JPH0417369B2 - - Google Patents
Info
- Publication number
- JPH0417369B2 JPH0417369B2 JP59070862A JP7086284A JPH0417369B2 JP H0417369 B2 JPH0417369 B2 JP H0417369B2 JP 59070862 A JP59070862 A JP 59070862A JP 7086284 A JP7086284 A JP 7086284A JP H0417369 B2 JPH0417369 B2 JP H0417369B2
- Authority
- JP
- Japan
- Prior art keywords
- small
- sample
- ray
- scanning
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010586 diagram Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明はＸ線CT装置による小径サンプルの能
率的な検査に好適なサンプル支持具に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a sample support suitable for efficient inspection of small-diameter samples using an X-ray CT device.
Ｘ線CT装置により小径サンプルの検査におい
ては従来小径の視野を用いてサンプル毎にＸ線照
射（以後スキヤンニングと呼ぶ）を行つていた
が、サンプルによるＸ線減弱量が小さい事やサン
プル保持が通常の人体に対するスキヤンニングと
異なりサンプル毎にＸ線計測回路系の調整（例え
ば計測ゲイン調整）や支持具の交換などが検査の
能率を低下させていた。
Conventionally, when inspecting small-diameter samples using an X-ray CT device, X-ray irradiation (hereinafter referred to as scanning) was performed for each sample using a small-diameter field of view, but the amount of X-ray attenuation due to the sample was small and the sample retention However, unlike normal scanning of the human body, the X-ray measurement circuit system needs to be adjusted (for example, measurement gain adjustment) and supports replaced for each sample, reducing the efficiency of the test.
本発明の目的は上記した従来検査の欠点をなく
し能率的な検査を可能とするサンプル支持具を提
供することにある。
An object of the present invention is to provide a sample holder that eliminates the above-mentioned drawbacks of conventional testing and enables efficient testing.
本発明は、小径サンプルを同一スキヤン面内に
多数配列させるための個室を備えることを特徴と
するサンプル支持具である。
The present invention is a sample support device characterized by having a private chamber for arranging a large number of small-diameter samples in the same scan plane.
本発明の実施例を第１図に示す。 An embodiment of the invention is shown in FIG.
第１図のＡは、サンプル支持具の側面図であ
り、１はボデー、２はカバーを示す。破線ａ，
a′はスキヤンニング面を示す。Ｂはサンプル支持
具の正面図で、３はカバー止めネジを示す。Ｃは
破線ａ，a′面のボデーの断面を示す。４は仕切板
でボデーの内部を小室に分割する。５はネジ穴で
カバー止めネジを受ける。上記の各部分の材質は
Ｘ線透過体が適しポリエチレンやアクリルが用い
られる。 A in FIG. 1 is a side view of the sample holder, with 1 indicating the body and 2 indicating the cover. Broken line a,
a′ indicates the scanning plane. B is a front view of the sample support, and 3 shows the cover fixing screw. C shows a cross section of the body taken along dashed lines a and a'. 4 is a partition plate that divides the inside of the body into small rooms. 5 is a screw hole that receives the cover fixing screw. The material for each of the above parts is suitably an X-ray transmissive material, and polyethylene or acrylic is used.
第１図の例では４分割した各室に小径サンプル
をそう入すると１回のスキヤンニングにより４個
の小径サンプルの断面像を得られる。又、小径サ
ンプルを集めてスキヤンニングする事でＸ線減弱
量を通常の人体に対するスキヤンニング条件に近
づけられる。 In the example of FIG. 1, if a small-diameter sample is placed in each of the four divided chambers, cross-sectional images of the four small-diameter samples can be obtained by one scanning operation. Furthermore, by collecting and scanning small-diameter samples, the amount of X-ray attenuation can be brought close to the scanning conditions for normal human bodies.
第２図はボデー内部の他の分割方法を示す。ボ
デーそのものに４の小穴をあけ小室としたもので
ある。 FIG. 2 shows another method of dividing the inside of the body. Four small holes were made in the body itself to serve as small chambers.
第３図は５のサンプル支持具を重ね合わせ（例
では３個のサンプル支持具の重ね合わせを示す）
６のベルトで一体化したもので、検査をより能率
的に行なえる。 Figure 3 shows the superposition of five sample supports (the example shows the superposition of three sample supports)
It is integrated with 6 belts, making inspections more efficient.
本発明によれば、通常のスキヤン条件において
小径サンプルを能率良く検査する事を可能にす
る。
According to the present invention, it is possible to efficiently inspect small-diameter samples under normal scan conditions.
本発明は単に医療用CT装置のみならず大型産
業用CT装置にも利用できるものである。 The present invention can be used not only for medical CT devices but also for large-scale industrial CT devices.
第１図は本発明の実施例のサンプル支持具の構
成図、第２図はボデー内部の説明図、第３図はサ
ンプル支持具を重ね合わせた状態図である。
１……ボデー、２……カバー、４……仕切板、
５……サンプル支持具、６……ベルト。
FIG. 1 is a configuration diagram of a sample holder according to an embodiment of the present invention, FIG. 2 is an explanatory diagram of the inside of the body, and FIG. 3 is a diagram of the sample holder in a superimposed state. 1...Body, 2...Cover, 4...Partition plate,
5...Sample support, 6...Belt.
Claims (1)
させるための個室を備えることを特徴とするＸ線
CT用サンプル支持具。1. An X-ray system characterized by having a private chamber for arranging a large number of small-diameter samples in the same scan plane.
Sample support for CT.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59070862A JPS60214244A (en) | 1984-04-11 | 1984-04-11 | Sample supporter for x-ray ct |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59070862A JPS60214244A (en) | 1984-04-11 | 1984-04-11 | Sample supporter for x-ray ct |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60214244A JPS60214244A (en) | 1985-10-26 |
| JPH0417369B2 true JPH0417369B2 (en) | 1992-03-25 |
Family
ID=13443792
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59070862A Granted JPS60214244A (en) | 1984-04-11 | 1984-04-11 | Sample supporter for x-ray ct |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60214244A (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04122356U (en) * | 1991-04-19 | 1992-11-02 | 新日本製鐵株式会社 | Test object holding device for X-ray CT measurement |
| WO2012098604A1 (en) * | 2011-01-19 | 2012-07-26 | 株式会社島津製作所 | Radiation tomography device |
| US20130294673A1 (en) * | 2011-01-24 | 2013-11-07 | Shimadzu Corporation | Data processor and radiation tomography apparatus provided with the same |
| CN113524754A (en) * | 2021-07-19 | 2021-10-22 | 无锡市塑艺科技有限公司 | Machining process for CT equipment outer cover |
-
1984
- 1984-04-11 JP JP59070862A patent/JPS60214244A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60214244A (en) | 1985-10-26 |
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