JPH04126132U - Optical power measuring device for light emitting elements - Google Patents
Optical power measuring device for light emitting elementsInfo
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- JPH04126132U JPH04126132U JP3205891U JP3205891U JPH04126132U JP H04126132 U JPH04126132 U JP H04126132U JP 3205891 U JP3205891 U JP 3205891U JP 3205891 U JP3205891 U JP 3205891U JP H04126132 U JPH04126132 U JP H04126132U
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Abstract
(57)【要約】
【目的】 レーザダイオードの発光量を測定し、レーザ
ダイオードの良否を判定する装置において、受光器とし
て用いるフォトダイオードの暗電流分を除去し、測定精
度を向上する。
【構成】 レーザダイオードに与える電流がゼロの状態
で光パワーを測定し、この測定値を暗電流光パワーとし
て記憶すると共に、レーザダイオードに与える電流を徐
々に増加させ、各電流値ごとに光パワーを測定し、この
測定した光パワー値から暗電流光パワーを減算し、暗電
流光パワー値を含まない光パワー測定値を得る。
(57) [Summary] [Purpose] To improve measurement accuracy in a device that measures the amount of light emitted by a laser diode and determines whether the laser diode is good or bad by removing the dark current of the photodiode used as a light receiver. [Structure] Measure optical power with zero current applied to the laser diode, store this measured value as dark current optical power, and gradually increase the current applied to the laser diode to increase the optical power at each current value. is measured, and the dark current optical power is subtracted from the measured optical power value to obtain an optical power measurement value that does not include the dark current optical power value.
Description
【０００１】0001
この考案は、例えばレーザダイオードのような発光素子の発光量を測定する発 光素子の光パワー測定装置に関する。 This idea is based on a light emitting device that measures the amount of light emitted from a light emitting element such as a laser diode. The present invention relates to an optical power measuring device for an optical element.
【０００２】0002
例えばレーザダイオードのような発光素子は発光量を測定し、この発光量が規 定の範囲に入るか否かによって良否の判定を行っている。 従来は、図４に示すように被測定発光素子１に可変電流源２を接続し、この可 変電流源２から被測定発光素子１を発光させるために発光電流ＩLDを与える。発 光電流ＩLDを漸次増加させて、発光量を変化させ、発光した光３をフォトダイオ ード４で受光し、フォトダイオード４から出力される電流Ｉを測定し、この電流 Ｉを測定して光パワーを求める。光パワーＰｗはＰｗ＝Ｉ×１／ＫＰｄで求めら れる。１／ＫＰｄはフォトダイオード４の感度で決まる常数。For example, the amount of light emitted from a light emitting element such as a laser diode is measured, and the quality of the light emitting device is determined based on whether the amount of light emitted falls within a specified range. Conventionally, as shown in FIG. 4, a variable current source 2 is connected to a light emitting element 1 to be measured, and a light emitting current I LD is applied from the variable current source 2 to cause the light emitting element 1 to emit light. The light emitting current ILD is gradually increased to change the amount of light emitted, the emitted light 3 is received by the photodiode 4, the current I output from the photodiode 4 is measured, and the optical power is determined by measuring this current I. seek. The optical power Pw is determined by Pw=I×1/KPd. 1/KPd is a constant determined by the sensitivity of photodiode 4.
【０００３】 被測定発光素子１に与える発光電流ＩLDを規定の値まで増加させた状態にフォ トダイオード４から出力される電流Ｉが規定の範囲に入っているか否か、つまり 光パワーが規定の範囲に入っているか否かにより良否が判定される。 ここでフォトダイオード４にはよく知られているように、受光する光がなくて も暗電流Ｉｄが存在する。従って受光器としてフォトダイオードを用いた場合に は、このフォトダイオード４を流れる電流ＩはＩ＝Ｉｄ＋Ｉｎ（Ｉｎは光を受光 したときに流れる電流）で表示することができ、暗電流Ｉｄが光パワーの測定誤 差となる。[0003] When the light emitting current ILD applied to the light emitting element 1 to be measured is increased to a specified value, it is determined whether the current I output from the photodiode 4 is within the specified range, that is, the optical power is within the specified range. Passage or failure is determined based on whether or not it falls within the range. Here, as is well known, a dark current Id exists in the photodiode 4 even when there is no light to be received. Therefore, when a photodiode is used as a light receiver, the current I flowing through the photodiode 4 can be expressed as I=Id+In (In is the current flowing when light is received), and the dark current Id is the optical power. This results in a measurement error of .
