JPH04224682A - Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method - Google Patents

Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method

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Publication number
JPH04224682A
JPH04224682A JP40614290A JP40614290A JPH04224682A JP H04224682 A JPH04224682 A JP H04224682A JP 40614290 A JP40614290 A JP 40614290A JP 40614290 A JP40614290 A JP 40614290A JP H04224682 A JPH04224682 A JP H04224682A
Authority
JP
Japan
Prior art keywords
plating solution
oxygen
plating
copper
electroless copper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP40614290A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Ikezoe
善幸 池添
Hisao Takano
高野 久夫
Takao Yamada
隆男 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP40614290A priority Critical patent/JPH04224682A/en
Publication of JPH04224682A publication Critical patent/JPH04224682A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To stabilize plating solution and to prevent lowering of precipitating velocity of a copper by increasing soluble oxygen in the plating solution up to the specific value according to increase of sp. gr. of the electroless copper plating solution. CONSTITUTION:During using the electroless copper plating solution containing >10g/l copper surface as Cu ion source, >4.5ml/l formalin as reducing agent for Cu ion, >60g/l ethylenediamine-tetraacetic acid as complexing agent and material refining agent and non-cyanogen series stabilizer and having >12.4 pH, lowering of plating capacity of the plating solution is detected with increase of this sp. gr. The plating solution in a plating vessel 9 is supplied into a vessel providing a static mixer element 5 by a pump 10, and oxygen from an oxygen cylinder 8 is supplied from an introducing hole 2 to increase oxygen concn. in the plating solution up to within the range of 6-20ppm. The copper having excellent quality is stably plated with the electroless method without lowering the precipitating velocity of copper.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、プリント配線板用の基
板の表面及び、スル−ホ−ル内面に銅めっきを施して導
体を形成するための無電解銅めっき法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electroless copper plating method for forming a conductor by plating copper on the surface of a substrate for a printed wiring board and the inner surface of a through-hole.

【0002】0002

【従来の技術】従来の無電解銅めっきは、銅塩、錯化剤
、還元剤、pH調整剤、安定剤等を主成分としている。 一般に、銅塩としては硫酸銅、錯化剤としてはエチレン
ジアミン四酢酸(EDTA)、還元剤としてはホルマリ
ン、pH調整剤としては苛性ソ−ダ、安定剤としては2
,2’ジピリジル等が使用されている。また、このよう
な無電解銅めっき液を使用してめっきを行うときは、め
っき槽に外部から配管を引込み、空気を供給して空気撹
拌を行うことによってめっき液の安定化を図っている。
BACKGROUND OF THE INVENTION Conventional electroless copper plating mainly contains copper salts, complexing agents, reducing agents, pH adjusters, stabilizers and the like. In general, the copper salt is copper sulfate, the complexing agent is ethylenediaminetetraacetic acid (EDTA), the reducing agent is formalin, the pH adjuster is caustic soda, and the stabilizer is 2
, 2' dipyridyl, etc. are used. Furthermore, when performing plating using such an electroless copper plating solution, the plating solution is stabilized by drawing piping into the plating tank from the outside and supplying air to perform air agitation.

【0003】このような無電解銅めっき方法において、
長期に連続してめっきを行うときには、以下のような問
題が発生する。例えば、硫酸銅、エチレンジアミン四酢
酸(EDTA)、ホルマリン、苛性ソ−ダ、2,2’ジ
ピリジルをその組成とし、1000l〜8000lの容
積のめっき槽を用い、めっき槽の底に穴あきパイプや多
孔質パイプを設置して空気撹拌を行い、めっき析出速度
が2.0〜2.5μm/hrで連続運転した場合、50
時間経過すると、めっき反応に伴って、硫酸ナトリウム
が約0.5モル/l、蟻酸ナトリウムが約0.1モル/
l生成され、めっき液の安定性を阻害し、銅降りが回路
導体間に発生する。また、銅物性、例えば銅伸び率が、
通常の圧延銅箔に比較して小さく、プリント配線板に使
用された場合に、はんだ等の熱によるストレスによって
回路が切断されやすい。このような問題を解決するため
に、めっき液を交換する技術、安定剤や銅の物性を改良
する添加剤を用いる技術、有害な副産物を除去する技術
、有害な副産物を発生させない技術、あるいは酸素を使
用してめっき液を安定化させる技術等さまざまな技術が
開発されている。以下に各従来例について説明する。
[0003] In such an electroless copper plating method,
When plating is performed continuously over a long period of time, the following problems occur. For example, copper sulfate, ethylenediaminetetraacetic acid (EDTA), formalin, caustic soda, and 2,2' dipyridyl are used as a plating tank with a volume of 1,000 to 8,000 liters. When continuous operation is performed at a plating deposition rate of 2.0 to 2.5 μm/hr with a quality pipe installed and air agitation,
Over time, as the plating reaction progresses, the amount of sodium sulfate and sodium formate is approximately 0.5 mol/l and approximately 0.1 mol/l, respectively.
1 is produced, which impedes the stability of the plating solution and causes copper deposits to occur between circuit conductors. In addition, physical properties of copper, such as copper elongation rate,
It is smaller than ordinary rolled copper foil, and when used in printed wiring boards, circuits are easily broken due to stress caused by heat from soldering. In order to solve these problems, we have developed techniques to replace the plating solution, techniques to use stabilizers and additives to improve the physical properties of copper, techniques to remove harmful by-products, techniques that do not generate harmful by-products, and techniques to use oxygen. Various technologies have been developed, including those that use plating solutions to stabilize them. Each conventional example will be explained below.

