JPH0447542A - Manufacture of optical master disk - Google Patents
Manufacture of optical master diskInfo
- Publication number
- JPH0447542A JPH0447542A JP15786590A JP15786590A JPH0447542A JP H0447542 A JPH0447542 A JP H0447542A JP 15786590 A JP15786590 A JP 15786590A JP 15786590 A JP15786590 A JP 15786590A JP H0447542 A JPH0447542 A JP H0447542A
- Authority
- JP
- Japan
- Prior art keywords
- light intensity
- sec
- seconds
- development time
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 230000003287 optical effect Effects 0.000 title claims description 9
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims abstract description 6
- 229910052786 argon Inorganic materials 0.000 claims abstract description 3
- 239000000463 material Substances 0.000 claims abstract 4
- 239000000758 substrate Substances 0.000 claims description 2
- 238000005530 etching Methods 0.000 abstract description 10
- 229920002120 photoresistant polymer Polymers 0.000 abstract description 8
- 238000000034 method Methods 0.000 description 11
- 238000007796 conventional method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000003513 alkali Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Manufacturing Optical Record Carriers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は光ディスク原盤、特にプリグループ光ディスク
用のレジスト原盤を製造する方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for manufacturing an optical disc master, particularly a resist master disc for a pregroup optical disc.
一般にビデオディスク等の再生専用の光ディスクはディ
スク表面に形成したピット部の組合わせによってデータ
の書込みが行われ、レーザビームを光ディスク表面に投
射してピント部からの反射光の有無を捉えて再生を行う
ようになっている。In general, data is written on playback-only optical discs such as video discs using a combination of pits formed on the disc surface, and a laser beam is projected onto the optical disc surface and the presence or absence of reflected light from the focused area is detected to perform playback. It is supposed to be done.
このような光ディスクの製造では、所謂スタンバと称さ
れる原盤を製作し、この原盤を主型として大量生産され
ている。In manufacturing such optical discs, a master disc called a so-called standber is manufactured, and mass production is performed using this master disc as a main mold.
ところでこのような原盤の製造は通常ガラス板上にフォ
トレジストを塗布してフォトレジスト層を形成し、レー
ザビームを用いて露光した後、現像してバターニングし
、レジスト原盤を製作し、その後このレジスト原盤に金
属材料を充填して金属製の原盤を製作する。上述した如
き原盤の製作過程中、レジスト原盤におけるプリグルー
プ部の形状は所定の幅寸法と深さ寸法を有する断面矩形
形成するのが望ましいが、この形状はレーザ露光時のレ
ーザビームプロファイル、光強度、フォトレジストの種
類、現像液の種類及び現像時間等の関数として決まる。By the way, the production of such master discs is usually done by coating a glass plate with photoresist to form a photoresist layer, exposing it to a laser beam, developing it and buttering it to produce a resist master disc. A metal master is manufactured by filling a resist master with a metal material. During the manufacturing process of the master as described above, it is desirable that the shape of the pre-group part in the resist master is formed into a rectangular cross-section with predetermined width and depth dimensions, but this shape depends on the laser beam profile and light intensity during laser exposure. , is determined as a function of the type of photoresist, type of developer, development time, etc.
例えば現像は露光部と未露光部に対するフォトレジスト
のエツチング速度差を利用しており、露光量を多くする
とエツチング速度は早くなる。従って一定量のエツチン
グを行う場合、光強度を弱くすると現像に長い時間を要
し、露光部と未露光部とにおけるエツチング速度差が小
さくなり、未露光部に対するエツチング速度が相対的に
大きくなり、結果としてプリグループ部幅が深さに対し
て相対的に広くなる。For example, development utilizes the difference in etching speed of photoresist between exposed and unexposed areas, and the etching speed increases as the exposure amount increases. Therefore, when etching a certain amount, if the light intensity is lowered, it will take a longer time to develop, and the difference in etching speed between the exposed and unexposed areas will become smaller, and the etching speed for the unexposed areas will become relatively higher. As a result, the width of the pre-group portion becomes wider relative to the depth.
ところで従来にあってはこのようなプリグループ部の形
状制御は溝幅を拡げるための現像液である有機アルカリ
液、溝深さのみを深める現像液である無機アルカリ液を
使い分けて20℃程度で60秒前後で現像を行っている
(特開昭59−229754号)。By the way, conventionally, the shape control of the pre-group part was carried out at around 20°C by using an organic alkaline developer, which is a developer to widen the groove width, and an inorganic alkaline developer, which is a developer to deepen only the groove depth. Development is performed for about 60 seconds (Japanese Patent Application Laid-Open No. 59-229754).
しかしこのような従来方法では、現像時間が長いために
未露光部に対するエツチングの進行が激しく、グループ
の溝幅を狭くするのが難しく、第4図に示す如く断面形
状が矩形にならないという問題があった。However, with this conventional method, due to the long development time, etching progresses rapidly in the unexposed areas, making it difficult to narrow the groove width of the group, resulting in the problem that the cross-sectional shape does not become rectangular as shown in Figure 4. there were.