【０００４】 このため従来はレーザダイオード１を発光させない状態でフォトダイオード４ を流れる電流を測定し、この電流を暗電流値Ｉｄとして記憶し、爾後この暗電流 値Ｉｄを測定値Ｉｎから減算して正規の光パワーＰｗを算出している。0004 For this reason, conventionally, the laser diode 1 is not emitted and the photodiode 4 is This current is stored as the dark current value Id. The normal optical power Pw is calculated by subtracting the value Id from the measured value In.
【０００５】[0005]
従来は測定の開始時点でフォトダイオード４の暗電流値Ｉｄを一度測定すると 、被測定発光素子１が新たに交換されてもこの暗電流値Ｉｄによって減算を行っ ている。 暗電流Ｉｄは温度の変化等により変化する性質を持っているから、次の被測定 発光素子１が交換された時点では暗電流値Ｉｄが変化している可能性がある。従 って、従来の測定方法では誤差を含むことになり測定精度が悪い欠点がある。 Conventionally, once the dark current value Id of the photodiode 4 was measured at the start of measurement, , even if the light emitting element 1 to be measured is replaced with a new one, the dark current value Id is used for subtraction. ing. Since the dark current Id has the property of changing due to changes in temperature, etc., the following There is a possibility that the dark current value Id has changed at the time the light emitting element 1 is replaced. subordinate Therefore, conventional measurement methods include errors and have the disadvantage of poor measurement accuracy.
【０００６】 この考案の目的は暗電流の変動による誤差の発生を抑え、測定精度の高い発光 素子の光出力測定装置を提案するものである。[0006] The purpose of this invention is to suppress errors caused by fluctuations in dark current, and to measure luminescence with high accuracy. This paper proposes a device for measuring the optical output of a device.
【０００７】[0007]
この考案では被測定発光素子を新たに交換するごとに、その時点でフォトダイ オードの暗電流を測定し、この暗電流値で受光データを修正し、真の光パワーを 得るように構成したものである。 この考案によれば、各被測定発光素子の発光特性を測定するごとに受光用のフ ォトダイオードの暗電流を測定するから、周囲の温度が変動していたとしてもそ の時点の暗電流をを求めることができる。よって、この暗電流値によって測定し た光パワー値を修正することにより精度の高い測定を行うことができる。 With this idea, each time a new light-emitting element to be measured is replaced, the photodiode is Measure the dark current of the ode, correct the received light data using this dark current value, and calculate the true optical power. It is configured so that it can be obtained. According to this invention, each time the light emitting characteristics of each light emitting element to be measured is measured, the light receiving frame is Since the dark current of the photodiode is measured, even if the ambient temperature fluctuates, the dark current of the photodiode is measured. The dark current at the point in time can be determined. Therefore, it is measured using this dark current value. By correcting the optical power value, highly accurate measurement can be performed.
【０００８】[0008]
図１にこの考案の一実施例を示す。図中１は被測定発光素子、２はこの被測定 発光素子１に発光電流を与える可変電流源、４は受光用のフォトダイオード、５ は光パワー測定回路を示す。この光パワー測定回路５は内部にＡＤ変換器５Ａを 内蔵し、このＡＤ変換器５Ａによって測定した光パワー値はディジタル符号に変 換され、ディジタル符号によって入出力ポート６に入力される。 FIG. 1 shows an embodiment of this invention. In the figure, 1 is the light-emitting element to be measured, and 2 is the light-emitting element to be measured. a variable current source that provides a light emitting current to the light emitting element 1; 4 is a photodiode for receiving light; 5 is a photodiode for receiving light; indicates an optical power measurement circuit. This optical power measurement circuit 5 has an AD converter 5A inside. The optical power value measured by the built-in AD converter 5A is converted into a digital code. The signal is converted into a digital code and input to the input/output port 6.
