JPH0395621A - System running test system for library device - Google Patents

Abstract

PURPOSE:To improve the operating efficiency of a system running test by securing such a constitution where a 1st test part detects an exchange process start timing of a medium set by a 2nd test part via the flag of a common memory. CONSTITUTION:The 1st test part 10b turns on the flag 30 of a common memory 20 and monitors the flag OFF timing when the an ejecting instruction is issued. Meanwhile a 2nd test part 10c retrieves a recording/reading device 6 kept in an ejection state prior to the start of a shift test. When such device 6 is confirmed, the flag 30 is turned off and an exchange process is carried out. If such device 6 is not confirmed, a shift test is carried out. Then the part 10b that detects a flag OFF state confirms whether a set state is secured or not within a prescribed time necessary for exchange with retrieval of a state table 3. Thus it is only required to confirm a set state for a prescribed time after the flag OFF state is set. Accordingly, a system running test is carried out with high efficiency.

Description

[Detailed Description of the Invention] [Summary] The present invention relates to a system running test method for a library device, and aims to make the test more efficient. In a data processing system including a library device having a transfer device, a first test section monitors a status table in which setting and ejection status of the medium in the recording/reading device is stored. The second test section tests the medium and instructs to eject the medium after the test is completed, and the second test section performs a transfer test of the medium within the library device and records/reads the ejected state before starting each transfer test. A system running test method for a library device that searches and exchanges media, the system including a common memory accessed by the first and second test units, and a system provided in the first test unit to instruct ejection of the medium. a confirmation means for turning on a predetermined flag in the common memory when the flag is turned on, monitoring whether the flag is turned off, and checking whether or not the set state is notified within a predetermined time after the flag is turned off; processing means for referring to the common memory and turning off a flag of the target recording/reading device at the start of the medium exchange process; The system is configured to detect the start timing of the exchange process and check whether the cent status of the medium has been notified within a predetermined time.

[Industrial application field]

The present invention relates to an improvement in a system running test method for a library device.

There are multiple hangars (hereinafter referred to as cells) that store a large amount of cartridge tapes (CTG), multiple magnetic tape devices (gate TIJ), and between MTIJ and MTU, between cells, and between cells and MTU. A test program for system running of a magnetic tape library device, which is composed of an accessor device (ACC) that moves a CTG between ) of M
It consists of an ACC test section that searches for a TU and sets a CTG, and a magnetic tape device test section that tests the CTG set by the ACC. Conventionally, there was no interface between each test program. Since the ACC test section did not have the CTG setting process, the timing for starting the CTG setting process by the ACC test section was not known, and it was therefore difficult to set the time for confirming the completion of the setting (READY state).

As a result, testing efficiency deteriorates, and a system running test method for library devices that solves this problem is desired.

[Conventional technology]

FIG. 5 is an explanatory diagram of a system running test method for a conventional library device.

In the figure, numeral 1 denotes a test section loaded into memory, which is composed of a monitor la, an MTU test section 1b, and an ACC test section 1c. 2 is a central processing unit CPU that performs test processing based on the test department engineering, 3 is a status table, and the channel status word (CS
UNLOAD/READ of CTG 11 based on W)
Y state equal force < MTIJ Stored every 6. 4 is a plurality of channel devices (CIll to CH4), and 5 is a plurality of controllers (DIR1 to DIR4), each of which is accessed by the four sets of channel devices 4. 6 is 16 sets of magnetic tape unit MTUs.

Further, the ACC device 7 includes a control unit 8, a transfer structure 9, and a plurality of C
It is operated from the TG hangar (cell) 12.

In order to efficiently perform a system running test of such a library device, the MTU test unit 1b uses 16 sets of access paths formed by 4 sets of channel devices and 4 sets of controllers to perform READ/W.
It consists of 16 sets of tasks to perform the RITE test,
Multiple processing is performed together with the ACC test section 1c.

In addition, the ACC test section 1c performs a CTG movement test between cells, and performs a CTG 1 movement test before starting each movement test.
UNLOAD 1, search for MTU 6, cTG
Perform 11 exchanges.

The system running test operation will be explained below.

When CTG 11 is sent to MTU 6 by 8CC device 7, NOT-READY To l? EADY
An attention interrupt is generated from MT[I 6, and monitor la updates the status record for that MTU 6 in status table 3 to the READY state.

The MT[I test unit 1b periodically searches the status table 3 after the end of the previous test, and when the READY status is confirmed, executes the READ/WRITE test.

After the test is finished, the MTU test section 1b outputs the UNLOAD instruction, and again l? The state table 3 is searched until the EADY state is reached.

Note that when the UNLOAD state is reached, the UNLOAD attention interrupt force < MTU 6 occurs, and the UNLOAD
The status is recorded in status table 3. (READY-
+tlNLOAD) On the other hand, the ACC test unit 1c randomly performs a movement test of CTG 11, but before starting the movement test, it searches the status table 3 and
If there is no gate TU in D state, perform a movement test, and if there is, CTG in UNLOAD state in MTU 6 11
is returned to the CTG hangar 12 and a new CTG 11 is set to its MTU 6.

NOT-READY TO READ by the second set
The Y attention interrupt is raised, and the READ/WRITE test is performed by the <MTυ test section 1b as described above.

