JPH0420835A - Apparatus for measuring noise of returned light - Google Patents
Apparatus for measuring noise of returned lightInfo
- Publication number
- JPH0420835A JPH0420835A JP12456290A JP12456290A JPH0420835A JP H0420835 A JPH0420835 A JP H0420835A JP 12456290 A JP12456290 A JP 12456290A JP 12456290 A JP12456290 A JP 12456290A JP H0420835 A JPH0420835 A JP H0420835A
- Authority
- JP
- Japan
- Prior art keywords
- light
- lens
- beam splitter
- optical
- monitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 62
- 230000004907 flux Effects 0.000 claims abstract description 26
- 230000007935 neutral effect Effects 0.000 claims description 6
- 230000002238 attenuated effect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 10
- 206010041662 Splinter Diseases 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 210000003127 knee Anatomy 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
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- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はレーザダイオード (以下LDと略称する)の
もどり光ノイズ測定装置の光学系に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an optical system for a return light noise measuring device of a laser diode (hereinafter abbreviated as LD).
LDをコンパクトディスクや光磁気ディスクなどの記録
、読み出しに用いる場合、LDからの出射光がこれらデ
ィスクの表面から反射してLDにもどり、このもどり光
によってLD発振が変調され、出射光量が一定にならな
くなることがある。When an LD is used for recording and reading compact disks, magneto-optical disks, etc., the light emitted from the LD is reflected from the surface of these disks and returns to the LD, and this returned light modulates the LD oscillation, making the amount of emitted light constant. It may disappear.
これをもどり光ノイズと称し、安定な記録、読み取りを
妨げるものである。したがって、LDのもどり光ノイズ
を測定し評価することが重要である第4図に従来のもど
り光ノイズ測定装置とその光学系の構成を模式図で示し
、第4図を参照してもどり光測定装置の概要とその光学
系について説明する。This is called return optical noise and interferes with stable recording and reading. Therefore, it is important to measure and evaluate the return light noise of the LD. Figure 4 shows a schematic diagram of the configuration of a conventional return light noise measuring device and its optical system. An overview of the device and its optical system will be explained.
第4図はLDIからの出射光を説明の便宜上1本の光と
して点線で経路を表わし、その進行方向を矢印で示し、
各光学部品とともに光の進行を辿ったものである。まず
LDIから出射した光は、コリメータレンズ2を通って
光3となり、ビームスプリッタ4により光3と同じ方向
の光5と、光3に垂直な光6とに分けられる。光3の強
度を1とすると、光5.光6の強度はそれぞれ約172
である。In FIG. 4, for convenience of explanation, the light emitted from the LDI is treated as one light, and its path is represented by a dotted line, and its traveling direction is shown by an arrow.
It traces the progress of light along with each optical component. First, light emitted from the LDI passes through a collimator lens 2 to become light 3, and is split by a beam splitter 4 into light 5 in the same direction as light 3 and light 6 perpendicular to light 3. If the intensity of light 3 is 1, then light 5. The intensity of light 6 is about 172 each
It is.
光5は可変減光フィルタ7を通過し、光強度を弱められ
て集光レンズ8により平面[9の反射面に集光される。The light 5 passes through the variable neutral density filter 7, has its light intensity weakened, and is focused by the condensing lens 8 onto the reflective surface of the plane [9].
そして平面!I9によって反射され逆向きの光5aとな
り、ビームスプリッタ4にもどる。光5aの強度の1/
2はビームスプリッタ4によって光3aと、これに垂直
な方向の光10となり、光3aばコリメータレンズ2を
遣って光の出射点LD1にもどる。光3aと同し強度の
光10は、集光レンズ11によってもどり光モニタ12
に集光される。And a plane! It is reflected by I9, becomes light 5a in the opposite direction, and returns to beam splitter 4. 1/ of the intensity of light 5a
2 becomes light 3a and light 10 in a direction perpendicular to the light 3a by the beam splitter 4, and the light 3a returns to the light output point LD1 using the collimator lens 2. The light 10 having the same intensity as the light 3a returns to the light monitor 12 by the condenser lens 11.
