JPH0436208Y2 - - Google Patents

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Publication number
JPH0436208Y2
JPH0436208Y2 JP15228385U JP15228385U JPH0436208Y2 JP H0436208 Y2 JPH0436208 Y2 JP H0436208Y2 JP 15228385 U JP15228385 U JP 15228385U JP 15228385 U JP15228385 U JP 15228385U JP H0436208 Y2 JPH0436208 Y2 JP H0436208Y2
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JP
Japan
Prior art keywords
power supply
switching
power
semiconductor switch
switching means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15228385U
Other languages
Japanese (ja)
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JPS6261137U (en
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Filing date
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Priority to JP15228385U priority Critical patent/JPH0436208Y2/ja
Publication of JPS6261137U publication Critical patent/JPS6261137U/ja
Application granted granted Critical
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Expired legal-status Critical Current

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Description

【考案の詳細な説明】 A 産業上の利用分野 本考案は、例えばバイパス電源のある無停電電
源装置について、インバータバイパス電源えの
同期切り換えを行う電源切換装置の動作状態を点
検する点検装置に関するものである。
[Detailed Description of the Invention] A. Field of Industrial Application The present invention relates to an inspection device for inspecting the operating state of a power supply switching device that performs synchronous switching of an inverter bypass power supply, for example, in an uninterruptible power supply system with a bypass power supply. It is.

B 考案の概要 互に並列に接続されたインバータとバイパス電
源の間で、各電源に夫々接続された半導体スイツ
チにより負荷への給電の切り換えを行う無停電電
源装置であつて、その切り換えの動作点検を行う
場合、 一方の半導体スイツチを短絡して短絡電路を通
じて負荷へ給電すると共に双方の半導体スイツチ
に一方の電源から給電しておき、この状態の下で
給電切り換えを行つて、各半導体スイツチの入力
電圧及び出力電圧を比較して動作点検を行うこと
によつて、 切り換え回路の異常の有無に拘わらず、負荷に
給電を行つたまま切り換えの動作点検が行えるよ
うにしたものである。
B. Summary of the invention This is an uninterruptible power supply that switches the power supply to the load between an inverter and a bypass power supply that are connected in parallel to each other using semiconductor switches connected to each power supply, and the switching operation is inspected. When performing this, one semiconductor switch is shorted and power is supplied to the load through the shorted circuit, and both semiconductor switches are supplied with power from one power supply. Under this condition, the power supply is switched and the input of each semiconductor switch is By comparing the voltage and output voltage to check the operation, it is possible to check the switching operation while power is being supplied to the load, regardless of whether there is an abnormality in the switching circuit.

C 従来の技術 第3図は、バイパス回路を備えた無停電電源装
置を示し、同図において1はインバータ、TSi,
TScは半導体スイツチとしてのサイリスタスイツ
チ、MCCB1〜MCCB3は電磁しや断器である。こ
のような装置においては、サイリスタスイツチ
TSi,TScをオンまたはオフさせて同期切り換え
を行うことによつてインバータ1とバイパスとの
間で電源の選択が行われる。そして例えばインバ
ータ1からバイパスへの同期切換え動作を点検す
るためには、従来では実際にインバータ1からバ
イパスへ同期切換えを行うことによつて異常の有
無を確認するようにしていた。
C. Prior Art Figure 3 shows an uninterruptible power supply equipped with a bypass circuit, in which 1 is an inverter, TSi,
TSc is a thyristor switch as a semiconductor switch, and MCCB 1 to MCCB 3 are electromagnetic switches. In such devices, the thyristor switch
The power supply is selected between the inverter 1 and the bypass by synchronously switching TSi and TSc on and off. For example, in order to check the synchronous switching operation from the inverter 1 to the bypass, conventionally the synchronous switching from the inverter 1 to the bypass was actually performed to check for abnormalities.

