JPH04115008U - Absolute length measuring device - Google Patents

Absolute length measuring device

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Publication number
JPH04115008U
JPH04115008U JP1954591U JP1954591U JPH04115008U JP H04115008 U JPH04115008 U JP H04115008U JP 1954591 U JP1954591 U JP 1954591U JP 1954591 U JP1954591 U JP 1954591U JP H04115008 U JPH04115008 U JP H04115008U
Authority
JP
Japan
Prior art keywords
length measuring
light source
absolute
measuring device
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1954591U
Other languages
Japanese (ja)
Inventor
克己 磯崎
Original Assignee
横河電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 横河電機株式会社 filed Critical 横河電機株式会社
Priority to JP1954591U priority Critical patent/JPH04115008U/en
Publication of JPH04115008U publication Critical patent/JPH04115008U/en
Withdrawn legal-status Critical Current

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Abstract

(57)【要約】 【目的】 光源に波長チュ−ニング可能なLD励起のN
d:YAGレ−ザを使用することにより、小型かつ高信
頼性のアブソリュ−ト測長器を実現する。 【構成】 波長の異なる複数の光を測長用干渉計部に入
射し、この測長用干渉計部から得られた複数の干渉位相
から絶対距離を測定するアブソリュ−ト測長器におい
て、前記波長の異なる複数の光を出射する光源にレ−ザ
ダイオ−ド励起のNd:YAGレ−ザを用い、その共振
器内に波長選択素子を挿入して、複数の発振波長を順次
出射できる多波長光源を使用した構成としたことを特徴
とする。
(57) [Summary] [Purpose] N of LD excitation with wavelength tunable light source
By using a d:YAG laser, a compact and highly reliable absolute length measuring device is realized. [Structure] In an absolute length measuring device that makes a plurality of lights of different wavelengths enter a length measuring interferometer section and measures an absolute distance from a plurality of interference phases obtained from the length measuring interferometer section, the above-mentioned A laser diode-pumped Nd:YAG laser is used as a light source that emits multiple light beams with different wavelengths, and a wavelength selection element is inserted into the resonator to sequentially emit multiple oscillation wavelengths. It is characterized by a configuration that uses a light source.

Description

【考案の詳細な説明】[Detailed explanation of the idea]

【0001】0001

【産業上の利用分野】[Industrial application field]

本考案は、光の干渉を利用して物体までの絶対距離を測定するアブソリュ−ト 測長器に関し、特に光源部にNd:YAGレ−ザを使用した多波長レ−ザを用い て、小型かつ高信頼性の装置を実現するものである。 This invention is an absolute method that uses light interference to measure the absolute distance to an object. Regarding length measuring instruments, we especially use multi-wavelength lasers using Nd:YAG lasers in the light source. This enables the realization of a compact and highly reliable device.

【0002】0002

【従来の技術】[Conventional technology]

従来からアブソリュ−ト測長器に関する様々な報告がされているが、未だに実 用化されているものはない。その原因は、アブソリュ−ト測長を行うために必要 な光源の構成が、非常に複雑になってしまうためである。現在報告されている中 で1×10-7以上の精度を持つアブソリュ−ト測長器は、光源にCO2 (炭酸ガ ス)レ−ザを用い、測長用干渉計部に異なる波長の複数の光を順次選択して入射 させ、得られる干渉位相の差から絶対距離を求める端数法により実現している測 長器である。Various reports have been made regarding absolute length measuring devices, but none have been put into practical use yet. The reason for this is that the configuration of the light source required to perform absolute length measurement becomes extremely complicated. The currently reported absolute length measuring device with an accuracy of 1 x 10 -7 or higher uses a CO 2 (carbon dioxide) laser as a light source, and uses multiple wavelengths of different wavelengths in the interferometer section for length measurement. This is a length measuring device that uses the fractional method to sequentially select and inject the following lights and calculate the absolute distance from the difference in the resulting interference phases.

