JPH04372729A - Integrated optical element and integrated optical pickup - Google Patents

Integrated optical element and integrated optical pickup

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Publication number
JPH04372729A
JPH04372729A JP3177187A JP17718791A JPH04372729A JP H04372729 A JPH04372729 A JP H04372729A JP 3177187 A JP3177187 A JP 3177187A JP 17718791 A JP17718791 A JP 17718791A JP H04372729 A JPH04372729 A JP H04372729A
Authority
JP
Japan
Prior art keywords
photodetector
light
integrated optical
microprism
optical element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3177187A
Other languages
Japanese (ja)
Inventor
Shiyuuichi Konayama
小名山 秀一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
NEC Corp
Original Assignee
NEC Home Electronics Ltd
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd, Nippon Electric Co Ltd filed Critical NEC Home Electronics Ltd
Priority to JP3177187A priority Critical patent/JPH04372729A/en
Publication of JPH04372729A publication Critical patent/JPH04372729A/en
Pending legal-status Critical Current

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  • Optical Head (AREA)

Abstract

PURPOSE:To miniaturize an optical pickup, to contrive the reduction in weight and cost and to reduce the change with the lapse of time by integrating each optical element of the optical pickup. CONSTITUTION:A photodetector 2, microprism 4 for which planar glasses 3 are combined and laser diode are integrally provided on a slicon substrate 1 are integrally provided. The microprism 4 is equipped with a halfmirror face, and the bottom face is equipped with a V groove grinding face 4b. A laser beam emitted from the laser diode is reflected on the halfmirror, for warded to an optical disk, a returning light reflected by the optical disk transmits through the halfmirror, transmits through the V groove grinding face 4b, and the photodetector is irradiated with the light. The returning light is split into two optical beams by the V groove grinding face 4b. A focusing error is detected by an Foucault method using the light splitting action of this V groove grinding face 4b.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は、光ディスクに記録さ
れた情報を光学的に読み取る集積型光ピックアップおよ
びこれに用いる集積型光学素子に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an integrated optical pickup for optically reading information recorded on an optical disk and an integrated optical element used therein.

【0002】0002

【従来の技術】図12に従来の光ピックアップを示す。 レーザダイオード30から出射されたレーザ光は、回折
格子31で3つの光ビームに分離され、ホログラム素子
33を透過した後、対物レンズ33で集光されて光ディ
スク34の信号面に焦点を結び、光ディスク34で反射
した戻り光は同じ経路をたどって対物レンズ33を透過
し、次いでホログラム素子32を透過する際に回折され
、回折の1次光が光検出器35で検出される。このよう
に、従来の光ピックアップでは、レーザダイオード30
、回折格子31、ホログラム素子32、対物レンズ33
、光検出器35などの各光学素子がほぼ単独で存在し、
各光学素子を保持・調整する構造もそれぞれ独自に備え
ていた。
2. Description of the Related Art FIG. 12 shows a conventional optical pickup. The laser light emitted from the laser diode 30 is separated into three light beams by the diffraction grating 31, passes through the hologram element 33, and is condensed by the objective lens 33 to focus on the signal surface of the optical disc 34. The return light reflected by 34 follows the same path and passes through objective lens 33 , and then is diffracted when passing through hologram element 32 , and the first-order light of the diffraction is detected by photodetector 35 . In this way, in the conventional optical pickup, the laser diode 30
, diffraction grating 31, hologram element 32, objective lens 33
, each optical element such as the photodetector 35 exists almost independently,
Each had its own structure to hold and adjust each optical element.

【0003】0003

【発明が解決しようとする課題】上記従来の光ピックア
ップでは、各光学素子が単独で存在し、独自に保持・調
整される構造であるから、光ピックアップの小型軽量化
にもおのずと限界があった。また、各光学素子のずれ等
による経時変化も発生し易く、信頼性を低下させる点で
問題であった。
[Problems to be Solved by the Invention] In the above-mentioned conventional optical pickup, each optical element exists independently and is held and adjusted independently, so there is a natural limit to the miniaturization and weight reduction of the optical pickup. . In addition, changes over time due to misalignment of each optical element are likely to occur, which is a problem in that reliability is reduced.

【0004】本発明は上記事情に鑑みてなされたもので
、各光学素子を集積して小型軽量化、コストダウンを図
るとともに、経時変化の少ない集積型光ピックアップお
よびこれに用いる集積型光学素子を提供することを目的
とする。
The present invention has been made in view of the above circumstances, and provides an integrated optical pickup that integrates various optical elements to reduce size, weight, and cost, and also provides an integrated optical pickup with little change over time and an integrated optical element used therein. The purpose is to provide.

