JPH04321773A - Power integrated circuit for automobile - Google Patents
Power integrated circuit for automobileInfo
- Publication number
- JPH04321773A JPH04321773A JP3087119A JP8711991A JPH04321773A JP H04321773 A JPH04321773 A JP H04321773A JP 3087119 A JP3087119 A JP 3087119A JP 8711991 A JP8711991 A JP 8711991A JP H04321773 A JPH04321773 A JP H04321773A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- region
- diode
- battery
- side switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 42
- 230000006378 damage Effects 0.000 abstract description 5
- 230000003071 parasitic effect Effects 0.000 abstract description 5
- 239000010410 layer Substances 0.000 description 13
- 239000000758 substrate Substances 0.000 description 12
- 238000010586 diagram Methods 0.000 description 9
- 230000007257 malfunction Effects 0.000 description 7
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000002344 surface layer Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Landscapes
- Ignition Installations For Internal Combustion Engines (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electronic Switches (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、自動車の誘電性負荷等
に対するスイッチングのためのパワー半導体スイッチン
グ素子とその制御回路, 駆動回路等を一つの半導体基
板中および上に構成した自動車用パワー集積回路に関す
る。[Industrial Application Field] The present invention relates to a power integrated circuit for an automobile in which a power semiconductor switching element for switching dielectric loads of an automobile, a control circuit thereof, a driving circuit, etc. are constructed in and on a single semiconductor substrate. Regarding.
【0002】0002
【従来の技術】自動車に搭載されている各種電気装置は
バッテリを電源としている。そしてバッテリと負荷であ
る電気装置の間に半導体スイッチング素子が接続される
。図2は、半導体スイッチング素子と同一半導体基板中
および上に制御回路, 駆動回路等を集積したインテリ
ジェントパワー半導体スイッチを用いた例を示し、バッ
テリ20の正端子と一方の端子が接地される負荷3との
間にインテリジェントパワー半導体ハイサイドスイッチ
21が接続される場合と一方の端子がバッテリ20の正
端子に接続される負荷3の他方の端子にインテリジェン
トパワー半導体ローサイドスイッチ22が接続される場
合とがある。2. Description of the Related Art Various electrical devices installed in automobiles use batteries as a power source. A semiconductor switching element is connected between the battery and the electrical device that is the load. FIG. 2 shows an example using an intelligent power semiconductor switch in which a control circuit, a drive circuit, etc. are integrated in and on the same semiconductor substrate as a semiconductor switching element. The intelligent power semiconductor high-side switch 21 is connected between the load 3 and the intelligent power semiconductor low-side switch 22 is connected to the other terminal of the load 3 whose one terminal is connected to the positive terminal of the battery 20. be.
【0003】図3はインテリジェントパワー半導体ハイ
サイドスイッチを示し、スイッチング素子としてのパワ
ーMOSFET1のゲートに抵抗Rg を介して接続さ
れる駆動回路, 制御回路等の付属回路11, MOS
FET12, ツエナダイオード13などを同一半導体
基板に備えている。そして、特にパワーMOSFETの
ソースに接続される出力端子 (OUT) に誘導性の
負荷を接続してスイッチングを行った場合にターンオフ
時にOUT端子が大きな負の電位になった際、その電位
が接続点14の電位に対してツエナダイオード13のツ
エナ電圧を越えて負に深くなると、接続点14からMO
SFET12を経て電流が流れ、Rg を介してパワー
MOSFET1にゲート電圧を印加することにより、パ
ワーMOSFET1自身が出力オンしてターンオフ時の
エネルギーを吸収する。図4は、インテリジェントパワ
ー半導体ローサイドスイッチを示し、パワーMOSFE
T1のドレイン端子が出力端子 (OUT) となり、
MOSFET12等も含む付属回路15をMOSFET
と同一半導体基板に備え、MOSFET1のゲートと抵
抗Rg を介して接続されている。FIG. 3 shows an intelligent power semiconductor high-side switch, which includes ancillary circuits 11 such as a drive circuit and a control circuit, and a MOS connected to the gate of a power MOSFET 1 as a switching element via a resistor Rg.