【０００９】 入出力ポート６にはバスライン１１を通じてマイクロコンピュータ９が接続さ され、光パワー測定回路５で測定した光パワー値はマイクロコンピュータ９を介 してメモリ８に取り込まれる。 バスライン１１にはその他に演算回路７及び表示回路１０等が接続される。 演算回路７は光パワー測定回路５から入力される光パワー値からフォトダイオ ード４の暗電流に相当する光パワー値を減算する動作を行う。[0009] A microcomputer 9 is connected to the input/output port 6 through a bus line 11. The optical power value measured by the optical power measuring circuit 5 is sent via the microcomputer 9. and is taken into the memory 8. The bus line 11 is also connected to an arithmetic circuit 7, a display circuit 10, and the like. The arithmetic circuit 7 calculates the photodiode based on the optical power value input from the optical power measuring circuit 5. The optical power value corresponding to the dark current of the code 4 is subtracted.
【００１０】 つまり、測定は以下の如くして行われる。 マイクロコンピュータ９は可変電流源２から出力する発光電流ＩLDを制御する ことができる。可変電流源２から出力する発光電流がゼロの状態で光パワー測定 回路５の測定値Ｐidを取り込む。この測定値Ｐidを暗電流に対応した光パワー値 （以下暗電流光パワーと称す）としてメモリ８に取り込む。[0010] That is, the measurement is performed as follows. The microcomputer 9 can control the light emitting current ILD output from the variable current source 2. The measured value P id of the optical power measuring circuit 5 is taken in a state where the light emitting current output from the variable current source 2 is zero. This measured value P id is taken into the memory 8 as an optical power value corresponding to the dark current (hereinafter referred to as dark current optical power).
【００１１】 マイクロコンピュータ９は可変電流源２の出力電流ＩLDを１ステップ、例えば ０．１mmA ずつ増加させ、各ステップごとに光パワー測定回路５から光パワーの 測定値Ｐ1 ，Ｐ2 ，Ｐ3 …を取り込む。図２に各ステップごとに取り込んだ測定 値Ｐ1 ，Ｐ2 ，Ｐ3 …を示す。各測定値Ｐ1 ，Ｐ2 ，Ｐ3 …はメモリ８に取り込 まれると共に、演算回路７でＰ＝（Ｐn −Ｐid）／ＫＰd （ｎは１，２，３…， ）を演算し、暗電流光パワー値Ｐidを除去した光パワー測定値Ｐを得る。図３に 暗電流光パワー値Ｐidを除去した光パワー測定値を示す。[0011] The microcomputer 9 increases the output current I LD of the variable current source 2 by one step, for example, 0.1 mmA, and at each step, the optical power measurement circuit 5 outputs the measured values of optical power P 1 , P 2 , P. 3 Take in... FIG. 2 shows measured values P 1 , P 2 , P 3 . . . taken in each step. Each measured value P 1 , P 2 , P 3 . An optical power measurement value P is obtained by removing the current optical power value P id . FIG. 3 shows the optical power measurement value with the dark current optical power value P id removed.
【００１２】 このように、この考案によれば各被測定発光素子１を交換するごとに暗電流光 パワーを測定し、この暗電流光パワーを各測定値Ｐ1 ，Ｐ2 ，Ｐ3 …から減算し 、暗電流成分を除去した測定値を得る。As described above, according to this invention, the dark current optical power is measured every time each light emitting element 1 to be measured is replaced, and this dark current optical power is calculated from each measured value P 1 , P 2 , P 3 . A measured value is obtained by subtracting the dark current component.
