected from each other. The parallel laser beam generated by the deflection device is In the deflection dividing layer 2, its components A' and A' (A' is vertical and A' are linearly deflected horizontally), and they are separated into mutually parallel beam paths and The three vertically polarized components A' passing through the carrier frequency interferometer according to the invention are λ /2 plate 3, which is rotated by 90″, deflection dividing cube 5 and It passes through the λ/4 plate 6 and is reflected at the fixed reference mirror 8. λ/4 pre After passing again through port 6, the deflection plane of A' is rotated by 90° and therefore the deflection vertical The first triple prism 9, which is totally reflected by the dividing layer of the cube 5, is move the beam around twice the beam diameter and divide it into the deflection dividing cube 5. Return to layer. The beam is thus reflected twice by the fixed reference mirror 8 and is reflected at λ/4. The two passes of plate 6 rotate it by 90°, resulting in a deflection according to A'. The divided cube 5 becomes transparent. λ/2 plate 3 rotates A' to its original deflection plane let In the deflection device 1, A' is reflected and the incident beam A (f t It exits laterally parallel to f z).

水平偏向成分A′に関してほぼ類似のビーム通路が対称構造を基礎にして生じる 。単にλ/2の代わりに、プレート4がガラス通路をA′およびA′に関して同 様に保持するようにビーム通路に存在する。可動測定ミラー7での反射は変位に よるドツプラー周波数を有するビーム成分A′の周波数f2 に作用する。偏向 分割層2においてA′およびA′は重ねられかつ搬送周波数干渉計を同一直線上 でかつ互いに垂直に偏向されて出る。その場合に出射ビームは周波数f工および f2 ±Δf2 を有する。例えば、アバランシェダイオードによるドツプラー 周波数の評価のために偏向方向は45@回転された偏向子により重ねられる。Approximately similar beam paths with respect to the horizontal deflection component A' result on the basis of the symmetrical structure. . Instead of just λ/2, plate 4 makes the glass passages the same with respect to A' and A'. It is located in the beam path to hold it in place. Reflection from movable measurement mirror 7 results in displacement It acts on the frequency f2 of the beam component A' having a Doppler frequency of . deflection In splitting layer 2, A' and A' are superimposed and the carrier frequency interferometer is aligned on the same line. and are deflected perpendicularly to each other. In that case, the output beam has a frequency f and f2 ±Δf2. For example, Doppler with avalanche diode For frequency evaluation the deflection direction is superimposed by a 45@ rotated deflector.

変化する間隔(可動測定ミラー7の変位による)の4回の通過によりλ/4の解 像度が達成される。この提案の対応する展開および偏向に際してλ/8ないしλ /16の実際の光学的解像度が達成される。Four passes of varying spacing (depending on the displacement of the movable measuring mirror 7) result in a solution of λ/4. image resolution is achieved. In corresponding developments and deviations of this proposal, λ/8 to λ A practical optical resolution of /16 is achieved.

要 約 ビーム偏向部材およびビーム分割部材と、固定基準ミラー(8)および可動測定 ミラー(7)とを備えた長さ。summary Beam deflection element and beam splitting element, fixed reference mirror (8) and movable measurement length with mirror (7).

距離および速度測定用の対称形搬送周波数干渉計。第1分極分割層(2)に続い て配置させる光学的に有効な面をこの層(2)に対してミラ一対称に配置させる 。両ビーム通路の一方において45°だけ傾斜させた第2分極分割層の前方にλ /2のプレート(3)を配置させ1通過方向においてこの層の後ろにλ/4のプ レート(6)と、固定基準ミラー(8)と、可動測定ミラー(7)とを配置しで ある0反射方向において少なくとも1つの逆転部材(9,10)を備えたもので ある。Symmetric carrier frequency interferometer for distance and velocity measurements. Following the first polarization splitting layer (2) The optically effective surface to be arranged is mirror-symmetrically arranged with respect to this layer (2). . λ in front of the second polarization splitting layer tilted by 45° in one of both beam paths. /2 plate (3) is arranged and a λ/4 plate is placed behind this layer in the passing direction. A rate (6), a fixed reference mirror (8) and a movable measuring mirror (7) are arranged. It is equipped with at least one reversing member (9, 10) in a certain zero reflection direction. be.

図面の簡単な説明 図面は本発明による搬送周波数干渉形の好適な実施例を分解図で示す。Brief description of the drawing The drawing shows a preferred embodiment of a carrier frequency interferometer according to the invention in an exploded view.

A′はレーザ光線の垂直分極成分。A' is the vertical polarization component of the laser beam.