A FET 12, a Zener diode 13, etc. are provided on the same semiconductor substrate. In particular, when switching is performed by connecting an inductive load to the output terminal (OUT) connected to the source of the power MOSFET, when the OUT terminal becomes a large negative potential at turn-off, that potential is transferred to the connection point. When the potential of the zener diode 13 exceeds the zener voltage of the zener diode 13 and becomes deeply negative, the MO from the connection point 14
A current flows through SFET 12, and by applying a gate voltage to power MOSFET 1 via Rg, power MOSFET 1 itself turns on its output and absorbs the energy at turn-off. Figure 4 shows an intelligent power semiconductor low-side switch, power MOSFE
The drain terminal of T1 becomes the output terminal (OUT),
The attached circuit 15 including MOSFET 12 etc. is connected to MOSFET.
It is provided on the same semiconductor substrate as , and is connected to the gate of MOSFET 1 via a resistor Rg.
【0004】0004
【発明が解決しようとする課題】バッテリが誤って逆接
続されたときには、図3のハイサイドスイッチでは、接
地端子 (GND) から電流I1 が付属回路11に
流入し、図4のローサイドスイッチには付属回路15か
らバッテリに向けて電流I2 が流出することにより、
付属回路11あるいは15が破壊してしまう。これを防
止するために、図5に示すようにハイサイドスイッチ2
1にはGND端子に直列に電流流入制限用ダイオード4
1を、ローサイドスイッチ22には電源端子 (Vcc
) に直列に電流流出制限用ダイオード42を接続する
必要がある。従来このようなダイオードは外付けで接続
していたが、そのような外部接続を省略できることが望
ましい。しかし、図6に示すように自己分離技術を用い
てパワーMOSFETとダイオードを同一基板中に作成
した場合にも問題がある。図の右側はパワーMOSFE
Tの部分で、n+ シリコン基板51に積層されたn−
シリコン層52の表面層内にp+ 領域53が選択的
に形成されp+ 領域53の表面層内にさらにn+ ソ
ース領域54が選択的に形成されている。p+領域53
のn− 層52とn+ 領域54にはさまれた部分がチ
ャネル部で、その上にゲート酸化膜となるシリコン酸化
膜55を介して低抵抗のn+ 多結晶Siからなりゲー
ト端子Gに接続されたゲート電極56が備えられており
、ゲート電極56とPSG膜57により絶縁され、ソー
ス端子Sに接続されたAl−Si合金よりなるソース電
極58はp+ 領域53およびn+ 領域54に共通に
接触している。一方、n+ 層51にはドレイン電極5
9が接触している。図の左側はパワーMOSFETと分
離された集積ダイオードで、n− 層52の表面層内に
選択的に形成されたp+ アノード領域61とその表面
層内に選択的に形成されたn+ カソード領域62より
なり、アノード領域61にはアノード端子Aに接続され
たアノード電極63が、またカソード領域62にはカソ
ード端子Kに接続されたカソード電極64が接触してい
る。[Problem to be Solved by the Invention] When the battery is accidentally reversely connected, current I1 flows from the ground terminal (GND) to the attached circuit 11 in the high-side switch of FIG. 3, and the low-side switch of FIG. As the current I2 flows out from the attached circuit 15 toward the battery,
The attached circuit 11 or 15 will be destroyed. In order to prevent this, the high side switch 2
1 has a current inflow limiting diode 4 in series with the GND terminal.