【0005】[0005]

【課題を解決するための手段】上記課題を解決する請求
項1の集積型光学素子は、基板上に光検出器と、この光
検出器を覆うように置かれた微小プリズムと、この微小
プリズムに向けてレーザ光を発するレーザダイオードと
を備え、前記微小プリズムは、前記レーザダイオードか
ら発せられたレーザ光を光ディスク側に反射するととも
に、光ディスク面で反射し同じ経路で戻った戻り光を透
過させるプリズム内部のハーフミラー面と、このハーフ
ミラー面を透過した戻り光を2つに分離させるV溝研磨
面とを備え、前記光検出器はこのV溝研磨面を透過した
戻り光の焦点位置にあることを特徴とする。請求項2の
集積型光学素子は、基板上に光検出器と、この光検出器
を覆うように置かれた微小プリズムと、この微小プリズ
ムに向けてレーザ光を発するレーザダイオードとを備え
、前記微小プリズムは、前記レーザダイオードから発せ
られたレーザ光が入射する面に形成された、入射光を3
つに分離させる回折格子面と、この回折格子面を透過し
た光を光ディスク側に反射するとともに、光ディスク面
で反射し同じ経路で戻った戻り光を透過させるプリズム
内部のハーフミラー面と、このハーフミラー面を透過し
た戻り光に非点収差を発生させる円筒溝研磨面とを備え
、前記光検出器はこの円筒溝研磨面を透過した戻り光の
焦点位置にあることを特徴とする。請求項3の集積型光
学素子は、基板上に光検出器と、この光検出器を覆うよ
うに置かれた微小プリズムと、この微小プリズムに向け
てレーザ光を発するレーザダイオードとを備え、前記微
小プリズムは、前記レーザダイオードから発せられたレ
ーザ光が入射する面に形成された、入射光を3つに分離
させる回折格子面と、この回折格子面を透過した光を光
ディスク側に反射するとともに、光ディスク面で反射し
同じ経路で戻った戻り光を透過させるプリズム内部のハ
ーフミラー面と、このハーフミラー面を透過した戻り光
をそれぞれさらに2つに分離させるホログラム面とを備
え、前記光検出器はこのホログラム面を透過した戻り光
の焦点位置にあることを特徴とする。請求項4は、請求
項1または2または3記載の集積型光学素子を用いて集
積型光ピックアップを構成したものである。
[Means for Solving the Problems] An integrated optical element according to claim 1 which solves the above problems comprises: a photodetector on a substrate; a microprism placed so as to cover the photodetector; and a laser diode that emits a laser beam toward the optical disk, and the microprism reflects the laser beam emitted from the laser diode toward the optical disk, and transmits the return light that is reflected on the optical disk surface and returns along the same path. The prism includes a half-mirror surface inside the prism and a V-groove polished surface that separates the returned light that has passed through this half-mirror surface into two, and the photodetector is located at the focal position of the returned light that has passed through this V-grooved polished surface. characterized by something. An integrated optical element according to a second aspect of the present invention includes a photodetector on a substrate, a microprism placed so as to cover the photodetector, and a laser diode that emits a laser beam toward the microprism. The micro prism is formed on the surface on which the laser light emitted from the laser diode enters, and is configured to divide the incident light into three parts.
A half mirror surface inside the prism that reflects the light that has passed through this diffraction grating surface toward the optical disk side and transmits the return light that is reflected on the optical disk surface and returns along the same path. The mirror includes a cylindrical grooved polished surface that generates astigmatism in the returned light that has passed through the mirror surface, and the photodetector is located at the focal point of the returned light that has passed through the cylindrical grooved polished surface. An integrated optical element according to a third aspect of the present invention includes a photodetector on a substrate, a microprism placed so as to cover the photodetector, and a laser diode that emits a laser beam toward the microprism. The micro prism has a diffraction grating surface formed on the surface on which the laser light emitted from the laser diode enters, which separates the incident light into three parts, and a diffraction grating surface that separates the incident light into three parts, and reflects the light transmitted through this diffraction grating surface toward the optical disk side. , a half-mirror surface inside the prism that transmits the return light that is reflected on the optical disk surface and returns along the same path, and a hologram surface that separates the return light that has passed through the half-mirror surface into two parts, The device is characterized by being located at the focal point of the returned light that has passed through this hologram surface. According to a fourth aspect of the present invention, an integrated optical pickup is constructed using the integrated optical element according to the first, second or third aspect.

