JPH0447941B2 - - Google Patents
Info
- Publication number
- JPH0447941B2 JPH0447941B2 JP11827283A JP11827283A JPH0447941B2 JP H0447941 B2 JPH0447941 B2 JP H0447941B2 JP 11827283 A JP11827283 A JP 11827283A JP 11827283 A JP11827283 A JP 11827283A JP H0447941 B2 JPH0447941 B2 JP H0447941B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- conductive spring
- tube
- deflection
- image pickup
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000011521 glass Substances 0.000 claims description 17
- 239000012212 insulator Substances 0.000 claims description 4
- 238000003384 imaging method Methods 0.000 claims description 3
- 239000011324 bead Substances 0.000 description 5
- 229910052738 indium Inorganic materials 0.000 description 5
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/92—Means forming part of the tube for the purpose of providing electrical connection to it
Landscapes
- Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は撮像管に係わり、特に静電偏向形撮像
管の偏向電極への給電手段に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to an image pickup tube, and particularly to a means for feeding power to a deflection electrode of an electrostatic deflection type image pickup tube.
第１図は従来の静電偏向撮像管の一例を示す断
面構成図である。同図において、１は透光性ガラ
ス板などからなるフエースプレート、１Ａはガラ
ス外管、２はフエースプレート１の背面に形成さ
れた透明導電膜、３は透明膜２上に形成された光
導電膜、４は光導電膜３に対抗配置されたメツシ
ユ電極、５ａは透明導電膜２の外周膜の一部に接
続されて信号電流を外部に導出させかつフエース
プレート１とガラス外管１Ａとを接着させるイン
ジウム金属、5bはメツシユ電極４をガラス外管
１Ａの開口部に支持固定させかつ所定の電圧を給
電させるインジウム金属、６は透明導電膜２側の
インジウム金属５ａの外周面に被覆されたリング
状の信号取り出し電極、７はメツシユ電極４側の
インジウム金属５の外周面に被覆されたメツシユ
電圧供給リング、８はガラス外管１Ａの内壁面に
被着形成された電子ビームの偏向電極であり、こ
の偏向電極８は第２図に示すように電子ビームを
Ｘ軸、Ｙ軸方向に偏向するＸ軸偏向電極８ＸとＹ
軸偏向電極８Ｙとから構成されている。９は図示
しないカソードから放射された電子を制御する
G1電極、１０は制御された電子を集束するG2電
極、１１はG1電極９、G3電極１０を形成する電
極サポート、１２は前記Ｘ軸偏向電極８Ｘ、Ｙ軸
偏向電極８Ｙに所定の電圧を給電する導電スプリ
ング、１３はG1電極９と導電スプリング１２と
の間に介在されかつ導電スプリング１２を偏向電
極８へ押圧させる導電スプリングサポートセラミ
ツク、１４はステムリードである。
FIG. 1 is a cross-sectional configuration diagram showing an example of a conventional electrostatic deflection image pickup tube. In the figure, 1 is a face plate made of a translucent glass plate, 1A is a glass outer tube, 2 is a transparent conductive film formed on the back of the face plate 1, and 3 is a photoconductive film formed on the transparent film 2. A membrane 4 is a mesh electrode disposed opposite to the photoconductive film 3, and 5a is connected to a part of the outer peripheral film of the transparent conductive film 2 to lead out a signal current to the outside and connect the face plate 1 and the glass outer tube 1A. Indium metal to be bonded, 5b is an indium metal that supports and fixes the mesh electrode 4 to the opening of the glass outer tube 1A and supplies a predetermined voltage, and 6 is an indium metal that is coated on the outer peripheral surface of the indium metal 5a on the side of the transparent conductive film 2. A ring-shaped signal extraction electrode, 7 a mesh voltage supply ring coated on the outer peripheral surface of the indium metal 5 on the side of the mesh electrode 4, and 8 an electron beam deflection electrode formed on the inner wall surface of the glass outer tube 1A. As shown in FIG. 2, this deflection electrode 8 has an
It is composed of an axial deflection electrode 8Y. 9 controls electrons emitted from a cathode (not shown)
G1 electrode, 10 is a G2 electrode that focuses controlled electrons, 11 is an electrode support forming the G1 electrode 9 and G3 electrode 10, and 12 is predetermined for the X-axis deflection electrode 8X and Y-axis deflection electrode 8Y. 13 is a conductive spring support ceramic interposed between the G1 electrode 9 and the conductive spring 12 and presses the conductive spring 12 toward the deflection electrode 8; 14 is a stem lead.
