JPH0419046A - Profile control method - Google Patents

Abstract

PURPOSE:To perform pick-feed action with a tracer head separated from a model by controlling the tracer head in such a way as to be separated from the model upon reaching a first limit before proceeding to a second or third limit and to perform pick-feed action on the second limit. CONSTITUTION:A tracer head 4 comes in contact with a model 6 at a point Pa to start its profiling action, advances on a limit LCYP up to a point P1, and profiles the circumference of the model 6 aiming at a point P2. Upon reaching the point P2, the tracer head 4 proceeds on the limit LYCP toward a limit LXP. The limit LXP is a normal X-axis limit and set being spaced from the model 6. After performing pick-feed action at a point P3, the tracer head 4 reaches a point 4 to proceed to the model 6, comes in contact with the model 6 at a point 5, and profiles the circumference of the model 6 to reach a profiling point P6. The tracer head 4 is then separated from the model 6 to proceed on the limit LCYP toward a point P7 on a limit LXN, advances toward a point P8 after performing pick-feed action at the point P7, and comes in contact with a point P9 to continue its profiling action.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a method for controlling a part of a circumference to follow a circumferential shape, and more particularly to a method for controlling a profile to improve the cutting surface of a workpiece.

[Conventional Techniques] When tracing the circumference of a model such as a conical or cylindrical shape, a so-called full contour tracing is used in which the tracer head is traced around the outer circumference of the model.

If you want to trace part of the circumference, for example half of the circumference of the model, set a limit that passes approximately through the center of the model, and when the tracer head reaches this limit, perform a pick feed operation. , then perform the following motion in the opposite direction, and repeat this process.

[Problem to be solved by the invention]

However, in this tracing control method, the pick feed operation is performed while the tracer head is in contact with the model surface, that is, during the tracing operation, so cutter marks are generated on the workpiece surface and the finish of the cut surface of the workpiece is deteriorated. There is a problem.

The present invention has been made in view of these points, and it is an object of the present invention to provide a tracing control method in which a tracer head is separated from a model and a pick-feed operation is performed.

[Means to solve the problem]

In order to solve the above-mentioned problems, the present invention provides a tracing control method in which a part of the circumference is circumferentially shaped. and a third limit, and when the tracer head reaches the first limit, the workpiece is moved along the first limit toward the second limit or the third limit. apart, said second
Provided is a tracing control method characterized in that a pick-feed operation is performed at the point when the limit or the third limit is reached, the model is returned to, and a tracing operation is performed.

[Effect]

When the tracer head reaches the first limit, it moves along the first limit and away from the model to the second limit.
(or the third limit) and performs a pick feed operation on the second limit.

Since the second limit is away from the model surface, the pick feed operation is performed with the tracer head away from the model. Therefore, no cutter marks are left on the surface of the workpiece during the pick-feed operation.

〔Example〕

Hereinafter, one embodiment of the present invention will be described based on the drawings.

FIG. 1 is a perspective view for explaining the operation of the profile control method of the present invention, and FIG. 2 is a plan view of FIG. 1. The tracer head 4 descends from above at a point Pa, contacts the model 6, and starts a tracing operation.

First, proceed on the limit) LCYP to point P1, and then trace the circumference of model 6 aiming at point P2.

When reaching the point P2 (that is, the Y-axis limit) LCYP, it moves toward the limit LXP on the limit LYCP. Limit LXP is the positive X-axis limit, model 6
set away from. Therefore, at point P3 on limit LXP, stylus 5 has left model 6.

At point P3, a pick feed operation is performed and the tracer head 4 reaches point P4. Next, it heads toward model 6, contacts model 6 at point P5, traces the circumference of model 6, and reaches point P6.

Point P6 is on limit LCYP and tracer head 4
leaves model 6 and heads for point P7 on IJ (Limit) LCYP (Limit) LXN. A pick feed operation is performed at point P7, and the process proceeds to point P8. Furthermore, it moves toward model 6, contacts model 6 at point P9, and continues tracing.

FIG. 3 is a flowchart of the processing of the profile control method of the present invention. In the figure, the number following S indicates the step number.

C3]) Check whether the racer head 4 has reached the limit LCYP, and if so, proceed to S2; otherwise, proceed to S7.

[S2] The point at which the limit LCYP is reached is the limit) L
If it is the XN side, proceed to S3, otherwise proceed to S4.

C33]) Advance the racer head 4 toward the limit LXN.