【0004】(めっき液を交換する従来例)このような
有害な副産物を抑制するために、大量の水やめっき液主
成分を投入し、オ−バ−フロ−させてめっき液を交換す
る方法や、めっき液の使用時間を管理して、40〜90
時間ごとに新たに建浴した液と交換する方法が知られて
いる。
(Conventional example of replacing the plating solution) In order to suppress such harmful by-products, a method of replacing the plating solution by adding a large amount of water or the main component of the plating solution and allowing it to overflow. Also, manage the usage time of the plating solution,
A method is known in which the liquid is replaced with freshly prepared bath liquid every hour.

【0005】(安定剤等を使用する従来例)また、安定
剤として、シアン化ナトリウムや五酸化バナジウム等を
添加することや、銅物性改良剤としてカルボン酸やゲル
マニウムを添加することや、あるいは界面活性剤を添加
する工夫や銅塩として蛾酸銅を使用する等の工夫がされ
ている。
(Conventional Examples of Using Stabilizers, etc.) In addition, sodium cyanide, vanadium pentoxide, etc. are added as stabilizers, carboxylic acids and germanium are added as copper physical property improvers, or interfacial Efforts have been made to add an activator and to use copper mothate as a copper salt.

【0006】(有害な副産物を除去あるいは発生させな
い従来例)特公昭57−43630号公報に開示されて
いるように、その無電解銅めっき液の一部を取り出し、
取り出した溶液を蒸留し、副産物の濃度をその溶解度よ
り高くして沈殿させ、その沈殿を除去して、残った濃縮
液を元の無電解銅めっき液に戻すことが知られている。
(Conventional example that does not remove or generate harmful by-products) As disclosed in Japanese Patent Publication No. 57-43630, a part of the electroless copper plating solution is taken out,
It is known to distill the removed solution, make the concentration of the by-product higher than its solubility, precipitate it, remove the precipitate, and return the remaining concentrated solution to the original electroless copper plating solution.

【0007】また、特公昭58−5983号には、この
ような有害な副産物を含ませない錯化剤と銅イオンの溶
液を製造する方法として、錯化剤を含む溶液に銅を陽極
として浸漬し、他の陰極との間に電位を加えて陽極であ
る銅を溶解し、錯化剤との化合物を作る方法が開示され
ている。
[0007] Furthermore, Japanese Patent Publication No. 58-5983 describes a method for producing a solution of a complexing agent and copper ions that does not contain such harmful by-products, in which copper is immersed as an anode in a solution containing a complexing agent. However, a method is disclosed in which a potential is applied between the anode and another cathode to dissolve the copper that is the anode to form a compound with a complexing agent.

【0008】さらに、銅沈殿装置や錯化剤回収装置を用
いて、銅イオンや錯化剤のみを回収し、再使用する方法
、イオン交換膜により硫酸イオンや蟻酸イオンを除去す
る方法、および、めっき液の銅源を水酸化銅や酸化第二
銅の形で供給することにより、有害な副産物そのものの
発生を少なくする方法等が知られている。
Furthermore, there is a method of recovering only copper ions and complexing agents using a copper precipitation device or a complexing agent recovery device and reusing them, a method of removing sulfate ions and formate ions using an ion exchange membrane, and A known method is to reduce the generation of harmful by-products by supplying the copper source of the plating solution in the form of copper hydroxide or cupric oxide.

【0009】(酸素を用いて安定化する従来例)さらに
また、特開昭63−3220号公報や特開昭63−49
50号公報に開示されているように、酸素ガスをめっき
槽内にバブリングしたり、外部配管から注入して、めっ
き液中の溶存酸素濃度を空気の飽和値よりも高くして、
老化しためっき液を長寿命化する方法が知られている。
(Conventional example of stabilization using oxygen) Furthermore, Japanese Patent Laid-Open No. 63-3220 and Japanese Patent Laid-Open No. 63-49
As disclosed in Publication No. 50, oxygen gas is bubbled into the plating tank or injected from external piping to make the dissolved oxygen concentration in the plating solution higher than the saturation value of air.
There are known methods for extending the life of aged plating solutions.

【0010】0010

【発明が解決しようとする課題】電子機器の発達に伴い
、配線板に要求される特性はもちろんのことであるが、
顧客への納期、価格等も同様に短縮しなければならなく
なってきている。このような顧客からの要求に対して、
絶縁基板の表面やスル−ホ−ル内への無電解めっきの速
度あるいは製造コストについて、より早くそしてより低
価格のものを提供する必要が生じてきたのである。 したがって、めっきの析出速度を高くすること、製造に
使用する材料の価格を低下させること、および製造装置
に係る経費の節減が重要な技術課題となってきている。
[Problem to be Solved by the Invention] With the development of electronic equipment, the characteristics required of wiring boards have of course increased.
Customer delivery times, prices, etc. must also be shortened. In response to such customer requests,
There has arisen a need to provide faster and lower cost electroless plating on the surface of insulating substrates and in through-holes, and at lower manufacturing costs. Therefore, increasing the deposition rate of plating, lowering the price of materials used for manufacturing, and reducing costs related to manufacturing equipment have become important technical issues.

