JPH0444101A - Auto-slice device - Google Patents

Auto-slice device

Info

Publication number
JPH0444101A
JPH0444101A JP2152216A JP15221690A JPH0444101A JP H0444101 A JPH0444101 A JP H0444101A JP 2152216 A JP2152216 A JP 2152216A JP 15221690 A JP15221690 A JP 15221690A JP H0444101 A JPH0444101 A JP H0444101A
Authority
JP
Japan
Prior art keywords
voltage
amplification
level
output
output voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2152216A
Other languages
Japanese (ja)
Inventor
Takahiko Ito
貴彦 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2152216A priority Critical patent/JPH0444101A/en
Publication of JPH0444101A publication Critical patent/JPH0444101A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Feedback Control In General (AREA)

Abstract

PURPOSE:To automatically set a proper slice level by defining the amplification factor of an amplifier means and the output voltage of a voltage generating means as the amplification level and the slice level of each signal respectively when the output voltage of the amplifier means exceeds the output voltage of the voltage generating means. CONSTITUTION:The voltage Vh obtained by amplifying the signal output by an amplifier means 11 is inputted to a comparison means 13 together with the output voltage Vs of a voltage generating means 12. The means 13 compares the levels of the Vh and Vs with each other and informs a control means 14 of the result of this comparison. The means 14 sends the control signals to both means 11 and 12 to increase the Vh and to reduce the Vs respectively when the Vh is smaller than the Vs. Then the means 14 discontinues the transmission of the control signals when the Vh exceeds the Vs. At this time point, both the Vh and the Vs are fixed. Therefore the Vs is automatically set at a level slightly lower than the Vh. As a result, a proper slice level is automatically set.

Description

【発明の詳細な説明】 〔概 要〕 信号の増幅レベルおよびスライスレベルの設定を行うオ
ートスライス装置に関し、 適正なスライスレベルを自動的に設定することを目的と
し、 信号の増幅を行う増幅手段と、所定の電圧を発生させる
電圧発生手段と、該増幅手段および該電圧発生手段の出
力電圧の大小を比較する比較手段と、該比較手段の比較
結果に基づいて該増幅手段の出力電圧および該電圧発生
手段の出力電圧を変化させる制御手段を有し、該増幅手
段の出力電圧が該電圧発生手段の出力電圧より大きくな
ったときの該増幅手段の増幅率および該電圧発生手段の
出力電圧を各々該信号の増幅レベルおよびスライスレベ
ルとするように構成する。
[Detailed Description of the Invention] [Summary] Regarding an auto-slice device that sets the amplification level and slice level of a signal, the purpose of this invention is to automatically set an appropriate slice level, and the present invention provides an amplification means for amplifying the signal; , a voltage generation means for generating a predetermined voltage, a comparison means for comparing the output voltages of the amplification means and the voltage generation means, and an output voltage of the amplification means and the voltage based on the comparison result of the comparison means. control means for changing the output voltage of the generation means, and the amplification factor of the amplification means and the output voltage of the voltage generation means respectively when the output voltage of the amplification means becomes larger than the output voltage of the voltage generation means; The signal is configured to have an amplification level and a slice level.

〔産業上の利用分野〕[Industrial application field]

本発明は信号の増幅レベルおよびスライスレベルの設定
を行うオートスライス装置に関する。
The present invention relates to an autoslicing device that sets the amplification level and slicing level of a signal.

自動預金支払機やファクシミリ装置では通帳や原稿の位
置を検出するために、従来から光センサが用いられてい
る。光センサは発光素子と受光素子を対向して配置した
ものから成り、発光素子から照射された光を受光素子で
検出し、その出力が発光素子と受光素子間の物体の有無
によって変化することを利用するものである。物体の有
無は、あらかじめ設定されたスライスレベルと受光素子
の出力の大小を検出することによって判断される。
Optical sensors have conventionally been used in automatic teller machines and facsimile machines to detect the position of bankbooks and documents. An optical sensor consists of a light-emitting element and a light-receiving element arranged opposite each other, and the light emitted from the light-emitting element is detected by the light-receiving element, and the output changes depending on the presence or absence of an object between the light-emitting element and the light-receiving element. It is something to be used. The presence or absence of an object is determined by detecting a preset slice level and the magnitude of the output of the light receiving element.

