JPH04310849A - Spectrophotometer - Google Patents

Spectrophotometer

Info

Publication number
JPH04310849A
JPH04310849A JP3077668A JP7766891A JPH04310849A JP H04310849 A JPH04310849 A JP H04310849A JP 3077668 A JP3077668 A JP 3077668A JP 7766891 A JP7766891 A JP 7766891A JP H04310849 A JPH04310849 A JP H04310849A
Authority
JP
Japan
Prior art keywords
sample
light
flux
measurement
cutting surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3077668A
Other languages
Japanese (ja)
Other versions
JP2644099B2 (en
Inventor
Hitoshi Ishibashi
石橋 仁志
Masataka Shichiri
雅隆 七里
Masaaki Tsuchimoto
土本 正明
Ryoji Suzuki
良治 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP7766891A priority Critical patent/JP2644099B2/en
Publication of JPH04310849A publication Critical patent/JPH04310849A/en
Application granted granted Critical
Publication of JP2644099B2 publication Critical patent/JP2644099B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable raw unhulled rice grains to be subjected to spectral analysis in a short time by providing a light-projecting portion for emitting a flux of measurement light and a light-reception portion for receiving a flux of transmission light from the other cutting surface on one cutting surface of the unhulled rice whose both edges are cut opposingly at a support portion which supports a blade for cutting both edge portions of the unhulled rice. CONSTITUTION:A flux of light for measurement is projected to a cutting surface S1 from a light-projecting portion 9 which is provided at a position corresponding to one cutting surface S1 of a sample S out of a support portion 8 in an operation state where the left and right both edge portions of the sample S are cut by a pair of blades 8A and 8B which are supported by the supporting portion 8 for a raw sample S where a middle portion is held by a retention portion 7. A flux of transmission light which passes the sample S is received by a light-reception portion 10 which is provided at a position corresponding to the other cutting surface S2 of the sample S out of the support portion 8. Constituent analysis of the sample S is performed by the flux of irradiation light and the flux of transmission light. Since constituent analysis can be made immediately without going through any machining process, an accurate measurement can be made in a short time.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、例えば穀物の成分分析
に用いる分光測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spectrometer used, for example, in analyzing the components of grains.

【0002】0002

【従来の技術】この種の分光測定装置としては、乾燥、
粉砕した後の穀物を試料として用いるものがあり(特公
平1−49890号公報記載)、例えば、蛋白・アミロ
ースの含有量と食味に高相関関係が認められる米の近赤
外分光技術による成分分析に用いられている。
[Prior Art] This type of spectrometer is used for drying,
There are methods that use crushed grains as samples (described in Japanese Patent Publication No. 1-49890), such as component analysis using near-infrared spectroscopy of rice, which shows a high correlation between protein/amylose content and taste. It is used in

【0003】0003

【発明が解決しようとする課題】1しかし、上述の従来
技術では、試料の作成に時間がかかるばかりでなく、分
析結果も生の穀物に対する結果としては正確さに欠ける
ものであるという欠点があった。例えば米の成分分析に
際して、試料の作成に、白米を乾燥、籾摺、精白、粉砕
という多工程と、30時間以上の長時間を要するもので
あったため、作業が煩雑であるという欠点があり、しか
も乾燥工程を経るものであるので水分含有量が正確に検
出できないという欠点もあった。一方、消費者の嗜好の
多様化、良食味米の要求に応えるためには、乾燥工程に
入る前に、収穫後集荷される生籾を直ちに品質に応じて
分類することが必要である。生籾は収穫後1日以内に乾
燥しないと品質が急速に劣化するからである。しかし、
籾米に対して籾を介して分光分析すると透過光量が低下
して正確に分析できず、そのような短時間の分類を可能
にするような短時間の成分分析を可能とする測定装置が
ないため、それを可能にする装置が望まれていた。本発
明の目的は上述した従来欠点を解消する点にある。
[Problems to be Solved by the Invention] 1 However, the above-mentioned conventional technology has the drawbacks that not only does it take time to prepare the sample, but also that the analytical results lack accuracy when compared to raw grains. Ta. For example, when analyzing the components of rice, preparing a sample requires multiple steps of drying, hulling, polishing, and pulverizing the polished rice, and requires a long time of over 30 hours, which has the disadvantage of being complicated. Moreover, since it goes through a drying process, it also has the disadvantage that the moisture content cannot be detected accurately. On the other hand, in order to meet the diversification of consumer tastes and the demand for good-tasting rice, it is necessary to immediately classify raw paddy collected after harvest according to quality before entering the drying process. This is because if raw paddy is not dried within one day after harvesting, its quality will rapidly deteriorate. but,
When spectroscopically analyzing unhulled rice through the paddy, the amount of transmitted light decreases, making it impossible to analyze accurately, and there is no measuring device that can perform component analysis in a short time that would enable classification in such a short time. , there was a desire for a device that would make this possible. An object of the present invention is to eliminate the above-mentioned conventional drawbacks.

