JPH04251801A - Fungiproof antireflection film - Google Patents

Fungiproof antireflection film

Info

Publication number
JPH04251801A
JPH04251801A JP3027959A JP2795991A JPH04251801A JP H04251801 A JPH04251801 A JP H04251801A JP 3027959 A JP3027959 A JP 3027959A JP 2795991 A JP2795991 A JP 2795991A JP H04251801 A JPH04251801 A JP H04251801A
Authority
JP
Japan
Prior art keywords
film
mold
layer
optical
optical element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP3027959A
Other languages
Japanese (ja)
Inventor
Toshiaki Oimizu
利明 生水
Toshiaki Tezuka
手塚 利明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP3027959A priority Critical patent/JPH04251801A/en
Publication of JPH04251801A publication Critical patent/JPH04251801A/en
Withdrawn legal-status Critical Current

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  • Agricultural Chemicals And Associated Chemicals (AREA)
  • Surface Treatment Of Optical Elements (AREA)

Abstract

PURPOSE:To semipermanently suppress the generation of fungi on the surfaces of optical parts without contaminating the optical systems and without lowering the optical performance thereof. CONSTITUTION:An ITO film 8 (or In2O3 film) is formed as a 1st film in an effective luminous flux diameter part 3 on a substrate 7 of the optical element and the peripheral part 4 thereof. An MgF2 film 9 is then formed as a 2nd layer on the effective luminous flux diameter part 3 on the 1st layer, an ITO film 8 as a 3rd layer and an MgF2 film 9 as a 4th layer respectively thereon. Then, the ITO film 8 of the 1st layer having the excellent fungiproofness prevents the generation and advance of the fungi from the periphery of the holding part of the optical element.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、光学部品から構成され
る各種の精密機器や光学機器等においてカビの発生を防
止するための防カビ性反射防止膜に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mold-proof anti-reflection film for preventing the growth of mold in various precision instruments, optical instruments, etc. made up of optical parts.

【0002】0002

【従来の技術】一般に、顕微鏡、スチルカメラ、電子カ
メラ、ビデオカメラ等の精密光学機器において、光学素
子の表面に対するカビの発生により、基本光学性能の低
下や外観不良等が生じることがある。特に、光学素子の
光束有効径内におけるカビの発生は、他の部分に比べて
著しく光学性能を損なうため、特に重要な課題となって
いる。
BACKGROUND OF THE INVENTION Generally, in precision optical instruments such as microscopes, still cameras, electronic cameras, and video cameras, the growth of mold on the surfaces of optical elements may cause a decline in basic optical performance or poor appearance. In particular, the growth of mold within the effective luminous diameter of an optical element is a particularly important issue because it significantly impairs optical performance compared to other parts.

【0003】従来、防カビ対策としては、光学系付近に
種々の防カビ剤の固定をすることが最も有効であると考
えられていた。例えば、防カビ剤を塗料に添加して光学
系周辺部材に塗布するとか、防カビ剤を固形化して光学
素子周辺に設置する等の手段がなされていた。
Conventionally, it has been thought that the most effective anti-mold measure is to fix various anti-mold agents near the optical system. For example, methods have been taken such as adding a fungicide to a paint and applying it to peripheral members of an optical system, or solidifying a fungicide and installing it around an optical element.

【0004】0004

【発明が解決しようとする課題】しかし、上記従来の防
カビ手段では、防カビ剤の有効期限に限界があり、また
長期間に亘って防カビ効果を持続させるために、防カビ
剤の添加量を増加させると、周辺に再結晶して光学系自
体を汚染することになり、さらに臭気も発生する等の問
題があった。また、防カビ薬剤を光学素子表面に直接処
理する試みもなされたが、光学性能の維持が困難である
という点で実用化にはいたらなかった。さらに、反射防
止膜材料の中からカビの発生を抑制する材料を選択し、
従来の材料に代えて使用する試みも行われ、ある程度の
効果を出したが、必要十分な効果は得られていない。
[Problems to be Solved by the Invention] However, with the above-mentioned conventional anti-mold means, there is a limit to the expiration date of the anti-mold agent, and in order to maintain the anti-mold effect over a long period of time, it is necessary to add an anti-mold agent. If the amount is increased, there are problems such as recrystallization in the surrounding area and contamination of the optical system itself, as well as generation of odor. There have also been attempts to directly treat the surface of optical elements with antifungal agents, but this has not been put to practical use because it is difficult to maintain optical performance. Furthermore, we select materials that suppress the growth of mold from among anti-reflective coating materials,
Attempts have been made to use it in place of conventional materials, and although some results have been achieved, the necessary and sufficient effects have not been achieved.

