JPH0444942B2 - - Google Patents

Info

Publication number
JPH0444942B2
JPH0444942B2 JP8887884A JP8887884A JPH0444942B2 JP H0444942 B2 JPH0444942 B2 JP H0444942B2 JP 8887884 A JP8887884 A JP 8887884A JP 8887884 A JP8887884 A JP 8887884A JP H0444942 B2 JPH0444942 B2 JP H0444942B2
Authority
JP
Japan
Prior art keywords
sample
measured
optical system
absorption axis
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8887884A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60231106A (ja
Inventor
Akio Tsumura
Suguru Yamamoto
Noriharu Myaake
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP8887884A priority Critical patent/JPS60231106A/ja
Priority to US06/687,403 priority patent/US4684256A/en
Priority to DE19843447878 priority patent/DE3447878A1/de
Publication of JPS60231106A publication Critical patent/JPS60231106A/ja
Publication of JPH0444942B2 publication Critical patent/JPH0444942B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP8887884A 1983-12-30 1984-05-01 吸収軸ズレ測定装置 Granted JPS60231106A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP8887884A JPS60231106A (ja) 1984-05-01 1984-05-01 吸収軸ズレ測定装置
US06/687,403 US4684256A (en) 1983-12-30 1984-12-28 Apparatus and method for continuously measuring polarizing property
DE19843447878 DE3447878A1 (de) 1983-12-30 1984-12-31 Vorrichtung und verfahren zum fortlaufenden messen der polarisierungseigenschaft

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8887884A JPS60231106A (ja) 1984-05-01 1984-05-01 吸収軸ズレ測定装置

Publications (2)

Publication Number Publication Date
JPS60231106A JPS60231106A (ja) 1985-11-16
JPH0444942B2 true JPH0444942B2 (enExample) 1992-07-23

Family

ID=13955256

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8887884A Granted JPS60231106A (ja) 1983-12-30 1984-05-01 吸収軸ズレ測定装置

Country Status (1)

Country Link
JP (1) JPS60231106A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180283952A1 (en) * 2015-10-08 2018-10-04 Sharp Kabushiki Kaisha Polarizing axis detection device, polarizing axis detection method, display device producing method, and display device produced thereby

Also Published As

Publication number Publication date
JPS60231106A (ja) 1985-11-16

Similar Documents

Publication Publication Date Title
GB1419738A (en) Ellipsometer
JPH0478137B2 (enExample)
US4513512A (en) Angle-measuring instrument having an indicator for the degree of angle
KR100351267B1 (ko) 복합층의리터데이션측정방법및장치
JPH0444942B2 (enExample)
KR100258172B1 (ko) 복굴절 부재 셀 갭 측정 방법 및 장치
US3016789A (en) Polarimetric apparatus
CN100381877C (zh) 检出对象的参数检出方法以及检出装置
US3342099A (en) Scattered light spectrophotometer
JPH08201277A (ja) 複屈折測定方法及び装置
EP0393591B1 (en) Method and apparatus for determining refractive index distribution
US2986066A (en) Polarimetric apparatus
US2754719A (en) Methods and apparatus for determining displacement between curves
US7511815B2 (en) Device and method for measuring optical parameters of liquid crystal display
JPH0148977B2 (enExample)
JP3411433B2 (ja) 液晶セルのプレティルト角測定装置
JPH0127380B2 (enExample)
CN108955579B (zh) 一种高精度光学膜吸收轴测量装置
KR0158045B1 (ko) 액정 셀의 갭 및 트위스트각을 측정하기 위한 방법 및 장치
JPH04329339A (ja) 複屈折測定装置
JPH01193604A (ja) フイルム状物体の厚み測定装置
JPS60143745A (ja) 光軸方向連続測定装置
JPH0444941B2 (enExample)
JPH02118406A (ja) 液晶セルギャップ測定装置
Love et al. The application of Edser-Butler fringes to the measurement of the spatial optical structure of liquid crystal prisms and the determination of dispersion characteristics and thickness