【００１３】[0013]
以上説明したように、この考案によれば各被測定発光素子ごとに暗電流光パワ ーを測定したから、温度変動等があっても、各被測定発光素子ごとのそれぞれの 測定時点の暗電流光パワーを求めることができる。よって精度の高い測定を行う ことができ、各発光素子の良否判定の信頼性を高めることができる。 As explained above, according to this invention, the dark current optical power is Even if there are temperature fluctuations, each light emitting element to be measured The dark current optical power at the time of measurement can be determined. Therefore, highly accurate measurements can be made. This makes it possible to improve the reliability of determining the quality of each light emitting element.
【提出日】平成４年６月８日[Submission date] June 8, 1992
【手続補正１】[Procedural amendment 1]
【補正対象書類名】明細書[Name of document to be amended] Specification
【補正対象項目名】考案の詳細な説明[Name of item to be corrected] Detailed explanation of the invention
【補正方法】変更[Correction method] Change
【０００１】0001
この考案は、例えばレーザダイオードのような発光素子の発光量を測定する発 光素子の光パワー測定装置に関する。 This idea is based on a light emitting device that measures the amount of light emitted from a light emitting element such as a laser diode. The present invention relates to an optical power measuring device for an optical element.
【０００２】0002
例えばレーザダイオードのような発光素子は発光量を測定し、この発光量が規 定の範囲に入るか否かによって良否の判定を行っている。 従来は、図４に示すように被測定発光素子１に可変電流源２を接続し、この可 変電流源２から被測定発光素子１を発光させるために発光電流ＩLDを与える。発 光電流ＩLDを漸次増加させて、発光量を変化させ、発光した光３をフォトダイオ ード４で受光し、フォトダイオード４から出力される電流Ｉを測定し、この電流 Ｉを測定して光パワーを求める。光パワーＰｗはＰｗ＝Ｉ×１／Ｋｐｄで求めら れる。１／Ｋｐｄはフォトダイオード４の感度で決まる定数。For example, the amount of light emitted from a light emitting element such as a laser diode is measured, and the quality of the light emitting device is determined based on whether the amount of light emitted falls within a specified range. Conventionally, as shown in FIG. 4, a variable current source 2 is connected to a light emitting element 1 to be measured, and a light emitting current I LD is applied from the variable current source 2 to cause the light emitting element 1 to emit light. The light emitting current ILD is gradually increased to change the amount of light emitted, the emitted light 3 is received by the photodiode 4, the current I output from the photodiode 4 is measured, and the optical power is determined by measuring this current I. seek. The optical power Pw is determined by Pw=I×1/ Kpd . 1/ Kpd is a constant determined by the sensitivity of photodiode 4.
【０００３】 被測定発光素子１に与える駆動電流ＩLDを規定の値まで増加させた状態にフォ トダイオード４から出力される電流Ｉが規定の範囲に入っているか否か、つまり 光パワーが規定の範囲に入っているか否かにより良否が判定される。 ここでフォトダイオード４にはよく知られているように、受光する光がなくて も暗電流Ｉｄが存在する。従って受光器としてフォトダイオードを用いた場合に は、このフォトダイオード４を流れる電流ＩはＩ＝Ｉｄ＋Ｉｎ（Ｉｎは光を受光 したときに流れる電流）で表示することができ、暗電流Ｉｄが光パワーの測定誤 差となる。[0003] When the drive current ILD applied to the light emitting element 1 to be measured is increased to a specified value, it is determined whether the current I output from the photodiode 4 is within the specified range, that is, the optical power is within the specified range. Passage or failure is determined based on whether or not it falls within the range. Here, as is well known, a dark current Id exists in the photodiode 4 even when there is no light to be received. Therefore, when a photodiode is used as a light receiver, the current I flowing through the photodiode 4 can be expressed as I=Id+In (In is the current flowing when light is received), and the dark current Id is the optical power. This results in a measurement error of .
【０００４】 このため従来はレーザダイオード１を発光させない状態でフォトダイオード４ を流れる電流を測定し、この電流を暗電流値Ｉｄとして記憶し、爾後この暗電流 値Ｉｄを測定値Ｉｎから減算して正規の光パワーＰｗを算出している。0004 For this reason, conventionally, the laser diode 1 is not emitted and the photodiode 4 is This current is stored as the dark current value Id. The normal optical power Pw is calculated by subtracting the value Id from the measured value In.
