JPH04199592A - Manufacture of copper-foiled circuit board - Google Patents
Manufacture of copper-foiled circuit boardInfo
- Publication number
- JPH04199592A JPH04199592A JP32548190A JP32548190A JPH04199592A JP H04199592 A JPH04199592 A JP H04199592A JP 32548190 A JP32548190 A JP 32548190A JP 32548190 A JP32548190 A JP 32548190A JP H04199592 A JPH04199592 A JP H04199592A
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- circuit board
- etching
- copper
- clad circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 95
- 238000005530 etching Methods 0.000 claims abstract description 89
- 239000011889 copper foil Substances 0.000 claims abstract description 37
- 238000000034 method Methods 0.000 claims abstract description 32
- 239000000758 substrate Substances 0.000 claims abstract description 23
- 239000007921 spray Substances 0.000 claims abstract description 22
- 239000010949 copper Substances 0.000 claims description 58
- 229910052802 copper Inorganic materials 0.000 claims description 58
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 20
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 18
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 10
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 claims description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 4
- 229960003280 cupric chloride Drugs 0.000 claims description 3
- 239000000615 nonconductor Substances 0.000 claims description 3
- 239000012752 auxiliary agent Substances 0.000 claims description 2
- 239000006185 dispersion Substances 0.000 abstract 2
- 238000005266 casting Methods 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 22
- 229920005989 resin Polymers 0.000 description 10
- 239000011347 resin Substances 0.000 description 10
- 239000007864 aqueous solution Substances 0.000 description 8
- -1 etc. Polymers 0.000 description 7
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 7
- 238000005406 washing Methods 0.000 description 6
- 239000011521 glass Substances 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 4
- 150000001298 alcohols Chemical class 0.000 description 4
- 239000000428 dust Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000006386 neutralization reaction Methods 0.000 description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000002265 prevention Effects 0.000 description 3
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 229920001225 polyester resin Polymers 0.000 description 2
- 239000004645 polyester resin Substances 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- 235000017550 sodium carbonate Nutrition 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 239000003381 stabilizer Substances 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- LRDIEHDJWYRVPT-UHFFFAOYSA-N 4-amino-5-hydroxynaphthalene-1-sulfonic acid Chemical compound C1=CC(O)=C2C(N)=CC=C(S(O)(=O)=O)C2=C1 LRDIEHDJWYRVPT-UHFFFAOYSA-N 0.000 description 1
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000004760 aramid Substances 0.000 description 1
- 229920003235 aromatic polyamide Polymers 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Substances 0.000 description 1
- 210000004556 brain Anatomy 0.000 description 1
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229920006351 engineering plastic Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000005038 ethylene vinyl acetate Substances 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000003112 inhibitor Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- FBAFATDZDUQKNH-UHFFFAOYSA-M iron chloride Chemical compound [Cl-].[Fe] FBAFATDZDUQKNH-UHFFFAOYSA-M 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000002075 main ingredient Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000012188 paraffin wax Substances 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- JRKICGRDRMAZLK-UHFFFAOYSA-L peroxydisulfate Chemical compound [O-]S(=O)(=O)OOS([O-])(=O)=O JRKICGRDRMAZLK-UHFFFAOYSA-L 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000000088 plastic resin Substances 0.000 description 1
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 1
- 229920002589 poly(vinylethylene) polymer Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000003449 preventive effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
- 239000001993 wax Substances 0.000 description 1
Landscapes
- Manufacturing Of Printed Circuit Boards (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、エツチングにより薄銅箔張回路基板を製造す
る方法の改良に関するものであり、銅箔張回路基板を垂
直に立てて搬送しつつ、エツチングすることにより、エ
ツチング精度の場所によるバラツキを大幅に減少させた
寸法精度の優れた薄銅箔張回路基板を生産性よく、安定
的に製造するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an improvement in a method for manufacturing a thin copper foil-clad circuit board by etching, in which the copper foil-clad circuit board is conveyed vertically. By etching, thin copper foil-clad circuit boards with excellent dimensional accuracy can be manufactured stably and with high productivity by greatly reducing variations in etching accuracy depending on location.
本願発明者らは先に特開平2−50189、−2509
0、−25089、−22896、−22887、同2
−97688などに薄銅箔張回路基板の製造法を提案し
た。The inventors of the present application previously published Japanese Patent Application Publication No. 2-50189,
0, -25089, -22896, -22887, same 2
-Proposed a manufacturing method for thin copper foil-clad circuit boards such as 97688.
より微細なパターン(=ファインパターン)のプリント
配線板を製造するには、薄銅張回路基板がより有効であ
ることが理解されると共に、より進んだファインパター
ンを作るために、所望厚みに対する厚みバラツキがより
一層小さいものが求められている。It is understood that thin copper-clad circuit boards are more effective in producing printed wiring boards with finer patterns (=fine patterns), and in order to produce more advanced fine patterns, the thickness of There is a need for something with even smaller variations.
この目的を従来−数的に使用されている水平エツチング
マシーンを用いて実施する場合、上面と下面とのエツチ
ング速度のバランス、上面の面内の厚みバラツキ、特に
その中央部分のエツチング不足などが発生し易く、大型
基板を使用したり、多量生産するには不都合があった。When this purpose is carried out using a conventional horizontal etching machine, problems occur such as the balance between the etching speed of the top and bottom surfaces, variations in the thickness within the top surface, and insufficient etching, especially in the central part. However, it is inconvenient to use large substrates or mass-produce.
この解決策として、特開平2−97688号を提案した
が、搬送用の治具を使用する必要があるという不都合が
あった。As a solution to this problem, Japanese Patent Application Laid-open No. 2-97688 was proposed, but it had the disadvantage of requiring the use of a conveying jig.