【0005】本発明は、かかる従来の問題点に鑑みてな
されたもので、光学系を汚染することなく、しかも光学
性能を低下させずに半永久的に光学部品表面でのカビの
発生を抑制することができる防カビ性反射防止膜を提供
することを目的とする。
The present invention has been made in view of such conventional problems, and is capable of semi-permanently suppressing the growth of mold on the surface of optical components without contaminating the optical system or degrading optical performance. The purpose of the present invention is to provide a mold-proof anti-reflection film that can be used as a mold-proof anti-reflective film.

【0006】[0006]

【課題を解決するための手段】反射防止膜が形成されて
いる光学部品が実際にカビの害を受ける多くの場合、光
学素子を保持する外周部にその害が特に顕著であること
に着目した。すなわち、図5に示すように、通常、光学
素子1はその外周部において枠2により保持されている
。図5において、3は光学素子1の光束有効径部を示し
、4はその周辺部を示す。図5に示す領域5の拡大図で
ある図6に示すように、光学部品に発生するカビ6は、
枠2側から光学素子1の周辺部4を通って光学素子1の
中心部側へ向けて繁殖する場合が多い。これは、カビ6
の発生機構として、粗面でかつ複雑な形状の部分にカビ
菌の付着が発生しやすいことが主な原因であると考えら
れる。よって、光学素子1の周辺部4に強い防カビ領域
を設定することにより、光学素子1の中央部の光束有効
径部3をカビ6から守ることが可能になる。
[Means for solving the problem] We focused on the fact that in many cases where optical components on which anti-reflection films are formed are actually damaged by mold, the damage is particularly noticeable on the outer periphery that holds the optical elements. . That is, as shown in FIG. 5, the optical element 1 is normally held by the frame 2 at its outer periphery. In FIG. 5, 3 indicates a luminous flux effective diameter portion of the optical element 1, and 4 indicates its peripheral portion. As shown in FIG. 6, which is an enlarged view of area 5 shown in FIG.
In many cases, they propagate from the frame 2 side through the peripheral part 4 of the optical element 1 toward the center part of the optical element 1. This is mold 6
The main reason for this occurrence is thought to be that mold and bacteria are more likely to adhere to rough surfaces and parts with complex shapes. Therefore, by setting a strong anti-mold region in the peripheral part 4 of the optical element 1, it becomes possible to protect the luminous flux effective diameter part 3 in the central part of the optical element 1 from mold 6.

【0007】従来実施されている枠2部分への薬剤処理
は、コスト面や光学素子1に及ぼす副作用から考えて好
ましくない。そこで、本発明者は光学素子1の光束有効
径部3の周辺部4に対し、反射防止膜作成と同時に防カ
ビ性を付与することで、周辺部4からの光学素子1の光
束有効径部3内へのカビ6の侵入を防ぐ方法を開発した
The conventional treatment of the frame 2 with chemicals is undesirable in terms of cost and side effects on the optical element 1. Therefore, the inventor of the present invention provided anti-mildew properties to the peripheral part 4 of the effective luminous diameter part 3 of the optical element 1 at the same time as forming an antireflection film, so that the effective luminous diameter part of the optical element 1 from the peripheral part 4 We have developed a method to prevent mold 6 from entering 3.

【0008】すなわち、上記目的を達成するために、本
発明は、光学素子の基板表面上に第1層として防カビ性
に優れた反射防止膜材料を光束有効径部だけでなくその
周辺部まで広い範囲に成膜し、第2層目以降は従来と同
様に光束有効径部内に反射防止膜を成膜することとした
。具体的には、光学素子の基板側から順に、第1層とし
て酸化インジウム(In2 O3 )膜または酸化イン
ジウム酸化スズ化合物(ITO)膜を光束有効径部の周
辺部まで広い面積に成膜し、第2層以降の成膜を光束有
効径部内に行う。
That is, in order to achieve the above object, the present invention provides an anti-reflection coating material having excellent anti-fungal properties as a first layer on the surface of a substrate of an optical element, not only in the effective luminous diameter area but also in the peripheral area thereof. The film was formed over a wide area, and from the second layer onward, an antireflection film was formed within the effective diameter of the light beam, as in the conventional case. Specifically, starting from the substrate side of the optical element, an indium oxide (In2O3) film or an indium tin oxide compound (ITO) film is formed as a first layer over a wide area up to the periphery of the luminous flux effective diameter, The second and subsequent layers are formed within the luminous flux effective diameter portion.