【0006】[0006]

【作用】請求項1の集積型光学素子において、レーザダ
イオードから発せられたレーザ光は微小プリズムのハー
フミラー面で反射して光ディスク側に向かい、光ディス
クで反射し同じ経路をたどって戻った戻り光は前記ハー
フミラーを透過し、さらにV溝研磨面を透過し、光検出
器を照射する。前記V溝研磨面は透過する戻り光をこの
V溝研磨面を形成する2つの傾斜面により半円形の2つ
の光ビームに分離させるので、フォーカシングエラー信
号は前記V溝研磨面の光分離作用を利用したフーコー法
により検出できる。また、トラッキングエラー信号は同
じくV溝研磨面の光分離作用を利用したプッシュプル法
により検出できる。
[Operation] In the integrated optical element according to claim 1, the laser light emitted from the laser diode is reflected by the half mirror surface of the micro prism and directed toward the optical disk, and the return light that is reflected by the optical disk and returns along the same path. The light passes through the half mirror, passes through the V-groove polished surface, and illuminates the photodetector. Since the V-groove polished surface separates the transmitted return light into two semicircular light beams by the two inclined surfaces forming the V-groove polished surface, the focusing error signal reflects the light separation effect of the V-groove polished surface. It can be detected using the Foucault method. Further, the tracking error signal can be detected by the push-pull method which also utilizes the light separation effect of the V-groove polished surface.

【0007】請求項2の集積型光学素子において、レー
ザダイオードから発せられたレーザ光は微小プリズムの
側面の回折格子面を透過して3つの光ビームに分離され
た後、ハーフミラー面で反射して光ディスク側に向かい
、光ディスクで反射し同じ経路をたどって戻った戻り光
は前記ハーフミラーを透過し、さらに円筒溝研磨面を透
過し、光検出器を照射する。この円筒溝研磨面は透過す
る戻り光に非点収差を発生させるので、フォーカシング
エラー信号は前記円筒溝研磨面の非点収差作用を利用し
た非点収差法により検出できる。また、トラッキングエ
ラー信号は回折格子面の光分離作用を利用した3ビーム
法により検出できる。
In the integrated optical element according to claim 2, the laser light emitted from the laser diode is transmitted through the diffraction grating surface on the side surface of the micro prism, separated into three light beams, and then reflected by the half mirror surface. The returned light, which is reflected by the optical disk and returns along the same path, passes through the half mirror, further passes through the cylindrical grooved polished surface, and illuminates the photodetector. Since this cylindrical groove polished surface generates astigmatism in the transmitted return light, the focusing error signal can be detected by an astigmatism method that utilizes the astigmatism effect of the cylindrical groove polished surface. Further, the tracking error signal can be detected by a three-beam method that utilizes the light separation effect of the diffraction grating surface.

【0008】請求項3の集積型光学素子において、レー
ザダイオードから発せられたレーザ光は微小プリズムの
側面の回折格子面を透過して3つの光ビームに分離され
た後、ハーフミラー面で反射して光ディスク側に向かい
、光ディスクで反射し同じ経路をたどって戻った戻り光
は前記ハーフミラーを透過し、ホログラム面を透過し、
光検出器を照射する。このホログラム面を透過する戻り
光をそれぞれ半円形の2つの光ビームに分離させるので
、フォーカシングエラー信号は前記ホログラム面の光分
離作用を利用したフーコー法により検出できる。また、
トラッキングエラー信号は前記回折格子面の光分離作用
を利用した3ビーム法により検出できる。
In the integrated optical element according to claim 3, the laser light emitted from the laser diode passes through the diffraction grating surface on the side surface of the micro prism, is separated into three light beams, and is then reflected by the half mirror surface. The return light that travels toward the optical disk, is reflected by the optical disk, and returns along the same path is transmitted through the half mirror, then through the hologram surface,
Illuminate the photodetector. Since the returned light passing through the hologram surface is separated into two semicircular light beams, the focusing error signal can be detected by the Foucault method using the light separation effect of the hologram surface. Also,
The tracking error signal can be detected by a three-beam method that utilizes the light separation effect of the diffraction grating surface.

【0009】[0009]