本発明は、上記の不都合を解決した薄銅箔張回路基板を
生産性よく製造する方法につい′て鋭意検討した結果、
本願発明に到達した。The present invention was developed as a result of extensive research into a method for manufacturing thin copper foil-clad circuit boards with high productivity that solves the above-mentioned disadvantages.
The present invention has been achieved.
すなわち、本発明は、平均厚さ 12−以上の銅箔と電
気絶縁体とより製造された銅箔張回路基板(a)を立て
て搬送しつつ銅エツチング液を用いて全面をエツチング
する薄銅箔張回路基板の製造法であって、搬送方向に沿
い、その上端に設けた送り用駆動具(1)と、該駆動具
(1〕により駆動され、その下方で左右両側にほぼ全面
的に軸を縦方向として対抗設置され、各々搬送方向に沿
いかつ軸に配された多数のローラー(4)を備えてなる
該基板(a)を挟み込んで送るローラー部と、搬送方向
に沿いかつローラー部(4)の下端に設けた該基板の支
えローラー(7)とから少なくともなる該基板(a)の
搬送部(A)、並びに搬送方向に沿い、その左右両側に
設けた多数のスプレーノズル(8)からなるノズル部(
B) とを有するエツチング装置に、該基板(a)を
投入し、0.01〜0.4Arn/秒の速度で銅箔全面
をエツチングし、もとの銅箔の厚さの10〜80%を残
存させ所望厚さに対する残存銅箔の厚さのバラツキが±
1.0ρ以内とする薄銅箔張回路基板の製造法であり、
該支えローラー(7)が駆動軸(5)により該ローラー
(4)の送り速度と同一送り速度で駆動軸(5)により
駆動されること、該ノズル部(B)を有するエツチング
ゾーンが2段設けられ、その中間に該基板(a)の反転
部(C)を設けたものであること、該スプレーノズル(
8)に供給される銅エツチング液が予めフィルター濾過
してなるものであること、さらに該エツチングが、エツ
チング速度 0.01〜0347秒、スプレー圧力0.
3〜1.3 kg/ catの範囲から選択した所定条
件であることである。That is, the present invention is a thin copper film in which a copper foil-clad circuit board (a) manufactured from a copper foil with an average thickness of 12 mm or more and an electrical insulator is transported upright and the entire surface is etched using a copper etching solution. A method for manufacturing a foil-clad circuit board, which includes a feeding drive tool (1) provided at the upper end along the conveyance direction, and driven by the drive tool (1), and almost entirely on both left and right sides below the feeding drive tool (1). A roller section that sandwiches and conveys the substrate (a), comprising a large number of rollers (4) arranged opposite to each other with their axes in the vertical direction, each along the conveyance direction and arranged on the axis; (4) A conveyance section (A) for the substrate (a) consisting of at least a supporting roller (7) provided at the lower end of the substrate, and a large number of spray nozzles (8) provided on both left and right sides along the conveyance direction. ) consists of a nozzle part (
B) The substrate (a) is placed in an etching apparatus having the following, and the entire surface of the copper foil is etched at a speed of 0.01 to 0.4 Arn/sec to a thickness of 10 to 80% of the original thickness of the copper foil. The variation in the thickness of the remaining copper foil relative to the desired thickness is ±
A method for manufacturing a thin copper foil-clad circuit board with a thickness within 1.0ρ,
The support roller (7) is driven by the drive shaft (5) at the same feed speed as that of the roller (4), and the etching zone having the nozzle portion (B) is formed in two stages. the spray nozzle (
8) The copper etching solution supplied in step 8) must be filtered in advance, and the etching may be carried out at an etching speed of 0.01 to 0.347 seconds and a spray pressure of 0.
The predetermined condition is selected from the range of 3 to 1.3 kg/cat.
また、本発明に使用する該銅エツチング液が、過酸化水
素1.5〜4w/v%、硫酸3〜7w/v%、銅10〜
100g#!でかつ過酸化水素、硫酸及び銅濃度が所定
濃度の±1.0%以内に制御され、温度が25〜60℃
で±1.0deg、以内に制御されてなるものであり、
さらに該銅エツチング液が、助剤としてアルコールを0
.1〜5w/v%配合してなるものであること、該銅エ
ツチング液が、塩化第二8 0.25〜3 mol/
l 、塩酸1〜5m0I/lでかつ塩酸濃度が所定濃度
の±0.3 mol/ 1以内に制御され、温度が25
〜55℃で±5.Odeg、以内に制御されてなるもの
であることによる薄銅箔張回路基板の製造法である。Further, the copper etching solution used in the present invention contains hydrogen peroxide 1.5 to 4 w/v%, sulfuric acid 3 to 7 w/v%, copper 10 to
100g#! and the hydrogen peroxide, sulfuric acid and copper concentrations are controlled within ±1.0% of the specified concentration, and the temperature is 25 to 60°C.
It is controlled within ±1.0deg,
Furthermore, the copper etching solution contains no alcohol as an auxiliary agent.
.. The copper etching solution contains 0.25 to 3 mol/8 chloride of 1 to 5 w/v%;
1 to 5 mol/l of hydrochloric acid, the hydrochloric acid concentration is controlled within ±0.3 mol/1 of the predetermined concentration, and the temperature is 25 mol/l.
±5. at ~55°C. This is a method for manufacturing thin copper foil-clad circuit boards by controlling the temperature within 100 degrees.
以下、本発明の構成について説明する。The configuration of the present invention will be explained below.