【０００５】[0005]
従来は測定の開始時点でフォトダイオード４の暗電流値Ｉｄを一度測定すると 、被測定発光素子１が新たに交換されてもこの暗電流値Ｉｄによって減算を行っ ている。 暗電流Ｉｄは温度の変化等により変化する性質を持っているから、次の被測定 発光素子１が交換された時点では暗電流値Ｉｄが変化している可能性がある。従 って、従来の測定方法では誤差を含むことになり測定精度が悪い欠点がある。 Conventionally, once the dark current value Id of the photodiode 4 was measured at the start of measurement, , even if the light emitting element 1 to be measured is replaced with a new one, the dark current value Id is used for subtraction. ing. Since the dark current Id has the property of changing due to changes in temperature, etc., the following There is a possibility that the dark current value Id has changed at the time the light emitting element 1 is replaced. subordinate Therefore, conventional measurement methods include errors and have the disadvantage of poor measurement accuracy.
【０００６】 この考案の目的は暗電流の変動による誤差の発生を抑え、測定精度の高い発光 素子の光出力測定装置を提案するものである。[0006] The purpose of this invention is to suppress errors caused by fluctuations in dark current, and to measure luminescence with high accuracy. This paper proposes a device for measuring the optical output of a device.
【０００７】[0007]
この考案では被測定発光素子を新たに交換するごとに、その時点でフォトダイ オードの暗電流を測定し、この暗電流値で受光データを修正し、真の光パワーを 得るように構成したものである。 この考案によれば、各被測定発光素子の発光特性を測定するごとに受光用のフ ォトダイオードの暗電流を測定するから、周囲の温度が変動していたとしてもそ の時点の暗電流をを求めることができる。よって、この暗電流値によって測定し た光パワー値を修正することにより精度の高い測定を行うことができる。 With this idea, each time a new light-emitting element to be measured is replaced, the photodiode is Measure the dark current of the ode, correct the received light data using this dark current value, and calculate the true optical power. It is configured so that it can be obtained. According to this invention, each time the light emitting characteristics of each light emitting element to be measured is measured, the light receiving frame is Since the dark current of the photodiode is measured, even if the ambient temperature fluctuates, the dark current of the photodiode is measured. The dark current at the point in time can be determined. Therefore, it is measured using this dark current value. By correcting the optical power value, highly accurate measurement can be performed.
【０００８】[0008]
図１にこの考案の一実施例を示す。図中１は被測定発光素子、２はこの被測定 発光素子１に発光電流を与える可変電流源、４は受光用のフォトダイオード、５ は光パワー測定回路を示す。この光パワー測定回路５は内部にＡＤ変換器５Ａを 内蔵し、このＡＤ変換器５Ａによって測定した光パワー値はディジタル符号に変 換され、ディジタル符号によって入出力ポート６に入力される。 FIG. 1 shows an embodiment of this invention. In the figure, 1 is the light-emitting element to be measured, and 2 is the light-emitting element to be measured. a variable current source that provides a light emitting current to the light emitting element 1; 4 is a photodiode for receiving light; 5 is a photodiode for receiving light; indicates an optical power measurement circuit. This optical power measurement circuit 5 has an AD converter 5A inside. The optical power value measured by the built-in AD converter 5A is converted into a digital code. The signal is converted into a digital code and input to the input/output port 6.
【０００９】 入出力ポート６にはバスライン１１を通じてマイクロコンピュータ９が接続さ され、光パワー測定回路５で測定した光パワー値はマイクロコンピュータ９を介 してメモリ８に取り込まれる。 バスライン１１にはその他に演算回路７及び表示回路１０等が接続される。 演算回路７は光パワー測定回路５から入力される光パワー値からフォトダイオ ード４の暗電流に相当する光パワー値を減算する動作を行う。[0009] A microcomputer 9 is connected to the input/output port 6 through a bus line 11. The optical power value measured by the optical power measuring circuit 5 is sent via the microcomputer 9. and is taken into the memory 8. The bus line 11 is also connected to an arithmetic circuit 7, a display circuit 10, and the like. The arithmetic circuit 7 calculates the photodiode based on the optical power value input from the optical power measuring circuit 5. The optical power value corresponding to the dark current of the code 4 is subtracted.