【実施例】以下、本発明の実施例を図1〜図11を参照
して説明する。図1〜図4は、請求項1の集積型光学素
子および集積型光ピックアップの一実施例を示す。符号
1は配線パターンを形成したシリコン基板であり、この
シリコン基板1に光検出器2を設け、その上に平板ガラ
ス3を下面に貼り合わせた微小プリズム4を配置する。 また、シリコン基板1上にヒートシンク5を介してレー
ザダイオード6を設ける。前記微小プリズム4は、2つ
の三角プリズムを接合してハーフミラー面4aを形成し
、下面の中央をトラック進行方向から見てV形をなすよ
うに切り欠いて形成したV溝研磨面4bを備えている。 前記光検出器2は、このV溝研磨面4bを透過した戻り
光の焦点位置にある。この光検出器2は、図3に示すよ
うに並列するA、B、C、Dの4つのエレメントからな
る4分割光センサである。シリコン基板1、光検出器2
、平板ガラス3、微小プリズム4、ヒートシンク5、レ
ーザダイオード6等は集積型光学素子7を構成する。こ
の集積型光学素子7は、この集積型光学素子7から出射
した光を光ディスク8上に焦点を結ばせる対物レンズ9
等とともに集積型光ピックアップを構成する。この集積
型光学素子7を用いた集積型光ピックアップの一例を示
すと、図4に示すように、集積型光学素子7を例えば対
物レンズ9を取り付けたレンズホルダ10内に設け、こ
のレンズホルダ10を、例えばアクチュエータベース1
1に設けた支持台15に一端を固定した4本のサスペン
ションワイヤ13でフォーカシング方向(図で上下方向
)およびトラッキング方向(図で紙面と直交する方向)
に変位可能に支持する。なお、図示は省略したが、例え
ばフォーカシングコイル、トラッキングコイルをレンズ
ホルダ10側に設け、これに磁界を作用させる磁気回路
をアクチュエータベース11上に設ける等して、対物レ
ンズ9のフォーカシングサーボ、トラッキングサーボを
行うようにする。
Embodiments Hereinafter, embodiments of the present invention will be described with reference to FIGS. 1 to 11. 1 to 4 show an embodiment of an integrated optical element and an integrated optical pickup according to claim 1. Reference numeral 1 denotes a silicon substrate on which a wiring pattern is formed, a photodetector 2 is provided on this silicon substrate 1, and a microprism 4 with a flat glass 3 bonded to the lower surface thereof is arranged thereon. Further, a laser diode 6 is provided on the silicon substrate 1 via a heat sink 5. The micro prism 4 is formed by joining two triangular prisms to form a half mirror surface 4a, and includes a V-groove polished surface 4b formed by cutting out the center of the lower surface to form a V shape when viewed from the track traveling direction. ing. The photodetector 2 is located at the focal point of the returned light that has passed through the V-groove polished surface 4b. The photodetector 2 is a 4-split optical sensor consisting of four elements A, B, C, and D arranged in parallel as shown in FIG. Silicon substrate 1, photodetector 2
, flat glass 3, micro prism 4, heat sink 5, laser diode 6, etc. constitute an integrated optical element 7. This integrated optical element 7 has an objective lens 9 that focuses the light emitted from this integrated optical element 7 onto an optical disk 8.
Together with these components, an integrated optical pickup is constructed. An example of an integrated optical pickup using this integrated optical element 7 is shown in FIG. For example, actuator base 1
Four suspension wires 13, one end of which is fixed to a support base 15 provided in 1, are used in the focusing direction (vertical direction in the figure) and the tracking direction (direction perpendicular to the plane of the paper in the figure).
support so that it can be displaced. Although not shown in the drawings, focusing servo and tracking servo of the objective lens 9 can be controlled by, for example, providing a focusing coil and a tracking coil on the lens holder 10 side, and providing a magnetic circuit on the actuator base 11 for applying a magnetic field to the focusing coil and tracking coil. Make sure to do the following.

【0010】上記の集積型光ピックアップにおいて、レ
ーザダイオード6から発せられたレーザ光は微小プリズ
ム4のハーフミラー面4aで反射して光ディスク8側に
向かい、光ディスク8で反射し同じ経路をたどって戻っ
た戻り光は前記ハーフミラー4aを透過し、V溝研磨面
4bを透過する。このV溝研磨面4bを透過する際、V
溝研磨面4bを形成する2つの傾斜面における屈折方向
がそれぞれ異なることで戻り光が半円形の2つの光ビー
ムに分離され、光検出器2を図3の(イ)または(ロ)
または(ハ)のように照射する。図3の(イ)は焦点が
近過ぎる場合、(ロ)は合焦点時、(ハ)は焦点が遠過
ぎる場合を示す。光検出器2はこの2つに分離された戻
り光を検出し、フォーカシングエラー信号はフーコー法
により検出する。また、トラッキングエラー信号はプッ
シュプル法により検出する。すなわち、フォーカシング
エラー信号(FE)、トラッキングエラー信号(TE)
、再生RF信号(RF)は次の通りである。 FE=(A+D)−(B+C)      …■TE=
(A+B)−(C+D)      …■RF=A+B
+C+D              …■
In the above-mentioned integrated optical pickup, the laser beam emitted from the laser diode 6 is reflected by the half mirror surface 4a of the micro prism 4 toward the optical disk 8, reflected by the optical disk 8, and returned along the same path. The returned light passes through the half mirror 4a and then through the V-groove polished surface 4b. When passing through this V-groove polished surface 4b, V
Since the refraction directions of the two inclined surfaces forming the grooved polished surface 4b are different, the returned light is separated into two semicircular light beams, and the photodetector 2 is separated into two semicircular light beams.
Or irradiate as in (c). In FIG. 3, (a) shows the case when the focus is too close, (b) shows the case when the focus is in focus, and (c) shows the case when the focus is too far. The photodetector 2 detects the two separated returned lights, and detects the focusing error signal using the Foucault method. Further, the tracking error signal is detected by a push-pull method. That is, focusing error signal (FE), tracking error signal (TE)
, the reproduced RF signal (RF) is as follows. FE=(A+D)-(B+C)...■TE=
(A+B)-(C+D)...■RF=A+B
+C+D…■