【0003】0003

【考案が解決しようとする課題】[Problem that the idea aims to solve]

しかしながら、CO2 レ−ザはガスレ−ザであるため、装置が大型で短寿命、 しかも高価であるなどの課題を持っており、これらの要因がアブソリュ−ト測長 器が商品化されるまでに至っていない点である。However, since CO 2 lasers are gas lasers, they have problems such as the equipment being large, short-lived, and expensive. This point has not yet been reached.

【0004】 本考案は上記従来技術の課題を踏まえて成されたものであり、アブソリュ−ト 測長器の光源部に固体レ−ザであるNd:YAGレ−ザ(レ−ザ増幅材料にネオ ジウムイオンNd3+を入れたイットリウム・アルミニウム・ガ−ネット(Y3 A l5 12:YAGと略称)を用いたもの)を使用することにより、小型かつ高信 頼性のアブソリュ−ト測長器を提供することを目的としたものである。[0004] The present invention has been made based on the problems of the prior art described above, and uses a solid-state laser Nd:YAG laser (as a laser amplification material) in the light source section of an absolute length measuring device. Compact and highly reliable absolute length measurement by using yttrium aluminum garnet ( Y3A15O12 : abbreviated as YAG) containing neodymium ions Nd3 + . The purpose is to provide utensils.

【0005】[0005]

【課題を解決するための手段】[Means to solve the problem]

上記課題を解決するための本考案の構成は、波長の異なる複数の光を測長用干 渉計部に入射し、この測長用干渉計部から得られた複数の干渉位相から絶対距離 を測定するアブソリュ−ト測長器において、前記波長の異なる複数の光を出射す る光源にレ−ザダイオ−ド(以下、単にLDという)励起のNd:YAGレ−ザ を用い、その共振器内に波長選択素子を挿入して、複数の発振波長を順次出射で きる多波長光源を使用した構成としたことを特徴とするものである。 The configuration of the present invention to solve the above problems is to use multiple lights with different wavelengths for length measurement. Absolute distance from multiple interference phases obtained from this length measurement interferometer In an absolute length measuring device that measures The light source is a laser diode (hereinafter simply referred to as LD) pumped Nd:YAG laser. By inserting a wavelength selection element into the resonator, multiple oscillation wavelengths can be sequentially emitted. The device is characterized by a configuration that uses a multi-wavelength light source that can generate wavelengths.

【0006】[0006]

【作用】[Effect]

以前のNd:YAGレ−ザはフラッシュランプで励起していたため、CO2 レ −ザと同様に大型な装置であったが、近年になって、LDの出力が向上したこと により、LD励起が可能となり、小型で高効率、高信頼性な光源となってきた。 一方、Nd:YAG結晶は固体であるため、多数の発振線を持っており、レ−ザ 共振器内に波長チュ−ニング可能な波長選択素子を入れることにより、複数の波 長で発振が可能であり、測長用の多波長光源を実現できる。したがって、本考案 によれば、光源に波長チュ−ニング可能なLD励起のNd:YAGレ−ザを使用 しており、装置の小型化を可能とし、信頼性を向上できる。 Previous Nd:YAG lasers were excited by flash lamps, so CO2 -It was a large device like the LD, but the output of the LD has improved in recent years. This has made LD excitation possible, resulting in a compact, highly efficient, and highly reliable light source. On the other hand, since Nd:YAG crystal is a solid, it has many oscillation lines and cannot be used as a laser beam. By placing a wavelength-tunable wavelength selection element inside the resonator, multiple waves can be It is possible to oscillate at a long distance, making it possible to realize a multi-wavelength light source for length measurement. Therefore, the present invention According to , a wavelength-tunable LD-pumped Nd:YAG laser is used as a light source. This makes it possible to downsize the device and improve reliability.

