JPH04134255A - Surface defect inspection device - Google Patents

Surface defect inspection device

Info

Publication number
JPH04134255A
JPH04134255A JP2259178A JP25917890A JPH04134255A JP H04134255 A JPH04134255 A JP H04134255A JP 2259178 A JP2259178 A JP 2259178A JP 25917890 A JP25917890 A JP 25917890A JP H04134255 A JPH04134255 A JP H04134255A
Authority
JP
Japan
Prior art keywords
light
image
inspected
video signal
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2259178A
Other languages
Japanese (ja)
Other versions
JP2938953B2 (en
Inventor
Kazumoto Tanaka
一基 田中
Takeshi Sugihara
毅 杉原
Akinori Utsunomiya
昭則 宇都宮
Tatsumi Makimae
槙前 辰己
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mazda Motor Corp
Original Assignee
Mazda Motor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mazda Motor Corp filed Critical Mazda Motor Corp
Priority to JP2259178A priority Critical patent/JP2938953B2/en
Publication of JPH04134255A publication Critical patent/JPH04134255A/en
Application granted granted Critical
Publication of JP2938953B2 publication Critical patent/JP2938953B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To sense a defective part with the opening excluded simply and shortly by irradiating the same region to be inspected with beams of illumination light having different intensity levels, and comparing each surface image obtained from reflected light corresponding to each beam of irradiated light. CONSTITUTION:The light case from an illumination apparatus 23 is reflected by a coating film 27 over the surface of a car body 26, and the locational relationship between the illumination apparatus 23 and a CCD camera 24 is controlled so that the beams from reflection are received by this CCD camera 24. In this manner, the camera 24 receives the beams of light reflected by the coating film 27 due to its mirror-face reflectivity and produces a light receipt image in the region to be inspected of the coating film 27. At this time, the difference in the lightness/darkness level is calculated, and the regular reflecting direction of the light changes at a defective part eventually existing in coating within the region to be inspected, and the camera 24 will no more receive the reflected beams otherwise to be received upon regular reflecting. Therefore, a darker part than surroundings is produced in the light receipt image.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、被検査面に照明光を照射するとともに、該
照射部分を撮像して得られた画像に画像処理を施すこと
により、上記被検査面の表面欠陥の有無を自動的に検査
する表面欠陥検査装置に関する。
Detailed Description of the Invention [Industrial Field of Application] The present invention irradiates the surface to be inspected with illumination light and performs image processing on the image obtained by imaging the irradiated area. The present invention relates to a surface defect inspection device that automatically inspects the presence or absence of surface defects on an inspection surface.

[従来の技術〕 従来、製品あるいは部品等の物体表面に生じた凹凸など
の欠陥を検出する検出作業は、検査員の目視検査による
のか一般的である。しかしながら、人間の視覚に基づく
この目視検査では、検査に多大の手間がかかり非能率的
で、また、検査員の主観や熟練度によって検査結果が左
右されるという問題がある。
[Prior Art] Conventionally, defects such as unevenness occurring on the surface of a product or part have generally been detected by visual inspection by an inspector. However, this visual inspection based on human vision requires a lot of time and effort, is inefficient, and has the problem that the inspection results are influenced by the subjectivity and skill level of the inspector.

この人間による目視検査を磯減装置による自動検査に置
き換え得る乙のとして、被検査面に照明光を照射すると
ともに、該照射部分をビデオカメラ等で撮像し、得られ
rこ画像に画像処理を施すことにより、上記被検査面の
表面欠陥の有無を自動的に検査する表面欠陥検査装置が
考えられている。
As a way to replace this visual inspection by humans with automatic inspection using a surface reduction device, the surface to be inspected is irradiated with illumination light, the irradiated area is imaged with a video camera, etc., and the resulting image is subjected to image processing. A surface defect inspection apparatus has been devised that automatically inspects the surface to be inspected for the presence or absence of surface defects by performing the following steps.

この種の装置は、基本的に、上記光照射部分に表面欠陥
があった場合、被検査面からの反射光を受光するカメラ
受光面のうち、該欠陥部に対応する受光面部分では、反
射光の受光量が周囲の健全な表面部に比べて減少するこ
とに着目し、上記欠陥部を、受光画像上において周囲と
明るさが異なる暗い(黒い)部分として検出するもので
ある。
Basically, in this type of device, if there is a surface defect in the light irradiation part, the part of the light receiving surface corresponding to the defective part of the camera light receiving surface that receives the reflected light from the surface to be inspected will not reflect the light. Focusing on the fact that the amount of light received is reduced compared to surrounding healthy surface areas, the defective area is detected as a dark (black) area on the light-receiving image that has a different brightness from the surrounding area.