【0011】ところで、前述の(めっき液を交換する従
来例)においては、大量のめっき廃液が発生し、処理設
備が必要となるので、経済的に実現が困難である。
By the way, in the above-mentioned conventional example in which the plating solution is replaced, a large amount of plating waste solution is generated and processing equipment is required, so that it is difficult to realize it economically.

【0012】また、(安定剤等を使用する従来例)にお
いては、めっき液の安定剤として使用するシアン化ナト
リウムは劇薬であり、取り扱いに注意を要し、また処理
設備が必要となり、五酸化バナジウムは高価であるため
、実用は困難である。また、銅物性の改良剤の場合、カ
ルボン酸は、めっき反応に伴って蟻酸になり、めっき液
の安定性を低下させ、ゲルマニウムは高価であって、界
面活性剤は有害な副産物の蓄積に伴ってその溶解度が低
下し、その効力を失うので、実用は困難である。蛾酸銅
を使用することは、有害な副産物を抑制する効果が低く
、めっき液の安定性が低いことから使用が困難である。
[0012] In addition, in the conventional example using stabilizers, etc., sodium cyanide used as a stabilizer in the plating solution is a powerful chemical, requires careful handling, and requires processing equipment. Since vanadium is expensive, it is difficult to put it into practical use. In addition, in the case of copper physical property improvers, carboxylic acid converts to formic acid during the plating reaction, reducing the stability of the plating solution, germanium is expensive, and surfactants accumulate harmful byproducts. However, its solubility decreases and it loses its effectiveness, making it difficult to put it into practical use. It is difficult to use copper mothate because it is less effective in suppressing harmful by-products and the stability of the plating solution is low.

【0013】さらに、(有害な副産物を除去あるいは発
生させない従来例)においては、特公昭57−4363
0号公報に開示されているように、その無電解銅めっき
液の一部を取り出し、取り出した溶液を蒸留し、副産物
の濃度をその溶解度より高くして沈殿させ、その沈殿を
除去して、残った濃縮液を元の無電解銅めっき液に戻す
方法では、硫酸ナトリウムを除去することはできても、
蟻酸ナトリウムを除去できないので、めっき液の安定性
を高める効果は小さい。
Furthermore, in (conventional example in which harmful by-products are not removed or generated), Japanese Patent Publication No. 57-4363
As disclosed in Publication No. 0, a part of the electroless copper plating solution is taken out, the taken out solution is distilled, the concentration of the by-product is made higher than its solubility and precipitated, and the precipitate is removed. Although it is possible to remove sodium sulfate by returning the remaining concentrated solution to the original electroless copper plating solution,
Since sodium formate cannot be removed, the effect of increasing the stability of the plating solution is small.

【0014】特公昭58−5983号に開示されている
ように、錯化剤を含む溶液に銅を陽極として浸漬し、他
の陰極との間に電位を加えて陽極である銅を溶解し、錯
化剤との化合物を作る方法では、装置が高価となり、ま
たその操作も複雑で作業性が低い。
As disclosed in Japanese Patent Publication No. 58-5983, copper as an anode is immersed in a solution containing a complexing agent, and a potential is applied between it and another cathode to dissolve the copper as an anode. In the method of making a compound with a complexing agent, the equipment is expensive, and the operation is complicated and the workability is low.

【0015】銅沈殿装置や錯化剤回収装置を用いて、銅
イオンや錯化剤のみを回収し、再使用する方法、イオン
交換膜により硫酸イオンや蟻酸イオンを除去する方法で
は、装置が高価になるとともに、イオン交換膜などの装
置の維持管理が必要で、実現が困難である。
[0015] In the method of recovering only copper ions and complexing agent using a copper precipitation device or complexing agent recovery device and reusing them, or in the method of removing sulfate ions and formate ions with an ion exchange membrane, the equipment is expensive. At the same time, it is difficult to realize this because it requires maintenance and management of equipment such as ion exchange membranes.

【0016】めっき液の銅源を水酸化銅や酸化第二銅の
形で供給することにより、有害な副産物そのものの発生
を少なくする方法では、材料が高価であり、また、溶解
度が小さいことから、めっき液の銅源として用いること
は実用的でない。
[0016] In the method of reducing the generation of harmful by-products by supplying the copper source of the plating solution in the form of copper hydroxide or cupric oxide, the material is expensive and has low solubility. , it is not practical to use it as a copper source for plating solutions.