【0007】[0007]

【実施例】【Example】

以下、本考案を図面に基づいて説明する。 図1は本考案の光源にNd:YAGレ−ザを用いたアブソリュ−ト測長器の一 実施例を示す構成図である。図1において、本考案のアブソリュ−ト測長器は多 波長光源部1と測長用干渉計部2に大別されて構成される。多波長光源部1は、 波長の異なる複数の光を順次出射するための光源であり、波長選択素子を共振器 内に入れたLD励起型のNd:YAGレ−ザである。多波長光源部1において、 LD駆動用定電流源12で駆動された励起用LD光源11の出射光は、カップリ ング用光学系13を経て、Nd:YAG結晶14に入射される。このNd:YA G結晶14で発生した螢光は、Nd:YAG結晶14の図1における左端面とレ −ザ共振器用ミラ−17で共振器が形成されるので、レ−ザ発振する。この時の 発振波長は、複屈折フィルタ15の角度を波長チュ−ニング用駆動部16で調整 することにより可変される。このようにして多波長光源部1から出射された波長 の光は、測長用干渉計部2に入射される。測長用干渉計部2は、ハ−フミラ−2 1と2つのコ−ナ−キュ−ブ22(参照用),23(測長用)から成るマイケル ソンの干渉計で構成され、その干渉信号は光検出器24で検出され、干渉位相測 定回路25で干渉位相を測定される。演算回路26では、多波長光源部1から出 射される複数の波長の光に対する干渉位相測定回路25の出力を取り込み、絶対 距離を演算する。 Hereinafter, the present invention will be explained based on the drawings. Figure 1 shows an example of an absolute length measuring device using an Nd:YAG laser as the light source of the present invention. FIG. 2 is a configuration diagram showing an example. In Figure 1, the absolute length measuring device of the present invention has multiple It is roughly divided into a wavelength light source section 1 and a length measurement interferometer section 2. The multi-wavelength light source section 1 is It is a light source that sequentially emits multiple lights with different wavelengths, and the wavelength selection element is used as a resonator. This is an LD-excited Nd:YAG laser installed inside the LD pump. In the multi-wavelength light source section 1, The light emitted from the excitation LD light source 11 driven by the LD drive constant current source 12 is coupled to The light passes through the optical system 13 and enters the Nd:YAG crystal 14. This Nd:YA The fluorescence generated in the G crystal 14 is located between the left end face and the left end face of the Nd:YAG crystal 14 in FIG. - Since a resonator is formed by the laser resonator mirror 17, laser oscillation occurs. at this time The oscillation wavelength is adjusted by adjusting the angle of the birefringence filter 15 using the wavelength tuning drive unit 16. It can be changed by The wavelengths emitted from the multi-wavelength light source section 1 in this way The light enters the length measurement interferometer section 2. The length measurement interferometer section 2 is a half mirror 2. 1 and two corner cubes 22 (for reference) and 23 (for length measurement). The interference signal is detected by the photodetector 24, and the interference phase measurement is performed. The interference phase is measured by a constant circuit 25. In the arithmetic circuit 26, the light emitted from the multi-wavelength light source section 1 is The output of the interference phase measurement circuit 25 for the multiple wavelengths of light emitted is taken in, and the absolute Calculate distance.