このように構成された撮像管において、G1電
極９、G2電極１０から射出された電子は、ステ
ムリード１４に印加された偏向電圧信号を導電ス
プリング１２を介して偏向電極８に給電された電
圧によりＸ軸、Ｙ軸方向に偏向され、ラスターが
形成される。そして、光導電膜３に映し出された
画像を撮像信号として信号取り出し電極６より外
部へ取り出される。 In the image pickup tube configured in this manner, electrons emitted from the G 1 electrode 9 and the G 2 electrode 10 are supplied with a deflection voltage signal applied to the stem lead 14 via the conductive spring 12 to the deflection electrode 8. It is deflected in the X-axis and Y-axis directions by voltage to form a raster. The image projected on the photoconductive film 3 is then taken out to the outside from the signal extraction electrode 6 as an imaging signal.
この場合、導電スプリング１２と偏向電極８と
の電気的接触は、極めて重要な役割を果してお
り、仮にこの電気的接触が不完全となると、雑音
の発生および感度不良の発生原因となる。したが
つて、導電スプリング１２はステムリード１４と
は充分に固定されて弾性効果を十分に発揮するこ
とが必要となる。 In this case, the electrical contact between the conductive spring 12 and the deflection electrode 8 plays an extremely important role, and if this electrical contact is incomplete, it will cause noise and poor sensitivity. Therefore, the conductive spring 12 needs to be sufficiently fixed to the stem lead 14 to fully exhibit its elastic effect.
しかしながら、前述した撮像管によると、第３
図ａ，ｂに要部拡大図で示すように導電スプリン
グ１２は絶縁物としての導電スプリングサポート
セラミツク１３を介してG1電極９に接触してい
ることおよび電極サポート１１が120度間隔で等
配して配設されているため、導電スプリング１２
を４個所で支えるには不適当であつた。 However, according to the above-mentioned image pickup tube, the third
As shown in enlarged views of main parts in Figures a and b, the conductive spring 12 is in contact with the G1 electrode 9 via the conductive spring support ceramic 13 as an insulator, and the electrode supports 11 are equally spaced at 120 degree intervals. Since the conductive spring 12
It was inappropriate to support it in four places.
したがつて本発明は、前述した従来の問題に鑑
みてなされたものであり、その目的とするところ
は、導電スプリングと偏向電極との電気的接触性
の信頼性を向上させた撮像管を提供することにあ
る。
Therefore, the present invention has been made in view of the above-mentioned conventional problems, and an object thereof is to provide an image pickup tube with improved reliability of electrical contact between a conductive spring and a deflection electrode. It's about doing.
円筒ガラス管内面に相対向する２組の偏向電極
を備えた撮像管において、複数の棒状絶縁体が円
筒ガラス管軸と直交する面内リング形状を形成す
るように前記棒状絶縁体の端部同志を接続し、こ
の接続部に、偏向電極に給電するための導電スプ
リングを保持するものである。
In an imaging tube equipped with two sets of deflection electrodes facing each other on the inner surface of a cylindrical glass tube, the ends of the plurality of rod-shaped insulators are arranged so that they form an in-plane ring shape perpendicular to the axis of the cylindrical glass tube. A conductive spring for supplying power to the deflection electrode is held at this connection.
次に図面を用いて本発明の実施例を詳細に説明
する。
Next, embodiments of the present invention will be described in detail using the drawings.
第４図ａ，ｂは本発明による撮像管の一例を示
す第３図ａ，ｂに相当する部分の要部拡大断面図
であり、前述の図と同記号は同一要素となるので
その説明は省略する。同図において、ガラス外管
１Ａ内の偏向電極８端子部には、管軸に対して直
角な面内にリング状に成形された導電スプリング
サポートビードガラス１５が配設されている。そ
して、この導電スプリングサポートビードガラス
１５の相対する２組の対向部位には、ステムリー
ド１４に一端を固定した４本の導電スプリング１
２が保持されてその接点部分が弾性力により偏向
電極８面上に接触されている。 FIGS. 4a and 4b are enlarged sectional views of essential parts of the portions corresponding to FIGS. 3a and 3b showing an example of the image pickup tube according to the present invention, and the same symbols as those in the previous drawings are the same elements, so the explanation thereof will be omitted. Omitted. In the same figure, a conductive spring support bead glass 15 formed in a ring shape in a plane perpendicular to the tube axis is disposed at the terminal portion of the deflection electrode 8 inside the glass outer tube 1A. Four conductive springs 1 each having one end fixed to the stem lead 14 are provided at two sets of opposing portions of the conductive spring support bead glass 15.