【0009】[0009]

【作用】上記構成の本発明の防カビ性反射防止膜におい
ては、光学素子を保持する枠等の部材と光学素子の反射
防止機能を有する領域との間にある防カビ性膜が、光学
素子の保持部周辺からのカビ発生進出を防ぐ。防カビ効
果を発揮するのは、In2 O3 またはITOである
。これは、被検体表面にカビの生菌を塗布し、カビの生
育に好適な環境下で一定期間(通常3週間)培養を実施
し、その後の発育状況で防カビ性の有無を確認して無処
理品に対しカビ菌の発育がなければ防カビ性があると判
断する培養試験で、防カビ性を有することが確認されて
いる。膜構成上、本発明のように最外面に出ている場合
は防カビ効果が大きい。
[Function] In the mold-proof anti-reflection film of the present invention having the above structure, the mold-proof film located between the member such as the frame holding the optical element and the area having the anti-reflection function of the optical element is Prevents mold from growing around the holding part. In2O3 or ITO exhibits the antifungal effect. This involves applying live mold to the surface of the specimen, culturing it for a certain period of time (usually 3 weeks) in an environment suitable for mold growth, and then checking the growth status to see if it has anti-mold properties. It has been confirmed that the product has anti-mold properties through a culture test, which determines that it has anti-mold properties if there is no growth of mold on untreated products. Due to the structure of the membrane, when it is exposed on the outermost surface as in the present invention, the antifungal effect is great.

【0010】0010

【実施例1】図1に示すように、光学素子のガラスから
なる基板7の表面上における光束有効径部3およびその
周辺部4に、第1層としてITO膜8を光束有効径より
大きいレンズホルダを用いて真空蒸着により成膜した。 次に、その第1層上の光束有効径部3に、第2層として
MgF2 膜9を、第3層としてITO膜8を、第4層
としてMgF2 膜9をそれぞれ光束有効径内のレンズ
ホルダを用いて真空蒸着により成膜し、防カビ性反射防
止膜を得た。
[Embodiment 1] As shown in FIG. 1, an ITO film 8 is applied as a first layer to a light beam effective diameter portion 3 and its peripheral portion 4 on the surface of a substrate 7 made of glass of an optical element. A film was formed by vacuum evaporation using a holder. Next, a MgF2 film 9 is applied as a second layer, an ITO film 8 is applied as a third layer, and an MgF2 film 9 is applied as a fourth layer to the effective diameter portion 3 of the luminous flux on the first layer. A film was formed by vacuum evaporation using the above method to obtain a mold-proof anti-reflection film.

【0011】真空蒸着は、蒸着チャンバ内を蒸着真空度
1×10−5Torrまで排気し、基板温度を150〜
200℃に設定するとともに、ITO蒸着時にはO2 
ガスをチャンバ内に導入して真空度を1×10−4To
rrに設定し、EB(電子銃)蒸着により行った。また
MgF2 蒸着時にはガス導入を行わずにEB蒸着を行
った。
[0011] In vacuum evaporation, the inside of the evaporation chamber is evacuated to a evaporation vacuum level of 1 x 10-5 Torr, and the substrate temperature is set to 150~150°C.
In addition to setting the temperature to 200℃, O2 was used during ITO deposition.
Gas is introduced into the chamber and the degree of vacuum is 1×10-4To.
rr, and EB (electron gun) evaporation was performed. Further, during MgF2 deposition, EB deposition was performed without introducing gas.

【0012】表1に、本実施例の防カビ性反射防止膜の
膜構成および膜厚を示す。
Table 1 shows the film structure and film thickness of the anti-mildew antireflection film of this example.