D 考案が解決しようとする問題点 しかしながら従来の点検方法では、例えば同期
切換回路に異常が生じてオンにすべきサイリスタ
スイツチTScがオフのままになつている場合、イ
ンバータからバイパス側へ電源を切り換えた時に
負荷母線が無電圧になつて負荷への給電が断た
れ、システムダウンを招くという問題がある。
D Problems that the invention aims to solve However, with the conventional inspection method, if, for example, an abnormality occurs in the synchronous switching circuit and the thyristor switch TSc that should be turned on remains off, the power is switched from the inverter to the bypass side. There is a problem in that when the load bus line becomes non-voltage, the power supply to the load is cut off, resulting in a system down.

本考案はこのような問題点を解決しようとする
ものであり、切換え回路や半導体スイツチ等の異
常の有無にかかわらず負荷に給電したまま切換え
の動作点検が行える点検装置を提供することを目
的とするものである。
The present invention is an attempt to solve these problems, and the purpose is to provide an inspection device that can inspect the switching operation while supplying power to the load, regardless of whether there is an abnormality in the switching circuit or semiconductor switch. It is something to do.

E 問題点を解決するための手段 本考案は、インバータ及びバイパス電源の各半
導体スイツチの出力側と負荷との間を開閉する第
1の開閉手段と、負荷への給電を行つているイン
バータ側の半導体スイツチの入力端子と前記第1
の開閉手段の出力端子間を短絡するよう、当該半
導体スイツチの入力側と前記第1の開閉手段の負
荷側との間を開閉する第2の開閉手段と、バイパ
ス側の商用電源と該電源側の半導体スイツチの入
力側との間を開閉する第3の開閉手段と、バイパ
ス電源用半導体スイツチの入力側とインバータ用
半導体スイツチの入力側端子間を開閉する第4の
開閉手段と、各半導体スイツチの入出力側の電圧
を比較してその比較結果にもとづき給電の切り換
えの動作確認を行う比較手段とを備えて成るもの
である。
E. Means for Solving Problems The present invention provides a first switching means for switching between the output side of each semiconductor switch of the inverter and bypass power supply and the load, and a first switching means for switching between the output side of each semiconductor switch of the inverter and the bypass power supply and the load, and The input terminal of the semiconductor switch and the first
a second switching means for opening and closing between the input side of the semiconductor switch and the load side of the first switching means so as to short-circuit the output terminals of the switching means; a commercial power supply on the bypass side and the power supply side; a third opening/closing means for opening and closing between the input side of the semiconductor switch for the bypass power supply and the input side terminal of the semiconductor switch for the inverter; and comparing means for comparing the voltages on the input and output sides of the power supply and confirming the operation of switching the power supply based on the comparison result.

F 作用 前記第2の開閉手段を閉成して一方の電源(イ
ンバータ)から負荷への給電を継続したまま前記
第1の開閉手段を開成して、しかる後に前記第3
の開閉手段及び第4の開閉手段を夫々開成及び閉
成することにより一方の電源(インバータ)から
バイパス電源側の半導体スイツチを通して給電
し、この状態の下で給電切換え指令を発して前記
比較手段により給電の切換えの動作確認を行う。
F Effect The second switching means is closed and the first switching means is opened while the power supply from one power source (inverter) to the load is continued, and then the third switching means is opened.
By opening and closing the opening/closing means and the fourth opening/closing means, respectively, power is supplied from one power supply (inverter) through the semiconductor switch on the bypass power supply side, and under this state, a power supply switching command is issued and the comparison means Check the operation of power supply switching.