【0004】0004

【課題を解決するための手段】この目的を達成するため
、本発明による分光測定装置の特徴構成は、支持装置に
支持された試料に測定用の光線束を照射する投光部と、
前記試料を透過する透過光線束を受光する受光部を設け
てある分光測定装置であって、前記支持装置を、前記試
料の中間部を挟持する保持部と、その保持部により保持
された前記試料の両端部を平行又はほぼ平行に切断する
一対の刃と、その一対の刃を前記切断方向に移動自在に
支持する支持部で構成して、前記支持部に、両端部が切
断された前記試料の一方の切断面へ測定用の光線束を照
射する前記投光部と前記試料の他方の切断面から出てく
る透過光線束を受光する前記受光部とを互いに対向させ
て設けてあることにある。さらに、前記一対の刃と前記
投光部及び前記受光部とを、切断する前記試料に対する
相対移動方向に並べて配置してあることが好ましい。
[Means for Solving the Problems] In order to achieve this object, the spectrometer according to the present invention has a characteristic configuration including: a light projection unit that irradiates a measurement light beam onto a sample supported by a support device;
A spectroscopic measuring device is provided with a light receiving section that receives a transmitted light beam that passes through the sample, and the supporting device is connected to a holding section that holds an intermediate portion of the sample, and the sample held by the holding section. a pair of blades that cut both ends of the sample in parallel or nearly parallel; and a support part that supports the pair of blades movably in the cutting direction; The light projecting section that irradiates a beam of light for measurement onto one cut surface of the sample and the light receiving section that receives a beam of transmitted light coming out from the other cut surface of the sample are provided to face each other. be. Furthermore, it is preferable that the pair of blades, the light projecting section, and the light receiving section are arranged side by side in a direction of relative movement with respect to the sample to be cut.

【0005】[0005]

【作用】保持部により中間部を挟持された生の試料に対
して、支持部に支持された一対の刃でその試料の左右両
端部を切断した作用状態で、その支持部のうち前記試料
の一方の切断面に対応する位置に設けられた投光部から
その切断面へ測定用の光線束を照射し、同じくその支持
部のうち前記試料の他方の切断面に対応する位置に設け
られた受光部で前記試料を透過する透過光線束を受光す
る。照射光線束と透過光線束とから試料の成分分析を行
う。
[Operation] A raw sample whose middle part is held between the holding parts is cut at both left and right ends by a pair of blades supported by the supporting part. A light beam for measurement is irradiated onto the cut surface from a light projecting section provided at a position corresponding to one cut surface, and a light beam for measurement is also provided at a position corresponding to the other cut surface of the sample in the supporting section. A light receiving section receives a transmitted light beam that passes through the sample. A component analysis of the sample is performed from the irradiated light beam and the transmitted light beam.

【0006】[0006]

【発明の効果】従って、本発明によれば収穫後の試料に
対して、何ら加工工程を経ることなく直に成分分析でき
るので、作業工程が簡素化され、短い作業時間で正確な
測定がができる分光測定装置を提供することができるよ
うになったばかりでなく、消費者の嗜好の多様化、良食
味米の要求に応えるため、乾燥工程に入る前に、収穫後
集荷される生籾を直ちに品質に応じて分類することを可
能とする測定装置を提供できるようになった。
[Effects of the Invention] Therefore, according to the present invention, the components of the sample after harvest can be analyzed directly without any processing steps, which simplifies the work process and enables accurate measurements in a short time. Not only has it become possible to provide a spectroscopic measurement device that allows It is now possible to provide a measuring device that allows classification according to quality.