【0011
】次に、請求項2の集積型光学素子の一実施例を図5〜
図7に示す。この実施例の集積型光学素子17において
、微小プリズム14は図1、図2に示した微小プリズム
4と同じくハーフミラー面14aを持つが、下面にはV
溝研磨面に代えてトラック進行方向と直交する方向から
見て円弧状をなすように切り欠いて形成した円筒溝研磨
面14bを持ち、また、レーザダイオード6側の側面に
回折格子面14cを形成している。また、光検出器12
は、図7に示すように、正方形を対角線でA、B、C、
Dの4つのエレメントに分割した4分割光センサとその
左右のE、Fの2つの光センサとからなる。シリコン基
板1、ヒートシンク5、レーザダイオード6、対物レン
ズ9等は図1、図2に示した集積型光学素子と同様であ
り、同じ符号を付して説明を省略する。 また、この集積型光学素子17は、前記と同じく例えば
図4のようにして集積型光ピックアップを構成する。
0011
] Next, an embodiment of the integrated optical element according to claim 2 is shown in FIGS.
It is shown in FIG. In the integrated optical element 17 of this embodiment, the micro prism 14 has a half mirror surface 14a like the micro prism 4 shown in FIGS. 1 and 2, but the lower surface has a V
Instead of the grooved polished surface, it has a cylindrical grooved polished surface 14b formed by cutting out an arc shape when viewed from a direction perpendicular to the track traveling direction, and a diffraction grating surface 14c is formed on the side surface on the laser diode 6 side. are doing. In addition, the photodetector 12
As shown in Figure 7, the diagonals of the square are A, B, C,
It consists of a 4-split optical sensor divided into four elements D, and two optical sensors E and F on the left and right sides of it. The silicon substrate 1, heat sink 5, laser diode 6, objective lens 9, etc. are the same as those of the integrated optical element shown in FIGS. 1 and 2, and are given the same reference numerals and description thereof will be omitted. Further, this integrated optical element 17 configures an integrated optical pickup as shown in FIG. 4, for example, as described above.

【0012】上記の集積型光ピックアップにおいて、レ
ーザダイオード6から発せられたレーザ光は微小プリズ
ム14の側面の回折格子面14cを透過して3つの光ビ
ームに分離された後、ハーフミラー面14aで反射して
光ディスク8側に向かい、光ディスク8で反射し同じ経
路をたどって戻った戻り光は前記ハーフミラー面14a
を透過し、さらに円筒溝研磨面14bを透過し、光検出
器12を照射する。この円筒溝研磨面14bは透過する
戻り光に非点収差を発生させ、フォーカシングエラー信
号は円弧溝研磨面14bによる非点収差作用を利用した
非点収差法により検出される。また、トラッキングエラ
ー信号は前記回折格子面14cの光分離作用を利用した
3ビーム法により検出される。すなわち、フォーカシン
グエラー信号(FE)、トラッキングエラー信号(TE
)、再生RF信号(RF)は、次の通りである。 FE=(A+C)−(B+D)      …■TE=
E−F                      
…■RF=A+B+C+D             
 …■
In the above-mentioned integrated optical pickup, the laser light emitted from the laser diode 6 passes through the diffraction grating surface 14c on the side surface of the microprism 14 and is separated into three light beams, which are then separated by the half mirror surface 14a. The returned light that is reflected toward the optical disk 8 side, reflected by the optical disk 8, and returned along the same path is reflected by the half mirror surface 14a.
The light passes through the cylindrical groove polished surface 14b and illuminates the photodetector 12. This cylindrical grooved polished surface 14b generates astigmatism in the transmitted return light, and a focusing error signal is detected by an astigmatism method that utilizes the astigmatic effect of the circularly grooved polished surface 14b. Further, the tracking error signal is detected by a three-beam method that utilizes the light separation effect of the diffraction grating surface 14c. That is, focusing error signal (FE), tracking error signal (TE
), the reproduced RF signal (RF) is as follows. FE=(A+C)-(B+D)...■TE=
E-F
…■RF=A+B+C+D
…■

