JPH04124936A - Continuity testing system for exchange speech path - Google Patents

Continuity testing system for exchange speech path

Info

Publication number
JPH04124936A
JPH04124936A JP2243841A JP24384190A JPH04124936A JP H04124936 A JPH04124936 A JP H04124936A JP 2243841 A JP2243841 A JP 2243841A JP 24384190 A JP24384190 A JP 24384190A JP H04124936 A JPH04124936 A JP H04124936A
Authority
JP
Japan
Prior art keywords
test
test cell
cell
highways
highway
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2243841A
Other languages
Japanese (ja)
Inventor
Yuji Kato
祐司 加藤
Shichiro Hayami
七郎 早見
Edamasu Kamoi
鴨井 條益
Toshio Shimoe
敏夫 下江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2243841A priority Critical patent/JPH04124936A/en
Publication of JPH04124936A publication Critical patent/JPH04124936A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To confirm the normal operation of a speech path through a signal cell for a test by providing an ATM exchange speech path with a loop-back means, and connecting the generation circuit of a test cell connected to a specified incoming highway and the receiver of a testing device connected to a specified outgoing highway through the loop-back circuit. CONSTITUTION:The test cell generated by the test cell generating means 4 is looped back by the loop-back means 6 through the ATM exchange speech path 3, and is led to a test object route in the TAM speech path 3, and by detecting a VCI for a test in the arrival cell by a test cell receiving means 5, the continuity of the tested object route in the ATM speech path 3 is confirmed. The test cell generated by the test cell generating means 4 is outputted to one of the outgoing highways through the ATM exchange speech path 3 as long as the conductive line of the ATN exchange speech path 3 is normal, and the outputted test cell is looped back by the loop-back means 6 corresponding to the test object route, and is inputted again to the ATM exchange speech path 3, and is outputted to one of the outgoing highways through the test object route.

Description

【発明の詳細な説明】 〔概要〕 ATM交換通話路の導通試験方式に関し、ATM交換通
話路内のパスの導通試験を簡単に行うことを目的とし、 複数の入ハイウェイと複数の出ハイウェイの間で交換を
行うATM通話路、人ハイウェイの一つに接続されてお
り、試験用VCIを含む試験セルを発生する試験セル発
生手段、出ハイウェイの一つに接続されており、試験セ
ルを受信する試験セル受信手段、出ハイウェイの各々と
対になった入ハイウェイに該出ハイウェイからの試験セ
ルのみを折り返す試験セル折り返し手段、およびATM
通話路内で試験セルのための通話路を形成するための試
験パス設定手段を具備し、試験セル発生手段で発生させ
た試験セルを試験セル折り返し手段により折り返して、
ATM通話路内の試験対象ルートに導き、試験セル受信
手段で到着セル内の試験用VCIを検出することにより
ATM通話路内の試験対象ルートの導通を確認するよう
に構成する。
[Detailed Description of the Invention] [Summary] Regarding a continuity test method for an ATM switching communication path, the present invention aims to easily conduct a continuity test of a path within an ATM switching communication path between multiple incoming highways and multiple outgoing highways. The ATM communication path for exchanging is connected to one of the human highways, and the test cell generating means for generating test cells containing the test VCI is connected to one of the outgoing highways for receiving test cells. A test cell receiving means, a test cell return means for returning only the test cells from the outgoing highway to an incoming highway paired with each outgoing highway, and an ATM.
A test path setting means is provided for forming a communication path for a test cell within the communication path, and the test cell generated by the test cell generation means is folded back by a test cell folding means,
The cell is guided to the test target route within the ATM communication path, and the test cell receiving means detects the test VCI in the arriving cell, thereby confirming continuity of the test target route within the ATM communication path.

〔産業上の利用分野〕[Industrial application field]

本発明はATM(Asynchronous Tran
sfer Mode)交換通話路の導通試験方式に関し
、特にATM交換機における保守機能として、通話路の
正常動作の確認と、呼設定時のパス接続における導通確
認と割り当て帯域の保証に関する。
The present invention is an ATM (Asynchronous Tran)
sfer Mode) Concerning a continuity test method for switched communication paths, in particular, as a maintenance function in ATM exchanges, it is concerned with checking the normal operation of communication paths, confirming continuity in path connections at the time of call setup, and guaranteeing allocated bandwidth.