1, and the low side switch 22 has a power supply terminal (Vcc
) It is necessary to connect a current outflow limiting diode 42 in series. Conventionally, such diodes have been connected externally, but it is desirable to be able to omit such external connections. However, there are also problems when a power MOSFET and a diode are fabricated on the same substrate using self-separation technology, as shown in FIG. The right side of the diagram is the power MOSFE
At the T portion, the n− layered on the n+ silicon substrate 51
A p+ region 53 is selectively formed in the surface layer of silicon layer 52, and an n+ source region 54 is further selectively formed in the surface layer of p+ region 53. p+ region 53
The part sandwiched between the n- layer 52 and the n+ region 54 is the channel part, which is made of low-resistance n+ polycrystalline Si and is connected to the gate terminal G via a silicon oxide film 55 that becomes a gate oxide film. A source electrode 58 made of an Al-Si alloy is insulated from the gate electrode 56 by a PSG film 57, and connected to the source terminal S. A source electrode 58 made of an Al-Si alloy is in common contact with the p+ region 53 and the n+ region 54. ing. On the other hand, the n+ layer 51 has a drain electrode 5
9 are in contact. On the left side of the figure is an integrated diode separated from the power MOSFET, which has a p+ anode region 61 selectively formed in the surface layer of the n- layer 52 and an n+ cathode region 62 selectively formed in the surface layer. An anode electrode 63 connected to an anode terminal A is in contact with the anode region 61, and a cathode electrode 64 connected to a cathode terminal K is in contact with the cathode region 62.
【0005】図6のような半導体素体中には、n− 層
52, p+ 領域61, n+ 領域62よりなるn
pnトランジスタ構造が生ずるため、この寄生トランジ
スタがオンすることにより大きな電流が流れて破壊に至
りやすい。それ故、寄生トランジスタの電流増幅率の増
大を招くダイオードの逆耐電圧を高くすることは望めな
いという欠点があった。In a semiconductor element as shown in FIG.
Since a pn transistor structure is generated, when this parasitic transistor is turned on, a large current flows, which tends to lead to destruction. Therefore, there is a drawback that it is impossible to increase the reverse withstand voltage of the diode, which would increase the current amplification factor of the parasitic transistor.
【0006】本発明の目的は、バッテリ逆接続時の付属
回路の破壊を防ぐための直列接続ダイオードの逆耐電圧
を自由に選ぶことのできるパワー集積回路を提供するこ
とにある。An object of the present invention is to provide a power integrated circuit in which the reverse withstand voltage of series-connected diodes can be freely selected in order to prevent damage to attached circuits when a battery is reversely connected.
【0007】[0007]
【課題を解決するための手段】上記の目的を達成するた
めに、本発明の自動車用パワー集積回路は、一つの半導
体素体に形成されたMOS型スイッチング素子およびそ
の付属回路と、その半導体素体の表面上に絶縁膜を介し
て設けられた半導体層にP領域およびN領域を隣接して
形成してなり、P領域が前記付属回路と接続されたダイ
オードと、前記スイッチング素子の一つの主電極に接続
された出力端子と、他の主電極に接続された電源端子と
、ダイオードのN領域に接続された接地端子を備えたも
のとする。そして、出力端子に一方が接地される負荷を
、電源端子にバッテリの正端子をそれぞれ接続し、接地
端子を接地して用いる。さらに電源端子とダイオードの
P領域との間に定電流源が接続されたことも有効である
。また、本発明の別の自動車用パワー集積回路は、一つ
の半導体素体に形成されたMOS型スイッチング素子お
よびその付属回路と、その半導体素体の表面上に絶縁膜
を介して設けられた半導体層にP領域およびN領域を隣
接して形成してなり、N領域が前記付属回路と接続され
たダイオードと、前記スイッチング素子の一つの主電極
に接続された出力端子と、ダイオードのP領域に接続さ
れた電源端子と、付属回路に接続された接地端子とを備
えたものとする。そして、出力端子とバッテリの正端子
の間に負荷を、電源端子にバッテリの正端子をそれぞれ
接続し、接地端子を接地して用いる。[Means for Solving the Problems] In order to achieve the above object, the power integrated circuit for an automobile of the present invention includes a MOS type switching element and its auxiliary circuit formed in one semiconductor element, and the semiconductor element. A P region and an N region are formed adjacent to each other in a semiconductor layer provided on the surface of the body via an insulating film, and the P region is a diode connected to the auxiliary circuit and one main switching element. It includes an output terminal connected to an electrode, a power terminal connected to another main electrode, and a ground terminal connected to the N region of the diode. Then, a load whose one side is grounded is connected to the output terminal, the positive terminal of the battery is connected to the power supply terminal, and the ground terminal is grounded. Furthermore, it is also effective to connect a constant current source between the power supply terminal and the P region of the diode. Another automotive power integrated circuit of the present invention includes a MOS switching element and its auxiliary circuit formed on one semiconductor body, and a semiconductor provided on the surface of the semiconductor body with an insulating film interposed therebetween. A layer has a P region and an N region formed adjacent to each other, and the N region is connected to a diode connected to the auxiliary circuit, an output terminal connected to one main electrode of the switching element, and a P region of the diode. It shall have a power terminal connected to it and a ground terminal connected to an attached circuit. Then, a load is connected between the output terminal and the positive terminal of the battery, the positive terminal of the battery is connected to the power supply terminal, and the ground terminal is grounded.
