JPS53138778A - Stress measuring device by x-ray - Google Patents

Stress measuring device by x-ray

Info

Publication number
JPS53138778A
JPS53138778A JP5314377A JP5314377A JPS53138778A JP S53138778 A JPS53138778 A JP S53138778A JP 5314377 A JP5314377 A JP 5314377A JP 5314377 A JP5314377 A JP 5314377A JP S53138778 A JPS53138778 A JP S53138778A
Authority
JP
Japan
Prior art keywords
ray
measuring device
stress measuring
normal line
stress
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5314377A
Other languages
Japanese (ja)
Inventor
Masato Nagao
Yoshio Fukuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5314377A priority Critical patent/JPS53138778A/en
Publication of JPS53138778A publication Critical patent/JPS53138778A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

PURPOSE:To secure a non-destructive approximate measurement of the stress at the micro area on the surface of a large-size structure by securing a constitution in that the angle formed by the normal line on the test sample and the normal line on the diffraction surface at the measurement area where the X-rays are irradiated on the sampel surface can be varied freely.
JP5314377A 1977-05-11 1977-05-11 Stress measuring device by x-ray Pending JPS53138778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5314377A JPS53138778A (en) 1977-05-11 1977-05-11 Stress measuring device by x-ray

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5314377A JPS53138778A (en) 1977-05-11 1977-05-11 Stress measuring device by x-ray

Publications (1)

Publication Number Publication Date
JPS53138778A true JPS53138778A (en) 1978-12-04

Family

ID=12934598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5314377A Pending JPS53138778A (en) 1977-05-11 1977-05-11 Stress measuring device by x-ray

Country Status (1)

Country Link
JP (1) JPS53138778A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015517672A (en) * 2012-05-22 2015-06-22 ザ・ボーイング・カンパニーＴｈｅＢｏｅｉｎｇ Ｃｏｍｐａｎｙ Reconfigurable detection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015517672A (en) * 2012-05-22 2015-06-22 ザ・ボーイング・カンパニーＴｈｅＢｏｅｉｎｇ Ｃｏｍｐａｎｙ Reconfigurable detection system

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