【0017】これらの従来技術においては、めっき析出
速度は、通常で2μm/hr、最大でも3.2μm/h
rであり、また銅の物性では、伸び率が1〜5%程度で
ある。また、銅の伸び率は熱処理を行って改良しても2
〜10%程度である。このため、無電解めっき銅は固く
てもろい性質であると考えられていた。そこで、従来の
技術を用いて、めっき析出速度を高めるために、硫酸銅
の濃度を高めるなどして、4μm/hr程度をもくろん
で実験を行ったが、めっきを始めて9時間後に、激しい
銅降りが発生し、回路導体間が完全に短絡してしまうと
いう現象が起こった。このときの有害な副産物である蟻
酸ナトリウムは、0.04モル/l、硫酸ナトリウムは
0.2モル/lであり、従来のめっき析出速度では、銅
降りの発生するような含有量ではなかった。
[0017] In these conventional techniques, the plating deposition rate is usually 2 μm/hr and at most 3.2 μm/hr.
r, and in terms of the physical properties of copper, the elongation rate is about 1 to 5%. In addition, even if the elongation rate of copper is improved by heat treatment,
It is about 10%. For this reason, electroless plated copper was thought to be hard and brittle. Therefore, in order to increase the plating deposition rate using conventional technology, we conducted an experiment by increasing the concentration of copper sulfate, aiming at a rate of about 4 μm/hr. This caused a phenomenon in which the circuit conductors were completely short-circuited. The harmful by-products of this process, sodium formate, were 0.04 mol/l and sodium sulfate was 0.2 mol/l, and at the conventional plating deposition rate, the content was not such that copper precipitation would occur. .

【0018】本発明は、銅降り等の異状析出が発生せず
にめっき析出速度に優れ、かつ、析出した銅の物性に優
れた無電解銅めっき方法を提供することを目的とする。
An object of the present invention is to provide an electroless copper plating method that does not cause abnormal precipitation such as copper precipitation, has an excellent plating deposition rate, and has excellent physical properties of the deposited copper.

【0019】[0019]

【課題を解決するための手段】本発明者らは、めっき析
出速度と銅降り現象の関係を確認する実験を行い、その
結果を鋭意検討した結果、析出速度の高い場合における
銅降り現象は、有害な副産物にのみ影響されるのではな
く、高速で析出させたときのめっき液内での激しい酸素
消費とめっき液中の溶存酸素の減少、および溶存酸素の
減少をおこさせやすい配合組成によって引き起こされる
という知見を得た。また、この配合組成と有害な副産物
を検出する指標として、めっき液の比重が有用であると
いうことの知見も得た。
[Means for Solving the Problems] The present inventors conducted an experiment to confirm the relationship between the plating precipitation rate and the copper fall-off phenomenon, and as a result of intensive study of the results, the copper fall-off phenomenon when the deposition rate is high is as follows: It is not only affected by harmful by-products, but is also caused by the intense oxygen consumption in the plating solution during high-speed precipitation, the decrease in dissolved oxygen in the plating solution, and the formulation composition that tends to cause a decrease in dissolved oxygen. I got the knowledge that it can be done. We also found that the specific gravity of the plating solution is useful as an indicator for detecting the composition and harmful byproducts.

【0020】本発明者らは、これらの知見に基づいて、
新たな酸素供給方法と、その酸素の供給量をめっき液の
比重に対応させるという技術を確立し、本発明はこのこ
とによってなすことができた。
[0020] Based on these findings, the present inventors
The present invention has been made possible by establishing a new oxygen supply method and a technique for making the amount of oxygen supplied correspond to the specific gravity of the plating solution.

【0021】本発明の無電解銅めっき方法は、銅塩、錯
化剤、還元剤、pH調整剤、物性改良剤及び非シアン系
安定剤等を含む無電解銅めっき液を使用して、めっき液
の比重の増大に応じて、めっき液中の溶存酸素濃度を6
〜20ppmの範囲で増大させながらめっきを行うこと
を特徴とする。
[0021] The electroless copper plating method of the present invention uses an electroless copper plating solution containing a copper salt, a complexing agent, a reducing agent, a pH adjuster, a physical property improver, a non-cyanide stabilizer, etc. The dissolved oxygen concentration in the plating solution is increased by 6 as the specific gravity of the solution increases.
It is characterized in that plating is performed while increasing the amount in the range of ~20 ppm.

【0022】前記錯化剤として、エチレンジアミン四酢
酸の濃度を60g/l以上とすれば、長期に連続めっき
したときに、銅の伸び率の低下やボイドの発生を抑制す
る効果があり好ましい。
[0022] It is preferable that the concentration of ethylenediaminetetraacetic acid as the complexing agent be 60 g/l or more, since this has the effect of suppressing the decrease in copper elongation and the generation of voids during long-term continuous plating.

【0023】前記無電解銅めっき液中の銅塩としての硫
酸銅の濃度を10g/l以上、還元剤としてのホルマリ
ン濃度を4.5ml/l以上、pHを12.4以上とす
ると、めっきの初期に発生しやすい、過剰酸素による銅
表面の不動態化を抑制でき好ましい。
[0023] When the concentration of copper sulfate as a copper salt in the electroless copper plating solution is set to 10 g/l or more, the concentration of formalin as a reducing agent to 4.5 ml/l or more, and the pH to 12.4 or more, the plating This is preferable because passivation of the copper surface due to excess oxygen, which tends to occur initially, can be suppressed.

【0024】次に、本発明の無電解銅めっき液に酸素を
供給する装置は、図1に示すように、めっき液の流入口
とめっき液の流出口と酸素供給口を有する酸素供給槽と
、振動するスタチックミキサ−エレメントとを備え、前
記スタチックミキサ−エレメントを前記酸素供給槽に納
めたことを特徴とする。
Next, as shown in FIG. 1, the apparatus for supplying oxygen to the electroless copper plating solution of the present invention includes an oxygen supply tank having a plating solution inlet, a plating solution outlet, and an oxygen supply port. , a vibrating static mixer element, and the static mixer element is housed in the oxygen supply tank.