従って物体の検出精度を保持するためには、受光素子の
出力レベルおよびそのスライスレベルを適正に調整する
ことが要求される。
Therefore, in order to maintain object detection accuracy, it is required to appropriately adjust the output level of the light receiving element and its slice level.

〔従来の技術〕[Conventional technology]

第3図(a)、(b)は光センサを用いて物体の有無の
検出を行う方法を説明するための図であり、たとえば、
通帳や原稿の頁の検出、位置の検出に用いられる。
FIGS. 3(a) and 3(b) are diagrams for explaining a method of detecting the presence or absence of an object using an optical sensor, for example,
Used to detect pages and positions of bankbooks and manuscripts.

同図(a)に示したように、光センサはLEDIIIと
フォトトランジスタ112を対向して配置さセたものか
ら成り、LEDIIIの照射光はフォトトランジスタ1
12により受光され抵抗器122で信号電圧Vpに変換
される。そして比較部117において上記信号電圧Vp
と電圧源123によって発生させたスライス電圧Vsと
の大小を比較検出する。
As shown in FIG. 3(a), the optical sensor consists of an LED III and a phototransistor 112 arranged facing each other, and the light irradiated by the LED III is transmitted to the phototransistor 112.
The light is received by the resistor 122 and converted into a signal voltage Vp by the resistor 122. Then, in the comparator 117, the signal voltage Vp
and the slice voltage Vs generated by the voltage source 123 are compared and detected.

L E Dlll とフォトトランジスタ112の間に
原稿121が挿入されていない場合にはLEDlllの
照射光の大部分はフォトトランジスタ112に入射し信
号電圧Vpは最大値をとるが、原稿121が同図(a)
に示した方向に沿って移動しLEDIIIとフォトトラ
ンジスタ112の間に挿入されると、LEDlllの照
射光は原稿121によって遮光されるため信号電圧Vp
は低下する。同図(b)に示したように従来は、電圧源
123を手動で調整することによってスライス電圧Vs
を信号電圧Vpの最大値より低い適当な値に設定し、比
較部117の出力を監視することによって原稿121の
有無を検出するようにしていた。
When the original 121 is not inserted between L E Dll and the phototransistor 112, most of the light irradiated by the LEDll enters the phototransistor 112, and the signal voltage Vp takes the maximum value. a)
When the LED III is moved along the direction shown in FIG.
decreases. As shown in FIG. 2(b), conventionally, the slice voltage Vs is adjusted manually by adjusting the voltage source 123.
is set to an appropriate value lower than the maximum value of the signal voltage Vp, and the presence or absence of the document 121 is detected by monitoring the output of the comparison section 117.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

一般に、ファクシミリ装置や自動預金支払機等の機器で
は、機器内の様々な場所で原稿や通帳の有無を検出する
ため同一機器内に上記のような光センサを多数配置して
いるが、LEDとフォトトランジスタの相対的な位置関
係は機器の形状等によって制限され、各光センサによっ
て異なっているのが普通である。ところがフォトトラン
ジスタの出力はLEDとの位置関係によって影響される
ため、各光センサごとにフォトトランジスタの出力レベ
ルが異なることになる。従って、個々の光センサ毎にフ
ォトトランジスタの出力レベル及びスライスレベルの調
整を行う必要がある。このような調整作業を多数の光セ
ンサを有する装置において手動で行う場合には、設定に
時間を要して機器製造コスト上昇の原因となるばかりで
な(、個々の光センサによって物体検出精度にバラツキ
が生じ機器の動作の信転性を低下させるという問題があ
った。
Generally, in devices such as facsimile machines and automatic teller machines, a large number of optical sensors such as those described above are placed within the same device in order to detect the presence or absence of documents and passbooks at various locations within the device. The relative positional relationship of phototransistors is limited by the shape of the device, etc., and usually differs depending on each optical sensor. However, since the output of the phototransistor is affected by the positional relationship with the LED, the output level of the phototransistor differs for each photosensor. Therefore, it is necessary to adjust the output level and slice level of the phototransistor for each optical sensor. If such adjustment work is performed manually on a device that has a large number of optical sensors, it not only takes time to set up and increases the manufacturing cost of the equipment (also, the accuracy of object detection depends on each individual optical sensor). There was a problem in that variations occurred and the reliability of the operation of the equipment was reduced.

