JPH04247871A - Film forming device - Google Patents

Film forming device

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Publication number
JPH04247871A
JPH04247871A JP41662790A JP41662790A JPH04247871A JP H04247871 A JPH04247871 A JP H04247871A JP 41662790 A JP41662790 A JP 41662790A JP 41662790 A JP41662790 A JP 41662790A JP H04247871 A JPH04247871 A JP H04247871A
Authority
JP
Japan
Prior art keywords
substrate
chamber
film forming
intermediate chamber
substrates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP41662790A
Other languages
Japanese (ja)
Inventor
Yoshioki Yokoyama
佳興 横山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP41662790A priority Critical patent/JPH04247871A/en
Publication of JPH04247871A publication Critical patent/JPH04247871A/en
Pending legal-status Critical Current

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  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To improve film quality by subjecting substrates to film forming treatments in plural reaction chambers around an intermediate chamber and heating the substrates under transportation in the intermediate chamber. CONSTITUTION:An inlet/outlet chamber 2 for heating or cooling the substrates and the plural reaction chambers 3 to 5 for subjecting the substrates to the film forming treatments are disposed around the octagonal intermediate chamber 1. A substrate transporting mechanism for transporting the substrates is provided in the intermediate chamber 1. The films are formed on the substrates in the plural reaction chambers 3 to 5. Heaters 15 are provided in the intermediate chamber 1 and the substrates under transportation are heated by these heaters. The temp. fall of the substrate surfaces during the course of the transportation is suppressed in this way.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、成膜装置、特に、基板
を搬送するための中間室を有する成膜室に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a film forming apparatus, and more particularly to a film forming chamber having an intermediate chamber for transporting a substrate.

【0002】0002

【従来の技術】基板上に絶縁膜等の薄膜を形成する装置
として、スパッタリング装置やプラズマCVD装置等の
成膜装置が用いられている。
2. Description of the Related Art Film forming apparatuses such as sputtering apparatuses and plasma CVD apparatuses are used as apparatuses for forming thin films such as insulating films on substrates.

【0003】この成膜装置は、主に、成膜すべき基板が
搬入,搬出される出入口室と、出入口室に隣接して設け
られ成膜処理を行う反応室とから構成されている。成膜
の際には、出入口室に搬入した基板を反応室に導入して
成膜処理を行い、所定の成膜処理後、再び出入口室から
装置外部に搬出する。
[0003] This film forming apparatus mainly consists of an entrance/exit chamber into which substrates to be deposited are carried in and out, and a reaction chamber which is provided adjacent to the entrance/exit chamber and performs a film forming process. During film formation, the substrate carried into the entrance/exit chamber is introduced into the reaction chamber and subjected to film formation processing, and after a predetermined film formation process is carried out again from the entrance/exit chamber to the outside of the apparatus.

【0004】このような成膜装置において、出入口室と
複数の反応室とを中間室の周囲に配置したいわゆる複合
型の成膜装置が提案されている。中間室内には、各反応
室間で基板を搬送するための搬送機構が設けられている
Among such film forming apparatuses, a so-called composite type film forming apparatus has been proposed in which an entrance/exit chamber and a plurality of reaction chambers are arranged around an intermediate chamber. A transport mechanism for transporting the substrate between each reaction chamber is provided in the intermediate chamber.

【0005】この複合型成膜装置を用いて成膜処理を行
う際には、まず出入口室に搬入された基板を中間室の搬
送機構により反応室内に導入する。そして、この反応室
で成膜処理された基板は、搬送機構により、中間室を経
由して次の反応室内に導入される。このようにして、各
反応室と中間室との間で基板の受渡しを行いつつ基板上
に多層膜等の薄膜が形成される。この複合型成膜装置で
は、中間室の周囲に各反応室が放射状に配置されるので
、プロセスの拡張が容易に行える。また、各チャンバご
とに別々にメンテナンスを行えるので、処理能力が向上
する。成膜処理の終了した基板は、搬送機構により、中
間室から出入口室を通って装置外部に搬出される。
[0005] When performing a film forming process using this composite type film forming apparatus, first, a substrate carried into an entrance/exit chamber is introduced into a reaction chamber by a transport mechanism in an intermediate chamber. Then, the substrate subjected to the film formation process in this reaction chamber is introduced into the next reaction chamber via the intermediate chamber by the transport mechanism. In this way, a thin film such as a multilayer film is formed on the substrate while the substrate is transferred between each reaction chamber and the intermediate chamber. In this composite film forming apparatus, the reaction chambers are arranged radially around the intermediate chamber, so that the process can be easily expanded. Furthermore, since maintenance can be performed separately for each chamber, processing capacity is improved. The substrate on which the film-forming process has been completed is transported from the intermediate chamber to the outside of the apparatus through the entrance/exit chamber by the transport mechanism.