しかしながら、上記タイプの検査装置では、反射光の受
光量が周囲に比して少ない受光面に対応する被検査面部
分を欠陥と判定するので、被検査物に例えば部品取付用
の穴部などの開口部が設けられている場合には、この開
口部も欠陥として検出することになる。
However, in the above-mentioned type of inspection equipment, the portion of the inspection surface corresponding to the light-receiving surface where the amount of reflected light received is small compared to the surrounding area is determined to be defective. If an opening is provided, this opening will also be detected as a defect.

すなわち、例えば、自動車ボディの塗装面における表面
欠陥を検出する場合を例にとって説明すれば、塗装終了
後の車体には、検査工程後に後付けされる部品を取り付
けるために、形状・大きさ等が異なる種々の穴部が残さ
れており、上記検査装置で、車体塗装面の表面欠陥の有
無を検査した場合、これら取付用の穴部が全て欠陥とし
て検出されることになる。このため、上記検査工程の自
動化、更にはロボット等を用いての無人化を達成するこ
とが難しいという問題がある。
In other words, to explain the case of detecting surface defects on the painted surface of a car body, for example, the car body after painting has different shapes and sizes due to the attachment of parts that will be retrofitted after the inspection process. Various holes remain, and when the above-mentioned inspection device inspects the painted surface of the vehicle body for surface defects, all of these mounting holes will be detected as defects. For this reason, there is a problem in that it is difficult to automate the inspection process, or even to make it unmanned using a robot or the like.

[発明が解決しようとする課題] この問題に対して、上記取付用の穴部全てについて、そ
の形状・大きさ等の基本パターンを検査装置のメモリに
予め記憶させておき、欠陥が検出された場合には検出パ
ターンと上記基本パターンと比較することにより、欠陥
と取付用穴部などの開口部とを識別することが考えられ
るが、この場合には、検査装置(画像処理装置)のメモ
リ容量及び処理プログラムが肥大化するとともに、処理
時間が長くなるという問題がある。
[Problem to be solved by the invention] To solve this problem, basic patterns such as the shape and size of all the above-mentioned mounting holes are stored in the memory of the inspection device in advance, and defects are detected. In some cases, it may be possible to identify defects and openings such as mounting holes by comparing the detection pattern with the basic pattern described above, but in this case, the memory capacity of the inspection device (image processing device) There are also problems in that the processing program becomes large and the processing time becomes long.

また、特開平2−73139号公報では、被検査面に所
定の明暗縞模様を投影させて撮像し、得られた画像に、
画像収縮処理及び画像膨張処理の繰り返しを含む画像処
理を施すことにより、同−被検査部位について、加工穴
(開口部)と欠陥部とを含む画像と、加工穴のみを示す
画像とを作成し、この両画像の対応する各画素の論理積
をとることにより、加工穴が除外されて欠陥部のみを示
す画像を得るようにしたものが提案されている。しかし
ながら、この場合でも、複雑な処理を繰り返す必要があ
るので、やはり処理プログラムの肥大化及び画像処理の
長時間化を解消することはできないという問題があった
In addition, in Japanese Patent Application Laid-Open No. 2-73139, a predetermined bright and dark striped pattern is projected onto the surface to be inspected, and the resulting image is
By performing image processing including repetition of image contraction processing and image expansion processing, an image including the machined hole (opening) and the defective part and an image showing only the machined hole are created for the same inspected part. It has been proposed to obtain an image that excludes the machined hole and shows only the defective portion by performing a logical product of each corresponding pixel of both images. However, even in this case, it is necessary to repeat complicated processing, so there is still a problem that it is not possible to solve the problems of an enlarged processing program and a long time of image processing.

ところで、欠陥部を含む同一被検査領域に強度(光度)
レベルが異なる照明光が照射された場合、各照射光にそ
れぞれ対応した反射光から得られる各画像における欠陥
部の明暗レベルは、照射光の強度レベルに応じて異なっ
たものとなる。一方、車体に設けられた開口部の場合に
は、もともと該開口部では反射光が得られないか、得ら
れてもごく僅かであるので、照射光の強度レベルが異な
ってら、画像上における明暗レベルにはほとんど差か生
じない。従って、上記両画像を比較才ろことによって、
画像上の黒点が欠陥部であるか取付穴等の開口部である
かを識別することができる。
By the way, the intensity (luminous intensity) is applied to the same inspected area including the defective part.
When illumination lights of different levels are irradiated, the brightness level of the defective portion in each image obtained from the reflected light corresponding to each irradiation light differs depending on the intensity level of the irradiation light. On the other hand, in the case of an opening provided in the car body, the opening does not originally provide reflected light, or even if it does, the reflected light is very small, so if the intensity level of the irradiated light differs, the brightness and darkness on the image There is almost no difference in level. Therefore, by comparing the above two images,
It is possible to identify whether a black dot on the image is a defective part or an opening such as a mounting hole.