まず、本発明の銅箔と電気絶縁体とより製造された銅箔
張回路基板(a)は、平均厚さ12p以上で、平均厚さ
に対する厚さのバラツキが±1.OJa以内の銅箔を使
用したものであれば特に限定はなく電子、電気材料用と
して用いられている種々の市販品等いずれも使用可能で
あり、片面或いは両面銅張のフィルム、シート、繊維強
化絶縁樹脂積層板、金属芯積層板、内層にプリント配線
網を形成した多層シールド板などである。First, the copper foil-clad circuit board (a) manufactured from the copper foil and electrical insulator of the present invention has an average thickness of 12p or more, and a variation in thickness with respect to the average thickness of ±1. There is no particular limitation as long as it uses copper foil within OJa, and various commercially available products used for electronic and electrical materials can be used, including single-sided or double-sided copper-clad films, sheets, and fiber-reinforced products. These include insulating resin laminates, metal core laminates, and multilayer shield plates with printed wiring networks formed on the inner layer.
ここに、電気絶縁体層は、ポリイミド樹脂、ポリエステ
ル樹脂等のフィルムやシート、熱硬化性樹脂や耐熱性の
熱可塑性樹脂とガラス(Eガラス、Dガラス、Sガラス
、石英ガラス(クォーツ)その他)、セラミックス類(
アルミナ、窒化硼素、その他)、全芳香族ポリアミド、
ポリイミド、セミカーボン、フッ素樹脂、その他の耐熱
性エンジニアリングプラスチックなどを一種或いは二種
以上適宜併用してなる繊維、チョップなどを用いた多孔
質フィルム或いはシート状の補強基材とを組み合わせて
なるプリプレグを用いて製造されるもの、又は、鉄、ア
ルミニウム板等に絶縁性の接着剤や接着フィルムを被覆
してなるものなどである。なお、12〜16虜の薄銅箔
を使用した銅張積層板或いはシートの製造法としては、
銅箔と鏡面板との間に銅箔よりも熱膨張率の大きいアル
ミニウム箔等の40〜100虜程度のシートを挿入して
積層成形する方法が好適である。Here, the electrical insulating layer is made of a film or sheet of polyimide resin, polyester resin, etc., thermosetting resin or heat-resistant thermoplastic resin, and glass (E glass, D glass, S glass, quartz glass, etc.) , ceramics (
alumina, boron nitride, etc.), fully aromatic polyamide,
Prepreg is made by combining a porous film or sheet-like reinforcing base material using fibers, chops, etc. made of one or more types of polyimide, semi-carbon, fluorine resin, and other heat-resistant engineering plastics. or those made by coating an iron, aluminum plate, etc. with an insulating adhesive or adhesive film. In addition, the method for manufacturing copper-clad laminates or sheets using thin copper foil of 12 to 16 mm is as follows:
A preferred method is to insert a sheet of about 40 to 100 mm thick, such as aluminum foil, which has a higher coefficient of thermal expansion than the copper foil, between the copper foil and the mirror plate, and perform lamination molding.
また、本願発明で使用する銅張回路基板(a)の銅箔表
面は清浄であること、すなわち、エツチングレジストと
して作用する「ゴミ」などが除去されたものである。こ
のような「ゴミ」、特に樹脂粉が付着しているとその部
分の銅箔がエツチングされずに残存して突起を形成して
しまう。従って、このような「ゴミ」を除去するために
、機械的研磨、デスミア処理液により処理、その他を行
ったものを使用することがより好適である。Further, the surface of the copper foil of the copper-clad circuit board (a) used in the present invention must be clean, that is, "dust" that acts as an etching resist has been removed. If such "dust", especially resin powder, is attached, the copper foil in that area is not etched and remains, forming protrusions. Therefore, in order to remove such "dust", it is more preferable to use a material that has been subjected to mechanical polishing, treatment with a desmear treatment liquid, or the like.
上記した銅箔張回路基板(a)を縦型のエツチングマシ
ンに導入して所定の条件でエツチングして本発明の薄銅
張回路基板を製造する。The copper foil-clad circuit board (a) described above is introduced into a vertical etching machine and etched under predetermined conditions to produce the thin copper-clad circuit board of the present invention.
銅箔張回路基板(a)のエツチングに用いる本発明の銅
エツチング液としては、過酸化水素/硫酸系、塩化銅系
、過硫酸塩又は塩化鉄などを主剤とする水溶液であって
、通常のエツチングに用いられるエツチング液に比較し
てエツチング成分の濃度を低く保つ方法、温度を低く保
つ方法、銅箔面上の供給エツチング液の接触量を均等で
かつ少なくする方法(スプレー法の場合にはスプレー圧
力を下げること)又は上記方法を適宜組み合わせること
によってエツチング速度を低下させ 0.01〜0゜4
μm/秒の範囲、好ましく0.旧〜0゜3uR/秒の範
囲、より好ましく 0.03〜0.2us/秒の範囲特
に0゜05〜0.11ρ/秒の範囲から選択された所定
のエツチング速度としたものである。The copper etching solution of the present invention used for etching the copper foil-clad circuit board (a) is an aqueous solution containing hydrogen peroxide/sulfuric acid, copper chloride, persulfate, iron chloride, or the like as a main ingredient. Compared to the etching solution used for etching, methods of keeping the concentration of etching components low, methods of keeping the temperature low, methods of making the amount of contact of the supplied etching solution on the copper foil surface uniform and small (in the case of the spray method, The etching rate is reduced by lowering the spray pressure) or by appropriately combining the above methods.
in the range of μm/sec, preferably 0. The predetermined etching rate is selected from the range of ~0.3 μR/sec, more preferably from 0.03 to 0.2 us/sec, particularly from 0.05 to 0.11 μR/sec.
本発明では過酸化水S/硫酸系および塩化銅系のエツチ
ング液が好適である。また、エツチング速度が0.41
.aA/秒より速いと僅かなエツチング処理時間の差に
よりエツチングの進行度が異なり、所望の厚みとの差が
大きくなるばかりでなく、厚みの場所によるバラツキが
大きくなる傾向があり、所定の銅箔厚みに対するバラツ
キ幅を±1.〇−以内にすることが困難となるので好ま
しくない。In the present invention, peroxide S/sulfuric acid type and copper chloride type etching solutions are suitable. In addition, the etching speed is 0.41
.. If the etching speed is faster than aA/sec, the degree of progress of etching will vary due to a slight difference in etching processing time, and not only will the difference from the desired thickness become large, but there will also be a tendency for the thickness to vary widely depending on the location. The variation width for thickness is ±1. This is not preferable because it becomes difficult to keep it within 0-.
