JPH0437937B2 - - Google Patents
Info
- Publication number
- JPH0437937B2 JPH0437937B2 JP59193513A JP19351384A JPH0437937B2 JP H0437937 B2 JPH0437937 B2 JP H0437937B2 JP 59193513 A JP59193513 A JP 59193513A JP 19351384 A JP19351384 A JP 19351384A JP H0437937 B2 JPH0437937 B2 JP H0437937B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- parallel
- particle size
- sample
- transmitting window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000002245 particle Substances 0.000 claims description 71
- 230000005540 biological transmission Effects 0.000 claims description 17
- 239000007787 solid Substances 0.000 claims description 17
- 230000004907 flux Effects 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 9
- 239000013307 optical fiber Substances 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 3
- 239000010419 fine particle Substances 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 26
- 239000003973 paint Substances 0.000 description 19
- 239000006185 dispersion Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 17
- 238000000149 argon plasma sintering Methods 0.000 description 16
- 239000007788 liquid Substances 0.000 description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 10
- 229910052710 silicon Inorganic materials 0.000 description 10
- 239000010703 silicon Substances 0.000 description 10
- 239000000049 pigment Substances 0.000 description 8
- 238000009826 distribution Methods 0.000 description 7
- 239000000725 suspension Substances 0.000 description 7
- 238000004140 cleaning Methods 0.000 description 6
- 238000010790 dilution Methods 0.000 description 4
- 239000012895 dilution Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- NRCMAYZCPIVABH-UHFFFAOYSA-N Quinacridone Chemical compound N1C2=CC=CC=C2C(=O)C2=C1C=C1C(=O)C3=CC=CC=C3NC1=C2 NRCMAYZCPIVABH-UHFFFAOYSA-N 0.000 description 2
- 239000011324 bead Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000002612 dispersion medium Substances 0.000 description 2
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- IEQIEDJGQAUEQZ-UHFFFAOYSA-N phthalocyanine Chemical compound N1C(N=C2C3=CC=CC=C3C(N=C3C4=CC=CC=C4C(=N4)N3)=N2)=C(C=CC=C2)C2=C1N=C1C2=CC=CC=C2C4=N1 IEQIEDJGQAUEQZ-UHFFFAOYSA-N 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000013441 quality evaluation Methods 0.000 description 1
- 239000001054 red pigment Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59193513A JPS6171336A (ja) | 1984-09-14 | 1984-09-14 | 粒度測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59193513A JPS6171336A (ja) | 1984-09-14 | 1984-09-14 | 粒度測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6171336A JPS6171336A (ja) | 1986-04-12 |
| JPH0437937B2 true JPH0437937B2 (fr) | 1992-06-22 |
Family
ID=16309308
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59193513A Granted JPS6171336A (ja) | 1984-09-14 | 1984-09-14 | 粒度測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6171336A (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0640057B2 (ja) * | 1987-08-11 | 1994-05-25 | 日機装株式会社 | 自動乾式粒度分布測定装置 |
| JP5155259B2 (ja) * | 2009-07-13 | 2013-03-06 | 新日鐵住金株式会社 | 石炭の粒度測定システム、方法及びプログラム |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5766342A (en) * | 1980-04-28 | 1982-04-22 | Agency Of Ind Science & Technol | Optical measuring method for suspension particles in medium |
| JPS57199943A (en) * | 1981-06-03 | 1982-12-08 | Hitachi Ltd | Measuring device for wetness of steam |
| JPS5970944A (ja) * | 1982-10-15 | 1984-04-21 | Toshiba Corp | 粒径測定装置 |
-
1984
- 1984-09-14 JP JP59193513A patent/JPS6171336A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5766342A (en) * | 1980-04-28 | 1982-04-22 | Agency Of Ind Science & Technol | Optical measuring method for suspension particles in medium |
| JPS57199943A (en) * | 1981-06-03 | 1982-12-08 | Hitachi Ltd | Measuring device for wetness of steam |
| JPS5970944A (ja) * | 1982-10-15 | 1984-04-21 | Toshiba Corp | 粒径測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6171336A (ja) | 1986-04-12 |
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