【0025】さらに本発明の無電解銅めっき液に酸素を
供給する装置は、図2に示すように、その中に気体と液
体とを分離するための隔壁とを備えラインミキサ−の吐
出口が接続された酸素供給槽と、振動するスタチックミ
キサ−エレメントと、めっき液の流入口と酸素供給口と
めっき液と酸素を混合した状態で加圧して送り出すエジ
ェクタ−とを備えたラインミキサ−とを備え、前記スタ
チックミキサ−エレメントを前記酸素供給槽に納めたこ
とを特徴とする。
Furthermore, as shown in FIG. 2, the device for supplying oxygen to the electroless copper plating solution of the present invention has a partition wall therein for separating gas and liquid, and the discharge port of the line mixer is connected to the device for supplying oxygen to the electroless copper plating solution. A line mixer equipped with a connected oxygen supply tank, a vibrating static mixer element, a plating solution inlet, an oxygen supply port, and an ejector that pressurizes and sends out a mixed state of the plating solution and oxygen. The static mixer element is housed in the oxygen supply tank.

【0026】このような装置において、前記酸素供給口
と、その供給口に接続される酸素ボンベとの間に供給さ
れる酸素量を制御する手段を設けることは、めっき槽と
、そのめっき槽からめっき液の一部を取り出す手段と、
その取り出した一部のめっき液に酸素供給槽で酸素を供
給する手段と、めっき槽中のめっき液の比重を監視する
手段と、めっき液の使用時間を記録保持する手段とを有
し、めっき液の使用時間とめっき液の比重から供給する
酸素の量を制御する手段を有する装置とすることができ
、めっき作業を自動で運転でき、好ましい。
In such an apparatus, providing means for controlling the amount of oxygen supplied between the oxygen supply port and the oxygen cylinder connected to the supply port means that the amount of oxygen supplied from the plating tank and the plating tank is a means for taking out a portion of the plating solution;
It has a means for supplying oxygen to a portion of the removed plating solution in an oxygen supply tank, a means for monitoring the specific gravity of the plating solution in the plating tank, and a means for keeping a record of the usage time of the plating solution. It is preferable that the device has means for controlling the amount of oxygen supplied based on the usage time of the solution and the specific gravity of the plating solution, and the plating work can be automatically operated.

【0027】[0027]

【作用】発明者らが鋭意検討した結果得られた知見に基
づいて、めっき析出速度を高めためっき液中で起こって
いると考えられる現象を以下に示す。
[Function] Based on the findings obtained through extensive research by the inventors, the following phenomena are believed to occur in the plating solution to increase the plating deposition rate.

【0028】(1) 無電解めっき液の主成分の反応は
  CuSO4+2HCHO+4NaOH→Cu0+2
HCOONa+Na2SO4+2H2O+H2    
        式1となっており、反応の結果、金属
銅が析出し、副産物である蟻酸ナトリウムおよび硫酸ナ
トリウムが生成し、水と水素が発生する。したがって、
めっき液の比重は、主成分と副産物の濃度によって決定
される。
(1) The reaction of the main components of the electroless plating solution is CuSO4+2HCHO+4NaOH→Cu0+2
HCOONa+Na2SO4+2H2O+H2
As a result of the reaction, metallic copper is precipitated, sodium formate and sodium sulfate are produced as by-products, and water and hydrogen are generated. therefore,
The specific gravity of the plating solution is determined by the concentrations of the main components and byproducts.

【0029】(2) 主反応に伴って   2Cu+HCHO+5OH−→Cu2O+HCOO
−+3H2O                   
        式2となる反応が起こり、このときに
生成された酸化第一銅が、   Cu2O+2HCHO+2NaOH→2Cu0+H
2+2HCOONa+H2O            
        式3という反応を、めっき液中で起こ
し、めっき液中に金属銅粒子を発生する。これが、銅降
りとよばれる現象であり、この金属銅粒子が被めっき体
に付着して、配線板の場合には、必要としない個所に導
体回路ができてしまうのである。
(2) Along with the main reaction, 2Cu+HCHO+5OH-→Cu2O+HCOO
−+3H2O
A reaction as shown in formula 2 occurs, and the cuprous oxide produced at this time is Cu2O+2HCHO+2NaOH→2Cu0+H
2+2HCOONa+H2O
A reaction expressed by Formula 3 occurs in the plating solution, and metallic copper particles are generated in the plating solution. This is a phenomenon called copper fall, and these metallic copper particles adhere to the object to be plated, and in the case of wiring boards, conductor circuits are formed in unnecessary locations.