又、エツチング速度が0.旧−7秒より遅いとエツチン
グが長時間となり実用的でない。Also, the etching speed is 0. If it is slower than -7 seconds, etching takes a long time and is not practical.
また、スプレーエツチングに使用するスプレー圧力とし
ては0.3〜1.3 kg/catの範囲、好ましくは
0.3〜0.8 kg/ cafの範囲、特に0.4〜
O56kg/cfIlの範囲が好適である。この好適な
スプレー圧力範囲は、通常のパターンエツチングなどに
比較して小さいものであり、また、全面エツチングを水
平型のエツチングマシーンを使用する場合に比較しても
小さいものである。垂直型にすることによりこのような
低いスプレー圧力の適用が可能であることから、基板が
0.1mlTl程度と薄い場合にも工ッチング中に基板
がスプレーにより「バタツク」ことなどが実質的になく
なり、より均質なエツチングを可能とするものである。The spray pressure used for spray etching is in the range of 0.3 to 1.3 kg/caf, preferably in the range of 0.3 to 0.8 kg/caf, particularly in the range of 0.4 to 1.3 kg/caf.
A range of O56 kg/cfIl is preferred. This preferred spray pressure range is smaller than that used in normal pattern etching, and is also smaller than that used when a horizontal etching machine is used for full surface etching. By using a vertical type, it is possible to apply such a low spray pressure, so even if the substrate is as thin as 0.1 ml Tl, there is virtually no ``flapping'' of the substrate due to the spray during processing. , which enables more homogeneous etching.
以上のエツチングに用いる好適な過酸化水素/硫酸系の
銅エツチング液の場合、過酸化水素1.5〜4w/v%
、硫酸3〜7w/v%で温度25〜50℃、銅濃度10
〜100g#の範囲で、適宜、過酸化水素の安定剤、銅
の光沢化剤などの添加剤−例えば、メタノール、エタノ
ール、プロパツール、ブタノールなどの一価アルコール
;エチレングリコーノベプロピレングリコール、フタン
ジオール、ベンタンジオールなどの二価アルコール;グ
リセリン、ペンタエリスリトールなどの三価以上のアル
コール−を加えたものが挙げられる。また、塩化銅系で
は塩化第二銅0.5〜2 mol/ j!、塩酸1〜3
.6 mol/lの水溶液で温度25〜55℃のものが
、特に現場でそのまま使用する場合には好適なものとし
て挙げられる。さらに前記した塩化第二銅系のエツチン
グ液で処理した後、前記した過酸化水素/硫酸系の銅エ
ツチング液や化学研磨液で処理する方法が例示される。In the case of a suitable hydrogen peroxide/sulfuric acid based copper etching solution used for the above etching, hydrogen peroxide is 1.5 to 4 w/v%.
, sulfuric acid 3-7 w/v%, temperature 25-50°C, copper concentration 10
~100g#, optionally additives such as hydrogen peroxide stabilizers, copper brighteners - monohydric alcohols such as methanol, ethanol, propatool, butanol; ethylene glycol, propylene glycol, phthanediol, Examples include dihydric alcohols such as bentanediol; alcohols containing trihydric or higher hydric alcohols such as glycerin and pentaerythritol. In addition, in the case of copper chloride, cupric chloride is 0.5 to 2 mol/j! , hydrochloric acid 1-3
.. An aqueous solution having a concentration of 6 mol/l and a temperature of 25 to 55° C. is preferred, especially when used directly on site. A further example is a method of treating with the cupric chloride-based etching solution described above, followed by treatment with the hydrogen peroxide/sulfuric acid-based copper etching solution or chemical polishing solution.
以上説明した銅箔張回路基板(a)を銅エツチング液を
用いて、垂直たてた状態で搬送しつつエツチングして本
発明の薄銅箔張回路基板を製造する。The copper foil-clad circuit board (a) described above is etched using a copper etching solution while being conveyed vertically to produce the thin copper foil-clad circuit board of the present invention.
本発明のエツチング装置に対する理解を容易とするため
に、まず、その−例を添付の図面を用いてまず説明する
。In order to facilitate understanding of the etching apparatus of the present invention, an example thereof will first be described with reference to the accompanying drawings.
第1図は、本発明に使用する縦型エツチング装置の平面
図であり、第2図は同側面図である。FIG. 1 is a plan view of a vertical etching apparatus used in the present invention, and FIG. 2 is a side view of the same.
第1.2図に示した装置において、銅箔張回路基板(a
)は図面左端側から立ててエツチング槽(10,20)
に導入され、その上端に設けた送り用駆動具(11,2
1,12,22,13)により駆動され、その下方で左
右両側にほぼ全面的に軸を縦方向として対抗設置され、
各々搬送方向に沿いかつ軸に配された多数のローラー(
14,24)を備えてなる該基板(a)を挟み込んで送
るローラー部と、ローラー部の下端に設けられ駆動装置
(15,25,16,26)により駆動される該基板の
支えローラー(17)から少なくともなる該基板(a)
の搬送体によって所定の速度で右方向に搬送される。In the apparatus shown in Figure 1.2, a copper foil-clad circuit board (a
) is the etching tank (10, 20) standing from the left side of the drawing.
The feeding drive tool (11, 2
1, 12, 22, 13), and are installed below them on both the left and right sides, facing each other almost entirely with their axes in the vertical direction.
A large number of rollers (
14, 24) for sandwiching and feeding the substrate (a); and a supporting roller (17) for the substrate, which is provided at the lower end of the roller section and driven by a drive device (15, 25, 16, 26). ) the substrate (a) consisting of at least
is transported rightward at a predetermined speed by a transporting body.