〔従来の技術〕[Conventional technology]

一般の回線交換で通話路の導通を確認するためには、大
ハイウェイにおいて被試験タイムスロットに信号を送り
、その信号を出ハイウェイで確認すればよいが、ATM
交換で通話路の導通を確認するためには、各セルは非同
期に通話路に入力されるので、セルの送出順序、負荷の
増大によるセルの廃棄欠落の判定のためセルの内容を確
認する必要がある。したがって、ATM交換通話路の導
通試験のだめの試験装置は複雑になる。
In order to check the continuity of the communication path in general circuit switching, it is sufficient to send a signal to the time slot under test on the main highway and check the signal on the outgoing highway.
In order to check the continuity of the communication path during switching, each cell is input to the communication path asynchronously, so it is necessary to check the contents of the cells to determine the order in which the cells are sent and whether cells are being discarded or missing due to an increase in load. There is. Therefore, test equipment for continuity testing of ATM switching communication lines becomes complicated.

第8図は従来のATM交換通話路における導通試験を行
うための構成例を示す図である。同図において、簡単の
ために人ハイウェイを4本、出ハイウェイも4本の通話
路を示す。従来は、第8図に示すように、ATM交換通
話路800の導通試験を行うために、入ハイウェイ80
1〜804の各々に試験セル発生手段805〜808を
接続し、出ハイウェイ809〜812の各々に試験セル
受信手段813〜816を接続していた。
FIG. 8 is a diagram showing an example of a configuration for conducting a continuity test on a conventional ATM exchange channel. In the figure, for the sake of simplicity, four communication routes are shown for people's highways, and four communication routes are also shown for exit highways. Conventionally, as shown in FIG.
Test cell generating means 805 to 808 were connected to each of output highways 809 to 804, and test cell receiving means 813 to 816 were connected to each of output highways 809 to 812.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記従来方式では、試験セル発生手段および試験セル受
信手段の数が多くてハード量が膨大であり、装置価格が
高いという問題がある。
The above-mentioned conventional system has problems in that the number of test cell generating means and test cell receiving means is large, the amount of hardware is enormous, and the cost of the apparatus is high.

本発明の目的はATM交換通話路において、/S−ドウ
エア量の少ない導通試験方式を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a continuity test method that reduces the amount of /S-ware in an ATM exchange channel.

〔課題を解決するための手段〕[Means to solve the problem]

第1図は本発明の原理ブロック図である。同図において
、1は複数の人ハイウェイ、2は複数の出ハイウェイ、
3は入ハイウェイ1と出ハイウエイ20間で交換を行う
ATM通話路である。本発明により試験用V CI (
Vertual Channel Identifie
r)を含む試験セルを発生する試験セル発生手段4が複
数の入ハイウェイ1のなかの一つにのみ接続されており
、試験セルを受信する試験セル受信手段5が複数の出ハ
イウェイ2のなかの一つにのみ接続されている。また、
出ハイウェイ2の各々と対になった入ハイウェイに出ハ
イウェイ2からの試験セルを折り返す試験セル折り返し
手段6が設けられている。さらに、ATM通話路3内で
試験セルのための通話路を形成するための試験パス設定
手段7がATM通話路3に接続されている。
FIG. 1 is a block diagram of the principle of the present invention. In the figure, 1 is a plurality of people highways, 2 is a plurality of exit highways,
3 is an ATM communication path for performing exchange between the incoming highway 1 and the outgoing highway 20. According to the present invention, test V CI (
Virtual Channel Identifier
The test cell generating means 4 for generating test cells containing r) is connected to only one of the plurality of incoming highways 1, and the test cell receiving means 5 for receiving the test cells is connected to one of the plurality of outgoing highways 2. connected to only one of the Also,
Test cell folding means 6 for folding back test cells from the outgoing highway 2 is provided on the incoming highway paired with each of the outgoing highways 2. Further, a test path setting means 7 for forming a communication path for a test cell within the ATM communication path 3 is connected to the ATM communication path 3.