そこで、この発明は、同一被検査領域に強度レベルの異
なる照明光を照射して、各照射光にそれぞれ対応した反
射光から得られる各画像どうしを比較することにより、
簡単かつ短時間で、上記開口部を除外して欠陥部のみを
検出することができる表面欠陥検査装置を提供すること
を目的としてなされたものである。
Therefore, the present invention irradiates the same inspection area with illumination light of different intensity levels and compares each image obtained from the reflected light corresponding to each irradiation light.
The object of this invention is to provide a surface defect inspection device that can detect only defective portions by excluding the openings in a simple manner and in a short period of time.

[課題を解決するための手段] このため、本願の第1の発明は、被検査面に照明光を照
射するとともに、該照射部分を撮像して得られた画像に
画像処理を施すことにより、上記被検査面の表面欠陥の
有無を検査する表面欠陥検査装置において、上記被検査
面の同一被検査領域に強度レベルの異なる照射光を照射
し得る光照射手段と、上記強度レベルの異なる照射光に
それぞれ対応する反射光を受光し、得られた各受光画像
を各々ビデオ信号に変換するビデオ信号発生手段と、該
ビデオ信号発生手段から出力された各ビデオ信号に基づ
いて上記両受光画像の対応する各画素どうしの明暗レベ
ルの差を演算する演算部を有する画像情報処理手段とを
備えたものである。
[Means for Solving the Problems] Therefore, the first invention of the present application irradiates the surface to be inspected with illumination light and performs image processing on the image obtained by imaging the irradiated portion. In the surface defect inspection apparatus for inspecting the presence or absence of surface defects on the surface to be inspected, a light irradiation means capable of irradiating the same inspection area of the surface to be inspected with irradiation light having different intensity levels; and the irradiation light having different intensity levels. a video signal generation means for receiving reflected light corresponding to each of the above, and converting each of the obtained light reception images into video signals, and a correspondence between the two light reception images based on each video signal output from the video signal generation means. and an image information processing means having an arithmetic unit that calculates the difference in brightness level between each pixel.

また、本願の第2の発明は、上記第1の発明において、
上記光照射手段及びビデオ信号発生手段が複数組設けら
れ、各ビデオ信号発生手段は、上記各光照射手段の同一
被検査領域に対する照射光に対応する反射光のうち、同
じ組の光照射手段からの照射光に対応する反射光のみを
受光し得る対応位置にそれぞれ保持されているようにし
たものである。
Further, the second invention of the present application is the first invention,
A plurality of sets of the light irradiation means and video signal generation means are provided, and each video signal generation means receives reflected light from the light irradiation means of the same set, which corresponds to the light irradiated onto the same inspection area by each of the light irradiation means. They are held at corresponding positions where they can receive only the reflected light corresponding to the irradiated light.

「発明の効果コ 本願の第1の発明によれば、同一被検査領域に照射され
た強度レベルの異なる照射光にそれぞれ対応する反射光
を受光して得られる両画像について、対応する各画素ど
うしの明暗レベルの差を演算することができ、この演算
結果より、上記両画像の明暗レベルの差を示す画像を得
ることができる。そして、この画像上においてデータが
ほぼ零(0)となる部分、つまり照射光の強度レベルが
異なっても画像上における明暗レベルにほとんど差が生
じない部分を除外して欠陥判定を行うことにより、取付
穴等の開口部を判定対象から除外し、欠陥部のみを検出
することができる。この結果、従来のように、メモリ容
量あるいは処理プログラムの肥大化及び画像処理の長時
間化等の不具合を招来することなく、簡単かつ短時間で
、上記開口部を判定対象から除外して欠陥部のみを検出
することができる。
"Effects of the Invention According to the first invention of the present application, each corresponding pixel is It is possible to calculate the difference in brightness level between the two images, and from this calculation result, it is possible to obtain an image that shows the difference in brightness level between the two images.Then, on this image, there are parts where the data is almost zero (0). In other words, by excluding areas where there is almost no difference in brightness level on the image even if the intensity level of the irradiated light is different, and performing defect determination, openings such as mounting holes are excluded from the determination target, and only defective areas can be detected. As a result, the above-mentioned opening can be easily and quickly determined without causing problems such as an increase in memory capacity or processing program, or a long image processing time, unlike conventional methods. Only defective parts can be detected by excluding them from the target.