A′はレーザ光線の水平分極成分。A' is the horizontal polarization component of the laser beam.

f、は成分A′の周波数、 f2は成分A′の周波数、 Δf、はドツプラー効果による成分A′の周波数変化。f is the frequency of component A', f2 is the frequency of component A', Δf is the frequency change of component A' due to the Doppler effect.

A、(f、f、)は入射ビーム、 A (f、f、士Δf□)は出射ビームを示す。A, (f, f,) is the incident beam, A (f, f, Δf□) indicates the output beam.

ビーム入り口には。At the beam entrance.

1 偏向装置、 2 偏向分割層、 5 偏向分割立方体、 6 λ/4プレ・−ト。1 Deflection device, 2 Deflection dividing layer, 5 Deflection division cube, 6 λ/4 pre-t.

7 可動測定ミラー、 8 固定基準ミラー。7. Movable measurement mirror, 8 Fixed reference mirror.

9 第1トリプルプリズム、 10 第2トリプルプリズムが配置されている。9 First triple prism, 10 A second triple prism is arranged.

国際調査報告international search report

Claims (1)

【特許請求の範囲】 1)ビーム偏向部材およびビーム分割部材と、固定基準ミラー(8)および可動 測定ミラー(7)とを備えた対称形搬送周波数干渉計において、第1分極分割層 (2)に続いて配置させる光学的に有効な面をこの層(2)に対してミラー対称 に配置させ、45°だけ傾斜された第2分極分割層の前方の両ビーム通路の一方 にλ/2のプレート(3)を配置させ、他の部分ビーム通路における対応する等 しい位置に光学的レンズ通路の調整用のプレート(4)を設け、その通過方向に おける第2の分極分割層の後ろに可動測定ミラー(7)とを配置し、一方反射方 向に少なくとも1つの逆転部材を備えたことを特徴とする対称形搬送周波数干渉 計。 2)偏向分割層を薄い誘電性材料から形成したことを特徴とする特許請求の範囲 第1項に記載の対称形搬送周波数干渉計。 3)光学的レンズ通路の調整用プレート(4)を石英ガラスから形成したことを 特徴とする特許請求の範囲第1項または第2項に記載の対称形搬送周波数干渉計 。 4)測定ミラー(7)をビーム方向に直線的に移動可能に配置させたことを特徴 とする特許請求の範囲第1項ないし第3項のいずれか1項に記載の対称形搬送周 波数干渉計。 5)逆転部材としてトリプルプリズム(9,10)を設けたことを特徴とする特 許請求の範囲第1項ないし第4項のいずれか1項に記載の対称形搬送周波数干渉 計。[Claims] 1) Beam deflection member, beam splitting member, fixed reference mirror (8) and movable a first polarization splitting layer; The optically effective surface to be placed subsequent to (2) is mirror-symmetrical to this layer (2). one of the two beam paths in front of the second polarization splitting layer arranged at 45° and tilted by 45°. and the corresponding etc. in the other partial beam paths. A plate (4) for adjusting the optical lens passage is provided at the correct position, and A movable measuring mirror (7) is arranged behind the second polarization splitting layer in the Symmetrical carrier frequency interference characterized in that it comprises at least one reversing member in the direction Total. 2) Claims characterized in that the deflection dividing layer is formed from a thin dielectric material. Symmetrical carrier frequency interferometer according to paragraph 1. 3) The optical lens passage adjustment plate (4) is made of quartz glass. Symmetrical carrier frequency interferometer according to claim 1 or 2 characterized in . 4) Features that the measurement mirror (7) is arranged so that it can move linearly in the beam direction. A symmetrical conveying circumference according to any one of claims 1 to 3, Wavenumber interferometer. 5) A special feature characterized by providing a triple prism (9, 10) as a reversing member. Symmetrical carrier frequency interference according to any one of claims 1 to 4. Total.
JP50207091A 1989-12-28 1990-12-27 Symmetric carrier frequency interferometer Pending JPH04505215A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE01B/336626-2 1989-12-28
DD33662689A DD292696B5 (en) 1989-12-28 1989-12-28 Symmetric carrier frequency interferometer

Publications (1)

Publication Number Publication Date
JPH04505215A true JPH04505215A (en) 1992-09-10

Family

ID=5615550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50207091A Pending JPH04505215A (en) 1989-12-28 1990-12-27 Symmetric carrier frequency interferometer

Country Status (4)

Country Link
EP (1) EP0461233A1 (en)
JP (1) JPH04505215A (en)
DD (1) DD292696B5 (en)
WO (1) WO1991010109A1 (en)

Also Published As

Publication number Publication date
DD292696B5 (en) 1994-05-19
EP0461233A1 (en) 1991-12-18
WO1991010109A1 (en) 1991-07-11

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