【0013】[0013]

【表1】[Table 1]

【0014】本実施例の防カビ性反射防止膜と、ITO
膜を設けない無処理の膜(比較例)とを併置して、カビ
の培養試験(温度30℃、湿度95%)を3週間に亘っ
て実施したところ(第1回目)、本実施例のものはカビ
が発生しなかったのに対し、比較例のものはカビが発生
してしまった。また、本実施例のものは、3週間経過後
においても光学性能上の低下は認められなかった。さら
に、第2回目として、上記各サンプルを洗浄後、再度試
験を行ったところ、防カビ性能は第1回目と同様の結果
を示し、本実施例の防カビ性反射防止膜は、経時的にも
非常に安定した防カビ性能を有することが明らかになっ
た。
[0014] The anti-fungal anti-reflective film of this example and the ITO
When a mold culture test (temperature 30°C, humidity 95%) was conducted for three weeks (first time) with an untreated membrane without a membrane (comparative example), it was found that While the sample did not develop mold, mold did develop in the comparative example. Further, in this example, no deterioration in optical performance was observed even after 3 weeks. Furthermore, when each of the above samples was washed and tested again for the second time, the mold-proofing performance showed the same results as the first time. It has also been revealed that it has very stable anti-mold performance.

【0015】表2に、上記培養試験の結果を示す。Table 2 shows the results of the above culture test.

【0016】[0016]

【表2】[Table 2]

【0017】なお、図2に本実施例の防カビ性反射防止
膜の反射率特性を示す。図2は、横軸に波長(nm)を
、縦軸に反射率(%)をとったもので、この図から判る
ように、本実施例の防カビ性反射防止膜は良好な反射率
特性を有している。
Incidentally, FIG. 2 shows the reflectance characteristics of the anti-mildew anti-reflection film of this example. Figure 2 shows wavelength (nm) on the horizontal axis and reflectance (%) on the vertical axis.As can be seen from this figure, the anti-mildew anti-reflective film of this example has good reflectance characteristics. have.

【0018】[0018]

【実施例2】図3および表3に膜構成および膜厚を示す
ように、ガラスの基板7上に防カビ性反射防止膜を形成
した。本実施例において、前記実施例1と異なる点は、
2層構成からなる点である。その他の蒸着条件等は実施
例1と同様である。
[Example 2] A mold-proof antireflection film was formed on a glass substrate 7 as shown in the film structure and film thickness shown in FIG. 3 and Table 3. This example differs from Example 1 as follows:
It has a two-layer structure. Other vapor deposition conditions and the like are the same as in Example 1.

【0019】[0019]

【表3】[Table 3]

【0020】本実施例の防カビ性反射防止膜についても
、前記と同様のカビの培養試験を実施したところ、防カ
ビ効果は実施例1に比べてさらに助長され、カビはまっ
たく発生しなかった。なお、膜厚を変更したのは、反射
防止性能を維持するためである。
[0020] When the mold-proof anti-reflective film of this example was subjected to the same mold culture test as described above, the mold-proofing effect was further enhanced compared to Example 1, and no mold was generated at all. . Note that the reason for changing the film thickness was to maintain antireflection performance.

【0021】[0021]

【実施例3】図4および表4に膜構成および膜厚を示す
ように、ガラスの基板7上に防カビ性反射防止膜を形成
した。本実施例において、前記実施例1と異なる点は、
第1層および第3層がIn2 O3 膜10からなり、
第2層および第4層がSiO2 膜11からなる点であ
る。その他の蒸着条件等は実施例1と同様である。
Example 3 A mold-proof anti-reflection film was formed on a glass substrate 7, as shown in FIG. 4 and Table 4, showing the film structure and film thickness. This example differs from Example 1 as follows:
The first layer and the third layer are made of In2O3 film 10,
The second layer and the fourth layer are made of SiO2 film 11. Other vapor deposition conditions and the like are the same as in Example 1.

【0022】[0022]

【表4】[Table 4]

【0023】本実施例の防カビ性反射防止膜についても
、前記と同様の培養試験を行ったところ、防カビ効果は
実施例1に比べてさらに助長され、カビはまったく発生
しなかった。なお、膜厚を変更したのは、反射防止性能
を維持するためである。
[0023] When the same culture test as above was carried out for the anti-mold anti-reflective film of this example, the anti-mold effect was further enhanced compared to Example 1, and no mold was generated. Note that the reason for changing the film thickness was to maintain antireflection performance.