そこで本発明は、適正なスライスレベルを自動的に設定
することを目的とする。
Therefore, an object of the present invention is to automatically set an appropriate slice level.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題の解決は、信号の増幅を行う増幅手段と、所定
の電圧を発生させる電圧発生手段と、該増幅手段および
該電圧発生手段の出力電圧の大小を比較する比較手段と
、該比較手段の比較結果に基づいて該増幅手段の出力電
圧および該電圧発生手段の出力電圧を変化させる制御手
段を有し、該増幅手段の出力電圧が該電圧発生手段の出
力電圧より大きくなったときの該増幅手段の増幅率およ
び該電圧発生手段の出力電圧を各々該信号の増幅レベル
およびスライスレベルとするようにしたことを特徴とす
るオートスライス装置によって達成される。
The solution to the above problem is to provide an amplification means for amplifying a signal, a voltage generation means for generating a predetermined voltage, a comparison means for comparing the output voltages of the amplification means and the voltage generation means, and a comparison means for comparing the output voltages of the amplification means and the voltage generation means. The amplification includes a control means for changing the output voltage of the amplification means and the output voltage of the voltage generation means based on a comparison result, and the amplification is performed when the output voltage of the amplification means becomes larger than the output voltage of the voltage generation means. This is achieved by an autoslicing device characterized in that the amplification factor of the means and the output voltage of the voltage generating means are set to the amplification level and slice level of the signal, respectively.

〔作 用〕[For production]

第1図は本発明の原理ブロック図を示したものであり、
11は増幅手段、12は電圧発生手段、13は比較手段
、14は制御手段である。
FIG. 1 shows a block diagram of the principle of the present invention.
11 is an amplification means, 12 is a voltage generation means, 13 is a comparison means, and 14 is a control means.

同図に示したように、信号出力を増幅手段11によって
増幅して得た電圧vhと電圧発生手段12の出力電圧V
sを比較手段13に入力する。比較手段13ではvhと
Vsの大小を比較しその結果を制御手段14に通知する
。制御手段14では、vhがVsより小さい場合には制
御信号を増幅手段11および電圧発生手段12に送って
vhを増加させるとともにVsを減少させ、vhがVs
より大きくなったときに上記制御信号の送出を停止し、
この時点でvhとVsを固定する。以上の方法により、
Vsはvhに対しわずかに低いレベルに自動的に設定さ
れることになり、このときの増幅手段11の増幅率を信
号の増幅レベルとして用い、電圧発生手段12の出力電
圧をスライスレベルとして用いることができる。
As shown in the figure, the voltage vh obtained by amplifying the signal output by the amplifying means 11 and the output voltage V of the voltage generating means 12
s is input to the comparison means 13. The comparison means 13 compares vh and Vs and notifies the control means 14 of the result. In the control means 14, when vh is smaller than Vs, a control signal is sent to the amplification means 11 and the voltage generation means 12 to increase vh and decrease Vs, so that vh becomes Vs.
When the signal becomes larger than that, stop sending the above control signal,
At this point, vh and Vs are fixed. By the above method,
Vs is automatically set to a level slightly lower than vh, and the amplification factor of the amplification means 11 at this time is used as the signal amplification level, and the output voltage of the voltage generation means 12 is used as the slice level. I can do it.

