JPH0432532U - - Google Patents
Info
- Publication number
- JPH0432532U JPH0432532U JP7352590U JP7352590U JPH0432532U JP H0432532 U JPH0432532 U JP H0432532U JP 7352590 U JP7352590 U JP 7352590U JP 7352590 U JP7352590 U JP 7352590U JP H0432532 U JPH0432532 U JP H0432532U
- Authority
- JP
- Japan
- Prior art keywords
- lead
- laser beam
- laser
- laser oscillator
- oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011179 visual inspection Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000005452 bending Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7352590U JPH0432532U (zh) | 1990-07-11 | 1990-07-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7352590U JPH0432532U (zh) | 1990-07-11 | 1990-07-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0432532U true JPH0432532U (zh) | 1992-03-17 |
Family
ID=31612413
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7352590U Pending JPH0432532U (zh) | 1990-07-11 | 1990-07-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0432532U (zh) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003167022A (ja) * | 2001-12-04 | 2003-06-13 | Seiko Epson Corp | 部品検出方法、部品検出装置、ｉｃハンドラ及びｉｃ検査装置 |
| WO2020070880A1 (ja) * | 2018-10-05 | 2020-04-09 | 株式会社Ｆｕｊｉ | 測定装置及び部品実装機 |
-
1990
- 1990-07-11 JP JP7352590U patent/JPH0432532U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003167022A (ja) * | 2001-12-04 | 2003-06-13 | Seiko Epson Corp | 部品検出方法、部品検出装置、ｉｃハンドラ及びｉｃ検査装置 |
| WO2020070880A1 (ja) * | 2018-10-05 | 2020-04-09 | 株式会社Ｆｕｊｉ | 測定装置及び部品実装機 |
| JPWO2020070880A1 (ja) * | 2018-10-05 | 2021-04-01 | 株式会社Ｆｕｊｉ | 測定装置及び部品実装機 |