JPH04310848A - Spectral measuring device - Google Patents

Spectral measuring device

Info

Publication number
JPH04310848A
JPH04310848A JP3077667A JP7766791A JPH04310848A JP H04310848 A JPH04310848 A JP H04310848A JP 3077667 A JP3077667 A JP 3077667A JP 7766791 A JP7766791 A JP 7766791A JP H04310848 A JPH04310848 A JP H04310848A
Authority
JP
Japan
Prior art keywords
sample
placement portion
light
cut
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3077667A
Other languages
Japanese (ja)
Other versions
JP2644098B2 (en
Inventor
Ryoji Suzuki
良治 鈴木
Masataka Shichiri
雅隆 七里
Hitoshi Ishibashi
石橋 仁志
Masaaki Tsuchimoto
土本 正明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP7766791A priority Critical patent/JP2644098B2/en
Publication of JPH04310848A publication Critical patent/JPH04310848A/en
Application granted granted Critical
Publication of JP2644098B2 publication Critical patent/JP2644098B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable raw unhulled rice grains to be subjected to spectral analysis by cutting upper and lower edge portions of unhulled rice grain which is retained by a placement portion with a blade which moves horizontally and then emitting a flux of rays for measurement. CONSTITUTION:Upper and lower edges of a sample S which is separated and placed for each placement portion 9 are cut by traveling in horizontal direction along the placement portion 9 of upper and lower pair of blades 10C and 11C. The upper and lower cutting pieces are eliminated from the placement portion 9 by traveling in horizontal direction along the placement portion 9 of exclusion portions 10D and 11D as in the blade 10C, 10C and the sample S whose upper and lower edges are cut remains on the placement portion 9. A flux of light for measurement is emitted from a light-projecting portion 2 at the upper portion of the placement portion 9. The flux of light passing through the sample S is received by light-reception portion 3 which are provided separately at a bottom portion of the placement portion 9, thus enabling constituent analysis to be made immediately.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、支持装置に支持された
試料に測定用の光線束を照射する投光部と、前記試料を
透過する透過光線束を受光する受光部を設けてある分光
測定装置に関する。
[Industrial Application Field] The present invention provides a spectroscopy system that is provided with a light projecting section that irradiates a beam of light for measurement onto a sample supported by a support device, and a light receiving section that receives the transmitted beam of light that passes through the sample. Concerning a measuring device.

【0002】0002

【従来の技術】この種の分光測定装置としては、前記支
持装置を、例えば乾燥、粉砕した後の穀物を試料として
載置する載置部のみ設けたものがあり(特公平1−49
890号公報記載)、蛋白・アミロースの含有量と食味
に高相関関係が認められる米の近赤外分光技術による成
分分析に用いられている。
2. Description of the Related Art There is a spectrometer of this type in which the supporting device is provided only with a mounting portion on which, for example, dried and crushed grain is placed as a sample (Japanese Patent Publication No. 1-49
No. 890), it is used for component analysis using near-infrared spectroscopy technology of rice, which shows a high correlation between protein/amylose content and taste.

【0003】0003

【発明が解決しようとする課題】しかし、上述の従来技
術では、試料の作成に時間がかかるばかりでなく、分析
結果も生の穀物に対する結果としては試料の厚みや密度
のばらつきに起因して正確さに欠けるものであるという
欠点があった。例えば米の成分分析に際しては、試料の
作成に、籾米を乾燥、籾摺、精白、粉砕という多工程と
、30時間以上の長時間を要するものであったため、作
業が煩雑であるという欠点があり、しかも乾燥工程を経
るものであるので水分含有量が正確に検出できないとい
う欠点もあった。一方、消費者の嗜好の多様化、良食味
米の要求に応えるためには、乾燥工程に入る前に、収穫
後集荷される生籾を直ちに品質に応じて分類することが
必要である。生籾は収穫後1日以内に乾燥しないと品質
が急速に劣化するからである。しかし、籾米に対して籾
殻を介して分光分析すると透過光量が低下して正確に分
析できず、そのような短時間の分類を可能にするような
短時間の成分分析を可能とする測定装置がないため、そ
れを可能にする装置が望まれていた。本発明の目的は上
述した従来欠点を解消する点にある。
[Problems to be Solved by the Invention] However, with the above-mentioned conventional technology, not only does it take time to prepare the sample, but also the analysis results are inaccurate due to variations in the thickness and density of the sample for raw grains. The drawback was that it lacked quality. For example, when analyzing the components of rice, preparing a sample involves multiple steps such as drying the unhulled rice, hulling, polishing, and crushing, and requires a long time of over 30 hours, which has the disadvantage of being complicated. Moreover, since it goes through a drying process, it also has the disadvantage that the moisture content cannot be detected accurately. On the other hand, in order to meet the diversification of consumer tastes and the demand for good-tasting rice, it is necessary to immediately classify raw paddy collected after harvest according to quality before entering the drying process. This is because if raw paddy is not dried within one day after harvesting, its quality will rapidly deteriorate. However, when spectroscopically analyzing unhulled rice through the rice husks, the amount of transmitted light decreases, making it impossible to perform accurate analysis.Therefore, there is no measuring device that can perform component analysis in a short period of time to enable classification in such a short period of time. Therefore, there was a desire for a device that would make this possible. An object of the present invention is to eliminate the above-mentioned conventional drawbacks.

