JPH0426360U - - Google Patents
Info
- Publication number
- JPH0426360U JPH0426360U JP6736490U JP6736490U JPH0426360U JP H0426360 U JPH0426360 U JP H0426360U JP 6736490 U JP6736490 U JP 6736490U JP 6736490 U JP6736490 U JP 6736490U JP H0426360 U JPH0426360 U JP H0426360U
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- comparison
- decrease
- concentration
- internal liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 2
- 239000007788 liquid Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 2
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6736490U JPH0426360U (sl) | 1990-06-26 | 1990-06-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6736490U JPH0426360U (sl) | 1990-06-26 | 1990-06-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0426360U true JPH0426360U (sl) | 1992-03-02 |
Family
ID=31600873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6736490U Pending JPH0426360U (sl) | 1990-06-26 | 1990-06-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0426360U (sl) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002107324A (ja) * | 2000-07-25 | 2002-04-10 | Mettler Toledo Ag | 電位差測定用測定プローブ、測定プローブの老化状態を監視する方法及び測定プローブの使用法 |
JP2009282011A (ja) * | 2008-05-22 | 2009-12-03 | Korea Atom Energ Res Inst | 自動校正機能を有する基準電極及びそれを使用した電気化学的電位自動補正装置 |
-
1990
- 1990-06-26 JP JP6736490U patent/JPH0426360U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002107324A (ja) * | 2000-07-25 | 2002-04-10 | Mettler Toledo Ag | 電位差測定用測定プローブ、測定プローブの老化状態を監視する方法及び測定プローブの使用法 |
JP2009282011A (ja) * | 2008-05-22 | 2009-12-03 | Korea Atom Energ Res Inst | 自動校正機能を有する基準電極及びそれを使用した電気化学的電位自動補正装置 |