また、本願の第2の発明によれば、上記第1の発明にお
いて、上記光照射手段及びビデオ信号発生手段を複数組
設け、各ビデオ信号発生手段を、同じ組の光照射手段に
対して上記対応位置に保持するようにしたので、上記各
光照射手段からの照射光の強度レベルが異なるように設
定することにより、同一被検査領域について、照射光の
強度レベルを変えての撮像を同時に行うことができ、検
査時間を短縮することができる。
According to a second invention of the present application, in the first invention, a plurality of sets of the light irradiation means and the video signal generation means are provided, and each video signal generation means is directed to the light irradiation means of the same set. Since they are held at corresponding positions, by setting the intensity levels of the irradiation light from each of the light irradiation means to be different, images of the same inspection area can be simultaneously captured with different intensity levels of the irradiation light. This makes it possible to shorten inspection time.

[実施例] 以下、本願発明の実施例を、自動車ボディの塗装面の表
面欠陥の有無を検査する検査装置に適用した場合につい
て、添付図面を参照しながら説明する。
[Example] Hereinafter, a case where an example of the present invention is applied to an inspection device for inspecting the presence or absence of surface defects on the painted surface of an automobile body will be described with reference to the accompanying drawings.

第1図は、本実施例に係る自動車製造ラインにおける車
体の塗装検査ステーションを示す斜視図であるが、この
図に示すように、上記検査ステーション20には、台座
Bに乗せられたロボット装置21が設けられ、該ロボッ
ト装置21の先端アーム22には、光照射手段としての
照明器23と、ビデオ信号発生手段としてのCCDカメ
ラ24とが支持金具25を介して取り付けられている。
FIG. 1 is a perspective view showing a car body painting inspection station in an automobile manufacturing line according to this embodiment. As shown in this figure, the inspection station 20 includes a robot device 21 mounted on a pedestal B An illuminator 23 as a light irradiation means and a CCD camera 24 as a video signal generation means are attached to the tip arm 22 of the robot device 21 via a support fitting 25.

上記ロボット装置21は、第2図のブロック構成図に示
すように、該装置21のアクチュエータ(不図示)を制
御するロボットコントローラ2を介してホストコンピュ
ータ1に接続され、また上記照明器23は、電圧切替器
6を介して上記ホストコンピュータ1に接続されている
。更に、上記ホストコンピュータ1には、画像処理プロ
セッサ4と画像メモリ5とを備えた画像処理装置3及び
上記CCDカメラ24か接続されている。
As shown in the block diagram of FIG. 2, the robot device 21 is connected to the host computer 1 via a robot controller 2 that controls actuators (not shown) of the device 21, and the illuminator 23 is It is connected to the host computer 1 via a voltage switch 6. Further, the host computer 1 is connected to an image processing device 3 having an image processing processor 4 and an image memory 5, and the CCD camera 24.

以上の構成において、塗装された車体26が検査ステー
ション20に搬入されてくると、ホストコンピュータl
からの指令に基づいてロボットコントローラ2が作動さ
せられ、該コントローラ2からの制御信号によってロボ
ット装置21のアクチュエータ(不図示)が駆動される
。そして、上記照明器23とカメラ24とが、車体26
の塗膜面27をなぞるようにトレースしながら移動させ
られる。このとき、照明器23から照射された光が車体
26の表面の塗膜面27で反射し、この反射光が上記C
CDカメラ24で受光されるように両者23.24の位
置関係が制御される。
In the above configuration, when the painted vehicle body 26 is brought into the inspection station 20, the host computer
The robot controller 2 is operated based on a command from the controller 2, and an actuator (not shown) of the robot device 21 is driven by a control signal from the controller 2. The illuminator 23 and camera 24 are connected to the vehicle body 26.
It is moved while tracing the coating surface 27 of. At this time, the light emitted from the illuminator 23 is reflected by the coating surface 27 on the surface of the vehicle body 26, and this reflected light is
The positional relationship between both 23 and 24 is controlled so that the CD camera 24 receives the light.