【0013】次の請求項3の集積型光学素子の一
実施例を図8〜図11を参照して説明する。この集積型
光学素子27において、微小プリズム24は図5、図6
の微小プリズム14と同様にハーフミラー面24aおよ
び回折格子面24cを持つが、下面には前記円筒溝研磨
面14bに代えてホログラム面24bを形成する。この
ホログラム面24bは、図10に示すように、円形を2
分割した半円形の2つの領域に互いに異なるピッチの格
子パターンを備えている。その分割線はトラック進行方
向とほぼ平行である。また、光検出器22は、図11に
示すように、正方形を縦横の分割線でA、B、C、Dの
4つのエレメントに分割した4分割光センサとその左右
のE、Fの2つの光センサとからなる。シリコン基板1
、ヒートシンク5、レーザダイオード6、対物レンズ9
等は図1、図2に示した集積型光学素子と同様であり、
同じ符号を付して説明を省略する。また、この集積型光
学素子27も、前記と同じく例えば図4のようにして集
積型光ピックアップを構成する。
An embodiment of the integrated optical element according to claim 3 will be described with reference to FIGS. 8 to 11. In this integrated optical element 27, the micro prism 24 is shown in FIGS.
It has a half mirror surface 24a and a diffraction grating surface 24c like the micro prism 14, but a hologram surface 24b is formed on the lower surface in place of the cylindrical groove polished surface 14b. As shown in FIG. 10, this hologram surface 24b has two circular shapes.
Two divided semicircular regions are provided with lattice patterns of different pitches. The dividing line is approximately parallel to the track traveling direction. In addition, as shown in FIG. 11, the photodetector 22 consists of a 4-split photosensor that divides a square into 4 elements A, B, C, and D using vertical and horizontal dividing lines, and 2 elements E and F on the left and right sides of the 4-split photosensor. It consists of a light sensor. Silicon substrate 1
, heat sink 5, laser diode 6, objective lens 9
etc. are similar to the integrated optical element shown in FIGS. 1 and 2,
The same reference numerals are used to omit the explanation. Further, this integrated optical element 27 also constitutes an integrated optical pickup as shown in FIG. 4, for example, as described above.

【0014】上記の集積型光ピックアップにおいて、レ
ーザダイオード6から発せられたレーザ光は微小プリズ
ム24の側面の回折格子面24cを透過して3つの光ビ
ームに分離された後、ハーフミラー面24aで反射して
光ディスク8側に向かい、光ディスク8で反射し同じ経
路をたどって戻った戻り光は前記ハーフミラー面24a
を透過し、さらにホログラム面24bを透過し、このホ
ログラム面24bを透過する3つの戻り光をそれぞれ半
円形の2つの光ビームに分離させるので、光検出器22
を図11のように照射する。フォーカシングエラー信号
はホログラム面24bの光分離作用を利用したダブルナ
イフエッジ法により検出される。また、トラッキングエ
ラー信号は前記図5、図6の場合と同じく回折格子面2
4cの光分離作用を利用した3ビーム法により検出され
る。すなわち、フォーカシングエラー信号(FE)、ト
ラッキングエラー信号(TE)、再生RF信号(RF)
は、次の通りである。 FE=(A+C)−(B+D)      …■TE=
E−F                      
…■RF=A+B+C+D             
 …■
In the above-mentioned integrated optical pickup, the laser light emitted from the laser diode 6 passes through the diffraction grating surface 24c on the side surface of the micro prism 24, is separated into three light beams, and is then split into three light beams by the half mirror surface 24a. The return light that is reflected toward the optical disk 8 side, reflected by the optical disk 8, and returned along the same path is reflected by the half mirror surface 24a.
The three return lights that pass through the hologram surface 24b are separated into two semicircular light beams, so the photodetector 22
is irradiated as shown in FIG. The focusing error signal is detected by a double knife edge method that utilizes the light separation effect of the hologram surface 24b. Also, the tracking error signal is generated at the diffraction grating surface 2 as in the case of FIGS. 5 and 6.
It is detected by a three-beam method that utilizes the light separation effect of 4c. That is, focusing error signal (FE), tracking error signal (TE), reproduction RF signal (RF)
is as follows. FE=(A+C)-(B+D)...■TE=
E-F
…■RF=A+B+C+D
…■

【0015】なお、実施例において平板ガラス3
はV溝研磨面や円筒溝研磨面やホログラム面と光検出器
との間隔を規定するために設けることが好ましいが、必
ずしも平板ガラスである必要はない。
[0015] In the embodiment, the flat glass 3
is preferably provided to define the distance between the V-groove polished surface, the cylindrical groove polished surface, or the hologram surface and the photodetector, but it does not necessarily have to be a flat glass.