【0008】[0008]
【作用】MOS型スイッチング素子とその付属回路を形
成した半導体素体の表面上に絶縁して設けたダイオード
を、ハイサイドスイッチでは付属回路と接地端子との間
に、ローサイドスイッチでは付属回路と電源端子の間に
挿入することにより、バッテリが逆接続されたときに付
属回路に流入したり、付属回路からバッテリに流出する
電流を阻止するため、付属回路の破壊が防止される。そ
して、このダイオードが半導体素体外にあるため寄生効
果が生ずることがない。また、付属回路の接地側端子と
接地端子の間にダイオードを接続した場合にその付属回
路の接地側端子が地電位に対して負になることによる誤
動作は、ダイオードに向けて電流を流す定電流源を備え
ることにより防止できる。[Operation] A diode is installed insulated on the surface of the semiconductor body that forms the MOS switching element and its auxiliary circuit, between the auxiliary circuit and the ground terminal for high-side switches, and between the auxiliary circuit and the power supply for low-side switches. By inserting it between the terminals, when the battery is reversely connected, it prevents current from flowing into or out of the accessory circuit to the battery, thereby preventing damage to the accessory circuit. Since this diode is located outside the semiconductor body, no parasitic effects occur. In addition, when a diode is connected between the grounding terminal of the attached circuit and the grounding terminal, malfunctions caused by the grounding terminal of the attached circuit becoming negative with respect to the ground potential will occur due to the constant current flowing towards the diode. This can be prevented by providing a source.
【0009】[0009]
【実施例】図1は本発明の一実施例の自動車用パワー集
積回路を示し、図3に示したインテリジェントパワー半
導体ハイサイドスイッチにGND端子側にダイオード4
を挿入したもので、このダイオード4は、図6と共通の
部分に同一の符号を付した図7に示すように、図6と同
様パワーMOSFETを形成したn+ 層51, n−
層52よりなる半導体基板の表面のシリコン酸化膜5
5の上に堆積した多結晶シリコン層2のp+ 領域71
とn+ 領域72とよりなる。すなわち、p+ 多結晶
シリコン層を堆積したのち、その一部に不純物を拡散し
てn+ 領域72を形成し、PSG膜57に開けたコン
タクトホールでp+ 領域71にアノード電極63を、
n+ 領域72にカソード電極64を接触させる。この
ダイオードは、バッテリの電圧12Vより高い16〜2
0Vの逆耐圧をもつようにする。1個のダイオードでそ
のような耐圧が得られないときには、酸化膜55の上に
複数個のダイオードを形成し、直列接続する。これによ
りバッテリ逆接続時に図3に示したようなGND端子か
ら付属回路11へ流入する電流I1 を阻止することが
できる。Embodiment FIG. 1 shows an automotive power integrated circuit according to an embodiment of the present invention, in which a diode 4 is connected to the GND terminal side of the intelligent power semiconductor high-side switch shown in FIG.
As shown in FIG. 7, in which parts common to those in FIG. 6 are denoted by the same reference numerals, this diode 4 has an n+ layer 51, an n- layer forming a power MOSFET as in FIG.
Silicon oxide film 5 on the surface of the semiconductor substrate consisting of layer 52
p+ region 71 of polycrystalline silicon layer 2 deposited on 5
and n+ region 72. That is, after depositing a p+ polycrystalline silicon layer, impurities are diffused into a part of it to form an n+ region 72, and an anode electrode 63 is connected to the p+ region 71 through a contact hole opened in the PSG film 57.