【0004】0004

【課題を解決するための手段】この目的を達成するため
、本発明による分光測定装置の特徴構成は、支持装置に
支持された試料に測定用の光線束を照射する投光部と、
前記試料を透過する透過光線束を受光する受光部を設け
てある分光測定装置であって、前記支持装置を、複数の
試料を各別に分離載置する載置部と、前記載置部への載
置状態で前記載置部に沿った横方向移動により前記試料
の上下端を切断する上下一対の刃と、前記刃により切断
された上下の切断片を同じく横方向移動により排除する
排除部で構成して、前記投光部を前記載置部の上方に配
置し、前記受光部を前記載置部の底部それぞれに配置し
てあることにある。
[Means for Solving the Problems] In order to achieve this object, the spectrometer according to the present invention has a characteristic configuration including: a light projection unit that irradiates a measurement light beam onto a sample supported by a support device;
A spectroscopic measuring device is provided with a light receiving section that receives a transmitted light beam that passes through the sample, and the support device is configured to include a mounting section for separately mounting a plurality of samples, and a mounting section for separately mounting a plurality of samples. A pair of upper and lower blades that cut the upper and lower ends of the sample by moving laterally along the mounting part in a placed state, and a removing part which removes the upper and lower cut pieces cut by the blades by moving laterally as well. The light projecting section is arranged above the mounting section, and the light receiving section is arranged at the bottom of each of the mounting sections.

【0005】[0005]

【作用】載置部に各別に分離載置された試料は、上下一
対の刃の載置部に沿った横方向移動により上下端が切断
される。上下の切断片は、刃と同様に排除部の載置部に
沿った横方向移動により載置部から除去され、載置部上
には上下端が切断された試料が残る。この試料に対して
、載置部上方の投光部から測定用の光線束を各試料に照
射して、試料を透過した光線束を、載置部の底部に各別
に設けてある受光部で受けるのである。
[Operation] The upper and lower ends of the samples separately placed on the mounting section are cut by the horizontal movement of the pair of upper and lower blades along the mounting section. The upper and lower cut pieces are removed from the receiver by lateral movement of the removal section along the receiver, similar to the blade, and the sample with the upper and lower ends cut remains on the receiver. A beam of light for measurement is irradiated onto each sample from the light projecting section above the mounting section, and the beam of light that has passed through the sample is sent to the light receiving section separately provided at the bottom of the mounting section. You receive it.

【0006】[0006]

【発明の効果】従って、本発明によれば収穫後の試料に
対して、何ら加工工程を経ることなく直に成分分析でき
るので、作業工程が簡素化され、短い作業時間で正確な
測定がができる分光測定装置を提供することができるよ
うになったばかりでなく、消費者の嗜好の多様化、良食
味米の要求に応えるため、乾燥工程に入る前に、収穫後
集荷される生籾を直ちに品質に応じて分類することを可
能とする測定装置を提供できるようになった。
[Effects of the Invention] Therefore, according to the present invention, the components of the sample after harvest can be analyzed directly without any processing steps, which simplifies the work process and enables accurate measurements in a short time. Not only has it become possible to provide a spectroscopic measurement device that allows It is now possible to provide a measuring device that allows classification according to quality.