このように上記CCDカメラ24は、車体26の塗膜面
27の鏡面反射性により該塗膜面27で反射した反射光
を受光し、塗膜面27の当該被検査領域の受光画像を作
成する。このとき、該被検査領域内に塗装欠陥部があっ
た場合、該欠陥部において光の正反射方向が変化し、こ
の欠陥部がなけわば正常に反射して受光されるべき反射
光が、上記CCDカメラ24て受光されなくなる。この
ため、受光画像中に、周囲に比べて黒い(暗い)部分が
生しることになる。
In this way, the CCD camera 24 receives the reflected light reflected by the coating surface 27 of the vehicle body 26 due to the specular reflectance of the coating surface 27, and creates a light-receiving image of the area to be inspected on the coating surface 27. . At this time, if there is a paint defect in the area to be inspected, the direction of specular reflection of light changes at the defect, and the reflected light that would normally be reflected and received without this defect changes. The CCD camera 24 no longer receives light. For this reason, a black (dark) part appears in the light-receiving image compared to the surrounding area.

この受光画像は、CODカメラ24により、明るさに応
じて変化するビデオ信号に変換された上で、画像処理装
置3の画像処理プロセッサ4に入力され、該プロセッサ
4て画像処理が施される。
This received light image is converted by the COD camera 24 into a video signal that changes depending on the brightness, and then input to the image processing processor 4 of the image processing device 3, where the processor 4 performs image processing.

そして、上記画像中で黒く写る部分を画像処理技術で識
別することにより、上記欠陥を自動的に検出することが
できるようになっている。
By identifying the black portions in the image using image processing technology, the defects can be automatically detected.

本実施例では、上記したように、ホストコンピュータ1
と照明器23との間に電圧切替器6が介設され、該切替
器6で照明電圧を切り替えることによって、被検査領域
に強度(光度)の異なる照明光を照射することができる
。そして、同一被検査領域について、上記と同様の欠陥
部の検出を、照明光の強度を変えて行うことにより、第
3図に示すように、上記被検査領域内に部品取付用の穴
部11がある場合には、この取付用の穴部11を塗膜面
27の塗装欠陥12と識別して欠陥判定から除外するこ
とかできろようになっている。
In this embodiment, as described above, the host computer 1
A voltage switch 6 is interposed between the test area and the illuminator 23, and by switching the illumination voltage with the switch 6, the area to be inspected can be irradiated with illumination light having different intensities (luminous intensities). Then, by detecting defects in the same manner as described above for the same inspection area while changing the intensity of the illumination light, as shown in FIG. If there is a defect, the mounting hole 11 can be identified as a paint defect 12 on the coating surface 27 and excluded from the defect determination.

以下、上記取付穴11を識別して欠陥判定から除外する
方法について、第4図のフローチャートに沿って説明す
る。
Hereinafter, a method for identifying the mounting hole 11 and excluding it from defect determination will be explained with reference to the flowchart of FIG. 4.

ンステムがスタートすると、まずステップt1で、電圧
切替器6を例えば低電圧側にセットして被検査領域を、
照射し該領域を撮像する。このとき、第5a図に示すよ
うに、塗膜面27の塗装欠陥部12は、周囲に比べて比
較的黒い部分P1として写し出される。一方、上記取付
穴11では照射光に対応する反射光が得られないか、得
られたとしてもごく僅かであるので、塗装欠陥部12の
場合よりも更に黒い部分Q1として写し出される。この
画像Z、が、画像処理装置3の画像メモリ5に格納され
る(ステップ#2)。
When the system starts, first in step t1, the voltage switch 6 is set to, for example, the low voltage side, and the area to be inspected is
irradiate and image the area. At this time, as shown in FIG. 5a, the coating defect portion 12 on the coating surface 27 appears as a relatively black portion P1 compared to the surrounding area. On the other hand, in the mounting hole 11, the reflected light corresponding to the irradiated light is not obtained, or even if it is obtained, the reflected light is very small, so that it is projected as a blacker part Q1 than in the case of the paint defect part 12. This image Z is stored in the image memory 5 of the image processing device 3 (step #2).

次にステップ#3で、電圧切替器6を高電圧側に切り替
えて、上記と同一被検査領域を照射して撮像する。この
とき、第5b図に示すように、上記欠陥部12は、照射
光の強度レベルが高められrこ程変に応じて明るく写し
出されるが、やはり周囲より黒い部分P、として写し出
される。一方、上記取付穴tiでは、もともと、照射光
に対応する反射光がほとんど得られないので、上記低電
圧での撮像で得られた画像Z1の場合と同程度に黒い部
分Q、として写し出される。この画像Z、が、画像メモ
リ5に格納される(ステップ#4)。
Next, in step #3, the voltage switch 6 is switched to the high voltage side, and the same area to be inspected as above is irradiated and imaged. At this time, as shown in FIG. 5b, the defective portion 12 is imaged brightly as the intensity level of the irradiated light is increased, but it is also imaged as a portion P that is darker than the surrounding area. On the other hand, in the attachment hole ti, since almost no reflected light corresponding to the irradiated light is originally obtained, the portion Q is projected as black, to the same extent as in the case of the image Z1 obtained by imaging at the low voltage. This image Z is stored in the image memory 5 (step #4).

