JPH0432967A - Clitical examination total information system - Google Patents

Clitical examination total information system

Info

Publication number
JPH0432967A
JPH0432967A JP6704790A JP6704790A JPH0432967A JP H0432967 A JPH0432967 A JP H0432967A JP 6704790 A JP6704790 A JP 6704790A JP 6704790 A JP6704790 A JP 6704790A JP H0432967 A JPH0432967 A JP H0432967A
Authority
JP
Japan
Prior art keywords
time
examined
examination
delayed
possibly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6704790A
Other languages
Japanese (ja)
Inventor
Toshiyuki Ikeda
Takeshi Sato
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6704790A priority Critical patent/JPH0432967A/en
Publication of JPH0432967A publication Critical patent/JPH0432967A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To prevent an examination from being delayed by checking a flow of information on bodies to be examined successively with time and warning an operator of a body to be examined which possibly exceeds a prescribed Turn Around Time (time from the acceptance of the body to be examined in an examination room to the reporting of the examination result) and an examined body which exceeds the time.
CONSTITUTION: The time begins to be measured after a body to be examined arrives and its acceptance processing is completed and the time measurement is carried on until respective analyzer 1 - 3 and control terminals 6 - 8 inquires about examined body measurement request information within the prescribed time; when the constant time is exceeded, an examination report is possibly delayed, so a 1st-level alarm is generated. Then it is checked continuously that the examination result arrives within the constant time after the inquiry amount the examined body measurement request information and when the constant time is exceeded, it is considered analyzing operation is possibly delayed and a 2nd-level alarm is generated. Consequently, the delay of the examination is prevented.
COPYRIGHT: (C)1992,JPO&Japio
JP6704790A 1990-03-19 1990-03-19 Clitical examination total information system Pending JPH0432967A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6704790A JPH0432967A (en) 1990-03-19 1990-03-19 Clitical examination total information system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6704790A JPH0432967A (en) 1990-03-19 1990-03-19 Clitical examination total information system

Publications (1)

Publication Number Publication Date
JPH0432967A true JPH0432967A (en) 1992-02-04

Family

ID=13333541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6704790A Pending JPH0432967A (en) 1990-03-19 1990-03-19 Clitical examination total information system

Country Status (1)

Country Link
JP (1) JPH0432967A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000046835A (en) * 1998-07-30 2000-02-18 Hitachi Ltd System and method for inspecting specimen
JP2005108209A (en) * 2003-09-11 2005-04-21 Mitsubishi Kagaku Bio-Clinical Laboratories Inc Clinical trial examination management system
JP2008175736A (en) * 2007-01-19 2008-07-31 Fujitsu Ltd Abnormality warning system for apparatus, abnormality warning method for apparatus and abnormality warning program for apparatus
JP2008216263A (en) * 2008-04-07 2008-09-18 Toshiba Corp Automatic analyzer
JP2010249839A (en) * 2010-06-30 2010-11-04 Toshiba Corp Automatic analyzer
WO2012039146A1 (en) * 2010-09-24 2012-03-29 コニカミノルタエムジー株式会社 Inspection reservation server and inspection reservation system
JP2012141149A (en) * 2010-12-28 2012-07-26 Sysmex Corp Specimen processing system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS646554B2 (en) * 1982-11-11 1989-02-03 Hitachi Ltd

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS646554B2 (en) * 1982-11-11 1989-02-03 Hitachi Ltd

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000046835A (en) * 1998-07-30 2000-02-18 Hitachi Ltd System and method for inspecting specimen
JP2005108209A (en) * 2003-09-11 2005-04-21 Mitsubishi Kagaku Bio-Clinical Laboratories Inc Clinical trial examination management system
JP2008175736A (en) * 2007-01-19 2008-07-31 Fujitsu Ltd Abnormality warning system for apparatus, abnormality warning method for apparatus and abnormality warning program for apparatus
JP2008216263A (en) * 2008-04-07 2008-09-18 Toshiba Corp Automatic analyzer
JP2010249839A (en) * 2010-06-30 2010-11-04 Toshiba Corp Automatic analyzer
WO2012039146A1 (en) * 2010-09-24 2012-03-29 コニカミノルタエムジー株式会社 Inspection reservation server and inspection reservation system
JP2012141149A (en) * 2010-12-28 2012-07-26 Sysmex Corp Specimen processing system

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