JPH0444200U - - Google Patents

Info

Publication number
JPH0444200U
JPH0444200U JP8693790U JP8693790U JPH0444200U JP H0444200 U JPH0444200 U JP H0444200U JP 8693790 U JP8693790 U JP 8693790U JP 8693790 U JP8693790 U JP 8693790U JP H0444200 U JPH0444200 U JP H0444200U
Authority
JP
Japan
Prior art keywords
probe
contact
attached
boards
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8693790U
Other languages
English (en)
Japanese (ja)
Other versions
JP2505822Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8693790U priority Critical patent/JP2505822Y2/ja
Publication of JPH0444200U publication Critical patent/JPH0444200U/ja
Application granted granted Critical
Publication of JP2505822Y2 publication Critical patent/JP2505822Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Combinations Of Printed Boards (AREA)
JP8693790U 1990-08-20 1990-08-20 回路検査装置 Expired - Lifetime JP2505822Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8693790U JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8693790U JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Publications (2)

Publication Number Publication Date
JPH0444200U true JPH0444200U (US08197722-20120612-C00093.png) 1992-04-15
JP2505822Y2 JP2505822Y2 (ja) 1996-08-07

Family

ID=31818882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8693790U Expired - Lifetime JP2505822Y2 (ja) 1990-08-20 1990-08-20 回路検査装置

Country Status (1)

Country Link
JP (1) JP2505822Y2 (US08197722-20120612-C00093.png)

Also Published As

Publication number Publication date
JP2505822Y2 (ja) 1996-08-07

Similar Documents

Publication Publication Date Title
JPH0444200U (US08197722-20120612-C00093.png)
JPS63181969U (US08197722-20120612-C00093.png)
JPH0174576U (US08197722-20120612-C00093.png)
JPH0259476U (US08197722-20120612-C00093.png)
JPS6117678U (ja) 試験器
JPH0342576U (US08197722-20120612-C00093.png)
JPS6234383U (US08197722-20120612-C00093.png)
JPS61187478U (US08197722-20120612-C00093.png)
JPS62176767U (US08197722-20120612-C00093.png)
JPS63139567U (US08197722-20120612-C00093.png)
JPS62163764U (US08197722-20120612-C00093.png)
JPS62108870U (US08197722-20120612-C00093.png)
JPH0239179U (US08197722-20120612-C00093.png)
JPS62168480U (US08197722-20120612-C00093.png)
JPS5868036U (ja) 半導体集積回路測定装置
JPH01134270U (US08197722-20120612-C00093.png)
JPS63109674U (US08197722-20120612-C00093.png)
JPH02729U (US08197722-20120612-C00093.png)
JPS63170778U (US08197722-20120612-C00093.png)
JPH0181583U (US08197722-20120612-C00093.png)
JPS5927467U (ja) 測定用接触ピン
JPS62176766U (US08197722-20120612-C00093.png)
JPH0332440U (US08197722-20120612-C00093.png)
JPS59122567U (ja) 電子回路検査装置
JPH0178963U (US08197722-20120612-C00093.png)