【0006】[0006]

【発明が解決しようとする課題】前記従来装置では、あ
る反応室から他の反応室へ基板を搬送する際には、基板
は必ず中間室を通って他の反応室へ搬送される。このた
め、搬送途中に基板の温度が一時的に下がり、この結果
、膜質の変化等の不具合が生じる場合がある。
In the conventional apparatus described above, when a substrate is transferred from one reaction chamber to another, the substrate is always transferred to the other reaction chamber through the intermediate chamber. Therefore, the temperature of the substrate temporarily decreases during transportation, which may result in problems such as changes in film quality.

【0007】本発明の目的は、膜質を向上できる成膜装
置を提供することにある。
An object of the present invention is to provide a film forming apparatus that can improve film quality.

【0008】[0008]

【課題を解決するための手段】本発明に係る成膜装置は
、中間室と、複数の反応室と、ヒータとを備えている。 前記中間室は、基板を搬送するためのものである。 前記反応室は、中間室の周囲に配置され、基板を加熱し
つつ成膜処理を行うものである。前記ヒータは、中間室
内に配置され、搬送途中の基板を加熱するためのもので
ある。
[Means for Solving the Problems] A film forming apparatus according to the present invention includes an intermediate chamber, a plurality of reaction chambers, and a heater. The intermediate chamber is for transporting the substrate. The reaction chamber is arranged around the intermediate chamber, and performs a film forming process while heating the substrate. The heater is arranged in the intermediate chamber and is used to heat the substrate during transportation.

【0009】[0009]

【作用】本発明では、中間室の周囲に配置された各反応
室において、基板を加熱しつつ成膜処理が行われる。ま
た、この処理の際、ある反応室で成膜処理された基板は
、中間室を通って他の反応室へ搬送され成膜処理が行わ
れる。この反応室間での基板搬送時には、中間室内に配
置されたヒータが、搬送途中の基板を加熱する。
[Operation] In the present invention, a film forming process is performed while heating the substrate in each reaction chamber arranged around the intermediate chamber. Further, during this process, a substrate subjected to a film formation process in a certain reaction chamber is transported to another reaction chamber through an intermediate chamber, and a film formation process is performed thereon. When the substrate is transferred between the reaction chambers, a heater placed in the intermediate chamber heats the substrate during transfer.

【0010】これにより、搬送途中において基板の温度
降下を抑制でき、膜質を向上できる。
[0010] This makes it possible to suppress the temperature drop of the substrate during transportation and improve the film quality.

【0011】[0011]

【実施例】図1は本発明の一実施例による複合型(マル
チチャンバ型)成膜装置を示している。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a composite type (multi-chamber type) film forming apparatus according to an embodiment of the present invention.

【0012】図1において、中間室1は概ね八角形状に
形成されている。中間室1の周囲には、基板の加熱また
は冷却を行う出入口室2と、成膜処理を行う複数の反応
室3〜5が配置されている。出入口室2及び各反応室3
〜5は、中間室1の各側面に対応して設けられている。 各反応室3〜5と中間室1との間には、それぞれ仕切弁
6〜8が設けられている。また、各反応室3〜5には、
それぞれ所定の反応ガスを導入するためのガス導入系9
〜11が接続されている。なお、図示していないが、各
反応室3〜5内には、成膜処理時に基板を加熱するため
のシーズヒータが配置されている。
In FIG. 1, the intermediate chamber 1 is generally formed into an octagonal shape. Arranged around the intermediate chamber 1 are an entrance/exit chamber 2 for heating or cooling a substrate, and a plurality of reaction chambers 3 to 5 for performing a film forming process. Entrance/exit chamber 2 and each reaction chamber 3
5 are provided corresponding to each side of the intermediate chamber 1. Gate valves 6 to 8 are provided between each reaction chamber 3 to 5 and intermediate chamber 1, respectively. In addition, in each reaction chamber 3 to 5,
Gas introduction system 9 for introducing respective predetermined reaction gases
~11 are connected. Although not shown, a sheathed heater for heating the substrate during the film forming process is arranged in each of the reaction chambers 3 to 5.