【0007】[0007]

【実施例】以下に本発明の一実施例である籾米を試料S
とする分光測定装置について説明する。分光測定装置は
、図1、図2及び図3に示すように、試料Sを支持する
支持装置1と、支持装置1の上方から試料Sに測定用の
光線束を照射する投光部2と、試料Sを透過した光線束
を支持装置1の下方から集光する受光部としての光ファ
イバ3と、試料Sを透過する光線束に基づき試料Sの成
分を分析出力する分光装置4と、分光結果を統計処理す
る計算機5等で構成してある。
[Example] Sample S of unhulled rice, which is an example of the present invention, is shown below.
A spectroscopic measurement device will be explained below. As shown in FIGS. 1, 2, and 3, the spectrometer includes a support device 1 that supports a sample S, and a light projector 2 that irradiates the sample S with a beam of light for measurement from above the support device 1. , an optical fiber 3 as a light-receiving unit that collects a beam of light that has passed through the sample S from below the support device 1, a spectrometer 4 that analyzes and outputs the components of the sample S based on the beam of light that has passed through the sample S, It consists of a computer 5 etc. that statistically processes the results.

【0008】前記支持装置1は、試料Sを一粒ずつ分離
載置する載置部9と、前記載置部への載置状態で前記載
置部9に沿った横方向移動により前記試料Sの上下端を
切断する上下一対の刃10C,11Cと、前記刃10C
,11Cにより切断された上下の切断片S’を同じく横
方向移動により排除する排除部10D,11Dで構成し
てある。
The support device 1 includes a mounting section 9 for separating and mounting the sample S one by one, and a mounting section 9 for separating and mounting the sample S one by one. a pair of upper and lower blades 10C, 11C that cut the upper and lower ends of the blade 10C;
, 11C, which removes the upper and lower cut pieces S' cut by the upper and lower cut pieces S' by lateral movement.

【0009】詳述すると、試料Sを一粒ずつ分離するた
めの複数の投入用開孔6Aを形成してある上板6と、投
入用開孔6Aに対応する位置に試料Sの横方向移動を阻
止する保持用開孔7A及び保持用開孔7Aに隣接して試
料Sの上側の切断片S’を落下除去する除去用開孔7B
を形成してある中板7と、除去用開孔7Bに対応する位
置に試料Sの上下両切断片S’を落下除去する除去用開
孔8Bを形成してある底板8を重ねて載置部9を構成し
てあり、上板6と中板7の間、及び中板7と底板8の間
にそれら間を横方向に往復移動自在の摺動板10,11
を配置してある。前記摺動板10,11には、前記投入
用開孔6Aに対応する位置にそれぞれ開孔10A,11
Aを形成してあり、それら開孔10A,11Aのうち復
動側の周部10C,11Cに鋭利な刃部を設けてある。 前記刃部10C,11Cの復動側には前記刃部10C,
11Cで切断された試料Sの切断片S’を落下除去する
開孔10B,11Bを形成してあり、さらにその復動側
には前記摺動板10,11の往動に伴い前記刃部10C
,11Cで切断された試料Sの切断片S’を開孔10B
,11B及び除去用開孔7B,8Bから落下するように
切断片S’を往動側に押し出す排除部10D,11Dと
しての突起を形成してある。前記底板8のうち前記投入
用開孔6A及び保持用開孔7Aに対応する位置の中央部
には試料Sを透過した光線束の集光用の単数又は複数本
の光ファイバ3を設けてあり、この光ファイバ3の他端
は他の光ファイバ3とで束ねられて光ファイババンドル
として前記分光装置4に導かれる。即ち、本分光測定装
置は一粒ずつ分離載置された試料Sの平均の成分分析を
一度に行うことになる。
In detail, the upper plate 6 is provided with a plurality of input holes 6A for separating the sample S one by one, and the sample S is moved laterally to a position corresponding to the input holes 6A. A holding hole 7A that prevents this from occurring and a removal hole 7B that drops and removes the upper cut piece S' of the sample S adjacent to the holding hole 7A.
The middle plate 7, which is formed with , and the bottom plate 8, which is formed with removal holes 8B for dropping and removing both the upper and lower cut pieces S' of the sample S, are placed on top of each other at positions corresponding to the removal holes 7B. Sliding plates 10 and 11 are provided between the top plate 6 and the middle plate 7, and between the middle plate 7 and the bottom plate 8, and are movable laterally.
are arranged. The sliding plates 10 and 11 have openings 10A and 11 at positions corresponding to the input opening 6A, respectively.
A is formed, and sharp blade portions are provided at peripheral portions 10C and 11C on the reciprocating side of the openings 10A and 11A. The blade portions 10C, 11C are provided on the reciprocating side of the blade portions 10C, 11C.
Opening holes 10B and 11B are formed to allow the cut pieces S' of the sample S cut at 11C to fall and be removed, and furthermore, the blade portions 10C are formed on the backward movement side as the sliding plates 10 and 11 move forward.
, 11C of the cut piece S' of the sample S
, 11B and removal holes 7B, 8B to push out the cut pieces S' to the forward movement side. One or more optical fibers 3 for condensing the beam of light transmitted through the sample S are provided in the center of the bottom plate 8 at positions corresponding to the input apertures 6A and the holding apertures 7A. The other end of this optical fiber 3 is bundled with another optical fiber 3 and guided to the spectrometer 4 as an optical fiber bundle. In other words, this spectrometer analyzes the average components of the sample S, which is separated and placed one grain at a time.