この搬送の間にその両側面に設けた多数のスプレーノズ
ル(18,28)から、ポンプ(P)からフィルター(
F)を経由しゴミ等を実質的に除去し、圧力調製弁を介
して供給される所定の銅エツチング液がスプレーして、
上記した条件の範囲内となるようにエツチングを行う。During this conveyance, a filter (
F) substantially removes dust, etc., and a predetermined copper etching solution supplied via a pressure regulating valve is sprayed.
Etching is performed within the range of the conditions described above.
以上、図面にはエツチング装置部分のみを示したが、通
常は、後記した如く、エツチング終了後(スプレーの直
後)直ちにエツチング液の除去或いはエツチング液のエ
ツチング能力停止手段を付加したものが好ましく、特に
本発明においては、エツチング終了後、中和・水洗或い
は清浄化、防錆処理、乾燥などを一つの連続装置として
一連のラインで行うのが好ましい。また、エツチングを
多段とすること、その中間に反転機構を入れることなど
適宜実施可能である。Although only the etching device part is shown in the drawings above, as described later, it is usually preferable to remove the etching solution immediately after the etching is completed (immediately after spraying) or to add means for stopping the etching ability of the etching solution. In the present invention, after etching is completed, it is preferable to carry out neutralization, washing with water or cleaning, rust prevention treatment, drying, etc. in a series of lines as one continuous device. Furthermore, it is possible to perform etching in multiple stages, and to insert a reversing mechanism between the stages, as appropriate.
なお、エツチングにより所定厚みの銅箔とするためには
、エツチング液によって所定のエツチング条件(エツチ
ング液の種類と濃度、温度、スプレー圧力、基板(a)
の送り速度など)下におけるエツチング速度を測定して
、エツチング時間を設定すると共にこのエツチング速度
を保つエツチング液管理を行う方法を使用する。例えば
、両面から同一厚みの銅を除去する場合には、左右両面
のスプレー圧を同一として所定時間エツチングする方法
による。また、互いに異なる所定厚みの銅箔とするため
には、左右のスプレー圧力又は使用スプレー数、特にス
プレー数を調整して左右の面のエツチング速度を所望の
速度範囲で所望の速度比に設定する方法が使用できる。In addition, in order to obtain a copper foil of a predetermined thickness by etching, the etching liquid must be used under the predetermined etching conditions (type and concentration of the etching liquid, temperature, spray pressure, substrate (a)).
A method is used in which the etching speed is measured under the following conditions (e.g., feeding speed), the etching time is set, and the etching solution is managed to maintain this etching speed. For example, when removing copper of the same thickness from both sides, a method is used in which the spray pressure on both the left and right sides is the same and etching is performed for a predetermined period of time. In addition, in order to obtain copper foils with different predetermined thicknesses, the left and right spray pressures or the number of sprays used, especially the number of sprays, are adjusted to set the etching speed of the left and right surfaces to the desired speed ratio within the desired speed range. method can be used.
その他に、エツチングに使用する両面銅張回路基板とし
て例えば片側に35虜電解銅箔、反対面に18p電解銅
箔を張ったものを用いて両面を同一量速度でエツチング
する方法;両面に18虜電解銅箔を張ったものを用いて
片側の全面或いは特に周囲にプラスチックフィルム等の
剥離性の保護膜を形成し、片面のみエツチングする方法
−両面銅張回路基板を垂直に立てて行う方法などが例示
される。さらに、片面の銅箔は完全に除去し、反対面は
所望の厚みの薄銅箔とする方法は、上記した互いに異な
る所定厚みの銅箔とするための方法において、銅箔完全
除去側面のエツチング速度を上記よりもさらに大きく設
定する方法による。また、清浄化とは、中和、酸洗浄、
水洗、湯洗などの公知の不純物の除去法でよく、用いた
銅エツチング液、その安定剤その他の成分を考慮して適
宜選択するが、弱酸性の水溶液や水で常温或いは加温下
に洗浄後、酸洗し、炭酸ソーダ1〜5 wt%の水溶液
で20〜50℃で中和処理し、防錆剤としては公知の銅
の防錆剤を0.01〜1wt%を含有し、適宜界面活性
剤などを併用した水溶液にて20〜50℃で処理するこ
とが好適である。Another method is to use a double-sided copper-clad circuit board to be used for etching, such as one with 35p electrolytic copper foil on one side and 18p electrolytic copper foil on the other side, and etching both sides at the same rate; A method in which a removable protective film such as a plastic film is formed on the entire surface or especially around one side using electrolytic copper foil, and etching is performed on only one side - a method in which a double-sided copper-clad circuit board is stood vertically, etc. Illustrated. Furthermore, the method of completely removing the copper foil on one side and leaving a thin copper foil of the desired thickness on the other side is the method of etching the side surface from which the copper foil has been completely removed, in the method for forming copper foils of different predetermined thicknesses described above. By setting the speed even higher than above. In addition, cleaning refers to neutralization, acid washing,
Known methods for removing impurities such as washing with water or hot water may be used, and these should be selected appropriately taking into account the copper etching solution used, its stabilizer, and other components. However, washing with a weakly acidic aqueous solution or water at room temperature or under heating After that, it was pickled and neutralized with an aqueous solution of 1 to 5 wt% of sodium carbonate at 20 to 50°C, and a well-known copper rust inhibitor was added as a rust preventive at 0.01 to 1 wt%, as appropriate. It is preferable to perform the treatment at 20 to 50°C using an aqueous solution containing a surfactant or the like.