G 実施例 第1図は本考案の実施例を示す回路図である。
MC1は、半導体スイツチTSc,TSiの接続点と負
荷との間を開閉する第1の開閉手段としての電磁
接触器である。NC2は、半導体スイツチTSiの入
力側と前記電磁接触器MC1の負荷側との間を開
閉する第2の開閉手段としての電磁接触器であ
り、閉成時に半導体スイツチTSiと電磁接触器
MC1の入出力端子間を短絡する。バイパス電源
と当該バイパス側の半導体スイツチTScとの間に
は、第3の開閉手段としての電磁接触器MC3
設けられ、この電磁接触器MC3は、開成時にバ
イパス電源から半導体スイツチTScを切り離す。
インバータ用半導体スイツチTSiの入力側とバイ
パス側の半導体スイツチTScの入力側との間には
第4の開閉手段としての電磁接触器MC4が設け
られ、この電磁接触器MC4を閉成し他方の接触
器MC3を開路した時にインバータ1からバイパ
ス側の半導体スイツチTScに給電される。2は突
き合わせ回路であり、この突き合わせ回路2は、
各半導体スイツチTSc,TSiの双方の入力側の電
圧と出力側の電圧との偏差分を取り出す。尚図中
1,32は絶縁回路である。4はコンパレータで
あり、前記突き合わせ回路2よりの偏差分が予め
設定した設定信号よりも大きければ、切り換え回
路の異常を知らせるための出力信号が発せられ
る。この実施例では突き合わせ回路2及びコンパ
レータ4により、各半導体スイツチTSc,TSiの
動作確認を行うための比較手段5が構成される。
G. Embodiment FIG. 1 is a circuit diagram showing an embodiment of the present invention.
MC 1 is an electromagnetic contactor serving as a first switching means for switching between the connection point of the semiconductor switches TSc and TSi and the load. NC 2 is an electromagnetic contactor as a second switching means for opening and closing between the input side of the semiconductor switch TSi and the load side of the electromagnetic contactor MC 1 , and when closed, the semiconductor switch TSi and the electromagnetic contactor are connected.
Short-circuit between the input and output terminals of MC 1 . An electromagnetic contactor MC 3 as a third switching means is provided between the bypass power supply and the semiconductor switch TSc on the bypass side, and this electromagnetic contactor MC 3 disconnects the semiconductor switch TSc from the bypass power supply when opened. .
A magnetic contactor MC 4 as a fourth switching means is provided between the input side of the semiconductor switch TSi for the inverter and the input side of the semiconductor switch TSc on the bypass side. When the contactor MC3 is opened, power is supplied from the inverter 1 to the semiconductor switch TSc on the bypass side. 2 is a matching circuit, and this matching circuit 2 is
The deviation between the voltage on the input side and the voltage on the output side of both semiconductor switches TSc and TSi is extracted. Note that 3 1 and 3 2 in the figure are insulated circuits. 4 is a comparator, and if the deviation from the matching circuit 2 is larger than a preset setting signal, an output signal is generated to notify of an abnormality in the switching circuit. In this embodiment, the matching circuit 2 and the comparator 4 constitute a comparing means 5 for checking the operation of each semiconductor switch TSc, TSi.

次に上述実施例の装置により、インバータ1か
らバイパスへと切換える場合の点検時の動作につ
いて述べる。
Next, the operation at the time of inspection when switching from inverter 1 to bypass using the apparatus of the above-described embodiment will be described.