【0016】[0016]

【発明の効果】本発明によれば、レーザダイオードから
発せられたレーザ光を光ディスク側に折り曲げる機能、
フォーカシングエラー検出機能、トラッキングエラー検
出機能を併せ持つ微小プリズムをレーザダイオードおよ
び光検出器とともに1つの基板上に一体化した構造なの
で、各光学素子が集積されて小型軽量化が図られるとと
もに、コストダウンが実現され、さらに経時変化の少な
い集積型光ピックアップおよびこれに用いる集積型光学
素子を得ることができた。
[Effects of the Invention] According to the present invention, the function of bending the laser beam emitted from the laser diode toward the optical disk side;
The structure integrates a microprism with a focusing error detection function and a tracking error detection function together with a laser diode and a photodetector on one substrate, so each optical element is integrated, making it smaller and lighter, and reducing costs. In addition, we were able to obtain an integrated optical pickup and an integrated optical element used therein that exhibit little change over time.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】請求項1の集積型光学素子の一実施例を示す正
面図である。
FIG. 1 is a front view showing an embodiment of an integrated optical element according to claim 1.

【図2】図1の集積型光学素子の側面図である。FIG. 2 is a side view of the integrated optical element of FIG. 1;

【図3】図1の集積型光学素子における光検出器の図で
、同図(イ)は焦点が近過ぎる場合、同図(ロ)は合焦
点時、同図(ハ)は焦点が遠過ぎる場合である。
[Figure 3] Diagrams of the photodetector in the integrated optical element in Figure 1. Figure (A) shows when the focus is too close, Figure (B) shows when the focus is in focus, and Figure (C) shows when the focus is too far. In some cases, it is too much.

【図4】図1の集積型光学素子を用いた集積型光ピック
アップの一例を示す側面図である。
4 is a side view showing an example of an integrated optical pickup using the integrated optical element of FIG. 1. FIG.

【図5】請求項2の集積型光学素子の一実施例を示す正
面図である。
FIG. 5 is a front view showing an embodiment of the integrated optical element according to claim 2.

【図6】図5の集積型光学素子の側面図である。FIG. 6 is a side view of the integrated optical element of FIG. 5;

【図7】図5の集積型光学素子における光検出器の図で
ある。
FIG. 7 is a diagram of a photodetector in the integrated optical element of FIG. 5;

【図8】請求項3の集積型光学素子の一実施例を示す正
面図である。
FIG. 8 is a front view showing an embodiment of the integrated optical element according to claim 3.

【図9】図8の集積型光学素子の側面図である。FIG. 9 is a side view of the integrated optical element of FIG. 8;

【図10】図8における要部のA−A線拡大断面図であ
る。
FIG. 10 is an enlarged cross-sectional view taken along the line A-A of the main part in FIG. 8;

【図11】図8の集積型光学素子における光検出器の図
である。
FIG. 11 is a diagram of a photodetector in the integrated optical element of FIG. 8;

【図12】従来の光ピックアップを示す光学系構成図で
ある。
FIG. 12 is an optical system configuration diagram showing a conventional optical pickup.

【符号の説明】[Explanation of symbols]

1      シリコン基板(基板) 2、12、22      光検出器 3      平板ガラス 4、14、24      微小プリズム4a、14a
、24a    ハーフミラー面4b    V溝研磨
面 14b  円筒溝研磨面 24b  ホログラム面 14c、24c      回折格子面6      
レーザダイオード 7、17、27    集積型光学素子8      
光ディスク
1 Silicon substrate (substrate) 2, 12, 22 Photodetector 3 Flat glass 4, 14, 24 Microprism 4a, 14a
, 24a Half mirror surface 4b V-groove polished surface 14b Cylindrical groove polished surface 24b Hologram surface 14c, 24c Diffraction grating surface 6
Laser diode 7, 17, 27 Integrated optical element 8
optical disk