そして、ステップ#5で、上記両画像Z + 、 Z 
!のデータに基づいて、欠陥判定から上記取付穴11を
除外する画像処理が行なわれる。すなわち、上記画像処
理装置3には、上記両画像2..2.の対応する各画素
どうしの明暗レベルの差を演算する演算部(不図示)が
設けられており、その演算結果に基づいて画像処理が行
なわれ、第5c図に示すように、上記両画像2..2.
の明暗レベルの差(Z−20を示す画像Z、が得られる
Then, in step #5, both the above images Z + , Z
! Based on the data, image processing is performed to exclude the mounting hole 11 from defect determination. That is, the image processing device 3 stores both images 2. .. 2. A calculation unit (not shown) is provided for calculating the difference in brightness level between corresponding pixels of , and image processing is performed based on the calculation result, and as shown in FIG. .. .. 2.
An image Z showing a difference in brightness level (Z-20) is obtained.

このとき、第6図のグラフからよく分かるように、上記
欠陥部12に対応する画像部分Pでは、照射光の強度レ
ベルの差に応じてその明るさ(暗さ)が異なるので、両
画像Z I、 Z tで差が生じ、この差が、第5c図
においてP3で示されるように、周囲より黒い部分とし
て表示される。一方、上記取付穴2に対応する画像部分
Qの場合には、両画像Z 1.Z 2においてその明る
さにほとんど差か生じないので、上記画像処理によって
キャンセルされ、上記両画Rz l、 z tの差とし
て得られた画像Z3上には表示されなくなる。すなわち
、取付穴11に対応する部分Q、(第5c図の破線部分
)については、データが零(0)になる。この画像Z。
At this time, as can be clearly seen from the graph in FIG. 6, the brightness (darkness) of the image portion P corresponding to the defective portion 12 differs depending on the difference in the intensity level of the irradiated light, so that both images Z A difference occurs between I and Z t, and this difference is displayed as a darker area than the surrounding area, as indicated by P3 in FIG. 5c. On the other hand, in the case of the image portion Q corresponding to the mounting hole 2, both images Z1. Since there is almost no difference in brightness in Z2, it is canceled by the image processing described above and is no longer displayed on the image Z3 obtained as the difference between the two images Rzl and zt. That is, the data for the portion Q corresponding to the mounting hole 11 (the broken line portion in FIG. 5c) is zero (0). This image Z.

が画像メモリ5に格納される(ステップ#6)。is stored in the image memory 5 (step #6).

その後、ステップ#7で、上記被検査領域における塗装
欠陥の有無の判定、及び欠陥箇所の特定が行なわれる。
Thereafter, in step #7, it is determined whether or not there is a coating defect in the area to be inspected, and the location of the defect is specified.

このとき、上記画像Z3においてデータが零(0)の領
域を除外し、上記画像Z1または画像Z、を用いて欠陥
判定のための解析を行えば良い。
At this time, it is sufficient to exclude the area where the data is zero (0) in the image Z3 and perform analysis for defect determination using the image Z1 or the image Z.

以上、説明したように、本実施例によれば、画像Z3上
においてデータがほぼ零(0)となる部分、つまり照射
光の強度レベルが異なっても画像Z3上における明暗レ
ベルにほとんど差が生じない部分を除外して欠陥判定を
1テうことにより、取付穴11等の開口部を判定対象か
ら除外し、欠陥部!2のみを検出することかできる。こ
の結果、従来のように、メモリ容量あるいは処理プログ
ラムの肥大化及び画像処理の長時間化等の不具合を招来
することなく、簡単かつ短時間で、上記開口部lIを判
定対象から除外して欠陥部12のみを検出することかで
きるのである。
As described above, according to this embodiment, there is almost no difference in the brightness level on the image Z3 even if the intensity level of the irradiation light is different, that is, the portion where the data is almost zero (0) on the image Z3. By excluding the defective parts and performing defect determination by 1 step, openings such as the mounting hole 11 are excluded from the determination target, and defective parts! It is possible to detect only 2. As a result, the above-mentioned opening II can be easily and quickly excluded from the determination target, without causing problems such as an increase in memory capacity or processing program, or a long image processing time, as in the past. It is possible to detect only the portion 12.