先ず点検指令が出されると、電磁接触器MC2
が閉成され、続いて電磁接触器MC1が開成され
る。これによつてインバータ1側の半導体スイツ
チTSiの入力側と接触器MC1の出力端子間が短絡
されて、インバータ1から電磁接触器MC2を経
て負荷して給電されると共に、各半導体スイツチ
TSi,TScの接続点が負荷から切離される。その
後電磁接触器MC3が開成されてから、電磁接触
器MC4が閉成される。これによつてバイパス側
の半導体スイツチTScへの給電がバイパス側から
インバータ1へ移行する。この状態のもとでイン
バータ1からバイパスへの給電切換え指令を発
し、切換え動作に異常があるか否かが判定され
る。この判定については、切換えが正常に行われ
れば、その間半導体スイツチTSi,TScの少なく
とも一方がオン状態にあるから、半導体スイツチ
TSi,TScの入出力端子間の電位は略等しく、こ
のためコンパレータ4の出力レベル「L」であつ
て、正常と判定されると共に、切換えが正常に行
われない場合、例えば非同期で切換わるか切換え
ができなければ、コンパレータ4から「H」レベ
ルの信号が出力されて、異常有りと判定される。
そして正常と判定された場合は、その後上述の逆
の動作に従つて電磁接触器MC1〜MC4が操作さ
れる。即ち先ず電磁接触器MC4が開成され、続
いて電磁接触器MC3が閉成されて、バイパス側
の半導体スイツチTScへの給電がバイパス側に戻
る。その後電磁接触器MC1が閉成されてから電
磁接触器MC2が開成され、これによりバイパス
側から半導体スイツチTScを介して負荷に給電さ
れバイパス側への給電が完了し、こうして切り換
え動作の点検が終了する。なお、バイパス側より
インバータへの給電切換え時の動作確認中述上し
たと同様な操作で行なわれる。
First, when an inspection command is issued, the magnetic contactor MC 2
is closed, and then magnetic contactor MC 1 is opened. As a result, the input side of the semiconductor switch TSi on the inverter 1 side and the output terminal of the contactor MC 1 are short-circuited, and power is loaded and supplied from the inverter 1 via the magnetic contactor MC 2 , and each semiconductor switch
The connection point of TSi and TSc is disconnected from the load. Thereafter, the electromagnetic contactor MC 3 is opened, and then the electromagnetic contactor MC 4 is closed. As a result, the power supply to the semiconductor switch TSc on the bypass side is transferred from the bypass side to the inverter 1. Under this condition, a command to switch the power supply to the bypass is issued from the inverter 1, and it is determined whether there is an abnormality in the switching operation. Regarding this judgment, if the switching is performed normally, at least one of the semiconductor switches TSi and TSc will be in the on state during that time.
The potentials between the input and output terminals of TSi and TSc are approximately equal, so the output level of comparator 4 is "L" and is determined to be normal.If switching is not performed normally, for example, it may be switched asynchronously. If switching is not possible, an "H" level signal is output from the comparator 4, and it is determined that there is an abnormality.
If it is determined to be normal, then the electromagnetic contactors MC 1 to MC 4 are operated in accordance with the reverse operation described above. That is, first, the electromagnetic contactor MC 4 is opened, then the electromagnetic contactor MC 3 is closed, and the power supply to the semiconductor switch TSc on the bypass side returns to the bypass side. After that, the magnetic contactor MC 1 is closed, and then the magnetic contactor MC 2 is opened, and as a result, power is supplied from the bypass side to the load via the semiconductor switch TSc, and the power supply to the bypass side is completed. In this way, the switching operation can be inspected. ends. Note that operations similar to those described above are performed during operation confirmation when switching power supply from the bypass side to the inverter.

ここで本考案は、インバータとバイパスとの間
で給電の切換えを行う装置に限定されるものでは
なく、これ以外の他の2つの電源との間で給電の
切換えを行う装置に適用することができる。
Here, the present invention is not limited to a device that switches power supply between an inverter and a bypass, but can be applied to a device that switches power supply between two other power sources. can.