Cathode electrode 64 is brought into contact with n+ region 72. This diode is 16-2V higher than the battery voltage 12V.
It should have a reverse breakdown voltage of 0V. When such a breakdown voltage cannot be obtained with one diode, a plurality of diodes are formed on the oxide film 55 and connected in series. This makes it possible to prevent the current I1 from flowing into the attached circuit 11 from the GND terminal as shown in FIG. 3 when the battery is reversely connected.
【0010】図1に示したパワーICにおいては図8に
示すような問題点がある。図8は、図1に示したICの
OUT端子に誘導負荷8を接続した場合で、多結晶シリ
コンダイオード4を接続したことにより、ターンオフ時
にOUT端子電位がクランプ用ツエナダイオード13の
ツエナ電位を越える負電位になってツエナダイオード1
3からMOSFETに流れる電流I4 が付属回路11
から流れ出る電流I3 に比して大きくなった場合にダ
イオード4を流れる電流I5 が負になり、接続点14
の電位が地電位を下まわる状態が生じる。これにより付
属回路11の駆動回路, 制御回路が誤動作を起こす可
能性が生じる。従っていかなる動作状態においても電流
I4が電流I3 を越えてはならないという制約が課せ
られる。The power IC shown in FIG. 1 has problems as shown in FIG. FIG. 8 shows a case where an inductive load 8 is connected to the OUT terminal of the IC shown in FIG. 1, and by connecting the polycrystalline silicon diode 4, the OUT terminal potential exceeds the Zener potential of the clamping Zener diode 13 at turn-off. Zener diode 1 becomes negative potential
The current I4 flowing from 3 to the MOSFET is connected to the attached circuit 11.
When the current I5 flowing through the diode 4 becomes larger than the current I3 flowing from the connection point 14, the current I5 flowing through the diode 4 becomes negative, and the current I5 flowing through the diode 4 becomes negative.
A situation occurs in which the potential of is lower than the ground potential. This may cause the drive circuit and control circuit of the attached circuit 11 to malfunction. Therefore, a restriction is imposed that current I4 must not exceed current I3 under any operating conditions.
【0011】図9はこれに対する対策を考慮した実施例
で、電源端子 (Vcc) と接続点14の間に定電流
源16を接続し、I4 <I3 +I6 となるような
電流I6 を常に流すことにより、I5 >0は維持さ
れ、接続点14が負の電位になることはなく、誤動作が
防げる。FIG. 9 shows an embodiment in which a countermeasure against this problem is taken into consideration. A constant current source 16 is connected between the power supply terminal (Vcc) and the connection point 14, and a current I6 such that I4 < I3 + I6 is always caused to flow. Therefore, I5>0 is maintained, the connection point 14 does not become a negative potential, and malfunctions can be prevented.
【0012】図10はインテリジェントパワー半導体ロ
ーサイドスイッチを含むパワー集積回路における実施例
で、ローサイドスイッチの電源端子側に図7に示した多
結晶シリコンダイオード4を挿入したものである。これ
により、バッテリ逆接続時に図4に示したような付属回
路15からVcc端子に流出する電流I2 を阻止する
ことができる。FIG. 10 shows an embodiment of a power integrated circuit including an intelligent power semiconductor low-side switch, in which the polycrystalline silicon diode 4 shown in FIG. 7 is inserted on the power supply terminal side of the low-side switch. This makes it possible to prevent the current I2 from flowing from the attached circuit 15 to the Vcc terminal as shown in FIG. 4 when the battery is reversely connected.
【0013】[0013]
【発明の効果】本発明によれば、バッテリ逆接続時にハ
イサイドスイッチの場合付属回路に流入する電流、ロー
サイドスイッチの場合付属回路から流出する電流を阻止
する保護用ダイオードを半導体基板内でなく基板表面上
に絶縁膜を介して形成することにより、寄生トランジス
タの駆動による破壊のおそれがなく、またダイオードの
外付けの必要もないので、半導体スイッチを含む自動車
用パワー集積回路の信頼性と付加価値を向上させること
ができた。そして、保護用ダイオードの接続が誤動作を
招くおそれのあるハイサイドスイッチの場合も、定電流
源を配置し、適正な電流を付加することにより、誤動作
を回避することができる。According to the present invention, a protective diode that blocks current flowing into the attached circuit in the case of a high-side switch and current flowing out from the attached circuit in the case of a low-side switch when a battery is reversely connected is installed in the substrate rather than in the semiconductor substrate. By forming an insulating film on the surface, there is no risk of damage caused by the driving of parasitic transistors, and there is no need to add external diodes, increasing the reliability and added value of automotive power integrated circuits including semiconductor switches. was able to improve. Even in the case of a high-side switch where connection of a protective diode may cause malfunction, malfunction can be avoided by arranging a constant current source and adding an appropriate current.