試験セル発生手段4で発生された試験セルは、ATM交
換通話路3を介して折り返し手段6により折り返されて
、ATM通話路3内の試験対象ルートに導かれ、試験セ
ル受信手段5で到着セル内の試験用VCIを検出するこ
とによりATM通話路3内の試験対象ルートの導通が確
認される。
The test cell generated by the test cell generating means 4 is looped back by the turning means 6 via the ATM exchange channel 3, guided to the route to be tested within the ATM channel 3, and the arriving cell is received by the test cell receiving means 5. By detecting the test VCI within the ATM channel 3, continuity of the test target route within the ATM communication path 3 is confirmed.

試験セル発生手段5は、試験セルの発生頻度を制御する
手段を具備し、パスの帯域割り当て要求分のセルを発生
させ該当パスがサービス品質を満足するのを確認したう
えで呼接続を行うことが好ましい。
The test cell generation means 5 is equipped with a means for controlling the frequency of test cell generation, generates cells corresponding to the path bandwidth allocation request, and connects the call after confirming that the corresponding path satisfies the service quality. is preferred.

〔作用〕[Effect]

試験セル発生手段4で発生された試験セルは、ATM交
換通話路3の導通路が正常であるかぎり、ATM交換通
話路4を介して出ハイウェイの一つに出力され、この出
力された試験セルは、試験対象ルートに対応する折り返
し手段6により折り返されて再びATM交換通話路3に
人力され、試験対象ルートを通過して出ハイウェイの一
つにaカされる。ついで、この出力された試験セルは試
験セル受信手段5に対応する折り返し手段6により再び
折り返されて、試験セル受信手段5に受信される。もし
、試験対象ルートに障害があると、試験セル受信手段5
には試験セルが受信されないので、そのルートに障害が
あることがわかる。
The test cell generated by the test cell generating means 4 is outputted to one of the output highways via the ATM switching channel 4 as long as the conduction path of the ATM switching channel 3 is normal. is turned back by the turn-back means 6 corresponding to the route to be tested, is again manually inputted to the ATM switching communication path 3, passes through the route to be tested, and is routed to one of the outgoing highways. Next, this output test cell is turned back again by the turn-back means 6 corresponding to the test cell reception means 5, and is received by the test cell reception means 5. If there is a failure in the route to be tested, the test cell receiving means 5
Since no test cells are received, we know that there is a failure on that route.

従来は各人出ハイウェイに設けていた試験セルの発生手
段、およびその受信手段をそれぞれ人出ハイウェイの特
定の一つにのみ置いたので、ノ\−ド量は大幅に削減さ
れる。
Since the test cell generating means and the test cell receiving means, which were conventionally provided on each highway with a large number of people, are placed only on a specific one of the highways with a large number of people, the number of nodes can be greatly reduced.

〔実施例〕〔Example〕

第2図は本発明の実施例によるATM交換通話路の構成
を示すブロック図である。同図において、201はAT
M交換通話路であり、4本の人ノz4ウェイ202〜2
05のいずれかからのからのセルを出ハイウェイ206
〜209のいずれかに出力する交換動作をする。このた
めに、各々がTAG判定部とセル蓄積バッファを備えた
セルスイッチ210〜225がマトリックス状に配置さ
れている。セルスイッチ210〜213の入力と入ハイ
ウェイ202の間にVCI(Vertual Ce1l
 Identifier)を出ハイウェイを示すTAG
に変換する変換回路(VCC)226が接続されている
。同様に、セルスイッチ214〜217の人力と大ハイ
ウェイ203の間に変換回路(VCC)227が接続さ
れており、セルスイッチ218〜2210入力と人ハイ
ウェイ204の間に変換回路(VCC) 228が接続
されており、セルスイッチ222〜224の入力と入ハ
イウェイ205の間に変換回路(VCC) 229が接
゛続されている。セルスイッチ210.214.218
.222の出力は出ハイウェイ206に接続されており
、セルスイッチ211.215.219.223の出力
は出ハイウェイ207 に接続されており、セルスイッ
チ212.216.220.224の出力は出ハイウェ
イ208に接続されており、セルスイッチ213.21
? 、221.225の出力は出ハイウェイ209に接
続されている。
FIG. 2 is a block diagram showing the configuration of an ATM switching channel according to an embodiment of the present invention. In the same figure, 201 is AT
It is an M exchange communication path, and there are 4 people's 4 ways 202 to 2.
Exit the cell from any of the 05 highway 206
209. For this purpose, cell switches 210 to 225 each having a TAG determination section and a cell storage buffer are arranged in a matrix. A VCI (Virtual Cell
Identifier) TAG indicating exit highway
A conversion circuit (VCC) 226 is connected to convert the voltage into the voltage. Similarly, a conversion circuit (VCC) 227 is connected between the inputs of the cell switches 214 to 217 and the main highway 203, and a conversion circuit (VCC) 228 is connected between the inputs of the cell switches 218 to 2210 and the main highway 204. A conversion circuit (VCC) 229 is connected between the inputs of the cell switches 222 to 224 and the input highway 205. Cell switch 210.214.218
.. The output of cell switch 222 is connected to output highway 206, the output of cell switch 211.215.219.223 is connected to output highway 207, and the output of cell switch 212.216.220.224 is connected to output highway 208. connected and cell switch 213.21
? , 221.225 are connected to outbound highway 209.