【0007】[0007]

【実施例】以下に本発明の一実施例である籾米を試料S
とする分光測定装置について説明する。分光測定装置は
、図1及び図2に示すように、試料Sの支持装置6と、
支持装置6に試料Sを一粒ずつ整列搬送する搬送装置1
と、支持装置6内の試料Sに測定用光線束を照射するた
めの光源Lと、試料Sを透過する光線束に基づき試料S
の成分を分析出力する近赤外の分光装置11と、分光結
果を統計処理する計算機12等で構成してある。
[Example] Sample S of unhulled rice, which is an example of the present invention, is shown below.
A spectroscopic measurement device will be explained below. As shown in FIGS. 1 and 2, the spectrometer includes a support device 6 for the sample S,
A transport device 1 that aligns and transports the samples S one by one to a support device 6
, a light source L for irradiating the sample S in the support device 6 with a measurement light beam;
It is composed of a near-infrared spectrometer 11 that analyzes and outputs the components of , a computer 12 that statistically processes the spectroscopic results, and the like.

【0008】前記搬送装置1は、試料Sを投入するホッ
パー2と、ホッパー2下端部より落下する試料Sを一粒
ずつ前記支持装置6に向けて整列搬送するコンベア3と
で構成してある。前記コンベア3の搬送面4には、試料
Sの長手方向を搬送方向と直行する姿勢で一粒ずつ保持
する凹部5を形成してあり、その凹部5のうち後述の刃
8A,8Bに対応する位置に刃8A,8Bを逃がす切り
欠き5A,5Bを形成してある。
The conveyance device 1 is composed of a hopper 2 into which the sample S is placed, and a conveyor 3 which aligns and conveys the sample S falling from the lower end of the hopper 2 one by one toward the support device 6. The conveyor surface 4 of the conveyor 3 is formed with a recess 5 for holding each grain of the sample S in a posture perpendicular to the transport direction in the longitudinal direction, and the recesses 5 correspond to blades 8A and 8B, which will be described later. Notches 5A and 5B are formed at the positions to allow the blades 8A and 8B to escape.

【0009】前記支持装置6は、試料Sに対して上方か
ら遠近自在に移動して前記コンベア3の凹部5との間で
試料Sの長手方向中間部を挟持する保持部としての押さ
え具7と、前記押さえ具7の両端側で同じく試料Sに対
して上方から遠近自在に前記押さえ具7とは独立して移
動して挟持状態にある前記試料Sの両端部を切断する刃
8A,8Bを先端部に備えた支持部8とで構成してある
。前記支持部8には、前記試料Sの切断状態で前記試料
Sの一方の切断面S1へ測定用の光線束を照射する投光
部としての投光用光ファイバ9と前記試料Sの他方の切
断面S2から透過光線束を受光する受光部としての受光
用光ファイバ10とを設けてある。前記投光用光ファイ
バ9は前記光源Lからの光線束を試料Sに導く光路を構
成してあり、前記受光用光ファイバ10は前記分光装置
11に光線束を導く光路を構成してある。
The support device 6 includes a presser 7 as a holding portion that moves freely toward and near the sample S from above and holds the longitudinal middle portion of the sample S between it and the recess 5 of the conveyor 3. , Blades 8A and 8B are provided at both ends of the holding tool 7 and move independently of the holding tool 7 to freely approach and approach the sample S from above to cut both ends of the sample S held in the clamped state. It consists of a support part 8 provided at the tip. The support section 8 includes a light projecting optical fiber 9 as a light projecting section that irradiates a beam of light for measurement onto one cut surface S1 of the sample S when the sample S is cut, and a light projecting optical fiber 9 that serves as a light projecting section that irradiates one cut surface S1 of the sample S with a beam of light for measurement. A light-receiving optical fiber 10 is provided as a light-receiving section that receives the transmitted light beam from the cut surface S2. The light emitting optical fiber 9 constitutes an optical path for guiding the light beam from the light source L to the sample S, and the light receiving optical fiber 10 constitutes an optical path for guiding the light beam to the spectrometer 11.