【0024】[0024]

【発明の効果】以上のように、本発明の防カビ性反射防
止膜によれば、光学素子の基板上に基板側から順に第1
層としてIn2 O3 またはITOの膜を光束有効径
部より広い面積に成膜し、第2層以降を有効径内にそれ
ぞれ真空蒸着により成膜したので、高い防カビ性能の部
分を一定面積、光学素子の光束有効径の周囲に設置でき
、これにより外周部分からのカビの進出を防げる。しか
も、薬剤添加ではないので光学系を汚染することもなく
、光学性能を低下させずに半永久的に光学素子光束有効
径面でのカビの発生を抑制することができる。
Effects of the Invention As described above, according to the anti-mold anti-reflection film of the present invention, the first anti-reflection film is coated on the substrate of an optical element in order from the substrate side.
As a layer, an In2O3 or ITO film was formed over an area wider than the effective diameter of the luminous flux, and the second and subsequent layers were formed within the effective diameter by vacuum evaporation, so that the part with high anti-fungal performance was formed over a certain area of the optical beam. It can be installed around the effective luminous diameter of the element, thereby preventing mold from advancing from the outer periphery. Moreover, since no chemicals are added, there is no contamination of the optical system, and the growth of mold on the effective diameter surface of the optical element can be suppressed semi-permanently without deteriorating optical performance.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の実施例1の防カビ性反射防止膜を示す
側面図である。
FIG. 1 is a side view showing a mold-proof antireflection film of Example 1 of the present invention.

【図2】本発明の実施例1の防カビ性反射防止膜の反射
率を示すグラフである。
FIG. 2 is a graph showing the reflectance of the anti-mildew anti-reflective film of Example 1 of the present invention.

【図3】本発明の実施例2の防カビ性反射防止膜を示す
側面図である。
FIG. 3 is a side view showing a mold-proof antireflection film of Example 2 of the present invention.

【図4】本発明の実施例3の防カビ性反射防止膜を示す
側面図である。
FIG. 4 is a side view showing a mold-proof antireflection film according to Example 3 of the present invention.

【図5】光学部品の要部を示す縦断面図である。FIG. 5 is a vertical cross-sectional view showing the main parts of the optical component.

【図6】図5における要部拡大縦断面図である。FIG. 6 is an enlarged vertical cross-sectional view of a main part in FIG. 5;

【符号の説明】[Explanation of symbols]

1  光学素子 3  光束有効径部 4  周辺部 6  カビ 7  基板 8  ITO膜 9  MgF2 膜 10  In2 O3 膜 11  SiO2 膜 1 Optical element 3 Effective diameter of luminous flux 4. Surrounding area 6 Mold 7 Board 8 ITO film 9 MgF2 membrane 10 In2 O3 film 11 SiO2 film

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  光学素子の基板表面に形成される防カ
ビ性反射防止膜において、基板表面における光束有効径
部およびその周辺部に第1層として酸化インジウム膜ま
たは酸化インジウム酸化スズ化合物膜を成膜し、その第
1層上における光束有効径部に第2層以降を順次成膜し
たことを特徴とする防カビ性反射防止膜。
Claim 1: In a mold-proof antireflection film formed on the surface of a substrate of an optical element, an indium oxide film or an indium oxide tin oxide compound film is formed as a first layer on the luminous flux effective diameter portion and its periphery on the substrate surface. 1. A mold-proofing antireflection film, characterized in that a second layer and subsequent layers are successively formed on the first layer at the luminous flux effective diameter portion.
JP3027959A 1991-01-28 1991-01-28 Fungiproof antireflection film Withdrawn JPH04251801A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3027959A JPH04251801A (en) 1991-01-28 1991-01-28 Fungiproof antireflection film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3027959A JPH04251801A (en) 1991-01-28 1991-01-28 Fungiproof antireflection film

Publications (1)

Publication Number Publication Date
JPH04251801A true JPH04251801A (en) 1992-09-08

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP3027959A Withdrawn JPH04251801A (en) 1991-01-28 1991-01-28 Fungiproof antireflection film

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JP (1) JPH04251801A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997026566A1 (en) * 1996-01-18 1997-07-24 Toyo Metallizing Co., Ltd. Plastic optical article having multi-layered antireflection film
USRE39215E1 (en) 1994-10-31 2006-08-01 Tru Vue, Inc. Antireflection coating for a temperature sensitive substrate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE39215E1 (en) 1994-10-31 2006-08-01 Tru Vue, Inc. Antireflection coating for a temperature sensitive substrate
WO1997026566A1 (en) * 1996-01-18 1997-07-24 Toyo Metallizing Co., Ltd. Plastic optical article having multi-layered antireflection film

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