尚、上記実施例は、1組の照明器23とカメラ24を用
いて、照射光の強度レベルを切り替えるようにしたもの
であったが、第7図に示すように、複数組(例えば2組
)の照明器33a及び33bとカメラ34a及び34b
を設け、該カメラ34a及び34bを、上記各照明器3
3a、33bの同一被検査領域37に対する照射光に対
応する反射光のうち、同じ組のカメラ33a、33bか
らの照射光に対応する反射光のみをそれぞれ受光し得る
対応位置に位置するように保持するとともに、上記各照
明器33a、33bからの照明光の強度レベルを異なら
せて設定することにより、同一被検査領域37について
、照射光の強度レベルを変えての撮像を同時に行うこと
かでき、検査時間を短縮することかできる。
In the above embodiment, one set of the illuminator 23 and the camera 24 were used to switch the intensity level of the irradiated light, but as shown in FIG. ) illuminators 33a and 33b and cameras 34a and 34b
are provided, and the cameras 34a and 34b are connected to each illuminator 3 described above.
The cameras 3a and 33b are held at corresponding positions that can receive only the reflected light corresponding to the irradiated light from the same set of cameras 33a and 33b among the reflected light corresponding to the irradiated light to the same inspection area 37. At the same time, by setting the intensity levels of the illumination light from each of the illuminators 33a and 33b to be different, it is possible to simultaneously perform imaging of the same inspection area 37 while changing the intensity level of the illumination light. Inspection time can be shortened.

また、車体表面に塗布される塗料に導電性物質を添加し
ておき、上記塗膜面の表面欠陥検査に先立って、塗装ワ
ーク(車体)に負の電荷をかけるとともに、ロボットア
ームに正の電極を取り付け、この正の電極を、塗膜表面
と所定の微小距離を保った状態で、車体表面に沿って移
動させることにより、凸状の塗装欠陥部を焦がして変色
させ、上記検査装置で欠陥部の検出を行う際に、上記凸
状の欠陥部をより検出し易くすることができる。この欠
陥部の変色の度合は電圧を制御することによって調整す
ることができ、また、変色部は後工程の補修作業で除去
される。
In addition, a conductive substance is added to the paint applied to the surface of the car body, and prior to the above-mentioned surface defect inspection of the paint film surface, a negative charge is applied to the painted workpiece (car body), and a positive electrode is connected to the robot arm. By moving this positive electrode along the car body surface while keeping a predetermined minute distance from the paint film surface, the convex paint defects are scorched and discolored, and the above inspection device detects the defects. When detecting the defective portion, the convex defective portion can be more easily detected. The degree of discoloration of this defective portion can be adjusted by controlling the voltage, and the discolored portion is removed in a post-process repair work.

尚、上記実施例は、凸状の塗装欠陥と取付穴とを識別す
るものであったが、本発明は、凹状の塗装欠陥と取付穴
とを識別し、該取付穴を欠陥判定から除外して欠陥部の
みを検出する場合にも有効に適用することができる。
Note that the above embodiment identifies convex paint defects and mounting holes, but the present invention identifies concave paint defects and mounting holes, and excludes the mounting holes from defect determination. It can also be effectively applied to detect only defective parts.

また、上記実施例は、自動車ボディの塗装検査について
のらのであったか、本発明は、上記の場合に限らす、他
の一般の物体表面の欠陥検査に広く適用することかでき
る。
Further, although the above-mentioned embodiments are limited to the inspection of paintwork on automobile bodies, the present invention is not limited to the above-mentioned case, but can be widely applied to defect inspections on the surfaces of other general objects.

【図面の簡単な説明】[Brief explanation of the drawing]

図面はいずれも、本発明の詳細な説明するためのらので
、第1図は自動車ボディの塗装検査ステーションの斜視
図、第2図は表面欠陥検査装置のブロック構成図、第3
図は被検査面と照明器及びカメラの配置説明図、第4図
は上記表面欠陥検査装置の作動を説明するフローチャー
ト、第5a図、第5b図及び第5c図は上記表面欠陥検
査装置で得られる画像の説明図、第6図は上記各画像の
明暗レベルを示すグラフ、第7図は本発明の他の実施例
を示す被検査面と照明器及びカメラの配置説明図である
。 3・・・画像処理装置、4・・・画像処理プロセッサ、
6・・・電圧切替器、23,33a、33b・・・照明
器、24.34a、34b−CCDカメラ、27=−塗
膜面、37・・・被検査領域、2..2..23・・・
画像。
The drawings are for explaining the present invention in detail, so FIG. 1 is a perspective view of an automobile body paint inspection station, FIG. 2 is a block diagram of a surface defect inspection device, and FIG.
The figure is an explanatory diagram of the arrangement of the surface to be inspected, an illuminator, and a camera, FIG. 4 is a flowchart explaining the operation of the above-mentioned surface defect inspection device, and FIGS. FIG. 6 is a graph showing the brightness level of each image, and FIG. 7 is an explanatory diagram of the arrangement of the inspected surface, illuminator, and camera showing another embodiment of the present invention. 3... Image processing device, 4... Image processing processor,
6... Voltage switcher, 23, 33a, 33b... Illuminator, 24. 34a, 34b-CCD camera, 27=-paint film surface, 37... Area to be inspected, 2. .. 2. .. 23...
image.