The light is focused on.
一方光6は偏向ビームスプリッタ13を遺り、さらに1
74波長板14を遣って集光レンズ15により光モニタ
16に集光される。On the other hand, the light 6 leaves the polarizing beam splitter 13 and further passes through the polarizing beam splitter 13.
The light is focused onto a light monitor 16 by a condenser lens 15 using a 74-wavelength plate 14 .
このように光モニタ16には減光フィルタ7による光強
度変化に依存しない光6が入射巳、もどり光モニタ12
には減光フィルタ7を2回通通し減光された光10が入
射する。偏向ビームスプリッタ13と174波長板14
との組み合わせは、この組み合わせにより光モニタ16
から反射する光6aがビームスプリッタ4にもどらない
ようにし、減光フィルタフによる減光率の大きい場合に
、もどり光強度を制御することを可能とする。減光され
た光3a、5aをLD 1. もどり光モニタ12に
もどすために、光モニタ16から反射する光6aをカッ
トするのが偏向ビームスプリッタ13と174波長板1
4の役割であり、もしここで光6aをカットしなければ
、十分に減光されたもどり光だけがLDIと、もどり光
モニタ12に行かなくなるからである。光モニタ16に
発生する信号のDC成分は、LDIの発光強度に比例し
、AC成分はもどり光ノイズに対応しており、これを通
常スペクトルアナライザを用いて評価している。In this way, the light 6 that does not depend on the light intensity change due to the neutral density filter 7 enters the light monitor 16, and the light 6 returns to the light monitor 12.
The light 10 that has been attenuated by passing through the neutral density filter 7 twice is incident. Polarizing beam splitter 13 and 174 wave plate 14
With this combination, the optical monitor 16
This prevents the light 6a reflected from the beam splitter 4 from returning to the beam splitter 4, and makes it possible to control the intensity of the returning light when the attenuation rate by the attenuation filter is large. The dimmed lights 3a and 5a are transmitted through the LD 1. The polarizing beam splitter 13 and the 174-wave plate 1 cut the light 6a reflected from the optical monitor 16 in order to return it to the optical monitor 12.
This is because if the light 6a is not cut here, only the sufficiently attenuated returning light will not go to the LDI and the returning light monitor 12. The DC component of the signal generated by the optical monitor 16 is proportional to the light emission intensity of the LDI, and the AC component corresponds to return light noise, which is usually evaluated using a spectrum analyzer.
以上のように従来のもどり光ノイズ測定装置は、ビーム
スプリンタ4と光モニタ16との間に、偏向ビームスプ
リッタ13.1/4波長板14および集光レンズ15の
三つの光学部品を配置しであるために、問題はこれら部
品間を高精度に光軸合わせを行うことが容易ではなく、
装置自体も高価なものとなっていることである。As described above, the conventional return light noise measuring device has three optical components arranged between the beam splitter 4 and the optical monitor 16: the polarizing beam splitter 13, the quarter-wave plate 14, and the condensing lens 15. Therefore, the problem is that it is not easy to align the optical axes between these parts with high precision.
The device itself is also expensive.
本発明は上述の点に鑑みてなされたものであり、その目
的は光学部品点数を減らして装置を簡素化し、しかも光
モニタからの反射光が測定系に入り込むことなく、従来
と同等の性能を有するもどり光ノイズ測定装置を提供す
ることにある。The present invention was made in view of the above points, and its purpose is to simplify the device by reducing the number of optical parts, and to maintain the same performance as the conventional one without allowing the reflected light from the optical monitor to enter the measurement system. An object of the present invention is to provide a return light noise measuring device having the following features.