C実施例〕 第2図(a)、(b)は本発明の詳細な説明するための
図である。この実施例は、同図(a)に示したLEDl
ll とフォトトランジスタ112から成る光センサを
物体検出に用いる際に、フォトトランジスタ112の出
力に対しあらかじめ適正な増幅レベルおよびスライスレ
ベルを設定する方法について述べるものであり、上記増
幅レベルおよびスライスレベルの設定は、LEDIII
 とフォトトランジスタ112の間に物体を挿入する前
に行う。
Embodiment C] FIGS. 2(a) and 2(b) are diagrams for explaining the present invention in detail. In this example, the LED l shown in FIG.
This article describes a method for setting an appropriate amplification level and slice level for the output of the phototransistor 112 in advance when using an optical sensor consisting of a phototransistor 112 and a phototransistor 112 for object detection, and describes how to set the amplification level and slice level appropriately for the output of the phototransistor 112. is LEDIII
This is done before inserting an object between the phototransistor 112 and the phototransistor 112.

まず、LEDIIIからの光を受けたフォトトランジス
タ112の出力を増幅器113a、 113b・・・1
13dのいずれかによって増幅し電圧vhに変換した後
、比較部117に入力する。増幅器113a、113b
・・・113dは、増幅率の大きい順に並べられており
、MPX (アナログマルチプレクサ)114によって
いずれか一つが選択される。また、分割抵抗115a、
115b・・・115hのいずれかによって発生した電
圧VsがMPX116によって選択され比較部117に
入力される。Vsは分割抵抗115aが選択されたとき
に最も大きく、分割抵抗115b・・・115hが選択
される順に小さくなる。比較部117は、たとえばコン
パレータの機能を有するものであり、vhとVsの大き
さを比較し、vhがVsより小さいときに0、大きいと
きに1を出力する。
First, the output of the phototransistor 112 receiving light from the LED III is input to the amplifiers 113a, 113b...1.
After being amplified and converted into a voltage vh by one of the voltage generators 13d, the voltage is input to the comparison unit 117. Amplifiers 113a, 113b
. . 113d are arranged in descending order of amplification factor, and one of them is selected by an MPX (analog multiplexer) 114. In addition, the dividing resistor 115a,
115b...115h is selected by the MPX 116 and input to the comparator 117. Vs is highest when the divided resistor 115a is selected, and becomes smaller as the divided resistors 115b...115h are selected. Comparison unit 117 has, for example, a comparator function, and compares the magnitudes of vh and Vs, and outputs 0 when vh is smaller than Vs, and outputs 1 when it is larger.

一方、利得調整レジスタ118には増幅器113a、1
13b・・・113dに対応する数値113a、 11
3b ・−−113dがセットされ、CPU119から
の指示によって一定の時間間隔TIで113a→113
b→・・→113dの順に遷移する。そしてセットされ
た数値が利得調整レジスタ118からMPX114へ送
られ、MPX114ではこの数値に対応する増幅器を選
択する。
On the other hand, the gain adjustment register 118 includes amplifiers 113a and 1
Numerical values 113a and 11 corresponding to 13b...113d
3b ・--113d is set, and 113a → 113 is set at a constant time interval TI according to instructions from the CPU 119.
Transition occurs in the order of b→...→113d. The set value is then sent from the gain adjustment register 118 to the MPX 114, and the MPX 114 selects the amplifier corresponding to this value.