【0013】中間室1内には、各反応室3〜5と中間室
1との間で基板の受渡しを行うとともに、各反応室3〜
5間で基板の搬送を行う基板搬送機構(図示せず)が設
けられている。各反応室3〜5と対向する側の中間室1
の上部には、ヒータ15が設けられている。このヒータ
15は、中間室1内において搬送途中の基板表面の温度
降下を抑制するためのものである。ヒータ15は、反応
室3と対向する側に設けられたヒータ15aと、反応室
5と対向する側に設けられたヒータ15bとを有してい
る。各ヒータ15a,15bは、それぞれ反応室4と対
向する側に一部延長して設けられている。
In the intermediate chamber 1, substrates are transferred between each reaction chamber 3 to 5 and the intermediate chamber 1, and each reaction chamber 3 to
A substrate transport mechanism (not shown) is provided for transporting the substrate between 5 and 5. Intermediate chamber 1 on the side facing each reaction chamber 3 to 5
A heater 15 is provided above. This heater 15 is for suppressing a temperature drop on the surface of the substrate during transportation within the intermediate chamber 1. The heater 15 includes a heater 15 a provided on a side facing the reaction chamber 3 and a heater 15 b provided on a side facing the reaction chamber 5 . Each heater 15a, 15b is provided with a portion extending on the side facing the reaction chamber 4, respectively.

【0014】次に、動作について説明する。成膜処理の
際には、まず、処理すべき基板が載置されたカセットホ
ルダ16を出入口室2内に搬入する。このとき、出入口
室2内には、基板の予備加熱が行われる。次に、中間室
1内の基板搬送機構を駆動して、カセットホルダ16上
の基板を取り出し、この基板を保持した状態で反応室3
との対向位置(ヒータ15aの下方位置)に移動させる
。このとき、ヒータ15aはオンとなっており、このヒ
ータ15aにより基板の予備加熱が行われる。この状態
から、仕切弁6を開き、基板搬送機構の駆動により基板
を反応室3内に導入する。導入処理後、再び仕切弁6を
閉じ、反応室3内で所定の成膜処理が行われる。すなわ
ち、反応室3内にガス導入系9から所定の反応ガスを導
入するとともに、基板を加熱した状態で成膜処理が行わ
れる。
Next, the operation will be explained. During the film forming process, first, the cassette holder 16 on which the substrate to be processed is placed is carried into the entrance/exit chamber 2 . At this time, the substrate is preheated in the entrance/exit chamber 2. Next, the substrate transport mechanism in the intermediate chamber 1 is driven to take out the substrate on the cassette holder 16, and the substrate is held in the reaction chamber 1.
(a position below the heater 15a). At this time, the heater 15a is on, and the substrate is preheated by the heater 15a. From this state, the gate valve 6 is opened and the substrate is introduced into the reaction chamber 3 by driving the substrate transport mechanism. After the introduction process, the gate valve 6 is closed again, and a predetermined film forming process is performed within the reaction chamber 3. That is, a predetermined reaction gas is introduced into the reaction chamber 3 from the gas introduction system 9, and the film forming process is performed with the substrate heated.

【0015】反応室3での成膜処理後、仕切弁6を開き
、基板搬送機構により成膜処理後の基板を反応室3内か
ら取り出して、次の成膜処理を行う反応室4との対向位
置(ヒータ15a,15bの下方位置)に移動させる。 この基板搬送の際、基板には常時ヒータ15a,15b
からの熱が加えられており、搬送途中に基板表面の温度
が下がるのが抑制される。これにより、温度降下による
膜質の変化等を防止できる。
After the film forming process in the reaction chamber 3, the gate valve 6 is opened, and the substrate after the film forming process is taken out from the reaction chamber 3 by the substrate transport mechanism, and the substrate is transferred to the reaction chamber 4 where the next film forming process will be performed. The heaters 15a and 15b are moved to opposing positions (positions below the heaters 15a and 15b). During this substrate transfer, the substrate is constantly heated by heaters 15a and 15b.
Heat is applied to the substrate to prevent the temperature of the substrate surface from decreasing during transportation. This can prevent changes in film quality due to temperature drop.