【図1】本発明の一実施例のハイサイドスイッチを含む
自動車用パワー集積回路の回路図FIG. 1 is a circuit diagram of an automotive power integrated circuit including a high-side switch according to an embodiment of the present invention.
【図2】インテリジェントパワー半導体ハイサイドおよ
びローサイドスイッチへのバッテリ正接続時の回路図[Figure 2] Circuit diagram when battery is positively connected to intelligent power semiconductor high-side and low-side switches
【
図3】インテリジェントパワー半導体ハイサイドスイッ
チの回路図[
Figure 3: Circuit diagram of intelligent power semiconductor high-side switch
【図4】インテリジェントパワー半導体ローサイドスイ
ッチの回路図[Figure 4] Circuit diagram of intelligent power semiconductor low-side switch
【図5】インテリジェントパワー半導体スイッチへのバ
ッテリ逆接続時に対する保護機能を備えた場合の回路図
[Figure 5] Circuit diagram when the intelligent power semiconductor switch is equipped with a protection function against reverse battery connection.
【図6】パワーMOSFETの半導体基板にダイオード
を集積した場合の断面図[Figure 6] Cross-sectional view when a diode is integrated on the semiconductor substrate of a power MOSFET
【図7】本発明による多結晶シリコンダイオードを備え
たパワーMOSFET半導体基板の断面図FIG. 7 is a cross-sectional view of a power MOSFET semiconductor substrate with a polycrystalline silicon diode according to the present invention.
【図8】図1
に示す集積回路における誤動作を説明する回路図[Figure 8] Figure 1
A circuit diagram illustrating malfunctions in the integrated circuit shown in
【図9】図8に示した誤動作に対する対策を施した本発
明の実施例の自動車用パワー集積回路の回路図FIG. 9 is a circuit diagram of an automotive power integrated circuit according to an embodiment of the present invention that takes measures against the malfunction shown in FIG.
【図10
】本発明の別の実施例のローサイドスイッチを含む自動
車用パワー集積回路の回路図[Figure 10
]Circuit diagram of an automotive power integrated circuit including a low-side switch according to another embodiment of the present invention.
1 パワーMOSFET 2 多結晶シリコン層 3 負荷 4 ダイオード 11 付属回路 15 付属回路 16 定電流源 20 バッテリ 51 n+ シリコン基板 52 n− シリコン層 58 ソース電極 59 ドレイン電極 63 アノード電極 64 カソード電極 71 p+ 領域 72 n+ 領域 1 Power MOSFET 2 Polycrystalline silicon layer 3 Load 4 Diode 11 Attached circuit 15 Attached circuit 16 Constant current source 20 Battery 51 n+ silicon substrate 52 n- silicon layer 58 Source electrode 59 Drain electrode 63 Anode electrode 64 Cathode electrode 71 p+ area 72 n+ area
Claims (5)
イッチング素子およびその付属回路と、その半導体素体
の表面上に絶縁膜を介して設けられた半導体層にP領域
およびN領域を隣接して形成してなり、P領域が前記付
属回路と接続されたダイオードと、前記スイッチング素
子の一つの主電極に接続された出力端子と、他の主電極
に接続された電源端子と、ダイオードのN領域に接続さ
れた接地端子を備えたことを特徴とする自動車用パワー
集積回路。Claim 1: A MOS type switching element and its auxiliary circuit formed in one semiconductor body, and a P region and an N region adjacent to a semiconductor layer provided on the surface of the semiconductor body with an insulating film interposed therebetween. a diode whose P region is connected to the auxiliary circuit; an output terminal connected to one main electrode of the switching element; a power supply terminal connected to the other main electrode; A power integrated circuit for an automobile, comprising a ground terminal connected to an N region.
