JPH04105069A - Contact probe - Google Patents

Contact probe

Info

Publication number
JPH04105069A
JPH04105069A JP22484590A JP22484590A JPH04105069A JP H04105069 A JPH04105069 A JP H04105069A JP 22484590 A JP22484590 A JP 22484590A JP 22484590 A JP22484590 A JP 22484590A JP H04105069 A JPH04105069 A JP H04105069A
Authority
JP
Japan
Prior art keywords
circuit board
roller
probe
contact
bearing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22484590A
Other languages
Japanese (ja)
Other versions
JP3156250B2 (en
Inventor
Toru Tomine
遠峰 徹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP22484590A priority Critical patent/JP3156250B2/en
Publication of JPH04105069A publication Critical patent/JPH04105069A/en
Application granted granted Critical
Publication of JP3156250B2 publication Critical patent/JP3156250B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To enable a circuit board to be protected against damage by using a roller at a mechanical contact section between a contact probe and an object for detection. CONSTITUTION:A roller 1 is in contact with an electrode pattern 10 on a circuit board 11, and a spring probe 7 acts to give pressure necessary for electrical continuity via an arm 4 supported on a bearing 6. The roller 1 is supported with a bearing 2. According to the aforesaid construction, an electrical signal can be sent or received without causing any damage to the surface of the circuit board 11 and the electrode pattern 10 thereon.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電気回路基板(以下回路基板)等の電気特性
を測定するときに使用するコンタクトプローブに関する
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a contact probe used when measuring electrical characteristics of an electric circuit board (hereinafter referred to as a circuit board) or the like.

〔従来の技術〕[Conventional technology]

従来回路基板等の電気特性を測定するときに使用するコ
ンタクトプローブは、第3図に示すように機械的接触端
子部15がコイルバネ14により押されて12の方向に
移動する構造のものか、第4図の様に機械的接触端子部
16かそれ自体のたわみによるバネで12の方向に移動
する構造のものであった。
Conventional contact probes used to measure the electrical characteristics of circuit boards, etc., have a structure in which a mechanical contact terminal part 15 is pushed by a coil spring 14 and moves in the direction 12, as shown in FIG. As shown in Fig. 4, the mechanical contact terminal part 16 had a structure that moved in the direction 12 by a spring caused by the deflection of itself.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかし従来のコンタクトプローブは、プローブ先端の接
触点が第3・4図における12方向すなわち回路基板面
に対して法線方向に移動する使用力が一般的であるが、
回路基板法線方向にたいして直角な回路基板面平行方向
13に移動する使用法には不向きであり、そのような場
合は回路基板上に傷を付けるという課題があった。そこ
で本発明は、面平行方向にプローブを移動させて回路基
板等の電気特性を測定する場合に回路基板に損傷を与え
ないようなプローブを提供することを目的とする。
However, with conventional contact probes, the contact point of the probe tip generally moves in the 12 directions shown in Figures 3 and 4, that is, in the normal direction to the circuit board surface.
It is not suitable for use in which the device is moved in a direction 13 parallel to the circuit board surface that is perpendicular to the normal direction of the circuit board, and in such a case, there is a problem that the circuit board may be damaged. SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a probe that does not damage a circuit board when measuring the electrical characteristics of a circuit board or the like by moving the probe in a plane-parallel direction.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために本発明のコンタクトプローブ
は、検出対象との機械的な接触部かローラーであること
を特徴とする特 〔実 施 例〕 以下に本発明の実施例を図面に基付いて説明する。回路
基板11上の電極パターン10に対してローラー1が接
触し、従来技術第3図に示すバネプローブ7によりベア
リング6に支持されたアーム4を介して電気的導通に必
要な加圧をし、かつプローブ7を介して電気信号を授受
する。接触端子であるローラー1はベアリング2で支持
され、ローラー1との電気信号を確実に授受する為にロ
ーラー1の先端をテーパーにとがらせ板バネ3と接触さ
せる。なおこのバネ3の加圧力は0−−)−1とベアリ
ング2とのスラストかたを除去することも目的としてい
る。ローラー1はハウジング9の両側に1個づつ2個配
し同一水準の検出をすることによる検出信頼性向上、あ
るいは一つのハウジングで2カ所の検出をする等の使い
分けを可能とするために、左右のプローブ同志の信号の
干渉を避ける目的で、ベアリング6を支持する軸5を電
気的絶縁体としている。ローラーの接触信頼性を向上す
るために、ローラー1の電極パターン10と接触する先
端アール部分は鏡面仕上げが必要である。
In order to solve the above problems, the contact probe of the present invention is characterized in that it has a mechanical contact portion with a detection target or a roller. I will explain. The roller 1 is brought into contact with the electrode pattern 10 on the circuit board 11, and the pressure necessary for electrical continuity is applied via the arm 4 supported by the bearing 6 by the spring probe 7 shown in FIG. It also transmits and receives electrical signals via the probe 7. A roller 1, which is a contact terminal, is supported by a bearing 2, and the tip of the roller 1 is tapered and brought into contact with a leaf spring 3 in order to reliably transmit and receive electric signals to and from the roller 1. The pressing force of the spring 3 is also intended to eliminate the thrust between 0--)-1 and the bearing 2. Two rollers 1 are arranged, one on each side of the housing 9, to improve detection reliability by detecting the same level, or to enable different uses such as detecting two locations with one housing. In order to avoid signal interference between the probes, the shaft 5 supporting the bearing 6 is made of an electrical insulator. In order to improve the contact reliability of the roller, the rounded end portion of the roller 1 that comes into contact with the electrode pattern 10 needs to be mirror-finished.