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】  基板上に光検出器と、この光検出器を
覆うように置かれた微小プリズムと、この微小プリズム
に向けてレーザ光を発するレーザダイオードとを備え、
前記微小プリズムは、前記レーザダイオードから発せら
れたレーザ光を光ディスク側に反射するとともに、光デ
ィスク面で反射し同じ経路で戻った戻り光を透過させる
プリズム内部のハーフミラー面と、このハーフミラー面
を透過した戻り光を2つに分離させるV溝研磨面とを備
え、前記光検出器はこのV溝研磨面を透過した戻り光の
焦点位置にあることを特徴とする集積型光学素子。
1. A photodetector on a substrate, a microprism placed to cover the photodetector, and a laser diode that emits a laser beam toward the microprism,
The micro prism includes a half mirror surface inside the prism that reflects the laser light emitted from the laser diode toward the optical disk, and transmits the return light that is reflected on the optical disk surface and returns along the same path. 1. An integrated optical element comprising a V-groove polished surface that separates transmitted return light into two parts, and wherein the photodetector is located at a focal point of the returned light transmitted through the V-groove polished surface.
【請求項2】  基板上に光検出器と、この光検出器を
覆うように置かれた微小プリズムと、この微小プリズム
に向けてレーザ光を発するレーザダイオードとを備え、
前記微小プリズムは、前記レーザダイオードから発せら
れたレーザ光が入射する面に形成された、入射光を3つ
に分離させる回折格子面と、この回折格子面を透過した
光を光ディスク側に反射するとともに、光ディスク面で
反射し同じ経路で戻った戻り光を透過させるプリズム内
部のハーフミラー面と、このハーフミラー面を透過した
戻り光に非点収差を発生させる円筒溝研磨面とを備え、
前記光検出器はこの円筒溝研磨面を透過した戻り光の焦
点位置にあることを特徴とする集積型光学素子。
2. A photodetector on a substrate, a microprism placed to cover the photodetector, and a laser diode that emits a laser beam toward the microprism,
The microprism has a diffraction grating surface formed on a surface onto which the laser light emitted from the laser diode is incident, which separates the incident light into three parts, and a diffraction grating surface that reflects the light transmitted through this diffraction grating surface toward the optical disk side. The prism also includes a half mirror surface inside the prism that transmits the return light that is reflected on the optical disk surface and returns along the same path, and a cylindrical groove polished surface that causes astigmatism in the return light that has passed through the half mirror surface.
The integrated optical element is characterized in that the photodetector is located at the focal point of the return light transmitted through the cylindrical groove polished surface.
【請求項3】  基板上に光検出器と、この光検出器を
覆うように置かれた微小プリズムと、この微小プリズム
に向けてレーザ光を発するレーザダイオードとを備え、
前記微小プリズムは、前記レーザダイオードから発せら
れたレーザ光が入射する面に形成された、入射光を3つ
に分離させる回折格子面と、この回折格子面を透過した
光を光ディスク側に反射するとともに、光ディスク面で
反射し同じ経路で戻った戻り光を透過させるプリズム内
部のハーフミラー面と、このハーフミラー面を透過した
戻り光をそれぞれさらに2つに分離させるホログラム面
とを備え、前記光検出器はこのホログラム面を透過した
戻り光の焦点位置にあることを特徴とする集積型光学素
子。
3. A photodetector on a substrate, a microprism placed to cover the photodetector, and a laser diode that emits a laser beam toward the microprism,
The microprism has a diffraction grating surface formed on a surface onto which the laser light emitted from the laser diode is incident, which separates the incident light into three parts, and a diffraction grating surface that reflects the light transmitted through this diffraction grating surface toward the optical disk side. The prism also includes a half-mirror surface inside the prism that transmits the return light that is reflected on the optical disk surface and returns along the same path, and a hologram surface that separates the return light that has passed through the half-mirror surface into two parts. An integrated optical element characterized in that the detector is located at the focal point of the returned light that has passed through the hologram surface.
【請求項4】  請求項1または2または3記載の集積
型光学素子を用いた集積型光ピックアップであって、集
積型光学素子から発したレーザ光を少なくとも1つの集
光レンズにより集光して光ディスク上に焦点を結ばせ、
その反射光を再び前記集積型光学素子に戻し前記光検出
器で検出することにより、光ディスクの情報を電気信号
に変換するようにした集積型光ピックアップ。
4. An integrated optical pickup using the integrated optical element according to claim 1, 2 or 3, wherein the laser beam emitted from the integrated optical element is focused by at least one focusing lens. focus on the optical disc,
The integrated optical pickup converts the information on the optical disc into an electrical signal by returning the reflected light to the integrated optical element and detecting it with the photodetector.
JP3177187A 1991-06-21 1991-06-21 Integrated optical element and integrated optical pickup Pending JPH04372729A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3177187A JPH04372729A (en) 1991-06-21 1991-06-21 Integrated optical element and integrated optical pickup

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3177187A JPH04372729A (en) 1991-06-21 1991-06-21 Integrated optical element and integrated optical pickup

Publications (1)

Publication Number Publication Date
JPH04372729A true JPH04372729A (en) 1992-12-25

Family

ID=16026701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3177187A Pending JPH04372729A (en) 1991-06-21 1991-06-21 Integrated optical element and integrated optical pickup

Country Status (1)

Country Link
JP (1) JPH04372729A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845106A (en) * 1994-04-30 1996-02-16 Daewoo Electron Co Ltd Optical pickup device of three-beam tracking system
JP2003016683A (en) * 2001-06-29 2003-01-17 Ricoh Co Ltd Optical pickup device, method of forming laminated optical element and optical disk driver

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0845106A (en) * 1994-04-30 1996-02-16 Daewoo Electron Co Ltd Optical pickup device of three-beam tracking system
JP2003016683A (en) * 2001-06-29 2003-01-17 Ricoh Co Ltd Optical pickup device, method of forming laminated optical element and optical disk driver

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