本発明の実施例により、4本の入ハイウェイのうちの3
本の入ハイウェイ202.203.204にはそれぞれ
折り返し回路230.231.232が接続されており
、残りの1本の人ハイウェイ205には試験セル発生回
路(G)233が接続されている。折り返し回路230
〜232はそれぞれ、出ハイウェイ206〜208から
出力されるセル■、■、■を受けると、これを変換回路
(VCC) 226〜228に折り返す機能を有する。
According to an embodiment of the present invention, three of the four incoming highways
Return circuits 230, 231, and 232 are connected to the main highways 202, 203, and 204, respectively, and a test cell generation circuit (G) 233 is connected to the remaining human highway 205. Folding circuit 230
-232 have a function of receiving cells (1), (2), and (2) output from output highways 206-208, respectively, and returning them to conversion circuits (VCC) 226-228.

1本の出ハイウェイ209は試験セル受信回路234.
に接続されている。
One output highway 209 is connected to the test cell receiving circuit 234.
It is connected to the.

本実施例では、試験セル発生回路(G)234から出力
されるセルの識別符号VCI は′5”であるとする。
In this embodiment, it is assumed that the cell identification code VCI output from the test cell generation circuit (G) 234 is '5''.

第3図は折り返し回路230〜232の1つの構成を示
す回路図である。図示の如く、折り返し回路は通話路か
らのセルを蓄える待ち合わせバッファ331 と、対応
する出ハイウェイからの信号セル中のセル識別符号VC
Iを判別する判定回路332と、判定回路332が試験
セルのVCI である′5″を判別すると、待ち合わせ
バッファ331から出力に代えてその試験セルを選択出
力する選択回路333 とからなっている。
FIG. 3 is a circuit diagram showing one configuration of folding circuits 230-232. As shown in the figure, the return circuit includes a waiting buffer 331 for storing cells from the communication path, and a cell identification code VC in the signal cell from the corresponding outgoing highway.
It consists of a determination circuit 332 that determines I, and a selection circuit 333 that selects and outputs the test cell instead of outputting it from the waiting buffer 331 when the determination circuit 332 determines VCI '5'' of the test cell.

第4図は変換回路(VCC)226〜229 +、:−
オケルVCIからTAGへの変換テーブルを示す。図示
のように、試験セルのVCIである5″が入力されると
、この実施例においては、VCC226ではこれをTA
G ”1’″に変換し、VCC227テハ、:レヲTA
G ”3” i:変換し、VCC228テIt 、:れ
をTAG ”4” l:変換し、VCC228テはこれ
をTAG ”2”に変換する。
Figure 4 shows conversion circuits (VCC) 226 to 229 +, :-
A conversion table from Okel VCI to TAG is shown. As shown in the figure, when the VCI of the test cell, 5'', is input, in this embodiment, VCC 226 uses this as the TA.
Convert to G "1'", VCC227TEH, :ReoTA
G ``3'' i: Converts, VCC 228 te It ,: Converts it to TAG ``4'' l: Converts this to TAG ``2''.

