JPH04339247A - Automatic inspecting device for flaw of solar battery - Google Patents

Automatic inspecting device for flaw of solar battery

Info

Publication number
JPH04339247A
JPH04339247A JP1547691A JP1547691A JPH04339247A JP H04339247 A JPH04339247 A JP H04339247A JP 1547691 A JP1547691 A JP 1547691A JP 1547691 A JP1547691 A JP 1547691A JP H04339247 A JPH04339247 A JP H04339247A
Authority
JP
Japan
Prior art keywords
solar battery
image
image signal
light
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1547691A
Other languages
Japanese (ja)
Inventor
Tamayasu Yoshikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1547691A priority Critical patent/JPH04339247A/en
Publication of JPH04339247A publication Critical patent/JPH04339247A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To inspect the flaw of a solar battery within a short time on the basis of a definite inspection standard.
CONSTITUTION: The light emitted from a light source 2 is condensed in an emitting part 3 to irradiate the surface of a solar battery 1 and a light detecting part 4 detects the scattering reflected light from the surface of the solar battery to output the image signal proportional to the quantity of light. A quaternarizing circuit 5 allows the position signals S from a surface scanning means 10 scanning the surface of the solar battery 1 to correspond to an image signal to convert the signal to a quaternarized multivalved image signal. The image formed by the multivalent image signal is set to the image of a predetermined region in a region determining part 6 and this image is converted to an image component showing flaws and dust in an unnecessary part erasing part 7 and further set only to an image showing flaws in a single point erasing part 8 and it is judged whether the surface of the solar battery has flaws larger than ones of a area preset by an area judging part 9 and the judgment result is outputted from the area judging part 9.
COPYRIGHT: (C)1992,JPO&Japio
JP1547691A 1991-02-06 1991-02-06 Automatic inspecting device for flaw of solar battery Pending JPH04339247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1547691A JPH04339247A (en) 1991-02-06 1991-02-06 Automatic inspecting device for flaw of solar battery

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1547691A JPH04339247A (en) 1991-02-06 1991-02-06 Automatic inspecting device for flaw of solar battery

Publications (1)

Publication Number Publication Date
JPH04339247A true JPH04339247A (en) 1992-11-26

Family

ID=11889855

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1547691A Pending JPH04339247A (en) 1991-02-06 1991-02-06 Automatic inspecting device for flaw of solar battery

Country Status (1)

Country Link
JP (1) JPH04339247A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008026113A (en) * 2006-07-20 2008-02-07 Japan Aerospace Exploration Agency Defect inspection device of solar cell and method for inspecting defect of solar cell
CN102435611A (en) * 2011-09-20 2012-05-02 江阴鑫辉太阳能有限公司 Electroluminescence automatic imaging apparatus
JP2015129662A (en) * 2014-01-07 2015-07-16 株式会社島津製作所 Visual inspection device and visual inspection method
JP2015173268A (en) * 2005-10-11 2015-10-01 ビーティー イメージング ピーティーワイ リミテッド Method and system for inspecting indirect bandgap semiconductor structure

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015173268A (en) * 2005-10-11 2015-10-01 ビーティー イメージング ピーティーワイ リミテッド Method and system for inspecting indirect bandgap semiconductor structure
US9909991B2 (en) 2005-10-11 2018-03-06 Bt Imaging Pty Limited Method and system for inspecting indirect bandgap semiconductor structure
JP2008026113A (en) * 2006-07-20 2008-02-07 Japan Aerospace Exploration Agency Defect inspection device of solar cell and method for inspecting defect of solar cell
CN102435611A (en) * 2011-09-20 2012-05-02 江阴鑫辉太阳能有限公司 Electroluminescence automatic imaging apparatus
JP2015129662A (en) * 2014-01-07 2015-07-16 株式会社島津製作所 Visual inspection device and visual inspection method

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