上記の課題を解決するために、本発明のもどり光ノイズ
測定装置は、LDから出射しコリメータレンズを通った
平行光束がビームスプリンタによってこれと垂直方向と
なる光束を受光する光モニタとビームスプリ7タとの間
に、ただ1個の集光レンズを用いて、この集光レンズの
中心をビームスプリッタを出て光モニタに入射する全光
束の外方に位lするように配置したものである。In order to solve the above-mentioned problems, the return light noise measuring device of the present invention includes a light monitor and a beam splitter 7 that receive a parallel light flux emitted from an LD and passed through a collimator lens in a direction perpendicular to the parallel light flux by a beam splinter. A single condensing lens is used between the beam splitter and the beam splitter, and the center of this condensing lens is positioned outside of the total luminous flux that exits the beam splitter and enters the optical monitor. .
〔作用]
本発明のもどり光ノイズ測定装置は以上のように溝成し
、ビームスプリンタと光モニタとの間に配置する集光レ
ンズは、少なくともビームスプリッタから出てくる全光
束の最大径より半径の大きいレンズを用いて、この集光
レンズの光軸が光束の外方に位置するようにし、光モニ
タ番よ集光レンズの熾点に配!しであるので、偏向ビー
ムスプリッタ、1/4波長板および集光レンズの三つの
光学部品を用いる代わりに、径の大きい集光レンズを−
ツ用いるだけで、ビームスプリッタから出て集光レンズ
により光モニタに集光される光束と、光モニタから反射
する光束とが重なり合うことはないから、反射光ガビー
ムスブリノタなど光学系に紛れ込むこともなく、光学系
を含むこの装置を簡素化し、しかも従来と同等の性能を
保持することができる。[Function] The returning light noise measuring device of the present invention has a groove structure as described above, and the condensing lens disposed between the beam splitter and the optical monitor has a radius at least larger than the maximum diameter of the total luminous flux coming out of the beam splitter. Use a large lens so that the optical axis of this condensing lens is located outside the light beam, and place the light monitor at the sharp point of the condensing lens! Therefore, instead of using three optical components: a polarizing beam splitter, a quarter-wave plate, and a condensing lens, a condensing lens with a large diameter is used.
By simply using a beam splitter, the light beam that exits the beam splitter and is focused on the optical monitor by the condensing lens does not overlap with the light beam that is reflected from the optical monitor, so there is no possibility that the reflected light will get mixed into the optical system such as a beam spotter. Therefore, this device including the optical system can be simplified, and the performance equivalent to that of the conventional device can be maintained.
第1図は本発明のもどり光ノイズ測定筒!とその光学系
の構成を示した模式図であり、第4図と共通部分には同
一符号を用いている。第1図も第4図と同様光の経路を
点線で表わし、その進行方向を矢印で示しであるが、第
1図ではLDIから出射する光束全体の輪郭として表わ
しである。第1図において、LDIからの出射光はコリ
メータレンズ2を通り、光束の最も外側の光線を表わす
17と18はビームスプリッタ4に入り、さらに可変減
光フィルタ7、集光レンズ8を経て平面鏡9で反射した
光線19と20は、集光レンズ11によってもどり光モ
ニタ12に集光される。一方、ビームスプリッタ4によ
って、それぞれ光&117と18に垂直な方向に進む全
光束の最も外側の光線は、ビームスプリッタ4と光モニ
タ16との間に配置した集光レンズ21を通る光線22
.23となって光モニタ16に集光される。このように
、本発明の装置が従来装置と異なる点は、第1図の本発
明の装置では、第4図の従来装置の偏向ビームスプリッ
タ13と1/4波長板14とを取り除き、これらの代わ
りに集光レンズ21を用いたことにある。Figure 1 shows the return light noise measurement tube of the present invention! 4 is a schematic diagram showing the configuration of an optical system thereof, and the same reference numerals are used for parts common to those in FIG. 4. Similarly to FIG. 4, FIG. 1 also shows the path of light with dotted lines and its direction of travel with arrows, but in FIG. 1, the outline of the entire luminous flux emitted from the LDI is shown. In FIG. 1, the light emitted from the LDI passes through a collimator lens 2, and the outermost rays 17 and 18 of the luminous flux enter a beam splitter 4, and further pass through a variable neutral density filter 7, a condensing lens 8, and a plane mirror 9. The reflected light rays 19 and 20 are condensed by a condensing lens 11 onto a return light monitor 12 . On the other hand, by the beam splitter 4, the outermost ray of the total luminous flux traveling in the direction perpendicular to the lights &117 and 18, respectively, is a ray 22 that passes through the condenser lens 21 disposed between the beam splitter 4 and the light monitor 16.