【0010】前記分光装置4は透過光線束を分光して胚
乳部の水分、蛋白、アミロース等の成分に対応する特定
波長毎の強度を検出するもので、その検出出力を前記計
算機5に入力してさらに平均化処理等を行うことで、各
ロットの平均的品質を同定する。
[0010] The spectroscopic device 4 separates the transmitted light beam and detects the intensity of each specific wavelength corresponding to components such as water, protein, and amylose in the endosperm, and inputs the detection output to the computer 5. By further performing averaging processing, etc., the average quality of each lot is identified.

【0011】以下、本発明の別実施例を説明する。先の
実施例では試料として籾米を対象とするものを説明した
が、試料は籾米に限定するものではなく、任意の穀物と
することができる。試料Sを一粒ずつ分離載置するため
の支持装置1における試料Sの配置は先の実施例に限定
するものではなく任意であり、M行N列のマトリックス
や千鳥状に配置してもよい。先の実施例では支持装置と
して水平方向に配置された載置部に複数の試料を載置す
るものについて説明したが、鉛直方向に配置された保持
部に複数の試料を保持するものであってもよい。分光装
置4として、近赤外の波長を対象とするものを用いてい
るが、特に限定するものではなく任意の波長を対象とす
るものであってよい。また、分光装置4の構成も限定す
るものではなく、プリズムを用いたものや回折格子を用
いたもの等任意である。尚、特許請求の範囲の項に図面
との対照を便利にする為に符号を記すが、該記入により
本発明は添付図面の構成に限定されるものではない。
Another embodiment of the present invention will be described below. In the previous embodiment, the sample was described as being unhulled rice, but the sample is not limited to unhulled rice, and may be any grain. The arrangement of the samples S in the support device 1 for separating and placing the samples S one by one is not limited to the previous embodiment, and may be arranged in an arbitrary matrix of M rows and N columns or in a staggered pattern. . In the previous embodiment, a supporting device in which a plurality of samples are placed on a horizontally arranged mounting section was explained, but a plurality of samples are held on a vertically arranged holding section. Good too. Although the spectroscopic device 4 is one that targets near-infrared wavelengths, it is not particularly limited and may be one that targets any wavelength. Furthermore, the configuration of the spectroscopic device 4 is not limited, and may be any configuration such as one using a prism or a diffraction grating. Incidentally, although reference numerals are written in the claims section for convenient comparison with the drawings, the present invention is not limited to the structure shown in the accompanying drawings.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】分光測定装置の測定前の概略構成図[Figure 1] Schematic diagram of the spectrometer before measurement

【図2】分
光測定装置の測定時の概略構成図
[Figure 2] Schematic configuration diagram of the spectrometer during measurement

【図3】支持装置の分
解斜視図
[Figure 3] Exploded perspective view of the support device

【符号の説明】[Explanation of symbols]

1      支持装置 2      投光部 3      受光部 9      載置部 10C  刃 11C  刃 10D  排除部 11D  排除部 S      試料 S’    切断片 1 Support device 2              3 Light receiving part 9 Placement section 10C blade 11C blade 10D Exclusion part 11D Exclusion part S Sample S’ Cut piece