【0030】(3) ここで、空気撹拌によって酸素を
供給した場合には、前述の式2で生成された酸化第一銅
を酸化して、   Cu2O+1/2O2+2H2O→2Cu2 +4
OH−                      
        式4となり、前述のめっき液中に金属
銅が生成することを抑制するのであるが、供給される酸
素の量が少ないと、酸化第一銅が触媒の働きをして、   2HCHO+O2+2NaOH→2HCOONa+
2H2O                     
        式5という反応が起こり、主反応以外
で副産物の蟻酸ナトリウムが発生し、めっき反応が不安
定となる。
(3) Here, when oxygen is supplied by air stirring, the cuprous oxide produced by the above formula 2 is oxidized to form Cu2O+1/2O2+2H2O→2Cu2+4
OH-
Equation 4 is obtained, which suppresses the formation of metallic copper in the plating solution mentioned above, but if the amount of oxygen supplied is small, cuprous oxide acts as a catalyst, and the following happens: 2HCHO+O2+2NaOH→2HCOONa+
2H2O
The reaction shown in Formula 5 occurs, and a by-product of sodium formate is generated in addition to the main reaction, making the plating reaction unstable.

【0031】(4) また、酸素は、前述の式1で起こ
るめっきの主反応で作られる水素ガスによって、めっき
液中から追い出され、前述の酸素の供給量が少なくなる
場合に起こる現象を増長させる。
(4) In addition, oxygen is driven out of the plating solution by the hydrogen gas produced in the main reaction of plating that occurs in equation 1 above, which aggravates the phenomenon that occurs when the amount of oxygen supplied is reduced. let

【0032】(5) 本発明は、めっきの析出速度を高
くした場合には、めっき液が不安定になるのは、有害な
副産物の蓄積よりも酸素の供給量が減ることによる方が
影響が大きいという知見によってなされたものである。 この知見に基づいて、本発明は、強制的に酸素を起こり
込むことと、連続的にめっきを行う場合に、供給する酸
素の量を増加することによって、めっき析出速度を高く
した場合でも、めっき液の安定性を確保できるのである
(5) In the present invention, when the deposition rate of plating is increased, the instability of the plating solution is caused more by a decrease in the amount of oxygen supplied than by the accumulation of harmful by-products. This was done based on the knowledge that it was large. Based on this knowledge, the present invention has been developed to improve plating even when the plating deposition rate is increased by forcibly introducing oxygen and increasing the amount of oxygen supplied when plating is performed continuously. This ensures the stability of the liquid.

【0033】[0033]

【実施例】以下に示す組成の無電解銅めっき液を用い、
図1に示す装置を用いて酸素を供給しながら無電解めっ
きを行った。 (めっき液組成) 硫酸銅                    10
g/lエチレンジアミン四酢酸    60g/lホル
マリン(37重量%)    5ml/l2,2’ジピ
リジル            20mg/lポリエチ
レングリコ−ル    0.1g/l水酸化ナトリウム
・・・・めっき液のpHを12.5にする量めっき条件
は、温度70℃、負荷2dm2/l、めっき槽の容積1
000lとし、被めっき体は、めっき触媒入りエポキシ
樹脂絶縁基板ACL−141N(日立化成工業株式会社
製商品名)の回路となる個所以外にめっきレジストを形
成した基板を使用した。1回のめっき処理はいずれも9
時間浸漬処理した。このときに、酸素供給槽として冷化
工業株式会社製バイブロミキサ−を用い、振動数は15
Hzとした。溶存酸素の測定は、オ−ビスフェアラボラ
トリ−ズ社製のポ−ラログラフィック方式のものを使用
し、めっき液を45℃に冷却して測定した。酸素ガスは
、酸素ガスボンベから所定の溶存酸素量となるように予
め測定しておいた圧力で、前述の酸素供給槽に注入した
[Example] Using an electroless copper plating solution with the composition shown below,
Electroless plating was performed using the apparatus shown in FIG. 1 while supplying oxygen. (Plating solution composition) Copper sulfate 10
g/l ethylenediaminetetraacetic acid 60g/l formalin (37% by weight) 5ml/l 2,2' dipyridyl 20mg/l polyethylene glycol 0.1g/l sodium hydroxide... Adjust the pH of the plating solution to 12.5 The plating conditions are: temperature 70℃, load 2dm2/l, plating tank volume 1.
000 l, and the substrate to be plated was a plating catalyst-containing epoxy resin insulating substrate ACL-141N (trade name, manufactured by Hitachi Chemical Co., Ltd.) on which a plating resist was formed except for the circuit areas. Each plating process is 9
Soaked for a period of time. At this time, a vibromixer manufactured by Reika Kogyo Co., Ltd. was used as the oxygen supply tank, and the vibration frequency was 15.
Hz. Dissolved oxygen was measured using a polarographic method manufactured by Orbis Fair Laboratories, Inc., and the plating solution was cooled to 45°C. Oxygen gas was injected from an oxygen gas cylinder into the above-mentioned oxygen supply tank at a pressure that was measured in advance so as to provide a predetermined amount of dissolved oxygen.

【0034】実施例1 第1回目のめっきを、初期の2時間は溶存酸素量が6p
pmとなるようにして行い、残りの7時間は溶存酸素量
が7ppmとなるようにして行った。この結果、めっき
に異状が全く発生せず、析出速度も4μm/hrと高く
、しかも銅の伸び率は12%と高かった。銅の伸び率は
、熱処理を行うことによって、21%にすることができ
た。
Example 1 During the first plating, the amount of dissolved oxygen was 6p for the initial 2 hours.
For the remaining 7 hours, the amount of dissolved oxygen was 7 ppm. As a result, no abnormality occurred in the plating, the deposition rate was as high as 4 μm/hr, and the elongation rate of copper was as high as 12%. The elongation rate of copper could be increased to 21% by heat treatment.