第2図は、2つの電源A,B間で給電の切換え
を行う装置に適用した他の実施例を示す回路図で
あり、この実施例では電源Aから電源Bに給電を
切り換える場合の点検とその逆で電源Bから電源
Aに給電を切換える場合の点検との双方を行うこ
とができる機能を備えている。第2図中スイツチ
SW1,SW2は夫々第1の開閉手段及び第2の開閉
手段に対応するものであり、スイツチSW2,SW4
は、共に第3の開閉手段、第4の開閉手段に対応
するものである。例えば電源Aから負荷に給電さ
れている場合には、スイツチSW1は閉成されてい
る。またスイツチSW2、スイツチSW3及びSW4
夫々接点a側に切換えられている。ここで電源A
から電源Bへの給電の切り換えの動作を点検する
ためには、スイツチSW1を開成し、電源Aからス
イツチSW2を介して負荷に給電されると共に半導
体スイツチTSA,TSBはいずれも電源Aから給電
されるので、先の実施例と同様にして点検を行う
ことができる。また電源Bから負荷に給電をして
いて、電源Bから電源Aへの給電の切換え動作を
確認する場合には、スイツチSW2〜SW4をいずれ
も接点bに切換えることによつて行うことができ
る。
FIG. 2 is a circuit diagram showing another embodiment applied to a device that switches the power supply between two power supplies A and B. In this embodiment, the inspection and On the other hand, it has a function that can perform both checks when switching the power supply from power supply B to power supply A. Switch in Figure 2
SW 1 and SW 2 correspond to the first opening/closing means and the second opening/closing means, respectively, and the switches SW 2 and SW 4
Both correspond to the third opening/closing means and the fourth opening/closing means. For example, when power is being supplied to the load from the power source A, the switch SW1 is closed. Further, the switches SW 2 , SW 3 and SW 4 are each switched to the contact a side. Here power supply A
In order to check the operation of switching the power supply from the power supply A to the power supply B, switch SW 1 is opened, and power is supplied from the power supply A to the load via the switch SW 2 , and the semiconductor switches TS A and TS B are both connected to the power supply. Since power is supplied from A, inspection can be performed in the same manner as in the previous embodiment. Also, if power is being supplied to the load from power supply B and you want to check the switching operation of power supply from power supply B to power supply A, you can do this by switching all switches SW 2 to SW 4 to contact b. can.

H 考案の効果 以上のように本考案は、一方の半導体スイツチ
の入力端子と負荷側の開閉器の出力端子間を短絡
して、この短絡電路を通じて負荷を給電すると共
に、双方の半導体スイツチに一方の電源のみから
給電しておいて、各半導体スイツチの入出力電圧
差にもとづいて切換え時の異常の有無を確認する
ようにしたものである。従つて本考案によれば切
換え回路や半導体スイツチ等の異常の有無にかか
わらず負荷に給電したまま切換えの動作点検が行
える。また、例えばインバータとバイパス電源と
の間で切換えを行う場合、バイパス側を切り離
し、当該バイパス側の半導体スイツチにインバー
タから給電しているため、インバータ側の半導体
スイツチが故障してもバイパスからインバータへ
横流が流れて、インバータを停止させることがな
い。更に電源を切換える場合、切り換え動作の異
常のないことを確認してから切換えることができ
るためシステムの信頼性が一段と向上する。
H. Effects of the invention As described above, the invention short-circuits the input terminal of one semiconductor switch and the output terminal of the load-side switch, supplies power to the load through this short-circuited circuit, and connects both semiconductor switches to one side. In this system, power is supplied only from the power source of the semiconductor switch, and the presence or absence of an abnormality at the time of switching is checked based on the input/output voltage difference of each semiconductor switch. Therefore, according to the present invention, the switching operation can be inspected while power is being supplied to the load, regardless of whether there is any abnormality in the switching circuit or semiconductor switch. In addition, when switching between an inverter and a bypass power supply, for example, the bypass side is disconnected and power is supplied from the inverter to the semiconductor switch on the bypass side, so even if the semiconductor switch on the inverter side fails, the power supply is switched from the bypass to the inverter. The inverter will not stop due to cross current. Furthermore, when switching the power source, the reliability of the system is further improved because it can be done after confirming that there is no abnormality in the switching operation.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す回路図、第2
図は本考案の他の実施例を示す回路図、第3図は
従来例を示す回路図である。 1……インバータ、TSc,TSi,TSA及びTSB
……半導体スイツチ、2……突き合わせ回路、4
……コンパレータ、5……比較手段、MC1
MC4……電磁接触器、A,B……電源、SW1
SW4……スイツチ。
Figure 1 is a circuit diagram showing one embodiment of the present invention;
The figure is a circuit diagram showing another embodiment of the present invention, and FIG. 3 is a circuit diagram showing a conventional example. 1...Inverter, TSc, TSi, TS A and TS B
... Semiconductor switch, 2 ... Matching circuit, 4
... Comparator, 5 ... Comparison means, MC 1 ~
MC 4 ...Magnetic contactor, A, B...Power supply, SW 1 ,
SW 4 ...Switch.