従って、比較部117には第1図b)に示したように階
段状に上昇する電圧vhが印加されることになる。同様
にして、スライス調整レジスタ120には分割抵抗器1
15a、115b・・・115hに対応した数値がセッ
トされており、この数値はCPUからの指示によって一
定の時間間隔T2で115h→・・・→115b→11
5aの順に遷移する。そしてスライス調整レジスタ12
0内の数値がMPX116へ送られ、MPX116では
この数値に対応する電圧Vsを選択する。従って、比較
部117には第1図(b)に示したように階段状に下降
する電圧VSが入力されることになる。
Therefore, a voltage vh that rises in a stepwise manner is applied to the comparator 117 as shown in FIG. 1b). Similarly, the slice adjustment register 120 has a dividing resistor 1.
Numerical values corresponding to 15a, 115b...115h are set, and these numerical values are changed from 115h→...→115b→11 at fixed time intervals T2 according to instructions from the CPU.
Transition occurs in the order of 5a. and slice adjustment register 12
A value within 0 is sent to the MPX 116, and the MPX 116 selects the voltage Vs corresponding to this value. Therefore, the comparator 117 receives the voltage VS that falls stepwise as shown in FIG. 1(b).

比較部117の出力がOである間は、CP U119は
利得調整レジスタ118およびスライス調整レジスタ1
20に対し、数値遷移の指示を続行し、vhとVsが逆
転して比較部117の出力が1となったときに数値遷移
の指示を停止すれば、vhとVsは第2図(ハ)中点線
で示した値に固定される。このときVsはvhに対して
Vsの増加分ΔVsの範囲内で相対的に低いレベルにそ
の位置関係が自動的に設定されることになり、このよう
にして選択された増幅器の増幅率を信号の増幅レベルと
し、Vsをスライスレベルとして用いることができる。
While the output of the comparator 117 is O, the CPU 119 controls the gain adjustment register 118 and the slice adjustment register 1.
20, if the numerical transition instruction is continued and the numerical transition instruction is stopped when vh and Vs are reversed and the output of the comparator 117 becomes 1, vh and Vs become as shown in FIG. 2 (c). It is fixed at the value indicated by the dotted line. At this time, the positional relationship of Vs is automatically set to a relatively low level within the range of the increase in Vs ΔVs with respect to vh, and the amplification factor of the amplifier selected in this way is set as a signal. , and Vs can be used as the slice level.

以上のようにして、個々の光センサにおけるフォトトラ
ンジスタの出力の絶対値が異なる場合においても、その
出力レベルに応じたスライスレベルを自動的に設定する
ことができ、また、上記ΔVsをあらかじめ小さな値に
定めることによって物体の検出精度のバラツキを抑える
ことができる。
As described above, even if the absolute value of the output of the phototransistor in each optical sensor is different, the slice level can be automatically set according to the output level, and the above ΔVs can be set to a small value in advance. By setting , it is possible to suppress variations in object detection accuracy.

〔発明の効果〕〔Effect of the invention〕

以上のように本発明によれば、信号の増幅レヘルおよび
スライスレベルの設定を自動的に行うことができるため
、多数の光センサについての物体検出特性の均一化およ
び調整時間の短縮を図る上で有効である。
As described above, according to the present invention, it is possible to automatically set the signal amplification level and slice level, so that it is possible to make the object detection characteristics uniform for a large number of optical sensors and shorten the adjustment time. It is valid.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の原理を示すブロック図、第2図(a)
は本発明の実施例を示すブロック図、第2図(b)は比
較部における入出力電圧の関係を示す図、 第3図(a)は従来例の問題点を示すブロック図、第3
図(b)は信号電圧とスライスレベルとの関係を示す図
、 である。 同図において、 11は増幅手段、 12は電圧発生手段、 13は比較手段、 14は制御手段、 111はLED。 112はフォトトランジスタ、 113a、113b −−−1136は増幅器、114
.116はMPX (7すt:lグア/lz−]−7”
t、’7す)、117は比較部、 118は利得調整レジスタ、 119はCPU。 120はスライス8周整レジスタ、 121は原稿、 122は抵抗器、 123は電圧源、 である。 従来例の問題点を示すブロック図 第3図(a) 本発明の実施例を示すブロック図 第2図(a) 信号電圧とスライスレベルとの関係を示す図第3図(b
) −〉 時刻
Figure 1 is a block diagram showing the principle of the present invention, Figure 2 (a)
is a block diagram showing an embodiment of the present invention, FIG. 2(b) is a diagram showing the relationship between input and output voltages in the comparison section, FIG.
Figure (b) is a diagram showing the relationship between signal voltage and slice level. In the figure, 11 is an amplification means, 12 is a voltage generation means, 13 is a comparison means, 14 is a control means, and 111 is an LED. 112 is a phototransistor, 113a, 113b---1136 is an amplifier, 114
.. 116 is MPX (7st:lgua/lz-]-7"
117 is a comparison section, 118 is a gain adjustment register, and 119 is a CPU. 120 is an 8-slice adjustment register, 121 is a document, 122 is a resistor, and 123 is a voltage source. A block diagram showing the problems of the conventional example FIG. 3 (a) A block diagram showing the embodiment of the present invention FIG. 2 (a) A diagram showing the relationship between the signal voltage and the slice level FIG. 3 (b)
) −> Time