又、防錆処理後に、剥離可能な樹脂、例えばポリエチレ
ン、ポリプロピレン、エチレン−プロピレン樹脂、エチ
レン−酢酸ビニル樹脂、塩化ビニリデン、ポリアクリレ
ート共重合体、1.2−ポリブタジェン樹脂、ポリエス
テル樹脂、その他の熱可塑性樹脂製のフィルム類やフォ
トレジストフィルム;パラフィンワックス、ポリエチレ
ンワックス、ロジン、低分子量ポリスチレンなどの汎用
溶媒溶解性の樹脂類:フォトレジスト樹脂液などを圧着
などして銅箔面を被覆することも好ましい。In addition, after the rust prevention treatment, heat-removable resins such as polyethylene, polypropylene, ethylene-propylene resin, ethylene-vinyl acetate resin, vinylidene chloride, polyacrylate copolymer, 1,2-polybutadiene resin, polyester resin, etc. Plastic resin films and photoresist films; General-purpose solvent-soluble resins such as paraffin wax, polyethylene wax, rosin, and low molecular weight polystyrene: Copper foil surfaces can also be covered by pressure bonding photoresist resin liquid, etc. preferable.
また、上記において、取り出された薄銅箔張回路基板は
、通常、枠固定のための孔、端部を有する。この孔、端
部などを除去する必要がある場合には、この部分を除去
して製品とする。Moreover, in the above, the thin copper foil-clad circuit board taken out usually has a hole and an end portion for fixing the frame. If it is necessary to remove the holes, edges, etc., these parts are removed to produce a product.
以下、実施例、比較例により本発明を具体的に説明する
。なお、銅箔の厚みは、うず電流方式で測定した。Hereinafter, the present invention will be specifically explained with reference to Examples and Comparative Examples. Note that the thickness of the copper foil was measured using an eddy current method.
実施例1
700 X 1020 mmで板厚0.1闘、片面ロー
プロファイル処理した平均厚さ15ρの銅箔を両面に張
ったガラス布基材エポキシ樹脂積層板100枚を用意し
、これを第1〜2図に記載したエツチング装置、さらに
その後部に水洗或いは希薄酸洗浄部、中和処理部、防錆
処理部、乾燥部を連結した装置を用いて厚さ9−の薄銅
箔張回路基板を製造した。Example 1 We prepared 100 glass cloth-based epoxy resin laminates, each 700 x 1020 mm thick with a thickness of 0.1mm and coated with copper foil on both sides having an average thickness of 15ρ treated with a low profile on one side. ~2 Thin copper foil-clad circuit boards with a thickness of 9 mm are fabricated using the etching device shown in Figure 2, which is further connected to a water washing or dilute acid cleaning section, a neutralization processing section, a rust prevention processing section, and a drying section at the rear. was manufactured.
ここにエツチング液、エツチング条件は下記に設定した
。The etching solution and etching conditions were set as follows.
ついで、濃度0.01〜0.05%の硫酸水溶液での室
温下のスプレー水洗処理、Na2CO35%水溶液での
室温下のスプレー中和処理、濃度0.3%のベンゾトリ
アゾール水溶液で40℃でスプレー防錆処理し、100
℃の熱風で乾燥した。Next, spray washing with a sulfuric acid aqueous solution with a concentration of 0.01 to 0.05% at room temperature, spray neutralization treatment with a 5% Na2CO3 aqueous solution at room temperature, and spraying with a benzotriazole aqueous solution with a concentration of 0.3% at 40 ° C. Antirust treated, 100%
Dry with hot air at ℃.
得られた薄銅張板100枚すべてについて、銅箔の厚さ
をそれぞれ縦横5等分して得られる一枚当たり25個の
長方形内の任意の点の銅箔厚さを測定したところ平均8
.9虜、最大9.3−1最小8.6虜で平均厚さに対す
るバラツキは±0.44、所望の厚さに対するバラツキ
は±0.4Jj2aで、測定点の95%が8.7〜9゜
3虜の範囲にあり、表面凹凸は2.0〜3.0虜であっ
た。For all 100 thin copper clad boards obtained, the copper foil thickness was measured at any point within 25 rectangles obtained by dividing the thickness of the copper foil into 5 equal parts vertically and horizontally, and the average thickness was 8.
.. 9mm, maximum 9.3-1 minimum 8.6mm, the variation with respect to the average thickness is ±0.44, the variation with respect to the desired thickness is ±0.4Jj2a, and 95% of the measurement points are 8.7 to 9 The surface roughness was in the range of 2.0 to 3.0 degrees.
さらに、得られた薄銅張板を25℃、60%RHで30
時間保持したが、錆の発生は見られなかった。Furthermore, the obtained thin copper clad plate was heated at 25°C and 60%RH for 30 minutes.
Although it was kept for a long time, no rust was observed.
実施例2
実施例1において厚さ5J、aaの薄銅箔張回路基板を
製造する条件とする他は同様とした。Example 2 The conditions were the same as in Example 1 except that the conditions were used to manufacture a thin copper foil-clad circuit board with a thickness of 5 J and aa.
ここにエツチング液、エツチング条件は下記に設定した
。The etching solution and etching conditions were set as follows.
得られた薄銅張板100枚すべてについて、銅箔の厚さ
をそれぞれ縦横5等分して得られる一枚当たり25個の
長方形内の任意の点の銅箔厚さを測定したところ平均5
.1虜、最大5,4p、最小4.6−で平均厚さに対す
るバラツキは±0.5虜、所望の厚さに対するバラツキ
は±0.4ρで、測定点の95%が4.7〜5.3−の
範囲にあり、表面凹凸は1.8〜2.6虜であった。For all 100 thin copper clad boards obtained, the copper foil thickness was measured at any point within 25 rectangles obtained by dividing the copper foil thickness into 5 equal parts vertically and horizontally, and the average thickness was 5.
.. The maximum thickness is 5.4p, the minimum is 4.6p, the variation with respect to the average thickness is ±0.5p, the variation with respect to the desired thickness is ±0.4p, and 95% of the measurement points are 4.7 to 5. The surface roughness was in the range of 1.8 to 2.6 mm.