Claims (1)

【実用新案登録請求の範囲】 互に並列に接続された一方及び他方の電源の間
で、各電源に夫々接続された各半導体スイツチに
より負荷への給電を切換えるものであつて、その
切換え時の動作点検を行う電源切換え点検装置に
おいて、 各半導体スイツチの接続点と負荷との間を開閉
する第1の開閉手段と、負荷への給電を行つてい
る一方の半導体スイツチの入力端子と前記第1の
開閉手段の出力端子を短絡する第2の開閉手段
と、前記他方の電源と該電源側の半導体スイツチ
の入力側との間を開閉する第3の開閉手段と、前
記一方の電源側の半導体スイツチの入力端子と他
の電源側の半導体スイツチの入力端子間を開閉す
る第4の開閉手段と、各半導体スイツチの入出力
側の電圧を比較してその比較結果にもとづき給電
の切換え動作確認を行う比較手段とを備え、 前記第2の開閉手段を閉成してから前記第1の
開閉手段を開成して、一方の電源から第2の開閉
手段を介して負荷に給電すると共に、前記第3の
開閉手段及び第4の開閉手段を夫々開成及び閉成
することにより一方の電源から他方の電源側の半
導体スイツチへ給電し、この状態の下で給電切換
え指令を発して前記比較手段により給電の切換え
の動作確認を行うことを特徴とする電源切換え点
検装置。
[Scope of Claim for Utility Model Registration] A device for switching the power supply to a load between one power supply and the other power supply connected in parallel with each other by means of semiconductor switches respectively connected to each power supply, and at the time of switching. In a power supply switching inspection device that performs operation inspection, a first opening/closing means opens and closes between the connection point of each semiconductor switch and the load, and an input terminal of one of the semiconductor switches that supplies power to the load and the first switching means. a second switching means for short-circuiting the output terminal of the switching means; a third switching means for opening and closing between the other power source and the input side of the semiconductor switch on the power source side; and a semiconductor switch on the one power source side. Compare the voltage on the input/output side of each semiconductor switch with the fourth switching means that opens and closes between the input terminal of the switch and the input terminal of the semiconductor switch on the other power supply side, and check the switching operation of the power supply based on the comparison result. and a comparing means for closing the second switching means and then opening the first switching means to supply power from one power source to the load via the second switching means, and By opening and closing the switching means 3 and the fourth switching means, respectively, power is supplied from one power supply to the semiconductor switch on the other power supply side, and in this state, a power supply switching command is issued and power is supplied by the comparison means. A power supply switching inspection device characterized by confirming switching operation.
JP15228385U 1985-10-04 1985-10-04 Expired JPH0436208Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15228385U JPH0436208Y2 (en) 1985-10-04 1985-10-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15228385U JPH0436208Y2 (en) 1985-10-04 1985-10-04

Publications (2)

Publication Number Publication Date
JPS6261137U JPS6261137U (en) 1987-04-16
JPH0436208Y2 true JPH0436208Y2 (en) 1992-08-26

Family

ID=31070120

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15228385U Expired JPH0436208Y2 (en) 1985-10-04 1985-10-04

Country Status (1)

Country Link
JP (1) JPH0436208Y2 (en)

Also Published As

Publication number Publication date
JPS6261137U (en) 1987-04-16

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