【0008】 次に、端数法によるアブソリュ−ト測長を行うための発振波長の選択例を示す 。なお、この場合、端数法に要求される波長差を持つ発振線で、かつ発光強度の 高いレ−ザ遷移を選ぶことが重要である。ここで、図2はNd:YAGのエネル ギ準位図である。4 3/2 準位は230μs程度の長い螢光寿命を有しており、 0.9μm帯(4 3/2 4 9/2 )、1.06μm帯(4 3/2 4 11/2) 、1.3μm帯(4 3/2 4 13/2)で強い螢光が観測される。この内、螢光 遷移が最も強いのは、1.06μm帯である。4 3/2 は結晶場によりR1 ,R 2 の二つの準位に分裂している。また、4 11/2準位はY1 〜Y6 の六つの準位 に分裂している。図3にNd:YAGの1.06μm帯における螢光スペクトラ ムを示す。図に示すように、常温ではR2 からY3 に至る波長1.064μmの 螢光線が最も強く、したがってこの波長でレ−ザ発振が最も生じやすい。表1は このようにして選択された発振波長例を示すものである。この表1に示す発振波 長λ1 〜λ4 の4つの波長を順次出射して、測長用干渉計部2に入射させ、得ら れる干渉位相をそれぞれ測定し、演算回路26にて演算することにより、高精度 なアブソリュ−ト測長を可能としている。定性的には、周波数差を対数的に大き くすることにより、合成波長を小さくしていき、アブソリュ−トで測定できる距 離を高精度化していく端数法を使用している。Next, an example of selecting an oscillation wavelength for performing absolute length measurement using the fraction method will be shown. In this case, it is important to select a laser transition that has an oscillation line with a wavelength difference required by the fraction method and has a high emission intensity. Here, FIG. 2 is an energy level diagram of Nd:YAG. The 4 F 3/2 level has a long fluorescence lifetime of about 230 μs, and the 0.9 μm band ( 4 F 3/24 I 9/2 ) and the 1.06 μm band ( 4 F 3/24 I 11/2 ), strong fluorescence is observed in the 1.3 μm band ( 4 F 3/24 I 13/2 ). Among these, the 1.06 μm band has the strongest fluorescence transition. 4F 3/2 is split into two levels, R1 and R2, by the crystal field. Furthermore, the 4 I 11/2 level is divided into six levels, Y1 to Y6. FIG. 3 shows the fluorescence spectrum of Nd:YAG in the 1.06 μm band. As shown in the figure, at room temperature, the fluorescent light with a wavelength of 1.064 .mu.m from R2 to Y3 is the strongest, and therefore laser oscillation is most likely to occur at this wavelength. Table 1 shows examples of oscillation wavelengths selected in this way. By sequentially emitting the four oscillation wavelengths λ1 to λ4 shown in Table 1 and making them incident on the length measurement interferometer section 2, measuring the obtained interference phases, and calculating them in the calculation circuit 26, This enables highly accurate absolute length measurement. Qualitatively, a fractional method is used in which the combined wavelength is made smaller by increasing the frequency difference logarithmically, thereby increasing the precision of the distance that can be measured in absolute terms.

【0009】[0009]

【表1】 [Table 1]

【0010】 なお、上記実施例において、波長選択素子15として複屈折フィルタを使用し たが、これに限るものではなく、回折格子や超音波光変調器などでも良い。また 、干渉計としては、マイケルソン干渉計を使用しているが、フィゾ−型やマッハ ツェンダ型などを用いても良い。0010 Note that in the above embodiment, a birefringence filter is used as the wavelength selection element 15. However, it is not limited to this, and may be a diffraction grating, an ultrasonic optical modulator, or the like. Also , a Michelson interferometer is used as an interferometer, but Fizeau type or Mach A Zehnder type or the like may also be used.

【0011】[0011]

【考案の効果】[Effect of the idea]

以上、実施例と共に具体的に説明したように、本考案によれば、アブソリュ− ト測長器の光源として、波長チュ−ニング可能なLD励起のNd:YAGレ−ザ を使用しており、小型で信頼性の高いアブソリュ−ト測長器を実現できる。 As described above in detail along with the embodiments, according to the present invention, the absolute A wavelength-tunable LD-excited Nd:YAG laser is used as a light source for a length measuring device. This makes it possible to create a compact and highly reliable absolute length measuring device.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本考案のアブソリュ−ト測長器の一実施例を示
す構成図である。
FIG. 1 is a configuration diagram showing an embodiment of an absolute length measuring device of the present invention.