第5図(a)は光強度(1)と現像時間との関係を示す
グラフであり、横軸に光強度(I)を、また縦軸に現像
時間(1)をとって示しである。このグラフから明らか
な如く光強度が大きくなるに従って現像時間は短縮され
ることが解る。FIG. 5(a) is a graph showing the relationship between light intensity (1) and development time, with light intensity (I) plotted on the horizontal axis and development time (1) plotted on the vertical axis. As is clear from this graph, as the light intensity increases, the development time decreases.
第5図(blは現像時間(1)とプリグループ部幅との
関係を示すグラフであり、横軸に現像時間(1)を、ま
た縦軸にプリグループ部幅(W)をとって示しである。Figure 5 (bl is a graph showing the relationship between development time (1) and pre-group width; the horizontal axis represents development time (1), and the vertical axis represents pre-group width (W). It is.
このグラフから明らかな如く現像時間が長くなるに従っ
てプリグループ部幅が広くなることが解る。As is clear from this graph, as the development time becomes longer, the width of the pregroup portion becomes wider.
この対策として対物レンズのNAを大きく、またレーザ
ビーム径を小さくして露光を行う方法が採用されている
が、この方法では焦点深度が浅くなり、歩留り低下の要
因となるという問題があった。As a countermeasure to this problem, a method has been adopted in which exposure is performed by increasing the NA of the objective lens and decreasing the diameter of the laser beam, but this method has a problem in that the depth of focus becomes shallow, which causes a decrease in yield.
本発明はかかる事情に鑑みなされたものであって、その
目的とするところは、露光に際しての光強度を適正に保
持し、また現像時間を短縮して未露光部へのエツチング
の影響を低減し断面矩形状のプリグループ部が得られる
ようにした光ディスク原盤の製造方法を提供するにある
。The present invention was developed in view of the above circumstances, and its purpose is to maintain appropriate light intensity during exposure, shorten development time, and reduce the effect of etching on unexposed areas. It is an object of the present invention to provide a method for manufacturing an optical disc master in which a pregroup portion having a rectangular cross section can be obtained.
本発明に係る光ディスク原盤の製造方法は、プリグルー
プ部形成時のレーザビームによる露光時の光強度■を3
.8X線速度(m/秒)≧■≧2.3×線速度(m/秒
)の範囲とし、また現像時間を10秒以下とする。In the method for manufacturing an optical disc master according to the present invention, the light intensity (■) during exposure by a laser beam when forming a pre-group portion is set to 3.
.. 8 X-ray velocity (m/sec)≧■≧2.3×linear velocity (m/sec), and the development time is 10 seconds or less.
本発明にあってはこれによって、対物レンズのNAを大
きくすることな(未露光部に対するエツチングの進行を
抑制し得ることとなる。In the present invention, this makes it possible to suppress the progress of etching on the unexposed area without increasing the NA of the objective lens.
以下本発明をその実施例を示す図面に基づき具体的に説
明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below based on drawings showing embodiments thereof.
第1図は本発明方法の主要製造過程を示す模式図であり
、ガラス製の基板1上にフォトレジスト層2を所要厚さ
に積層形成し、対物レンズのNA(開口率)を0.6以
下としたアルゴンレーザ発振器を備えた露光装置によっ
て、所定光強度■のレーザビームをフォトレジスト2の
表面に投射する。FIG. 1 is a schematic diagram showing the main manufacturing process of the method of the present invention, in which a photoresist layer 2 is laminated to a required thickness on a glass substrate 1, and the NA (aperture ratio) of the objective lens is set to 0.6. A laser beam with a predetermined light intensity (2) is projected onto the surface of the photoresist 2 by an exposure apparatus equipped with an argon laser oscillator as described below.
このときの光強度■は下記の条件を満足するように設定
する。The light intensity (■) at this time is set so as to satisfy the following conditions.
3.8X線速度(m/秒)≧I≧2.3X線速度(m/
秒)次にアルカリ性の現像液を22℃程度にて10秒以
下噴射し、現像を行い、プリグループ部のための溝3を
形成する。3.8X-ray velocity (m/sec)≧I≧2.3X-ray velocity (m/sec)
(Second) Next, an alkaline developer is sprayed at about 22° C. for 10 seconds or less to perform development and form grooves 3 for the pregroup portions.
現像液としては有機アルカリ (テトラメチルアンモニ
ウム、ハイドロオキサイド、0.265N)無機アルカ
リ (NaOtl、 KOH,0,232N)のいずれ
を用いてもよい。As the developer, either an organic alkali (tetramethylammonium, hydroxide, 0.265N) or an inorganic alkali (NaOtl, KOH, 0.232N) may be used.