.. 23 and is focused on the optical monitor 16. As described above, the device of the present invention differs from the conventional device in that the device of the present invention shown in FIG. The reason is that a condensing lens 21 is used instead.
この集光レンズ21は、少なくともビームスブリフタ4
から出てくる全光束の最大径より半径の大きいレンズを
用いることが必要であり、その設置の仕方は、集光レン
ズ21の光軸24が光線22と23とのなす光束の外側
に位置するようにしなければならない、そして光モニタ
16の集光レンズ21の焦点に配置し、光モニタ16の
受光面を集光レンズ21の光軸24に一致させる。This condensing lens 21 includes at least the beam splitter 4
It is necessary to use a lens with a radius larger than the maximum diameter of the total luminous flux coming out of the condenser lens 21, and its installation method is such that the optical axis 24 of the condensing lens 21 is located outside the luminous flux formed by the light rays 22 and 23. The light monitor 16 must be placed at the focal point of the condensing lens 21, and the light receiving surface of the light monitor 16 must be aligned with the optical axis 24 of the condensing lens 21.
このようにすると、最も外側の光!22と23とのなす
光束は、光モニタ16に集光し、光モニタ16からの反
射光束の最も外側の光&125と26は、集光レンズ2
1の光軸24に対して入射光とは対称の方向へ進むので
、集光レンズ21の光軸24が光線22と23とのなす
光束の外方にある限り、この光束がビームスプリッタ4
にもどることはない、即ち、偏向ビームスプリッタ13
.1/4波長板14および集光レンズ15の三つの光学
部品を用いる代わりに、径の大きい集光レンズ21を一
つ用いるだけで、光[22と23とのなす光束と、反射
光線25と26とのなす光束の両者が重なり合わないよ
うに光学系を含む装置を構成したことが本発明の要点で
ある。In this way, the outermost light! The light flux formed by 22 and 23 is focused on the light monitor 16, and the outermost light &125 and 26 of the light flux reflected from the light monitor 16 is focused on the condenser lens 2.
Since the incident light travels in a direction symmetrical with respect to the optical axis 24 of the condenser lens 21, as long as the optical axis 24 of the condenser lens 21 is outside the light flux formed by the light rays 22 and 23, this light flux will pass through the beam splitter 4.
There is no turning back, i.e. the polarizing beam splitter 13
.. Instead of using the three optical components of the 1/4 wavelength plate 14 and the condensing lens 15, just one condensing lens 21 with a large diameter is used, and the light beam [22 and 23 and the reflected light beam 25] The key point of the present invention is that the apparatus including the optical system is configured so that the light beams formed by the light beam and the light beam 26 do not overlap.
第2図は第1図と共通部分を同一符号で表わし、基本的
に第1図と屑じ光学系を持つ装置の模式図であるが、集
光レンズ21だけでは反射光線25と26とのなす光束
がビームスプリンタ4にもどる可能性も考えられるので
、これを避けるために集光レンズ21に遮光板27を設
けることにより、光モニタ16からの反射光25.26
を遮蔽し、この光束がビームスブリフタ4にもどること
を確寞に防止したものである。FIG. 2 shows parts common to those in FIG. 1 with the same reference numerals, and is basically a schematic diagram of a device having a waste optical system as in FIG. Since there is a possibility that the light flux generated returns to the beam splinter 4, in order to avoid this, a light shielding plate 27 is provided on the condensing lens 21 to prevent the reflected light 25.26 from the optical monitor 16.