【0035】実施例2 10回のめっきを行い、第1回目は実施例1と同様に行
い、残りは、図3に示すように、比重の増大に応じて溶
存酸素の量を増加してめっきした。このときに測定した
溶存酸素濃度と比重の関係を図4に示す。この結果、第
2回目以降のめっきについても、めっきの異状は発生せ
ず、析出速度も低下しなかった。また、銅の伸び率につ
いても、7〜8%と高く、熱処理を行うと15〜19%
にすることができた。
Example 2 Plating was performed 10 times, the first time was performed in the same manner as in Example 1, and the remaining plating was performed by increasing the amount of dissolved oxygen according to the increase in specific gravity, as shown in FIG. did. The relationship between dissolved oxygen concentration and specific gravity measured at this time is shown in FIG. As a result, in the second and subsequent platings, no abnormalities occurred in the plating, and the deposition rate did not decrease. In addition, the elongation rate of copper is high at 7-8%, and when heat treated it increases to 15-19%.
I was able to do it.

【0036】比較例1 めっき液の組成そのほかの条件は同じにして、酸素の供
給を止め、めっき槽の底から空気を泡立たせて空気撹拌
した。その結果、めっきの析出速度は同じであったが、
銅降りが発生し、回路間は異状析出した銅によって短絡
してしまった。
Comparative Example 1 The composition of the plating solution and other conditions were the same, the supply of oxygen was stopped, and air was stirred by bubbling air from the bottom of the plating tank. As a result, the deposition rate of plating was the same, but
Copper rain occurred, and the circuits were short-circuited due to the abnormally deposited copper.

【0037】[0037]

【発明の効果】以上に述べたように、本発明の酸素を強
制的にめっき液の比重の増大に応じて増加して供給する
ことにより、以下の効果を示すめっき方法とそのための
酸素供給装置およびこの方法を行うためのめっき装置を
提供することができる。
Effects of the Invention As described above, by forcibly supplying oxygen in accordance with the increase in specific gravity of the plating solution, the plating method and oxygen supply device therefor exhibit the following effects. And a plating apparatus for carrying out this method can be provided.

【0038】めっき液を安定化させるための特殊な添加
剤や高価な薬剤を必要としない。
[0038] No special additives or expensive chemicals are required to stabilize the plating solution.

【0039】めっき析出速度を従来より高くすることが
できる。
[0039] The plating deposition rate can be made higher than before.

【0040】めっき析出速度を高くした上で、銅降りが
発生しない。
Even though the plating deposition rate is increased, copper precipitation does not occur.

【0041】添加剤を必要としないので、その廃液処理
も必要とせず、安全で経済的である。
[0041] Since no additives are required, there is no need to treat the waste liquid, making it safe and economical.

【0042】有害な副産物を除去するための設備や処理
を必要とせず、経済的である。
[0042] It is economical because no equipment or treatment is required to remove harmful by-products.

【0043】めっき液の安定化に、比重を測定し、その
結果によって酸素供給量を制御できればよく、設備が簡
便で、その管理・維持も簡便である。
[0043] To stabilize the plating solution, it is sufficient to measure the specific gravity and control the amount of oxygen supplied based on the result, and the equipment is simple and its management and maintenance are simple.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】  本発明の一実施例に用いた酸素供給装置を
示す概略図である。
FIG. 1 is a schematic diagram showing an oxygen supply device used in an embodiment of the present invention.

【図2】  本発明の他の実施例に用いた無電解銅めっ
き装置野全体を示す概略図である。
FIG. 2 is a schematic diagram showing the entire electroless copper plating apparatus used in another embodiment of the present invention.

【図3】  本発明の一実施例を説明するためのめっき
液の比重と供給した酸素の溶存酸素濃度の関係を示す線
図である。
FIG. 3 is a diagram showing the relationship between the specific gravity of a plating solution and the dissolved oxygen concentration of supplied oxygen, for explaining an embodiment of the present invention.

【図4】  本発明の一実施例の酸素供給の結果めっき
液中に検出される溶存酸素濃度と比重の関係を示す線図
である。
FIG. 4 is a diagram showing the relationship between the dissolved oxygen concentration detected in the plating solution and specific gravity as a result of oxygen supply according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1.酸素供給槽                  
    2.酸素供給口3.めっき液流入口     
             4.めっき液流出口 5.スタチックミキサ−エレメント    6.エジェ
クタ−
1. oxygen supply tank
2. Oxygen supply port 3. Plating solution inlet
4. Plating solution outlet 5. Static mixer element 6. Ejector