さらに、得られた薄銅張板を25℃、60%RHで30
時間保持したが、錆の発生は見られなかった。Furthermore, the obtained thin copper clad plate was heated at 25°C and 60%RH for 30 minutes.
Although it was kept for a long time, no rust was observed.
以上、発明の詳細な説明および実施例から、本発明の縦
型エツチングする方法によれば、左右両面或いは基板上
下の位置の相違によるエツチング量の差が極めて小さく
、しかも、多数枚連続的に安定してエツチングが可能で
あることが理解される。この結果、銅箔厚み精度として
従来の極薄銅箔と同等以上の薄銅箔張基板が容易に製造
できるものである。From the above detailed description of the invention and examples, it is clear that according to the vertical etching method of the present invention, the difference in the amount of etching due to differences in the left and right sides or the top and bottom positions of the substrate is extremely small, and moreover, it can be stably etched continuously for a large number of substrates. It is understood that etching is possible. As a result, it is possible to easily produce a thin copper foil-clad board with a copper foil thickness accuracy that is equal to or better than that of conventional ultra-thin copper foil.
また、本発明は上記のように厚み精度が優れたものであ
ることから、従来は蒸着等によってしか製造出来なかっ
た極薄銅張積層板をも製造可能とするものであり、その
産業上の意義は極めて大きいものである。Furthermore, since the present invention has excellent thickness accuracy as described above, it is possible to manufacture ultra-thin copper-clad laminates, which could only be manufactured by vapor deposition, etc. in the past, and has industrial advantages. The significance is extremely great.
第1図は、本発明に使用する縦型エツチング装置の平面
図であり、第2図は同側面図である。
図中の符号及び番号はそれぞれ、10.20:エツチン
グ槽、11,21:駆動軸、12,22:駆動用歯車、
13,23:対ローラー駆動用歯車、14.24+ロー
ラー、15,25:駆動軸、16.26+駆動用歯車、
17:支えローラー、18.28ニスプレーノズル、P
:ポンプ、F:フィルターを示す。
特許出願人 三菱瓦斯化学株式会社
代理人(9070)弁理士 小堀 貞文図面の浄書
第1図
9、 第2図
手続補正書(方式)
%式%
■、事件の表示
平成2年特許願第325481号
2、発明の名称
薄銅箔張回路基板の製造法。
3.4I許出願人
住所(■100)東京都千代田区丸の内二丁目5番2号
名称(446)三菱瓦斯化学株式会社
代表者 画用 禮二
4、代理人
居所(■100)東京都千代田区丸の内二丁目5番2号
5、補正指令の日付
平成3年2月25日(発送日 平成3年32−yiミ)
脳)6、補正の対象 図面。
7、補正の内容 別紙のとおり、(−一 −ノド
〜FIG. 1 is a plan view of a vertical etching apparatus used in the present invention, and FIG. 2 is a side view of the same. The symbols and numbers in the figure are respectively 10.20: etching tank, 11, 21: drive shaft, 12, 22: drive gear,
13, 23: Roller drive gear, 14.24 + roller, 15, 25: drive shaft, 16.26 + drive gear,
17: Support roller, 18.28 Varnish spray nozzle, P
: pump, F: filter. Patent applicant Mitsubishi Gas Chemical Co., Ltd. agent (9070) Patent attorney Sadafumi Kobori Engraving of drawings Figure 1 9, Figure 2 Procedural amendment (method) % formula % ■, Indication of case 1990 Patent Application No. 325481 2. Name of the invention: Method for manufacturing a thin copper foil-clad circuit board. 3.4I Applicant Address (■100) 2-5-2 Marunouchi, Chiyoda-ku, Tokyo Name (446) Mitsubishi Gas Chemical Co., Ltd. Representative Reiji Kajo 4, Agent Residence (■100) Chiyoda-ku, Tokyo Marunouchi 2-5-2-5, date of amendment order: February 25, 1991 (shipment date: 32-yi-mi, 1991)
Brain) 6. Drawings to be corrected. 7. Contents of the amendment As shown in the attached sheet, (-1-throat~
Claims (1)
造された銅箔張回路基板(a)を立てて搬送しつつ銅エ
ッチング液を用いて全面をエッチングする薄銅箔張回路
基板の製造法であって、搬送方向に沿い、その上端に設
けた送り用駆動具(1)と、該駆動具(1)により駆動
され、その下方で左右両側にほぼ全面的に軸を縦方向と
して対抗設置され、各々搬送方向に沿いかつ軸に配され
た多数のローラー(4)を備えてなる該基板(a)を挟
み込んで送るローラー部と、搬送方向に沿いかつローラ
ー部(4)の下端に設けた該基板の支えローラー(7)
とから少なくともなる該基板(a)の搬送部(A)、並
びに搬送方向に沿い、その左右両側に設けた多数のスプ
レーノズル(8)からなるノズル部(B)とを有するエ
ッチング装置に、該基板(a)を投入し、0.01〜0
.4μm/秒の速度で銅箔全面をエッチングし、もとの
銅箔の厚さの10〜80%を残存させ所望厚さに対する
残存銅箔の厚さのバラツキが±1.0μm以内とする薄
銅箔張回路基板の製造法。 2 搬送方向に沿い、該支えローラー(7)の横にも駆
動軸(5)を設け、該支えローラー(7)が、搬送方向
に、該ローラー(4)の送り速度と同一送り速度で駆動
軸(5)により駆動される請求項1記載の薄銅箔張回路
基板の製造法。 3 該ノズル部(B)を有するエッチングゾーンが2段
設けられ、その中間に該基板(a)の反転部(C)を設
けたことを特徴とする請求項1記載の薄銅箔張回路基板
の製造法。 4 該スプレーノズル(8)に供給される銅エッチング
液が予めフィルター濾過してなるものである請求項1記
載の薄銅箔張回路基板の製造法。 5 該エッチングが、エッチング速度0.01〜03μ
m/秒、スプレー圧力0.3〜1.3kg/cm^2の
範囲である請求項1記載の薄銅箔張回路基板の製造法。 6 該銅エッチング液が、過酸化水素1.5〜4w/v
%、硫酸3〜7w/v%、銅10〜100g/lでかつ
過酸化水素、硫酸及び銅濃度が所定濃度の±1.0%以
内に制御され、温度が25〜60℃で±1.0deg.