Claims (1)

【特許請求の範囲】 信号の増幅を行う増幅手段(11)と、 所定の電圧を発生させる電圧発生手段(12)と、該増
幅手段(11)および該電圧発生手段(12)の出力電
圧の大小を比較する比較手段(13)と、 該比較手段(13)の比較結果に基づいて該増幅手段(
11)の出力電圧および該電圧発生手段(12)の出力
電圧を変化させる制御手段(14)を有し、 該増幅手段(11)の出力電圧が該電圧発生手段(12
)の出力電圧より大きくなったときの該増幅手段(11
)の増幅率および該電圧発生手段(12)の出力電圧を
各々該信号の増幅レベルおよびスライスレベルとするよ
うにしたことを特徴とするオートスライス装置。
[Claims] An amplification means (11) for amplifying a signal, a voltage generation means (12) for generating a predetermined voltage, and an output voltage of the amplification means (11) and the voltage generation means (12). a comparison means (13) for comparing the magnitude; and a comparison means (13) for comparing the amplification means (13) based on the comparison result of the comparison means (13).
control means (14) for changing the output voltage of the voltage generating means (11) and the output voltage of the voltage generating means (12), the output voltage of the amplifying means (11) is controlled by the voltage generating means (12);
) when the output voltage of the amplifying means (11
1. An auto-slicing device characterized in that the amplification factor of ) and the output voltage of the voltage generating means (12) are set to be an amplification level and a slicing level of the signal, respectively.
JP2152216A 1990-06-11 1990-06-11 Auto-slice device Pending JPH0444101A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2152216A JPH0444101A (en) 1990-06-11 1990-06-11 Auto-slice device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2152216A JPH0444101A (en) 1990-06-11 1990-06-11 Auto-slice device

Publications (1)

Publication Number Publication Date
JPH0444101A true JPH0444101A (en) 1992-02-13

Family

ID=15535617

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2152216A Pending JPH0444101A (en) 1990-06-11 1990-06-11 Auto-slice device

Country Status (1)

Country Link
JP (1) JPH0444101A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8138881B2 (en) 2007-09-28 2012-03-20 Heraeus Sensor Technology Gmbh Coated wire and film resistor
US8373535B2 (en) 2001-01-26 2013-02-12 Quality Thermistor, Inc. Thermistor and method of manufacture

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0255346A (en) * 1988-08-19 1990-02-23 Mita Ind Co Ltd Device for detecting size of original

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0255346A (en) * 1988-08-19 1990-02-23 Mita Ind Co Ltd Device for detecting size of original

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8373535B2 (en) 2001-01-26 2013-02-12 Quality Thermistor, Inc. Thermistor and method of manufacture
US8138881B2 (en) 2007-09-28 2012-03-20 Heraeus Sensor Technology Gmbh Coated wire and film resistor

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