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】  支持装置(1)に支持された試料(S
)に測定用の光線束を照射する投光部(2)と、前記試
料(S)を透過する透過光線束を受光する受光部(3)
を設けてある分光測定装置であって、前記支持装置(1
)を、複数の試料(S)を各別に分離載置する載置部(
9)と、前記載置部(9)への載置状態で前記載置部(
9)に沿った横方向移動により前記試料(S)の上下端
を切断する上下一対の刃(10C),(11C)と、前
記刃(10C),(11C)により切断された上下の切
断片(S’)を同じく横方向移動により排除する排除部
(10D),(11D)で構成して、前記投光部(2)
を前記載置部(9)の上方に配置し、前記受光部(3)
を前記載置部(9)の底部それぞれに配置してある分光
測定装置。
Claim 1: A sample (S) supported by a support device (1).
), and a light receiving part (3) that receives the transmitted light beam that passes through the sample (S).
A spectrometer comprising: a support device (1);
), and a mounting part (
9), and the said mounting part (9) in the state of being placed on the said mounting part (9).
A pair of upper and lower blades (10C) and (11C) that cut the upper and lower ends of the sample (S) by moving laterally along 9), and the upper and lower cut pieces cut by the blades (10C) and (11C). (S') is configured with removal parts (10D) and (11D) that also remove the light emitting part (S') by lateral movement, and the light emitting part (2)
is placed above the placement portion (9), and the light receiving portion (3) is placed above the placement portion (9).
are arranged at the bottom of each of the mounting portions (9).
【請求項2】  支持装置(1)に支持された試料(S
)に測定用の光線束を照射する投光部(2)と、前記試
料(S)を透過する透過光線束を受光する受光部(3)
を設けてある分光測定装置であって、前記支持装置(1
)を、複数の試料(S)を各別に分離保持する保持部(
9)と、前記保持部(9)への保持状態で前記保持部(
9)に沿った方向への移動により前記試料(S)の両端
部を切断する刃(10C),(11C)と、前記刃(1
0C),(11C)により切断された切断片(S’)を
同じく前記保持部(9)に沿った方向への移動により排
除する排除部(10D),(11D)で構成して、前記
投光部(2)を前記保持部(9)の一方側に配置し、前
記受光部(3)を前記載置部(9)の他方側にそれぞれ
に配置してある分光測定装置。
Claim 2: A sample (S) supported by a support device (1).
), and a light receiving part (3) that receives the transmitted light beam that passes through the sample (S).
A spectrometer comprising: a support device (1);
) and a holding part (
9) and the holding part (9) in a state of being held in the holding part (9).
blades (10C) and (11C) that cut both ends of the sample (S) by moving in the direction along
0C) and (11C), which remove the cut pieces (S') by moving in the direction along the holding part (9). A spectroscopic measuring device in which a light section (2) is arranged on one side of the holding section (9), and a light receiving section (3) is arranged on the other side of the mounting section (9).
【請求項3】  前記試料(S)が穀物である請求項1
又は2記載の分光測定装置。
[Claim 3] Claim 1, wherein the sample (S) is a grain.
Or the spectrometer according to 2.
JP7766791A 1991-04-10 1991-04-10 Spectrometer Expired - Lifetime JP2644098B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7766791A JP2644098B2 (en) 1991-04-10 1991-04-10 Spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7766791A JP2644098B2 (en) 1991-04-10 1991-04-10 Spectrometer

Publications (2)

Publication Number Publication Date
JPH04310848A true JPH04310848A (en) 1992-11-02
JP2644098B2 JP2644098B2 (en) 1997-08-25

Family

ID=13640234

Family Applications (1)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001018527A1 (en) * 1999-09-07 2001-03-15 Japan As Represented By Director General Of National Agriculture Research Center,Ministry Of Agriculture, Forestry And Fisheries Method and device for processing material
WO2015071706A1 (en) * 2013-11-14 2015-05-21 Teknologian Tutkimuskeskus Vtt Oy Optical analyzer, optical analyzing method and sample preparation device

Cited By (7)

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Publication number Priority date Publication date Assignee Title
WO2001018527A1 (en) * 1999-09-07 2001-03-15 Japan As Represented By Director General Of National Agriculture Research Center,Ministry Of Agriculture, Forestry And Fisheries Method and device for processing material
WO2015071706A1 (en) * 2013-11-14 2015-05-21 Teknologian Tutkimuskeskus Vtt Oy Optical analyzer, optical analyzing method and sample preparation device
CN106170692A (en) * 2013-11-14 2016-11-30 格兰森斯股份公司 Optical analyzer, optical analysis method and sample preparation apparatus
JP2016537655A (en) * 2013-11-14 2016-12-01 グラインセンス オーワイGrainsense Oy Optical analysis apparatus, optical analysis method, and sample preparation apparatus
US10073031B2 (en) 2013-11-14 2018-09-11 Grainsense Oy Optical analyzer, optical analyzing method and sample preparation device
CN106170692B (en) * 2013-11-14 2019-06-07 格兰森斯股份公司 Optical analyzer, optical analysis method and sample preparation apparatus
AU2013405440B2 (en) * 2013-11-14 2019-08-22 Grainsense Oy Optical analyzer, optical analyzing method and sample preparation device

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