JPH0418960U - - Google Patents

Info

Publication number
JPH0418960U
JPH0418960U JP5921990U JP5921990U JPH0418960U JP H0418960 U JPH0418960 U JP H0418960U JP 5921990 U JP5921990 U JP 5921990U JP 5921990 U JP5921990 U JP 5921990U JP H0418960 U JPH0418960 U JP H0418960U
Authority
JP
Japan
Prior art keywords
power supply
quadrupole
mass spectrometer
frequency power
temperature changes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5921990U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5921990U priority Critical patent/JPH0418960U/ja
Publication of JPH0418960U publication Critical patent/JPH0418960U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
JP5921990U 1990-06-06 1990-06-06 Pending JPH0418960U (US07494231-20090224-C00006.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5921990U JPH0418960U (US07494231-20090224-C00006.png) 1990-06-06 1990-06-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5921990U JPH0418960U (US07494231-20090224-C00006.png) 1990-06-06 1990-06-06

Publications (1)

Publication Number Publication Date
JPH0418960U true JPH0418960U (US07494231-20090224-C00006.png) 1992-02-18

Family

ID=31585525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5921990U Pending JPH0418960U (US07494231-20090224-C00006.png) 1990-06-06 1990-06-06

Country Status (1)

Country Link
JP (1) JPH0418960U (US07494231-20090224-C00006.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011023167A (ja) * 2009-07-14 2011-02-03 Shimadzu Corp イオントラップ装置
WO2022157905A1 (ja) * 2021-01-22 2022-07-28 株式会社日立ハイテク 質量分析装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011023167A (ja) * 2009-07-14 2011-02-03 Shimadzu Corp イオントラップ装置
WO2022157905A1 (ja) * 2021-01-22 2022-07-28 株式会社日立ハイテク 質量分析装置

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