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】  銅塩、錯化剤、還元剤、pH調整剤、
物性改良剤及び非シアン系安定剤等を含む無電解銅めっ
き液を使用して、めっき液の比重の増大に応じて、めっ
き液中の溶存酸素濃度を6〜20ppmの範囲で増大さ
せながらめっきを行うことを特徴とする無電解銅めっき
法。
[Claim 1] Copper salt, complexing agent, reducing agent, pH adjuster,
Using an electroless copper plating solution containing a physical property improver and a non-cyanide stabilizer, plating is performed while increasing the dissolved oxygen concentration in the plating solution in the range of 6 to 20 ppm according to the increase in the specific gravity of the plating solution. An electroless copper plating method that is characterized by:
【請求項2】  前記錯化剤として、エチレンジアミン
四酢酸の濃度が60g/l以上であることを特徴とする
請求項1に記載の無電解銅めっき法。
2. The electroless copper plating method according to claim 1, wherein the concentration of ethylenediaminetetraacetic acid as the complexing agent is 60 g/l or more.
【請求項3】  前記無電解銅めっき液中の銅塩として
の硫酸銅の濃度が10g/l以上、還元剤としてのホル
マリン濃度が4.5ml/l以上、pHが12.4以上
であることを特徴とする請求項1又は2に記載の無電解
銅めっき法。
3. The concentration of copper sulfate as a copper salt in the electroless copper plating solution is 10 g/l or more, the concentration of formalin as a reducing agent is 4.5 ml/l or more, and the pH is 12.4 or more. The electroless copper plating method according to claim 1 or 2, characterized in that:
【請求項4】  めっき液の流入口とめっき液の流出口
と酸素供給口を有する密閉した酸素供給槽と、振動する
スタチックミキサ−エレメントとを備え、前記スタチッ
クミキサ−エレメントを前記酸素供給槽に納めたことを
特徴とする無電解銅めっき液に酸素を供給する装置。
4. A sealed oxygen supply tank having a plating solution inlet, a plating solution outlet, and an oxygen supply port, and a vibrating static mixer element, the static mixer element being connected to the oxygen supply tank. A device that supplies oxygen to an electroless copper plating solution that is housed in a tank.
【請求項5】  その中に気体と液体とを分離するため
の隔壁とを備えラインミキサ−の吐出口が接続された酸
素供給槽と、振動するスタチックミキサ−エレメントと
、めっき液の流入口と酸素供給口とめっき液と酸素を混
合した状態で加圧して送り出すエジェクタ−とを備えた
ラインミキサ−とを備え、前記スタチックミキサ−エレ
メントを前記酸素供給槽に納めたことを特徴とする無電
解銅めっき液に酸素を供給する装置。
5. An oxygen supply tank having a partition wall for separating gas and liquid therein and connected to a discharge port of a line mixer, a vibrating static mixer element, and an inlet for a plating solution. and a line mixer equipped with an oxygen supply port and an ejector that pressurizes and sends out a mixed state of plating solution and oxygen, and the static mixer element is housed in the oxygen supply tank. A device that supplies oxygen to electroless copper plating solution.
【請求項6】  前記酸素供給口と、その供給口に接続
される酸素ボンベとの間に供給される酸素量を制御する
手段を有することを特徴とする請求項4または5に記載
の無電解銅めっき液に酸素を供給する装置。
6. The electroless device according to claim 4, further comprising means for controlling the amount of oxygen supplied between the oxygen supply port and an oxygen cylinder connected to the supply port. A device that supplies oxygen to the copper plating solution.
【請求項7】  めっき槽と、そのめっき槽からめっき
液の一部を取り出す手段と、その取り出した一部のめっ
き液に酸素供給槽で酸素を供給する手段と、めっき槽中
のめっき液の比重を監視する手段と、めっき液の使用時
間を記録保持する手段とを有し、めっき液の使用時間と
めっき液の比重から供給する酸素の量を制御する手段を
有することを特徴とする無電解銅めっき装置。
7. A plating tank, a means for taking out a part of the plating solution from the plating tank, a means for supplying oxygen to the taken out part of the plating solution in an oxygen supply tank, and a means for supplying oxygen to the part of the plating solution in the plating tank. The device has a means for monitoring specific gravity, a means for keeping records of the usage time of the plating solution, and a means for controlling the amount of oxygen to be supplied based on the usage time of the plating solution and the specific gravity of the plating solution. Electrolytic copper plating equipment.
JP40614290A 1990-12-25 1990-12-25 Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method Pending JPH04224682A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP40614290A JPH04224682A (en) 1990-12-25 1990-12-25 Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP40614290A JPH04224682A (en) 1990-12-25 1990-12-25 Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method

Publications (1)

Publication Number Publication Date
JPH04224682A true JPH04224682A (en) 1992-08-13

Family

ID=18515765

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40614290A Pending JPH04224682A (en) 1990-12-25 1990-12-25 Electroless copper plating method, oxygen supplying device used to this method and electroless copper plating apparatus used to this method

Country Status (1)

Country Link
JP (1) JPH04224682A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0688246A (en) * 1992-09-03 1994-03-29 Matsushita Electric Works Ltd Electroless plating method
JP2002339080A (en) * 2001-05-16 2002-11-27 Ibiden Co Ltd Method for supplying component of chemical plating solution

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0688246A (en) * 1992-09-03 1994-03-29 Matsushita Electric Works Ltd Electroless plating method
JP2002339080A (en) * 2001-05-16 2002-11-27 Ibiden Co Ltd Method for supplying component of chemical plating solution
JP4642268B2 (en) * 2001-05-16 2011-03-02 イビデン株式会社 How to replenish chemical plating solution components

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