2 is held and its contact portion is brought into contact with the surface of the deflection electrode 8 by elastic force.
このような構成によれば、導電スプリング１２
は、管軸に対して直角な面内に導電スプリングサ
ポートビードガラス１５を保持する構成となるの
で、導電スプリング１２の接点は偏向電極８上に
均一な弾性力で安定性良く接触することができ
る。また、電子ビーム電流に影響を与えるG1電
極９に応力を全く与えない構成となるので、G1
電極９の動作が極めて安定となる。 According to such a configuration, the conductive spring 12
Since the conductive spring support bead glass 15 is held in a plane perpendicular to the tube axis, the contact point of the conductive spring 12 can stably contact the deflection electrode 8 with uniform elastic force. . In addition, since the configuration does not apply any stress to the G 1 electrode 9, which affects the electron beam current, the G 1
The operation of the electrode 9 becomes extremely stable.
また、この場合、この導電スプリングサポート
ビードガラス１５は、導電スプリング１２を固定
したステムリード１４のステム組立体に極めて容
易にかつ安定性良く装着でき、さらにガラス外管
１Ａ内に組合せた後でも導電スプリング１２を偏
向電極８側に均一の応力で押圧させ導電スプリン
グ１２上に安定して保持固定させることができ
る。 Further, in this case, the conductive spring support bead glass 15 can be attached extremely easily and stably to the stem assembly of the stem lead 14 to which the conductive spring 12 is fixed, and is also conductive even after being assembled inside the glass outer tube 1A. The spring 12 can be stably held and fixed on the conductive spring 12 by pressing the spring 12 against the deflection electrode 8 side with uniform stress.
以上説明したように本発明によれば、導電スプ
リングを偏向電極上に安定性良く接触固定するこ
とができるので、雑音発生および感度不良の発生
が全くない信頼性の高い撮像管が得られるという
極めて優れた効果を有する。
As explained above, according to the present invention, since the conductive spring can be stably fixed in contact with the deflection electrode, it is possible to obtain an extremely reliable image pickup tube that does not generate any noise or poor sensitivity. Has excellent effects.
第１図ないし第３図は従来の撮像管の一例を説
明するための図、第４図ａ，ｂは本発明による撮
像管の一例を示す要部拡大断面図である。
１Ａ……ガラス外管、８……偏向電極、８Ｘ…
…Ｘ軸偏向電極、８Ｙ……Ｙ軸偏向電極、９……
G1電極、１０……G2電極、１１……電極サポー
ト、１２……導電スプリング、１４……ステムリ
ード、１５……導電スプリングサポートビードガ
ラス。
1 to 3 are views for explaining an example of a conventional image pickup tube, and FIGS. 4a and 4b are enlarged sectional views of essential parts showing an example of an image pickup tube according to the present invention. 1A...Glass outer tube, 8...Deflection electrode, 8X...
...X-axis deflection electrode, 8Y...Y-axis deflection electrode, 9...
G 1 electrode, 10...G 2 electrode, 11...electrode support, 12...conductive spring, 14...stem lead, 15...conductive spring support bead glass.
Claims (1)
極を備えた撮像管において、複数の棒状絶縁体が
円筒ガラス管軸と直交する面内リング形状を形成
するように前記棒状絶縁体の端部同志を接続し、
この接続部に、偏向電極に給電するための導電ス
プリングを保持することを特徴とする撮像管。1. In an imaging tube equipped with two sets of deflection electrodes facing each other on the inner surface of a cylindrical glass tube, the ends of the rod-shaped insulators are arranged so that the plurality of rod-shaped insulators form an in-plane ring shape perpendicular to the axis of the cylindrical glass tube. connect comrades,
An image pickup tube characterized in that this connection portion holds a conductive spring for supplying power to the deflection electrode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11827283A JPS6012651A (en) | 1983-07-01 | 1983-07-01 | Image pickup tube |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11827283A JPS6012651A (en) | 1983-07-01 | 1983-07-01 | Image pickup tube |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6012651A JPS6012651A (en) | 1985-01-23 |
| JPH0447941B2 true JPH0447941B2 (en) | 1992-08-05 |
Family
ID=14732534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11827283A Granted JPS6012651A (en) | 1983-07-01 | 1983-07-01 | Image pickup tube |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6012651A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0652582A1 (en) * | 1993-11-04 | 1995-05-10 | ORION ELECTRIC Co., Ltd. | Cathode-ray tube having ARC supressing means therein |
-
1983
- 1983-07-01 JP JP11827283A patent/JPS6012651A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6012651A (en) | 1985-01-23 |
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