【0010】つまり、前記搬送装置1は、前記支持装置
6の位置する箇所に試料Sが到達すると停止する。図2
及び図3に示すように、前記支持装置6の押さえ具7が
上方から近づき前記コンベア3との間で試料Sを挟持す
る。前記支持部8が上方から下降して先端部に設けた一
対の刃8A,8Bで試料の両端部を切断する。切断状態
で、前記投光用光ファイバ9を介して試料Sにその断面
S1から測定用の光線束を照射し、前記受光用光ファイ
バ10を介して試料Sを透過した光線束を集光して前記
分光装置11で測定する。
That is, the transport device 1 stops when the sample S reaches the location where the support device 6 is located. Figure 2
As shown in FIG. 3, the presser 7 of the support device 6 approaches from above and clamps the sample S between it and the conveyor 3. The support part 8 descends from above and cuts both ends of the sample with a pair of blades 8A and 8B provided at the tip. In the cut state, a beam of light for measurement is irradiated onto the sample S from its cross section S1 via the light emitting optical fiber 9, and a beam of light transmitted through the sample S is focused through the light receiving optical fiber 10. Then, the spectroscopic device 11 performs the measurement.

【0011】前記分光装置11は透過光線束を分光して
胚乳部の水分、蛋白、アミロース等の成分に対応する特
定波長毎の強度を検出するもので、その検出出力を前記
計算機12に入力して平均化処理等を行うことで、各ロ
ットの平均的品質を同定する。
[0011] The spectroscope 11 separates the transmitted light beam and detects the intensity of each specific wavelength corresponding to components such as water, protein, and amylose in the endosperm, and inputs the detection output to the computer 12. By performing averaging processing, etc., the average quality of each lot is identified.

【0012】〔別実施例〕以下、本発明の別実施例を説
明する。先の実施例では投光部及び受光部に光ファイバ
を用いたものを説明したが、投光部として前記支持部に
直接に光源を設けてもよく、受光部として前記支持部に
直接に受光素子を設けて構成してもよいし、それらを適
宜組み合わせてもよい。先の実施例では試料として籾米
を対象とするものを説明したが、試料は籾米に限定する
ものではなく、任意の穀物とすることができる。先の実
施例では試料Sの長手方向を搬送方向と直行する姿勢で
一粒ずつ保持搬送しているが、搬送姿勢はこれに限定す
るものではなく、長手方向が搬送面に垂直な姿勢でもよ
く、試料Sの長手方向を搬送方向と平行な姿勢で搬送し
てもよい。そして、この場合には支持装置の刃8A,8
Bの取付け位置等をそれに合わせればよい。本分光測定
装置を用いて稲穂1本内の籾の各成分の割合の頻度分布
を求めることにより、登熟度合いの判定や品種改良等の
研究に役立てることができる。分光装置11として、近
赤外の波長を対象とするものを用いているが、特に限定
するものではなく任意の波長を対象とするものであって
よい。また、分光装置11の構成も限定するものではな
く、プリズムを用いたものや回折格子を用いたもの等任
意である。尚、特許請求の範囲の項に図面との対照を便
利にする為に符号を記すが、該記入により本発明は添付
図面の構成に限定されるものではない。
[Another Embodiment] Another embodiment of the present invention will be described below. In the previous embodiment, an optical fiber was used for the light projecting section and the light receiving section, but a light source may be provided directly on the support section as the light projecting section, or a light source may be provided directly on the support section as the light receiving section. The structure may be configured by providing elements, or they may be combined as appropriate. In the previous embodiment, the sample was described as being unhulled rice, but the sample is not limited to unhulled rice, and may be any grain. In the previous embodiment, each particle of the sample S is held and transported with the longitudinal direction perpendicular to the transport direction, but the transport orientation is not limited to this, and the longitudinal direction may be perpendicular to the transport surface. , the sample S may be transported with its longitudinal direction parallel to the transport direction. In this case, the blades 8A, 8 of the support device
The mounting position of B can be adjusted accordingly. By using this spectrometer to determine the frequency distribution of the proportions of each component of paddy in one ear of rice, it can be useful for research such as determining the degree of ripening and improving breeds. Although the spectroscopic device 11 is one that targets near-infrared wavelengths, it is not particularly limited and may be one that targets any wavelength. Further, the configuration of the spectroscopic device 11 is not limited, and may be any configuration such as one using a prism or a diffraction grating. Incidentally, although reference numerals are written in the claims section for convenient comparison with the drawings, the present invention is not limited to the structure shown in the accompanying drawings.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】分光測定装置の概略構成図[Figure 1] Schematic configuration diagram of the spectrometer