【0016】次に、前記反応室3での処理の場合と同様
にして、仕切弁7を開き反応室4内に基板を導入して、
反応室4内で同様に基板を加熱しつつ所定の成膜処理を
行う。成膜処理後、基板は再び基板搬送機構により搬送
されて反応室5との対向位置(ヒータ15bの下方位置
)に移動する。この搬送の際においても同様に、ヒータ
15bにより基板表面の温度が下がるのが抑制される。 次に、反応室5内に基板を導入して成膜処理を行う。こ
のようにして、基板上に多層膜(ここでは3層膜)が形
成されることになる。反応室5での処理後、基板は、基
板搬送機構により出入口室内2へ搬送されてカセットホ
ルダ16上へ載置され、装置外部へ搬出される。
Next, in the same manner as in the case of the treatment in the reaction chamber 3, the gate valve 7 is opened and the substrate is introduced into the reaction chamber 4.
A predetermined film forming process is performed while heating the substrate in the reaction chamber 4 in the same manner. After the film forming process, the substrate is transported again by the substrate transport mechanism and moved to a position facing the reaction chamber 5 (a position below the heater 15b). During this transportation, the heater 15b similarly prevents the temperature of the substrate surface from decreasing. Next, the substrate is introduced into the reaction chamber 5 and a film forming process is performed. In this way, a multilayer film (here, a three-layer film) is formed on the substrate. After processing in the reaction chamber 5, the substrate is transported to the entrance/exit chamber 2 by the substrate transport mechanism, placed on the cassette holder 16, and transported outside the apparatus.

【0017】このようにして、膜の均質性を維持しつつ
成膜処理が行われる。
[0017] In this way, the film forming process is performed while maintaining the homogeneity of the film.

【0018】〔他の実施例〕前記実施例では、各反応室
3〜5に対応するヒータとして2つのヒータ15a,1
5bを配置したものを示したが、各反応室ごとにヒータ
を用意し、計3つのヒータを配置するようにしてもよい
[Other Embodiments] In the embodiments described above, two heaters 15a and 1 are used as heaters corresponding to each of the reaction chambers 3 to 5.
5b, a heater may be provided for each reaction chamber, and a total of three heaters may be provided.

【0019】また、前記実施例では、各ヒータ15a,
15bを単にオン状態にするだけのものについて示した
が、各反応室3〜5内での各処理温度に対応させて各ヒ
ータ15a,15bの温度コントロールを行うようにし
てもよい。この場合には、膜の均質性をより向上できる
Furthermore, in the above embodiment, each heater 15a,
Although the heater 15b is simply turned on, the temperature of the heaters 15a and 15b may be controlled in accordance with each processing temperature in each of the reaction chambers 3 to 5. In this case, the homogeneity of the film can be further improved.

【0020】[0020]

【発明の効果】本発明に係る成膜装置では、中間室内に
基板加熱用のヒータを配置したので、搬送途中の基板表
面の温度が下がるのを抑制でき、膜質を向上できる。
Effects of the Invention In the film forming apparatus according to the present invention, since a heater for heating the substrate is disposed in the intermediate chamber, it is possible to suppress a drop in temperature of the substrate surface during transportation, and improve film quality.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明の一実施例による成膜装置の平面概略図
である。
FIG. 1 is a schematic plan view of a film forming apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1  中間室 3〜5  反応室 15  ヒータ 1 Intermediate room 3-5 Reaction chamber 15 Heater

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  基板を搬送するための中間室と、前記
中間室の周囲に配置され、基板を加熱しつつ成膜処理を
行う複数の反応室と、前記中間室内に配置され、搬送途
中の基板を加熱するためのヒータと、を備えた成膜装置
1. An intermediate chamber for transporting a substrate; a plurality of reaction chambers arranged around the intermediate chamber for performing film formation processing while heating the substrate; A film forming apparatus equipped with a heater for heating a substrate.
JP41662790A 1990-12-27 1990-12-27 Film forming device Pending JPH04247871A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP41662790A JPH04247871A (en) 1990-12-27 1990-12-27 Film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP41662790A JPH04247871A (en) 1990-12-27 1990-12-27 Film forming device

Publications (1)

Publication Number Publication Date
JPH04247871A true JPH04247871A (en) 1992-09-03

Family

ID=18524840

Family Applications (1)

Application Number Title Priority Date Filing Date
JP41662790A Pending JPH04247871A (en) 1990-12-27 1990-12-27 Film forming device

Country Status (1)

Country Link
JP (1) JPH04247871A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007095637A (en) * 2005-09-30 2007-04-12 Toshiba Matsushita Display Technology Co Ltd Manufacturing apparatus of display device and method of manufacturing display device
JP2009302397A (en) * 2008-06-16 2009-12-24 Nuflare Technology Inc Vapor growth method, and vapor growth device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007095637A (en) * 2005-09-30 2007-04-12 Toshiba Matsushita Display Technology Co Ltd Manufacturing apparatus of display device and method of manufacturing display device
JP2009302397A (en) * 2008-06-16 2009-12-24 Nuflare Technology Inc Vapor growth method, and vapor growth device

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