【００１０】 つまり、測定は以下の如くして行われる。 マイクロコンピュータ９は可変電流源２から出力する発光電流ＩLDを制御する ことができる。可変電流源２から出力する発光電流がゼロの状態で光パワー測定 回路５の測定値Ｐidを取り込む。この測定値Ｐidを暗電流に対応した光パワー値 （以下暗電流光パワーと称す）としてメモリ８に取り込む。[0010] That is, the measurement is performed as follows. The microcomputer 9 can control the light emitting current ILD output from the variable current source 2. The measured value P id of the optical power measuring circuit 5 is taken in a state where the light emitting current output from the variable current source 2 is zero. This measured value P id is taken into the memory 8 as an optical power value corresponding to the dark current (hereinafter referred to as dark current optical power).
【００１１】 マイクロコンピュータ９は可変電流源２の出力電流ＩLDを１ステップ、例えば ０．１mAずつ増加させ、各ステップごとに光パワー測定回路５から光パワーの測 定値Ｐ1 ，Ｐ2 ，Ｐ3 …を取り込む（Ｐn ＝Ｉn ×１／Ｋｐｄ）。図２に各ステ ップごとに取り込んだ測定値Ｐ1 ，Ｐ2 ，Ｐ3 …を示す。各測定値Ｐ1 ，Ｐ2 ， Ｐ3 …はメモリ８に取り込まれると共に、演算回路７でＰ＝（Ｐn −Ｐid ）（ｎ は１，２，３…，）を演算し、暗電流光パワー値Ｐidを除去した光パワー測定値 Ｐを得る。図３に暗電流光パワー値Ｐidを除去した光パワー測定値を示す。[0011] The microcomputer 9 increases the output current I LD of the variable current source 2 by one step, for example, 0.1 mA , and at each step, the optical power measurement circuit 5 outputs the measured values of optical power P 1 , P 2 , Take in P 3 ... (Pn = In x 1/Kpd) . FIG. 2 shows measured values P 1 , P 2 , P 3 . . . taken in each step. Each measured value P 1 , P 2 , P 3 . . . is taken into the memory 8, and the arithmetic circuit 7 calculates ) (n is 1, 2, 3...,) to obtain the optical power measurement value P from which the dark current optical power value P id is removed. FIG. 3 shows the optical power measurement value with the dark current optical power value P id removed.
【００１２】 このように、この考案によれば各被測定発光素子１を交換するごとに暗電流光 パワーを測定し、この暗電流光パワーを各測定値Ｐ1 ，Ｐ2 ，Ｐ3 …から減算し 、暗電流成分を除去した測定値を得る。As described above, according to this invention, the dark current optical power is measured every time each light emitting element 1 to be measured is replaced, and this dark current optical power is calculated from each measured value P 1 , P 2 , P 3 . A measured value is obtained by subtracting the dark current component.
【００１３】[0013]
以上説明したように、この考案によれば各被測定発光素子ごとに暗電流光パワ ーを測定したから、温度変動等があっても、各被測定発光素子ごとのそれぞれの 測定時点の暗電流光パワーを求めることができる。よって精度の高い測定を行う ことができ、各発光素子の良否判定の信頼性を高めることができる。 As explained above, according to this invention, the dark current optical power is Even if there are temperature fluctuations, each light emitting element to be measured The dark current optical power at the time of measurement can be determined. Therefore, highly accurate measurements can be made. This makes it possible to improve the reliability of determining the quality of each light emitting element.
【図面の簡単な説明】[Brief explanation of drawings]
【図１】この考案の一実施例を示すブロック図。FIG. 1 is a block diagram showing an embodiment of this invention.