また、ベアリング2との勘合や加工プロセス上で打痕等
欠陥の発生を抑えるため、メツキ等の防錆処理が不要な
超硬あるいはステンレスのプレバトン材等を用いる事は
有効である。
Furthermore, in order to suppress the occurrence of defects such as dents during fitting with the bearing 2 and during the machining process, it is effective to use a pre-baton material such as carbide or stainless steel that does not require anti-rust treatment such as plating.

〔発明の効果〕〔Effect of the invention〕

以上述べたような発明によれば、検出プローブの先端を
ローラーにする事によって回路基板面内を回路基板と平
行に移動させるようなプローブの使い方をするとき、回
路基板表面や回路基板上の電極パターンに傷を付ける事
なく電気信号の授受ができるといった効果がある。
According to the invention described above, when the probe is used in such a way that the tip of the detection probe is made into a roller and is moved within the surface of the circuit board in parallel with the circuit board, the surface of the circuit board or the electrode on the circuit board is used. It has the effect of allowing electrical signals to be sent and received without damaging the pattern.

【図面の簡単な説明】[Brief explanation of drawings]

第1図・・本発明ローラープローブの平面断面図。 第2図・・本発明ローラープローブの正面図。 第3図・・従来のコイルバネ使用コンタクトプローブ断
面図。 第4図・・従来のピンたわみ方式コンタクトプローブ断
面図。 1 ・ 2 ・ 3 ・ 4 ・ 5 ・ 6 ・ 7 ・ 8・ 9 ・ 10・ 11 ・ 12 ・ 13拳 15拳 16φ ローラ ベアリング 板バネ アーム 軸 ベアリング コイルバネ式コンタクトプローブ プローブ固定軸 プローブハウジング 電極パターン 回路基板 回路基板法線方向 回路基板面平行方向 バネ プローブ プローブ 121刀 丁 /3 下/3 ¥3図 ¥ 4 ■
FIG. 1: A cross-sectional plan view of the roller probe of the present invention. FIG. 2: Front view of the roller probe of the present invention. Figure 3: Cross-sectional view of a conventional contact probe using a coil spring. Figure 4: Cross-sectional view of a conventional pin deflection type contact probe. 1 ・ 2 ・ 3 ・ 4 ・ 5 ・ 6 ・ 7 ・ 8 ・ 9 ・ 10 ・ 11 ・ 12 ・ 13 fist 15 fist 16φ Roller bearing plate spring arm axis bearing coil spring type contact probe probe fixed axis probe housing electrode pattern circuit board circuit board Normal direction circuit board surface parallel direction spring probe probe 121 knife/3 lower/3 ¥3 figure ¥4 ■

Claims (1)

【特許請求の範囲】[Claims] 電気的な信号を機械的な接触によって伝達させるコンタ
クトプローブにおいて、検出対象との機械的な接触部が
ローラーであることを特徴とするコンタクトプローブ。
A contact probe for transmitting electrical signals through mechanical contact, characterized in that the mechanical contact portion with a detection target is a roller.
JP22484590A 1990-08-27 1990-08-27 Contact probe Expired - Fee Related JP3156250B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22484590A JP3156250B2 (en) 1990-08-27 1990-08-27 Contact probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22484590A JP3156250B2 (en) 1990-08-27 1990-08-27 Contact probe

Publications (2)

Publication Number Publication Date
JPH04105069A true JPH04105069A (en) 1992-04-07
JP3156250B2 JP3156250B2 (en) 2001-04-16

Family

ID=16820072

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22484590A Expired - Fee Related JP3156250B2 (en) 1990-08-27 1990-08-27 Contact probe

Country Status (1)

Country Link
JP (1) JP3156250B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100368075B1 (en) * 2000-02-07 2003-01-15 마이크로 인스펙션 주식회사 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe
JP2010511865A (en) * 2006-11-30 2010-04-15 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Contact operation without movement

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100368075B1 (en) * 2000-02-07 2003-01-15 마이크로 인스펙션 주식회사 Inspection apparatus and method adapted to a scanning technique employing a rolling wire probe
JP2010511865A (en) * 2006-11-30 2010-04-15 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Contact operation without movement

Also Published As

Publication number Publication date
JP3156250B2 (en) 2001-04-16

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