以内に制御されてなるものである請求項5記載の薄銅箔
張回路基板の製造法。 7 該銅エッチング液が、助剤としてアルコールを0.
1〜5w/v%配合してなるものである請求項6記載の
薄銅箔張回路基板の製造法。 8 該銅エッチング液が、塩化第二銅0.25〜3mo
l/l、塩酸1〜5mol/lでかつ塩酸濃度が所定濃
度の±0.3mol/l以内に制御され、温度が25〜
55℃で±5.0deg.以内に制御されてなるもので
ある請求項5記載の薄銅箔張回路基板の製造法。[Claims] 1. Thin copper, in which the entire surface of a copper foil-clad circuit board (a) manufactured from a copper foil with an average thickness of 12 μm or more and an electrical insulator is etched using a copper etching solution while being conveyed upright. A method for manufacturing a foil-clad circuit board, which includes a feeding drive tool (1) provided at the upper end of the foil-clad circuit board along the conveyance direction, and a feed drive tool (1) that is driven by the drive tool (1), and the film is almost completely covered on both left and right sides below the feeding drive tool (1). A roller section that sandwiches and conveys the substrate (a), comprising a large number of rollers (4) arranged opposite to each other with their axes in the vertical direction, each along the conveyance direction and arranged on the axis; (4) Support roller (7) for the substrate provided at the lower end
and a nozzle part (B) comprising a large number of spray nozzles (8) provided on both left and right sides of the substrate (a) along the transport direction. Insert the substrate (a) and
.. Etch the entire surface of the copper foil at a rate of 4 μm/sec, leaving 10 to 80% of the original copper foil thickness, and keep the variation in the thickness of the remaining copper foil within ±1.0 μm from the desired thickness. A method for manufacturing copper foil-clad circuit boards. 2. A drive shaft (5) is also provided beside the support roller (7) along the conveyance direction, and the support roller (7) is driven in the conveyance direction at the same feed speed as the roller (4). 2. The method for producing a thin copper foil-clad circuit board according to claim 1, wherein the method is driven by a shaft (5). 3. The thin copper foil-clad circuit board according to claim 1, characterized in that two etching zones having the nozzle portion (B) are provided, and an inverted portion (C) of the substrate (a) is provided in the middle thereof. manufacturing method. 4. The method for producing a thin copper foil-clad circuit board according to claim 1, wherein the copper etching solution supplied to the spray nozzle (8) is filtered in advance. 5 The etching has an etching rate of 0.01 to 03μ
2. The method for manufacturing a thin copper foil-clad circuit board according to claim 1, wherein the spray pressure is in the range of 0.3 to 1.3 kg/cm^2. 6 The copper etching solution contains 1.5 to 4 w/v of hydrogen peroxide.
%, sulfuric acid 3-7 w/v%, copper 10-100 g/l, hydrogen peroxide, sulfuric acid and copper concentrations are controlled within ±1.0% of the predetermined concentration, and the temperature is ±1.0% at 25-60°C. 0deg.
6. The method for producing a thin copper foil-clad circuit board according to claim 5, wherein 7 The copper etching solution contains 0.0% alcohol as an auxiliary agent.
7. The method for producing a thin copper foil-clad circuit board according to claim 6, wherein the content is 1 to 5 w/v%. 8 The copper etching solution contains 0.25 to 3 mo of cupric chloride.
l/l, hydrochloric acid 1 to 5 mol/l, and the hydrochloric acid concentration is controlled within ±0.3 mol/l of the predetermined concentration, and the temperature is 25 to 5 mol/l.
±5.0deg. at 55°C. 6. The method for producing a thin copper foil-clad circuit board according to claim 5, wherein
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32548190A JP2876779B2 (en) | 1990-11-29 | 1990-11-29 | Manufacturing method of thin copper foil-clad circuit board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32548190A JP2876779B2 (en) | 1990-11-29 | 1990-11-29 | Manufacturing method of thin copper foil-clad circuit board |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04199592A true JPH04199592A (en) | 1992-07-20 |
JP2876779B2 JP2876779B2 (en) | 1999-03-31 |
Family
ID=18177362
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP32548190A Expired - Fee Related JP2876779B2 (en) | 1990-11-29 | 1990-11-29 | Manufacturing method of thin copper foil-clad circuit board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2876779B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6179954B1 (en) * | 1994-02-16 | 2001-01-30 | Fujitsu Limited | Apparatus and method for etching printed circuit board |
CN109187306A (en) * | 2018-09-06 | 2019-01-11 | 郑皖南 | A kind of dilute sulfuric acid atomization system and its application |
-
1990
- 1990-11-29 JP JP32548190A patent/JP2876779B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6179954B1 (en) * | 1994-02-16 | 2001-01-30 | Fujitsu Limited | Apparatus and method for etching printed circuit board |
CN109187306A (en) * | 2018-09-06 | 2019-01-11 | 郑皖南 | A kind of dilute sulfuric acid atomization system and its application |
CN109187306B (en) * | 2018-09-06 | 2020-12-04 | 嘉兴市大明实业有限公司 | Dilute sulfuric acid atomization system and application thereof |
Also Published As
Publication number | Publication date |
---|---|
JP2876779B2 (en) | 1999-03-31 |
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