This is to reliably prevent this light flux from returning to the beam subrifter 4.
第3図に示した模式図も基本的に第1図または第2図と
同しであるが、この場合は集光レンズ21の代わりに、
その一部を除去した集光用部分レンズ28を用い、遮光
板27を併用したものである。少なくともビームスプリ
ンタ4から光モニタエ6へ向かう最外側光線22.23
のなす光束が通過する部分以外のレンズは必要ないので
、その不要部分を取り除いて装置を簡素化したのが第3
図であり、集光用部分レンズ28は例えば直径を切断線
として1/2または1/4の大きさに切断したものを用
いている。このようにしても、光学系の性能は全く変わ
る所はない。The schematic diagram shown in FIG. 3 is basically the same as FIG. 1 or 2, but in this case, instead of the condensing lens 21,
A light condensing partial lens 28 with a portion thereof removed is used, and a light shielding plate 27 is also used. At least the outermost rays 22, 23 from the beam splinter 4 to the optical monitor 6
Since there is no need for lenses other than the part through which the light beam formed by
In this figure, the condensing partial lens 28 is cut into 1/2 or 1/4 size using the diameter as a cutting line, for example. Even if this is done, the performance of the optical system will not change at all.
〔発明の効果;
従来もどり光ノイズ測定装置の光学系には、ビームスプ
リッタと光モニタとの間に、偏向ビームスプリッタ、1
74波長板および集光レンズの三つの光学部品を配!し
であるために、これら部品間の高精度な光軸合わせが難
しかったが、本発明では実施例で述べたように、三つの
光学部品を径の大きなレンズただ1個に置き換え、しか
もビームスプリッタから出る光束の外方に、このレンズ
の光軸があるように配置するだけでよいから、光学系の
調整として、は光モニタの位置合わせたけて済ませるこ
とができ、光学的な性能を十分保ったまま、装置が簡素
化され経済的に寄与する点が大きい。[Effects of the invention; Conventionally, the optical system of the return light noise measuring device includes a polarizing beam splitter and one optical system between the beam splitter and the optical monitor.
Equipped with three optical components: 74 wavelength plate and condensing lens! However, as described in the embodiment, the present invention replaces the three optical components with just one lens with a large diameter, and also uses a beam splitter. All you need to do is position the lens so that its optical axis is outside of the light beam emitted from the lens, so all you have to do to adjust the optical system is align the optical monitor, and the optical performance can be maintained sufficiently. In addition, the device is simplified, which makes a major economic contribution.
第1図は本発明のもどり光ノイズ測定装置とその光学系
の構成を示した模式図、第2図は遮光板を設けた本発明
のもどり光ノイズ測定装置とその光学系の構成を示した
模式図、第3図は一部を除去した集光用部分レンズと遮
光板を設けた本発明のもどり光ノイズ測定装置とその光
学系の構成を示した模式図、第4図は従来のもどり光ノ
イズ測定装置とその光学系の構成を示した模式図である
1:LD、2:コリメータレンズ、3.3a、 5.5
a。
6.6a、10 ニー本の光、4:ビームスプリッタ
、7:可変減光フィルタ、8,11,15,21 :集
光レンズ9:平面鏡、12:もとり光モニタ、13:偏
量ビームスプリッタ、14 : 1/4波長板、16:
光モニタ、17.18.19,20,22,23.25
,26 :光束の最外側の光線24 :
光軸、
27 :
遮光板、
28;
集光用部分レンズ。FIG. 1 is a schematic diagram showing the configuration of a return light noise measuring device of the present invention and its optical system, and FIG. 2 is a schematic diagram showing the configuration of a return light noise measuring device of the present invention provided with a light shielding plate and its optical system. A schematic diagram, Fig. 3 is a schematic diagram showing the configuration of the return light noise measuring device of the present invention and its optical system, which is provided with a partially removed condensing lens and a light shielding plate, and Fig. 4 is a schematic diagram showing the configuration of the optical system thereof. A schematic diagram showing the configuration of an optical noise measuring device and its optical system. 1: LD, 2: Collimator lens, 3.3a, 5.5
a. 6.6a, 10 knee light, 4: beam splitter, 7: variable neutral density filter, 8, 11, 15, 21: condensing lens 9: plane mirror, 12: light monitor, 13: polarization beam splitter, 14: 1/4 wavelength plate, 16:
Optical monitor, 17.18.19, 20, 22, 23.25
, 26: Outermost ray of light 24: Optical axis, 27: Light shielding plate, 28: Condensing partial lens.