以下、第2図の回路による導通試験の動作を第5図〜第
7図によって説明する。尚、以下の説明では、大ハイウ
ェイ202〜205をそれぞれ1.2.3.4で表し、
出ハイウェイ206〜209 もそれぞれ1.2.3.
4で表す。
The operation of the continuity test using the circuit shown in FIG. 2 will be explained below with reference to FIGS. 5 to 7. In addition, in the following explanation, major highways 202 to 205 will be represented by 1.2.3.4, respectively.
Exit highways 206 to 209 are also 1.2.3 respectively.
Represented by 4.

(1)通話路の正常性確認 例えば第5図に示すように、入ハイウェイ2と出ハイウ
ェイ3の間のパス2−3の試験を行う場合を考える。本
実施例では、試験セル発生回路(G)233は入ハイウ
ェイ4に接続されており、試験セル受信回路234は出
ハイウェイ4に接続されているので、パス2−3の試験
を行うためには、パス4−2と、2−3.3−4を設定
すればよい。このためには、第4図に示したように変換
回路のテ−プルの内容を定めておけばよい。
(1) Confirming the normality of the communication path For example, as shown in FIG. 5, consider the case where a test is performed on the path 2-3 between the incoming highway 2 and the outgoing highway 3. In this embodiment, the test cell generation circuit (G) 233 is connected to the incoming highway 4, and the test cell receiving circuit 234 is connected to the outgoing highway 4, so in order to test path 2-3, , paths 4-2 and 2-3.3-4 may be set. For this purpose, it is sufficient to define the contents of the table of the conversion circuit as shown in FIG.

試験セル発生回路(G)233から出力された試験セル
中のVCI は′″5”であり、これを受けたVCC2
29ではVCIのパ5″′に対応するTAGは第4図の
テーブルかられかるように“2”なので、大ハイウェイ
4から出たセルは出ハイウェイ2に出力される。
The VCI in the test cell output from the test cell generation circuit (G) 233 is ``5'', and VCC2
In No. 29, the TAG corresponding to VCI P5'' is "2" as seen from the table in FIG.

これが、対応する入ハイウェイ2に接続されている折り
返し回路231 に入力されると、折り返されて入ハイ
ウェイ2を介してvcc 227に入力される。VCC
227では、第4図のテーブルからvCIの11511
はTAG“3”に変換され、したがって、試験セルは非
試験パスに沿って、入ハイウェイ2から入力されて出ハ
イウェイ3に出力される。
When this signal is input to the loopback circuit 231 connected to the corresponding input highway 2, it is looped back and input to the VCC 227 via the input highway 2. VCC
227, 11511 of vCI from the table in FIG.
is converted to TAG “3”, and therefore, the test cell is input from the incoming highway 2 and outputted to the outgoing highway 3 along the non-test path.

出ハイウェイ3からの試験セルは対応する入ハイウェイ
3に接続されている折り返し回路232で折り返され、
入ハイウェイ3を介してVCC228に入力される。V
CC228では、第4図のテーブルからVCI の5”
はTAG“4”に変換され、したがって、試験セルは入
ハイウェイ3から入力されて出ハイウェイ4に出力され
、試験セル受信回路(C)234に受信される。試験セ
ル受信回路(C)234において、試験セルが正しく、
欠落無く受信できれば導通試験は完了である。但し、^
TM交換なので、確率的には、セル廃棄がありえるが許
容範囲内のセル廃棄なら正常と判定する。第2図および
第6図の点線は上記の試験セルの通過経路を示す。
The test cell from the outbound highway 3 is looped back by a loopback circuit 232 connected to the corresponding inbound highway 3,
It is input to VCC 228 via input highway 3. V
For CC228, from the table in Figure 4, VCI 5''
is converted to TAG “4”, and therefore, the test cell is input from the input highway 3, outputted to the output highway 4, and received by the test cell receiving circuit (C) 234. In the test cell receiving circuit (C) 234, the test cell is correct;
If the data can be received without any omissions, the continuity test is complete. However, ^
Since it is a TM exchange, there is a probability that cells will be discarded, but if the cell discard is within the allowable range, it is determined to be normal. The dotted lines in FIGS. 2 and 6 indicate the path through which the test cell described above passes.