第2図(a)はエネルギ密度と現像時間との関係を示す
グラフであり、横軸にエネルギ密度(露光量(mW)
/線速度(m/秒))を、また縦軸に現像時間(秒)を
とって示しである。また第2図(′b)はプリグループ
部幅と現像時間との関係を示すグラフであり、横軸にプ
リグループ部幅(nm)を、また縦軸に現像時間(秒)
をとって示しである。Figure 2 (a) is a graph showing the relationship between energy density and development time, where the horizontal axis shows energy density (exposure amount (mW)).
/linear velocity (m/sec)), and the vertical axis represents development time (sec). FIG. 2('b) is a graph showing the relationship between pre-group width and development time, with the horizontal axis representing the pre-group width (nm) and the vertical axis representing the development time (seconds).
This is an indication.
このグラフから明らかなようにエネルギ密度が2、・3
〜3.8であって現像時間10秒以下にて所望のプリグ
ループ部幅580〜600nmを得られることが解る。As is clear from this graph, the energy density is 2, 3
It can be seen that the desired pregroup width of 580 to 600 nm can be obtained with a development time of 10 seconds or less.
第3図は本発明方法によった場合のプリグループ部の断
面形状を示す模式図であり、図中実線は本発明方法に依
った場合を、また破線は従来方法に依った場合を夫々示
している。FIG. 3 is a schematic diagram showing the cross-sectional shape of the pre-group part when the method of the present invention is used. In the figure, the solid line shows the case where the method of the present invention is used, and the broken line shows the case where the conventional method is used. ing.
第3,4図を比較すれば明らかなように、従来方法に依
った場合に比較して本発明方法に依った場合には幅寸法
に対する深さ寸法の比が大幅に向上していることが解る
。As is clear from a comparison of Figures 3 and 4, the ratio of depth to width is significantly improved when the method of the present invention is used compared to when the conventional method is used. I understand.
以上の如く本発明方法にあっては対物レンズの開口率を
小さくして露光を行うことが出来て、対物焦点深度を深
く設定することが可能となり、原盤作成の歩留りを大幅
に向上させ得る等本発明は優れた効果を奏するものであ
る。As described above, in the method of the present invention, it is possible to perform exposure with a small aperture ratio of the objective lens, and it is possible to set the objective depth of focus deep, which can greatly improve the yield of master production. The present invention has excellent effects.
第1図は本発明方法の主要工程を示す説明図、第2図は
エネルギ密度と現像時間との関係及びプリグループ部幅
と現像時間との関係を示すグラフ、第3図は本発明方法
により得た現像後のプリグループ部の断面図、第4図は
従来方法により得た現像後のプリグループ部の断面図、
第5図(alは光強度と現像時間との一般的な関係を示
すグラフ、第5図(blは現像時間とプリグループ部幅
との一般的な関係を示すグラフである。
1・・・ガラス板
2・・・フォトレジスト層
3・・・溝
なお、
図中、
同一符号は同一、
又は相当部分を
す。Fig. 1 is an explanatory diagram showing the main steps of the method of the present invention, Fig. 2 is a graph showing the relationship between energy density and development time, and the relationship between pregroup part width and development time, and Fig. 3 is a graph showing the relationship between energy density and development time. FIG. 4 is a cross-sectional view of the pre-group portion after development obtained by the conventional method;
Figure 5 (al is a graph showing the general relationship between light intensity and development time, Figure 5 (bl is a graph showing the general relationship between development time and pregroup width). 1... Glass plate 2...Photoresist layer 3...Groove In the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
ンレーザを用いて光強度Iを、3.8×線速度(m/秒
)≧I≧2.3×線速度(m/秒)の範囲に設定して露
光する工程と、前記感光材料層を22℃の現像液を用い
て10秒以下で現像する工程とを含むことを特徴とする
光ディスク原盤の製造方法。(1) For the photosensitive material layer laminated on the substrate, use an argon laser to set the light intensity I to 3.8 x linear velocity (m/sec) ≧ I ≧ 2.3 x linear velocity (m/sec) A method for producing an optical disc master, comprising: exposing the light-sensitive material layer to a temperature within the range of 22° C.; and developing the photosensitive material layer using a developer at 22° C. for 10 seconds or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15786590A JPH0447542A (en) | 1990-06-15 | 1990-06-15 | Manufacture of optical master disk |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15786590A JPH0447542A (en) | 1990-06-15 | 1990-06-15 | Manufacture of optical master disk |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0447542A true JPH0447542A (en) | 1992-02-17 |
Family
ID=15659088
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15786590A Pending JPH0447542A (en) | 1990-06-15 | 1990-06-15 | Manufacture of optical master disk |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0447542A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0890945A1 (en) * | 1997-07-11 | 1999-01-13 | Sony Corporation | Exposure recording method for optical recording materials |
-
1990
- 1990-06-15 JP JP15786590A patent/JPH0447542A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0890945A1 (en) * | 1997-07-11 | 1999-01-13 | Sony Corporation | Exposure recording method for optical recording materials |
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