端子にバッテリの正端子をそれぞれ接続し、接地端子を
接地して用いる請求項1記載の自動車用パワー集積回路
。2. The power integrated circuit for an automobile according to claim 1, wherein the output terminal is connected to a load having one end grounded, the power supply terminal is connected to a positive terminal of a battery, and the ground terminal is grounded.
電流源が接続された請求項1あるいは2記載の自動車用
パワー集積回路。3. The automotive power integrated circuit according to claim 1, wherein a constant current source is connected between the power supply terminal and the P region of the diode.
イッチング素子およびその付属回路と、その半導体素体
の表面上に絶縁膜を介して設けられた半導体層にP領域
およびN領域を隣接して形成してなり、N領域が前記付
属回路と接続されたダイオードと、前記スイッチング素
子の一つの主電極に接続された出力端子と、ダイオード
のP領域に接続された電源端子と、付属回路に接続され
た接地端子を備えたことを特徴とする自動車用パワー集
積回路。4. A MOS type switching element and its auxiliary circuit formed in one semiconductor body, and a P region and an N region adjacent to a semiconductor layer provided on the surface of the semiconductor body with an insulating film interposed therebetween. a diode whose N region is connected to the auxiliary circuit, an output terminal connected to one main electrode of the switching element, a power supply terminal connected to the P region of the diode, and the auxiliary circuit. An automotive power integrated circuit characterized by comprising a ground terminal connected to a ground terminal.
、電源端子にバッテリの正端子をそれぞれ接続し、接地
端子を接地して用いる請求項4記載の自動車用パワー集
積回路。5. The automotive power integrated circuit according to claim 4, wherein a load is connected between the output terminal and the positive terminal of the battery, the positive terminal of the battery is connected to the power supply terminal, and the ground terminal is grounded.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3087119A JP2870558B2 (en) | 1991-04-19 | 1991-04-19 | Automotive power integrated circuits |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3087119A JP2870558B2 (en) | 1991-04-19 | 1991-04-19 | Automotive power integrated circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04321773A true JPH04321773A (en) | 1992-11-11 |
JP2870558B2 JP2870558B2 (en) | 1999-03-17 |
Family
ID=13906070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3087119A Expired - Lifetime JP2870558B2 (en) | 1991-04-19 | 1991-04-19 | Automotive power integrated circuits |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2870558B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5821601A (en) * | 1996-09-05 | 1998-10-13 | Mitsubishi Denki Kabushiki Kaisha | Bipolar semiconductor integrated circuit with a protection circuit |
JP2007019812A (en) * | 2005-07-07 | 2007-01-25 | Yazaki Corp | Load driving device provided with reverse connection protection function for power source |
WO2010035667A1 (en) * | 2008-09-29 | 2010-04-01 | サンケン電気株式会社 | Electric circuit switching device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3633522B2 (en) | 2001-07-27 | 2005-03-30 | 株式会社デンソー | Load drive circuit |
-
1991
- 1991-04-19 JP JP3087119A patent/JP2870558B2/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5821601A (en) * | 1996-09-05 | 1998-10-13 | Mitsubishi Denki Kabushiki Kaisha | Bipolar semiconductor integrated circuit with a protection circuit |
JP2007019812A (en) * | 2005-07-07 | 2007-01-25 | Yazaki Corp | Load driving device provided with reverse connection protection function for power source |
WO2010035667A1 (en) * | 2008-09-29 | 2010-04-01 | サンケン電気株式会社 | Electric circuit switching device |
JP2010081536A (en) * | 2008-09-29 | 2010-04-08 | Sanken Electric Co Ltd | Switching device for electric circuit |
US8415989B2 (en) | 2008-09-29 | 2013-04-09 | Sanken Electric Co., Ltd. | Switching device for electric circuit |
Also Published As
Publication number | Publication date |
---|---|
JP2870558B2 (en) | 1999-03-17 |
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