JPH0438478A - Jig apparatus in machine for measuring characteristics of quartz resonator - Google Patents

Abstract

PURPOSE:To accurately measure the characteristics of a quartz resonator in a state near to a product by constituting a jig apparatus of the required jig stand on which the quartz resonator is placed and the grasping means grasping and holding the quartz resonator. CONSTITUTION:The quartz resonator C supplied to the placing hole 30 of a jig stand 12 is placed on a placing part 34 in a horizontal stable state. Thereafter, the upper pins 40 of a grasping means grasp the resonator C at the time of measurement. Lower pins 42 rise to raise the resonator C to the position of an enlarged space part 30a. Since the quartz resonator C is specially held, the characteristics thereof can be measured in a state near to a product and the quartz resonator is accurately specified.

Description

[Detailed Description of the Invention] [Field of Industrial Application] This invention is a measuring device that measures characteristics such as the oscillation frequency of a crystal resonator. The present invention relates to a jig device that supports a vibrator.

[Conventional technology]

A crystal resonator is a product in which silver, which serves as electrodes, is vapor-deposited on the front and back surfaces of a base plate made of crystal to form a pattern made of a vapor-deposited film. Conventionally, when inspecting such a crystal resonator, a base plate of the unfinished crystal resonator is placed on a substrate made of a conductor, which is called a contact type.
Electrodes are placed as close to the crystal resonator as possible, and the crystal impedance and oscillation frequency characteristics of the crystal resonator are measured and inspected.

[Problem to be solved by the invention]

Therefore, in the past, since the crystal base plate was placed directly on the board, the contact resistance and the presence of dust, dirt, etc. between the base plate and the board could occur, and the crystal impedance, oscillation frequency, etc. could not be accurately determined. The problem was that it could not be measured. Furthermore, since the crystal resonator as a product is not directly measured and inspected, but the raw crystal plate is measured and inspected, the characteristics of the crystal resonator as a product cannot be accurately measured.

The present invention has been made in view of the above problems, and is a jig for a crystal resonator in a characteristic measuring machine that enables accurate measurement of characteristics of a crystal resonator by performing measurement and inspection in a state close to the product. The purpose is to provide a device.

[Means to solve the problem]

In order to solve the above-mentioned problems, the present invention comprises a jig stand on which a crystal resonator is placed, and a clamping means for holding the crystal resonator, and the jig stand has an expanding space that expands upward in the center thereof. A mounting hole with a section is formed, and a crystal resonator is placed below the mounting hole. ! A mounting portion is provided at both ends of the mounting portion to communicate with the mounting hole, and the clamping means includes a pair of upper pins for clamping both ends of the crystal resonator; It consists of a pair of lower pins that are located at opposing positions and protrude and retract from the mounting hole through the through hole, and the crystal resonator is held between the upper pin and the lower pin in the expanded space. It was used as a jig device for a crystal resonator characteristic measuring machine.

Further, a compression spring may be provided at the upper end of the upper pin to constantly bias the upper pin downward.

Furthermore, it is preferable that the expanded space is formed by providing a taper that expands upward, since this also serves as a guide for the crystal resonator.

[Effect]

The crystal resonator (C) supplied to the mounting hole (30) of the jig stand (12) is horizontally and stably mounted on the mounting section (34) as shown in FIG. Thereafter, during measurement, the upper pin (40) descends together with the upper pin holder (41), and as shown in FIG. 5, the crystal resonator (C) is held between the lower pin (42) and the lower pin (42). Then, the lower pin (42) rises, the upper pin (40) rises against the compression spring (44), and the crystal oscillator (C) moves into the expanded space (30a) as shown in FIG. lifted into position.

Therefore, since the crystal resonator (C) is held in space, its characteristics can be measured in a state close to the product.

〔Example〕

Hereinafter, the present invention will be specifically described based on an embodiment shown in the accompanying drawings.

FIG. 1 is a schematic diagram of a measuring machine for measuring and inspecting the characteristics of a crystal resonator (C), and (10) is a turntable.

On the upper circumferential side of the turntable (10), there are jig stands (12a) spaced apart by 90'.

12b, 12c, 12d) are attached, and the turntable (10) is configured to rotate by 90 degrees.

The crystal resonator (C) is a crystal resonator as a product in which a pattern (C2), which is a silver vapor-deposited film, is formed on the front and back surfaces of a crystal base plate (C1), as shown in FIG. .

The crystal resonator (C), which is the component to be measured, is supplied to the jig stand (12a) at the supply position (16) by the component supply means (14) located above in FIG. The parts supply means (14) is connected to a parts feeder (not shown). The supplied parts are turntable (1
0) is rotated 90° clockwise, the jig table (
12a) is the measurement inspection position (1B) (jig stand (
12b) position], and at that location, place the crystal resonator (
C) is measured and tested. During this measurement, the jig stand (12d
) has moved to the supply position, and the part is in the supply means (14)
is supplied to the jig stand (12d). When the measurement is completed, the turntable (lO) is further rotated to 90°.
The jig table (12a) rotates and moves to the component removal position (20). At this time, the jig table (12d) supplied with the crystal resonator (C) from the component supply means (14) is at the measurement inspection position!
Move to (18). The extracted part, the crystal resonator (C), is divided into mechanisms (2
4).