この試験で、異常を検出すればその場所を特定する必要
がある。このために、通話路内での二重障害は無いと仮
定する。つまり2クロスポイント以上で同時に異常障害
をおこさないと仮定する。
If an abnormality is detected during this test, it is necessary to identify its location. For this purpose, it is assumed that there is no double failure within the communication path. In other words, it is assumed that abnormal failures do not occur simultaneously at two or more cross points.

そして、第7図(a)に示すようにパス4−2と2−4
で試験を行い、さらに第7図ら)に示すようにパス4−
3と3−4で導通試験を行えばよい。この導通試験で障
害が検出されなければ、第5図に示した最初の導通試験
の対象であったパス2−3に障害があったことがわかる
Then, as shown in FIG. 7(a), paths 4-2 and 2-4
Then, as shown in Figure 7, pass 4-
3 and 3-4 may be used to conduct the continuity test. If no fault is detected in this continuity test, it is understood that there is a fault in path 2-3, which was the object of the first continuity test shown in FIG.

通常この処理は、装置の正常性確認が目的であり試験セ
ルの送出頻度は試験セル以外の通話路からのセルの交換
動作を妨げない程度に低く抑え、周期的に全てのパスを
試験する。
Normally, the purpose of this processing is to confirm the normality of the device, and the frequency of transmitting test cells is kept low to the extent that it does not interfere with cell exchange operations from communication paths other than test cells, and all paths are periodically tested.

(2)帯域の保証 本発明の他の実施例により、試験セル発生回路(G)2
33は付加機能としてセルの発生頻度を制御する機能を
持つ。そして、呼設定時に、試験セル発生回路(G)2
33からその呼の帯域割り当て相当の頻度で、試験セル
を上述の導通試験同様のパスをはって、流してみる。こ
のとき、試験セル受信回路(C)234で要求された品
質を満足しておれば、パス設定する。
(2) Bandwidth Guarantee According to another embodiment of the present invention, the test cell generation circuit (G) 2
33 has an additional function of controlling the frequency of cell occurrence. Then, at the time of call setup, the test cell generation circuit (G) 2
33, test cells are passed through a path similar to the continuity test described above at a frequency corresponding to the band allocation for the call. At this time, if the quality required by the test cell receiving circuit (C) 234 is satisfied, a pass is set.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば、出ハイウェイか
らの出力の試験セルをそれと対になった大ハイウェイに
ふいてATM交換通話路に折り返す手段を設け、特定の
人ハイウェイに接続した試験セルの発生回路と特定の出
ハイウェイに接続した試験装置の受信装置の間を、折り
返し回路を経由することによって、入出力ハイウェイ間
で採り得る全ての組合せのパスを設定でき、そこに試験
用の信号セルを通して通話路の正常動作を確認すること
ができる。
As explained above, according to the present invention, means is provided for wiping the output test cell from the outbound highway onto the paired major highway and returning it to the ATM switching communication path, and the test cell connected to the specific person highway is provided. By passing the return circuit between the generation circuit and the receiving device of the test equipment connected to a specific output highway, all possible combinations of paths between the input and output highways can be set, and the test signal can be transmitted there. The normal operation of the communication path can be confirmed through the cell.

試験セル発生回路は単一の入ハイウェイにのみ接続され
、試験せる受信回路も単一の出ハイウェイに接続されて
おればよいので、ハードウェアの量は従来に比べて大幅
に削減される。
Since the test cell generation circuit only needs to be connected to a single input highway, and the receiving circuit to be tested only needs to be connected to a single output highway, the amount of hardware is significantly reduced compared to the conventional method.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の原理ブロック図、 第2図は本発明の実施例によるATM交換通話路の構成
を示すブロック図、 第3図は第2図に示した折り返し回路の1つの構成を示
すブロック図、 第4図は第2図に示した変換回路(VCC>内の変換テ
ーブルの内容を示す図、 第5図は本発明の実施例による被試験パスを説明する図
、 第6図は本発明の実施例による被試験パスの導通試験を
説明する図、 第7図は本発明の実施例による障害点の特定を説明する
図、 第8図は従来の構成を示すブロック図である。 図において、 1は入ハイウェイ、 2は出ハイウェイ、 3はATM通話路、 4は試験セル発生手段、 5は試験セル受信手段、 6は折り返し手段、 7はパス設定手段である。
FIG. 1 is a block diagram of the principle of the present invention. FIG. 2 is a block diagram showing the configuration of an ATM switching channel according to an embodiment of the present invention. FIG. 3 is a block diagram showing the configuration of one of the loopback circuits shown in FIG. 2. 4 is a diagram showing the contents of the conversion table in the conversion circuit (VCC) shown in FIG. 2, FIG. 5 is a diagram illustrating the path under test according to the embodiment of the present invention, and FIG. FIG. 7 is a diagram illustrating a continuity test of a path under test according to an embodiment of the present invention; FIG. 7 is a diagram illustrating fault point identification according to an embodiment of the present invention; FIG. 8 is a block diagram showing a conventional configuration. In the figure, 1 is an incoming highway, 2 is an outgoing highway, 3 is an ATM communication path, 4 is a test cell generating means, 5 is a test cell receiving means, 6 is a return means, and 7 is a path setting means.