[:S4]) Advance the laser head 4 toward the limit LχP.

[S5] Perform pick feed operation.

[S6]) Point the racer head 4 at the model 6 and cancel the contract.

[S7] Execute tracing operation.

Through such processing, tracer head 4 is transformed into model 6.
Crop the pick feed while keeping it away from the machine. As a result, the tracer head 4 is separated from the model during the pick-feed operation, and no cutter marks are left on the workpiece due to the pick-feed operation.

FIG. 4 is a block diagram showing the configuration of a profiling control device for implementing the present invention. In the figure, processor 11
reads out a system program stored in the ROM 12 via the bus 10, and controls the entire operation of the tracing control device 1 in accordance with this system program. RAM13
stores temporary data. The nonvolatile memory 14 is backed up by a battery (not shown), and stores various parameters such as limits LXN, LXP, LCYP (DmPA value data, tracing direction, tracing speed, etc.) manually entered from the operation panel 2 via the interface 15. remember.

The tracer head 4 provided in the profiling machine tool 3 has displacements εx1ε in the X-axis, Y-axis, and Z-axis directions caused by the stylus 5 at its tip coming into contact with the model 6.
y and ε2 are detected, digitally converted, and processed by processor 1.
Enter 1.

Based on the displacement amounts εX, εy, and ε2, the instructed tracing direction, and the tracing speed, the processor 11 uses a well-known technique to generate an X-axis speed command VxSY-axis speed commands vy and Z.
Generates an axis speed command Vz.

These speed commands are sent to D/A converters 16x, 16y and U1.
6z converts to analog, servo amplifier 17x, 17y
and 17z, and the servo motors 32x, 32y and 32z'b of the profiling machine tool 3 are activated by the output thereof.

As a result, the tracer head 4 is moved to the Z position so that the relative positional relationship between the tracer head 4 and the model 6 is kept constant.
While moving in the axial direction, the table 31 moves in the X-axis and Y-axis directions perpendicular to the plane of the paper to perform partial contour tracing,
A workpiece 35 is machined into a shape similar to that of the model 6 by a cutter 34 which is controlled along the Z axis like the tracer head 4.

In the present invention, the tracer head 4, that is, the stylus 5
Since the pick-feed operation is performed at a position away from the model 6, cutter marks are not left on the workpiece 35 during the pick-feed operation.

In addition, the servo motors 32x, 32y, and 32z receive detection pulses FPx and 32z, respectively, each time they rotate by a predetermined amount.
Pulse coders 33x and 33 that generate FPy and FPz
y and 33z are provided. Current position registers 18χ, 18y, and 18z in the tracing control device 1 count up/down detection pulses FPx, Fpy, and FPz, respectively, according to the rotational direction to obtain current position data Xa, Ya, and Za of the tracer head 4. These position data are read by the processor 11.

In the above explanation, the limit that passes near the center of the workpiece is defined as the Y-axis limit, and the two limits away from the workpiece are defined as the X-axis limits, but the relationship between the X-axis and Y-axis can be reversed. You can also do it.

Furthermore, although the tracing area is set to be approximately a semicircle, the present invention can be similarly applied to tracing other partial contours.

〔Effect of the invention〕

As described above, in the present invention, the tracer head separates from the model on one limit and performs the pick-feed operation, so it is possible to prevent cutter marks from occurring due to the pick-feed operation.

[Brief explanation of drawings]

Fig. 1 is a perspective view for explaining the operation of the profiling control method of the present invention, Fig. 2 is a plan view of Fig. 1, Fig. 3 is a flowchart of processing of the profiling control method of the present invention, and Fig. 4 is a 1 is a block diagram showing the configuration of a profiling control device for implementing the present invention. FIG. 1 Tracing control device 3 Tracing machine tool 4 Tracer head 5 Stylus XN XP CYP Model processor work X-axis negative limit X-axis positive limit Y-axis limit

Claims (2)

[Claims] (1) In a tracing control method that follows a part of the circumference in a circumferential manner, a first limit passing near the center of the model, and second and third limits that are parallel to each other outside the tracing area are set. providing, when the tracer head reaches the first limit, the second limit is moved along the first limit;
Alternatively, the method may leave the work toward the third limit, perform a pick-feed operation at the point where the second limit or the third limit is reached, return to the model, and perform a tracing operation. Control method. (2) The tracing control method according to claim 1, wherein the first limit is a Y-axis limit, and the second limit and third limit are X-axis positive and negative limits. .