【図２】測定結果の一例を示すグラフ。FIG. 2 is a graph showing an example of measurement results.
【図３】測定結果を演算処理した結果を示すグラフ。FIG. 3 is a graph showing the results of arithmetic processing of measurement results.
【図４】従来の技術を説明するための接続図。FIG. 4 is a connection diagram for explaining a conventional technique.
１ 被測定発光素子 ２ 可変電流源 ３ 光 ４ フォトダイオード ５ 光パワー測定回路 ６ 入出力ポート ７ 演算回路 ８ メモリ ９ マイクロコンピュータ １０ 表示回路 1 Light-emitting element to be measured 2 Variable current source 3 light 4 Photodiode 5 Optical power measurement circuit 6 Input/output port 7 Arithmetic circuit 8 Memory 9 Microcomputer 10 Display circuit
【手続補正書】[Procedural amendment]
【提出日】平成４年６月８日[Submission date] June 8, 1992
【手続補正２】[Procedural amendment 2]
【補正対象書類名】図面[Name of document to be corrected] Drawing
【補正対象項目名】図２[Correction target item name] Figure 2
【補正方法】変更[Correction method] Change
【補正内容】[Correction details]
【図２】 [Figure 2]
【手続補正３】[Procedural amendment 3]
【補正対象書類名】図面[Name of document to be corrected] Drawing
【補正対象項目名】図３[Correction target item name] Figure 3
【補正方法】変更[Correction method] Change
【補正内容】[Correction details]
【図３】 [Figure 3]
Claims (1)
源と、被測定発光素子が発光する光を受光し、光量に対
応した電流を出力するフォトダイオードと、このフォト
ダイオードが出力する電流値を光パワーとして測定する
光パワー測定回路と、上記可変電流源から出力する電流
をゼロの状態から徐々に増加させる制御を行う制御手段
と、上記可変電流源から出力される電流値がゼロの状態
の上記光パワー測定回路の測定値を取り込んで暗電流光
パワーとして記憶する記憶手段と、上記可変電流源から
出力する電流値を徐々に増加させる過程において、各電
流値ごとに光パワー値を取り込むメモリと、このメモリ
に取り込まれた各光パワー値から上記記憶手段に記憶し
た暗電流光パワーを減算する演算手段と、によって構成
した発光素子の光パワー測定装置。1. A variable current source that provides a light emitting current to a device under test, a photodiode that receives light emitted by the light emitting device to be measured and outputs a current corresponding to the amount of light, and a current value output by the photodiode. an optical power measurement circuit that measures the current value as optical power; a control means that controls the current output from the variable current source to gradually increase from a zero state; and a state where the current value output from the variable current source is zero. storage means for capturing the measured value of the optical power measuring circuit and storing it as dark current optical power; and in the process of gradually increasing the current value output from the variable current source, capturing the optical power value for each current value. An optical power measuring device for a light emitting element, comprising a memory and an arithmetic means for subtracting dark current optical power stored in the storage means from each optical power value taken into the memory.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3205891U JPH04126132U (en) | 1991-05-09 | 1991-05-09 | Optical power measuring device for light emitting elements |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3205891U JPH04126132U (en) | 1991-05-09 | 1991-05-09 | Optical power measuring device for light emitting elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04126132U true JPH04126132U (en) | 1992-11-17 |
Family
ID=31915098
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3205891U Pending JPH04126132U (en) | 1991-05-09 | 1991-05-09 | Optical power measuring device for light emitting elements |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04126132U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61275623A (en) * | 1985-05-31 | 1986-12-05 | Nec Corp | Check circuit for optical detection part |
| JPH0216032B2 (en) * | 1985-01-11 | 1990-04-13 | Fuji Electrochemical Co Ltd |
-
1991
- 1991-05-09 JP JP3205891U patent/JPH04126132U/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0216032B2 (en) * | 1985-01-11 | 1990-04-13 | Fuji Electrochemical Co Ltd | |
| JPS61275623A (en) * | 1985-05-31 | 1986-12-05 | Nec Corp | Check circuit for optical detection part |
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