Claims (2)

【特許請求の範囲】[Claims] (1)被検査面に照明光を照射するとともに、該照射部
分を撮像して得られた画像に画像処理を施すことにより
、上記被検査面の表面欠陥の有無を検査する表面欠陥検
査装置において、 上記被検査面の同一被検査領域に強度レベルの異なる照
射光を照射し得る光照射手段と、上記強度レベルの異な
る照射光にそれぞれ対応する反射光を受光し、得られた
各受光画像を各々ビデオ信号に変換するビデオ信号発生
手段と、該ビデオ信号発生手段から出力された各ビデオ
信号に基づいて上記両受光画像の対応する各画素どうし
の明暗レベルの差を演算する演算部を有する画像情報処
理手段とを備えたことを特徴とする表面欠陥検査装置。
(1) In a surface defect inspection device that inspects the presence or absence of surface defects on the surface to be inspected by irradiating the surface to be inspected with illumination light and performing image processing on the image obtained by imaging the irradiated area. , a light irradiation means capable of irradiating the same inspection area of the inspection surface with irradiation light of different intensity levels; and a light irradiation means capable of irradiating the same inspection area of the inspection surface, and receiving reflected light corresponding to the irradiation light of different intensity levels, and each of the obtained received light images. An image comprising a video signal generation means for converting each into a video signal, and a calculation section for calculating the difference in brightness level between corresponding pixels of both light-receiving images based on each video signal output from the video signal generation means. 1. A surface defect inspection device comprising: information processing means.
(2)上記光照射手段及びビデオ信号発生手段が複数組
設けられ、各ビデオ信号発生手段は、上記各光照射手段
の同一被検査領域に対する照射光に対応する反射光のう
ち、同じ組の光照射手段からの照射光に対応する反射光
のみを受光し得る対応位置にそれぞれ保持されているこ
とを特徴とする請求項1記載の表面欠陥検査装置。
(2) A plurality of sets of the above-mentioned light irradiation means and video signal generation means are provided, and each video signal generation means receives the same set of reflected light corresponding to the irradiation light of the above-mentioned light irradiation means on the same inspection area. 2. The surface defect inspection apparatus according to claim 1, wherein the surface defect inspection apparatus is held at a corresponding position where only the reflected light corresponding to the irradiation light from the irradiation means can be received.
JP2259178A 1990-09-27 1990-09-27 Surface defect inspection equipment Expired - Fee Related JP2938953B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2259178A JP2938953B2 (en) 1990-09-27 1990-09-27 Surface defect inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2259178A JP2938953B2 (en) 1990-09-27 1990-09-27 Surface defect inspection equipment

Publications (2)

Publication Number Publication Date
JPH04134255A true JPH04134255A (en) 1992-05-08
JP2938953B2 JP2938953B2 (en) 1999-08-25

Family

ID=17330450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2259178A Expired - Fee Related JP2938953B2 (en) 1990-09-27 1990-09-27 Surface defect inspection equipment

Country Status (1)

Country Link
JP (1) JP2938953B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5973777A (en) * 1996-06-25 1999-10-26 Hitachi, Ltd. Method and apparatus for inspecting defects of surface shape
KR100367260B1 (en) * 2000-07-18 2003-01-09 이용중 A Powerful Auto Inspection Method Using Algorithm for Panel of Motor Body on the Variable Light Condition
KR100543433B1 (en) * 1996-07-29 2006-04-12 엘파트로닉 아게 Method and apparatus for following and inspecting an edge or border

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5973777A (en) * 1996-06-25 1999-10-26 Hitachi, Ltd. Method and apparatus for inspecting defects of surface shape
KR100543433B1 (en) * 1996-07-29 2006-04-12 엘파트로닉 아게 Method and apparatus for following and inspecting an edge or border
KR100367260B1 (en) * 2000-07-18 2003-01-09 이용중 A Powerful Auto Inspection Method Using Algorithm for Panel of Motor Body on the Variable Light Condition

Also Published As

Publication number Publication date
JP2938953B2 (en) 1999-08-25

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