(22) is a confirmation position, where it is confirmed whether or not the crystal resonator (C) whose measurement has been completed remains on the jig table. When the sorting is completed, the turntable (10) further rotates 90 degrees, and the jig table (12a) moves to the confirmation position (22). (26) is a measuring device.

FIGS. 2 and 3 show a jig device according to the present invention, which is composed of the aforementioned jig stand (12) and clamping means (28) for clamping and supporting a crystal resonator (C). .

The jig stand (12) has a disc shape with a hollowed out lower side, and a square mounting hole (30) is formed in the center so that a crystal resonator (C) can be mounted therein. The upper part of this mounting hole (30) is shown in detail in FIG.
A taper (32) is formed to widen upward.

This taper (32) has the function of guiding the crystal resonator (C) to the horizontal mounting part (34) when it is supplied to the jig table (12), and also to form an expansion space (30a) at the top. It has become. From the lower end of the taper (32), a vertical portion (3
6). Reference numerals (38) are through holes that are bored on the left and right sides of the mounting portion (34) in the longitudinal direction and communicate with the mounting hole (30).

The holding means (28) is composed of a pair of upper pins (40) spaced apart from each other in the left and right directions, and a pair of lower pins (42) arranged to face the upper pins (40). (40) and the lower pin (42) to connect the crystal resonator (
C), that is, the crystal resonator (C) on which the pattern (C2) is formed, is held and lifted to open the expanded space (30a).
). In other words, the diameter of the upper pin (40) and lower pin (42) is about 0.5 cm, which can hold the crystal resonator (C) in a substantially point state, has low contact resistance, and prevents dust from intervening. There is no room for this, which is preferable. (44) is a compression spring attached to the upper end of the upper pin (40), which is housed in the upper pin holder (41) and always urges the upper pin (40) downward. The lower pin (42) is fixedly supported by a lower pin holder (46), and by vertical movement of the lower pin holder (46), the lower pin (42) is inserted into the mounting hole through the through hole (38) of the mounting portion (34). (30
).It is possible to appear inside.

The jig device according to the present invention has the above-mentioned configuration, and its operation will next be explained based on FIGS. 2, 4, and 5.

First, the lower pin (42) is pulled down by the lower pin holder (46), and the crystal resonator (C), which is the component to be measured, is placed horizontally and stably on the upper surface of the mounting section (34). The upper pin (40) is located above the jig table (12) at the measurement/inspection position (18) (see FIG. 4). In this state, the upper pin (40) descends as shown in FIG. 5, and the crystal resonator (C) is held between the upper pin (40) and the lower pin (42). After this, place the lower pin holder (
46) rises as shown in FIG. Then the upper pin (
40) rises against the compression spring (44), and the crystal oscillator (C) is lifted while being sandwiched and supported by the upper pin (40) and the lower pin (42), and is lifted into the expanded space (30a).
) space is maintained within. At this time, a crystal oscillator (C
) is the drag force of the compression spring (44).

Therefore, by appropriately selecting the spring pressure of the compression spring (44), the crystal oscillator (C) can be prevented from being damaged.
and can be supported reliably.

The compression spring (
44), but may be held using, for example, an air cylinder or the like. In addition, since the crystal oscillator (C) is held in space in the expanded space (30a), it does not come into contact with other objects, such as the jig stand (12), and accuracy is maintained when measuring characteristics. drooping

〔Effect of the invention〕

As explained above, according to the present invention, a mounting hole for controlling a crystal resonator is formed in the jig stand, an enlarged space portion expanding upward is formed in the mounting hole, and a crystal resonator, which is a component to be inspected, is formed in the mounting hole. Since the crystal resonator is held in the expanded space by holding and supporting the resonator with the upper and lower pins and lifting it, the crystal resonator is supported almost only by point contact, and the jig table Therefore, it has the advantage that the characteristics of the crystal resonator can be measured in a state close to the product, and that accurate measurement and inspection can be performed.

[Brief explanation of drawings]

Fig. 1 is a schematic diagram showing the entirety of a crystal resonator characteristic measuring machine, Fig. 2 is an enlarged cross-sectional view showing details of the jig device according to the present invention, and Fig. 3 is the same as Fig. 2. The front view of the jig table shown in FIGS. 4 and 5 are sectional views showing the operation of the jig device in FIG. 2. (38): Through hole, (40): Upper pin, C42):
Lower pin (44): compression spring.

Claims (3)

[Claims] (1) It consists of a jig stand on which the crystal resonator is placed, and a clamping means for holding the crystal resonator, and the jig stand has a mounting hole in the center of which has an enlarged space that expands upward. a mounting part for placing the crystal resonator is provided below the mounting hole, and through holes communicating with the mounting hole are formed at both ends of the mounting part, and the holding means consists of a pair of upper pins that sandwich both ends of the crystal resonator, and a pair of lower pins that are located opposite to the upper pins and retract into and out of the mounting hole through the through hole, and the crystal resonator is held between the upper pin and the lower pin. A jig device for a crystal oscillator characteristic measuring machine, characterized in that the quartz crystal oscillator is held in the enlarged space. (2) The jig device according to claim 1, characterized in that a compression spring is provided at the upper end of the upper pin to constantly bias the upper pin downward. (3) The jig device according to claim 1 or 2, wherein the mounting hole is tapered to form an enlarged space that expands upward.