【図2】図1装置の光源に用いるNd:YAGのエネル
ギ準位図である。
FIG. 2 is an energy level diagram of Nd:YAG used in the light source of the device in FIG. 1;

【図3】図1装置の光源に用いるNd:YAGの1.0
6μm帯における螢光スペクトルを示す図である。
[Figure 3] 1.0 of Nd:YAG used in the light source of the Figure 1 device
FIG. 3 is a diagram showing a fluorescence spectrum in the 6 μm band.

【符号の説明】[Explanation of symbols]

1 多波長光源部 2 測長用干渉計部 11 励起用LD光源 12 LD駆動用定電流源 13 カップリング用光学系 14 Nd:YAG結晶 15 複屈折フィルタ(波長選択素子) 16 波長チュ−ニング用駆動部 17 レ−ザ共振器用ミラ− 21 ハ−フミラ− 22 参照用コ−ナ−キュ−ブ 23 測長用コ−ナ−キュ−ブ 24 光検出器 25 干渉位相測定回路 26 演算回路 1 Multi-wavelength light source section 2 Interferometer section for length measurement 11 LD light source for excitation 12 Constant current source for LD drive 13 Coupling optical system 14 Nd:YAG crystal 15 Birefringence filter (wavelength selection element) 16 Wavelength tuning drive unit 17 Mirror for laser resonator 21 Half mirror 22 Reference corner cube 23 Corner cube for length measurement 24 Photodetector 25 Interference phase measurement circuit 26 Arithmetic circuit

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 波長の異なる複数の光を測長用干渉計部
に入射し、この測長用干渉計部から得られた複数の干渉
位相から絶対距離を測定するアブソリュ−ト測長器にお
いて、前記波長の異なる複数の光を出射する光源にレ−
ザダイオ−ド励起のNd:YAGレ−ザを用い、その共
振器内に波長選択素子を挿入して、複数の発振波長を順
次出射できる多波長光源を使用した構成としたことを特
徴とするアブソリュ−ト測長器。
Claim 1: In an absolute length measuring device that makes a plurality of lights of different wavelengths enter a length measuring interferometer section and measures an absolute distance from a plurality of interference phases obtained from the length measuring interferometer section. , a laser is attached to the light source that emits the plurality of lights with different wavelengths.
An absolute system characterized in that it uses a diode-pumped Nd:YAG laser, inserts a wavelength selection element into its resonator, and uses a multi-wavelength light source that can sequentially emit a plurality of oscillation wavelengths. - length measuring device.
JP1954591U 1991-03-28 1991-03-28 Absolute length measuring device Withdrawn JPH04115008U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1954591U JPH04115008U (en) 1991-03-28 1991-03-28 Absolute length measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1954591U JPH04115008U (en) 1991-03-28 1991-03-28 Absolute length measuring device

Publications (1)

Publication Number Publication Date
JPH04115008U true JPH04115008U (en) 1992-10-12

Family

ID=31905808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1954591U Withdrawn JPH04115008U (en) 1991-03-28 1991-03-28 Absolute length measuring device

Country Status (1)

Country Link
JP (1) JPH04115008U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9470007B2 (en) 2008-12-24 2016-10-18 Crystal Lagoons (Curacao) B.V. Efficient filtration process of water in a tank for recreational and ornamental uses, where the filtration is performed over a small volume of water and not over the totality of the water from the tank
US9470008B2 (en) 2013-12-12 2016-10-18 Crystal Lagoons (Curacao) B.V. System and method for maintaining water quality in large water bodies

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9470007B2 (en) 2008-12-24 2016-10-18 Crystal Lagoons (Curacao) B.V. Efficient filtration process of water in a tank for recreational and ornamental uses, where the filtration is performed over a small volume of water and not over the totality of the water from the tank
US9470008B2 (en) 2013-12-12 2016-10-18 Crystal Lagoons (Curacao) B.V. System and method for maintaining water quality in large water bodies

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