Claims (1)

【特許請求の範囲】 1、複数の入ハイウェイ(1)と複数の出ハイウェイ(
2)の間で交換を行うATM通話路(3)、該入ハイウ
ェイ(1)の一つに接続されており、試験用VCIを含
む試験セルを発生する試験セル発生手段(4)、 該出ハイウェイ(2)の一つに接続されており、該試験
セルを受信する試験セル受信手段(5)、該出ハイウェ
イ(2)の各々と対になった入ハイウェイに該出ハイウ
ェイからの試験セルのみを折り返す試験セル折り返し手
段(6)、および 該ATM通話路(3)内で該試験セルのための通話路を
形成するための試験パス設定手段(7)を具備し、該試
験セル発生手段(4)で発生させた試験セルを該試験セ
ル折り返し手段(6)により折り返して、該ATM通話
路(3)内の試験対象ルートに導き、該試験セル受信手
段(5)で到着セル内の試験用VCIを検出することに
より該ATM通話路(3)内の該試験対象ルートの導通
を確認することを特徴とするATM交換通話路の導通試
験方式。 2、請求項の1に記載の導通試験方式において、該試験
セル発生手段(5)は、試験セルの発生頻度を制御する
手段を具備し、パスの帯域割り当て要求分のセルを発生
させ該当パスがサービス品質を満足するのを確認したう
えで呼接続を行うことを特徴とする、回線設定方式。
[Claims] 1. A plurality of ingress highways (1) and a plurality of egress highways (
2), a test cell generating means (4) connected to one of the input highways (1) and generating test cells containing a test VCI; A test cell receiving means (5) which is connected to one of the highways (2) and receives the test cell, and a test cell receiving means (5) that receives the test cell from the outgoing highway on the incoming highway paired with each of the outgoing highways (2). a test cell loopback means (6) for looping back only a test cell; and a test path setting means (7) for forming a communication path for the test cell within the ATM communication path (3); The test cell generated in step (4) is looped back by the test cell loopback means (6), guided to the route to be tested within the ATM communication path (3), and the test cell generated in the test cell receiver (5) is A continuity test method for an ATM switching channel, characterized in that continuity of the test target route in the ATM channel (3) is confirmed by detecting a test VCI. 2. In the continuity test method according to claim 1, the test cell generating means (5) includes means for controlling the frequency of generation of test cells, and generates cells corresponding to the bandwidth allocation request of the path and A line setting method that connects a call after confirming that the service quality is satisfied.
JP2243841A 1990-09-17 1990-09-17 Continuity testing system for exchange speech path Pending JPH04124936A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2243841A JPH04124936A (en) 1990-09-17 1990-09-17 Continuity testing system for exchange speech path

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2243841A JPH04124936A (en) 1990-09-17 1990-09-17 Continuity testing system for exchange speech path

Publications (1)

Publication Number Publication Date
JPH04124936A true JPH04124936A (en) 1992-04-24

Family

ID=17109746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2243841A Pending JPH04124936A (en) 1990-09-17 1990-09-17 Continuity testing system for exchange speech path

Country Status (1)

Country Link
JP (1) JPH04124936A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06268668A (en) * 1993-03-10 1994-09-22 Nippon Telegr & Teleph Corp <Ntt> Speech path continuity test device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06268668A (en) * 1993-03-10 1994-09-22 Nippon Telegr & Teleph Corp <Ntt> Speech path continuity test device

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