【図2】支持装置の測定前の断面図[Figure 2] Cross-sectional view of the support device before measurement

【図3】支持装置の測定時の断面図[Figure 3] Cross-sectional view of the support device during measurement

【符号の説明】[Explanation of symbols]

6    支持装置 7    保持部 8    支持部 8A  刃 8B  刃 9    投光部 10  受光部 S    試料 6 Support device 7 Holding part 8 Support part 8A blade 8B blade 9 Light projecting section 10 Light receiving part S Sample

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  支持装置(6)に支持された試料(S
)に測定用の光線束を照射する投光部(9)と、前記試
料(S)を透過する透過光線束を受光する受光部(10
)を設けてある分光測定装置であって、前記支持装置(
6)を、前記試料(S)の中間部を挟持する保持部(7
)と、その保持部(7)により保持された前記試料(S
)の両端部を平行又はほぼ平行に切断する一対の刃(8
A),(8B)と、その一対の刃(8A),(8B)を
前記切断方向に移動自在に支持する支持部(8)で構成
して、前記支持部(8)に、両端部が切断された前記試
料(S)の一方の切断面(S1)へ測定用の光線束を照
射する前記投光部(9)と前記試料(S)の他方の切断
面(S2)から出てくる透過光線束を受光する前記受光
部(10)とを互いに対向させて設けてある分光測定装
置。
Claim 1: A sample (S) supported by a support device (6).
), a light projecting section (9) that irradiates a light beam for measurement onto the sample (S), and a light receiving section (10) that receives a transmitted light beam that passes through the sample (S).
), the support device (
6) with a holding part (7) that holds the middle part of the sample (S).
) and the sample (S) held by its holding part (7).
) with a pair of blades (8
A), (8B) and a support part (8) that supports the pair of blades (8A), (8B) movably in the cutting direction, and both ends are attached to the support part (8). The light emitting unit (9) irradiates one cut surface (S1) of the cut sample (S) with a light beam for measurement, and the light beam comes out from the other cut surface (S2) of the sample (S). A spectroscopic measuring device in which the light receiving section (10) that receives a transmitted light beam is provided facing each other.
【請求項2】  前記一対の刃(8A),(8B)と前
記投光部(9)及び前記受光部(10)とを、切断する
前記試料(S)に対する相対移動方向に並べて配置して
ある請求項1記載の分光測定装置。
2. The pair of blades (8A), (8B), the light projecting section (9), and the light receiving section (10) are arranged side by side in a direction of relative movement with respect to the sample (S) to be cut. The spectrometer according to claim 1.
JP7766891A 1991-04-10 1991-04-10 Spectrometer Expired - Lifetime JP2644099B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7766891A JP2644099B2 (en) 1991-04-10 1991-04-10 Spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7766891A JP2644099B2 (en) 1991-04-10 1991-04-10 Spectrometer

Publications (2)

Publication Number Publication Date
JPH04310849A true JPH04310849A (en) 1992-11-02
JP2644099B2 JP2644099B2 (en) 1997-08-25

Family

ID=13640266

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7766891A Expired - Lifetime JP2644099B2 (en) 1991-04-10 1991-04-10 Spectrometer

Country Status (1)

Country Link
JP (1) JP2644099B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001018527A1 (en) * 1999-09-07 2001-03-15 Japan As Represented By Director General Of National Agriculture Research Center,Ministry Of Agriculture, Forestry And Fisheries Method and device for processing material
WO2015071706A1 (en) * 2013-11-14 2015-05-21 Teknologian Tutkimuskeskus Vtt Oy Optical analyzer, optical analyzing method and sample preparation device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001018527A1 (en) * 1999-09-07 2001-03-15 Japan As Represented By Director General Of National Agriculture Research Center,Ministry Of Agriculture, Forestry And Fisheries Method and device for processing material
WO2015071706A1 (en) * 2013-11-14 2015-05-21 Teknologian Tutkimuskeskus Vtt Oy Optical analyzer, optical analyzing method and sample preparation device
US10073031B2 (en) 2013-11-14 2018-09-11 Grainsense Oy Optical analyzer, optical analyzing method and sample preparation device

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