Claims (1)
束とするコリメータレンズ、 前記平行光束を直進方向と、前記平行光束に垂直な方向
とに分離するビームスプリッタ、 このビームスプリッタから出る前記直進方向の光束を減
光する減光フィルタ、 前記減光された光束を反射し前記直進方向の光束をこれ
と逆方向の光束として前記ビームスプリッタに戻す平面
鏡、 前記ビームスプリッタによる前記垂直方向の光束および
これと逆方向の前記減光された光束の各々を受光する光
モニタ、 前記ビームスプリッタと前記各光モニタの間に配置する
光学系、 を有するもどり光ノイズ測定装置であって、前記光学系
のうち前記ビームスプリッタによる前記垂直方向の光束
を入射させる集光レンズの中心が、このレンズに入射し
通過する光束の外方に位置することを特徴とするもどり
光ノイズ測定装置。 2)請求項1記載のもどり光ノイズ測定装置であって、
前記集光レンズの光束が通る領域の残余の部分に遮光板
を取り付けたことを特徴とするもどり光ノイズ測定装置
。 3)請求項1記載のもどり光ノイズ測定装置であって、
前記集光レンズの光束が通る領域の残余の部分を取り除
いたことを特徴とするもどり光ノイズ測定装置。[Claims] 1) A collimator lens that receives light emitted from a laser diode and converts it into a parallel beam; a beam splitter that separates the parallel beam into a straight direction and a direction perpendicular to the parallel beam; this beam splitter a neutral density filter that attenuates the light beam in the straight direction emitted from the beam splitter; a plane mirror that reflects the attenuated light beam and returns the straight light beam as a light beam in the opposite direction to the beam splitter; A return light noise measuring device comprising: a light monitor that receives each of the light flux in the direction and the attenuated light flux in the opposite direction; an optical system disposed between the beam splitter and each of the light monitors, A return light noise measuring device characterized in that a center of a condensing lens in the optical system through which the vertical light beam from the beam splitter is incident is located outside of the light beam that enters and passes through this lens. 2) The return light noise measuring device according to claim 1,
A return light noise measuring device characterized in that a light shielding plate is attached to the remaining part of the area through which the light beam of the condensing lens passes. 3) The return light noise measuring device according to claim 1,
A return light noise measuring device characterized in that the remaining portion of the area through which the light beam of the condensing lens passes is removed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12456290A JPH0420835A (en) | 1990-05-15 | 1990-05-15 | Apparatus for measuring noise of returned light |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12456290A JPH0420835A (en) | 1990-05-15 | 1990-05-15 | Apparatus for measuring noise of returned light |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0420835A true JPH0420835A (en) | 1992-01-24 |
Family
ID=14888553
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12456290A Pending JPH0420835A (en) | 1990-05-15 | 1990-05-15 | Apparatus for measuring noise of returned light |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0420835A (en) |
-
1990
- 1990-05-15 JP JP12456290A patent/JPH0420835A/en active Pending
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