[Problem to be solved by the invention]

In the test processing described above, the MTU test section 1b searches the status table 3, confirms the READY state, and starts the test, but the ACC test section 1c performs the UNLOAD test between the mobile tests. In order to detect the MTU 6 in the state and start the setting process, the MTU test unit 1
For b, the timing to start the set processing is unknown,
This makes it difficult to set the time for confirmation, and this poses a problem in that testing efficiency deteriorates, especially in systems with many access buses.

In view of the above-mentioned problems, the present invention provides a system running test method for a library device that provides an interface between test sections, facilitates confirmation of NOT-READY to READY attention (f11! recognition of READY state), and improves test efficiency. The purpose is to provide.

[Means to solve the problem]

In order to achieve the above object, the system running test method of the library device of the present invention is as shown in FIG. 1, which is a diagram of the principle of the present invention. Common memory 20 and first test section 1
0b, which turns on a predetermined flag 30 in the common memory 20 when ejecting the medium 11 is instructed, monitors whether the flag is turned off, and checks whether or not the set state is notified within a predetermined time after the flag is turned off. A confirmation means 21, and a processing step 22 provided in the second test section 10c, which refers to the common memory 20 and turns off the flag 30 of the target recording/reading device at the start of the medium exchange process.

[For production]

When the first test section (hereinafter referred to as MTU test section) 10b outputs an ejection (UNLOAD) instruction, the common memory 2
0 flag 30 is turned on and the timing at which the flag turns off is monitored.

On the other hand, the second test section (hereinafter referred to as ACC test section) 10c records/records the UNLOAD state before starting the mobile test.
A reading device (hereinafter referred to as MTU) 6 is searched, and if found, the relevant flag 30 is turned off and replacement processing is performed, and if not found, a movement test is performed.

The MTLI test section 10b detects this flag-off,
The state table 3 is searched to check whether the device has entered the READY state within a predetermined time required for replacement.

As a result, the predetermined time after the flag is turned off is 1? I
It is only necessary to check the EADY state, and therefore the system running test can be performed efficiently.

〔Example〕

Embodiments of the present invention will be described in detail with reference to the drawings.

Fig. 2 is a block diagram of the test system of the embodiment, Fig. 3 is an operation flowchart of the MTU test section, and Fig. 4 is an ACC test system block diagram.
It is a test part operation flowchart figure.

In FIG. 2, 10b is the MTII test section (first test section), which confirms the completion of setting the medium CTG 11 (READY state) and executes READ/WRITE of the recording/reading device MTLI 6.
It is used for testing, and includes a confirmation stage 21 (shown in FIG. 3) that turns on a flag after outputting an UNLOAD instruction to confirm the READY state.

10c is an ACC test section (second test section) that randomly performs a movement test of CTG 11, and searches for MTU 6 in the UNLOAD state before starting the movement test.
If there is, it will perform the setting process of MTU 6,
Processing stage 22 that turns off flag 30 at the start of set processing
(shown in Figure 4).

20 is a common memory, which is connected to the MTU test section 10b and A.
It is accessed by the CC test section 10c and the flag 30 is turned on and off.

In addition, the same symbols represent the same objects throughout the figures. The test section 10 having the above structure performs the following test operations.

(Operation of MTU test unit 10b) See Figure 3 (1)
WR ITE/RE of C'rG 11 set
Run AD test.

(2) When the test is completed, the IUNLOAD instruction is output and the flag 30 is turned on (“de”).

(3) Thereafter, the status table 3 is repeatedly searched until the flag is turned off.

(4) Start time measurement when the flag becomes off.

(5) READY state for a predetermined time, that is, NOT-R.
Check whether there is an EADYTO READY interrupt.

(6) If the R E A DY status is confirmed, RE
Run the AD/WR ITE test.

(7) If the READY state does not occur within a predetermined time, abnormality processing is performed.

(ACC test unit operation) See Figure 4. (1) Before starting the movement test between cells, UNLOAD
Search for state MTU 6.

(2) If there is no corresponding MTU 6, the cell (CTG hangar 1
2) Perform a movement test between.

(3) [MTU 6 in I N L O A D state
If exists, the flag 30 of the MTU of the common memo IJ20 is turned off to instruct the setting of the CTG 11.

As a result, the ACC device 7 sets CTG tt.

(4) After completing the CTG 11 set, perform a movement test between cells.

As described above, the flag 30 is set in the common memory 20,
By having interfaces that turn on and off with each other, the timing of starting the set process of CTG 11 can be easily determined, and therefore, the READY state, that is, NOT-RE
It becomes possible to set a time for confirming ADY to READY attention, making the test more efficient.

〔Effect of the invention〕

In the present invention, since the timing of the CTG exchange opening of the ACC device can be identified by turning on and off the flag in the common memory, N
It becomes possible to set the time for OT-READY TO READY attention confirmation, which has the effect of streamlining system running tests.

[Brief explanation of drawings]

Fig. 1 is a principle diagram of the present invention, Fig. 2 is a test system block diagram of an embodiment, Fig. 3 is an operation flowchart of the MTLI test section, and Fig. 4 is an AC
FIG. 5 is an explanatory diagram of a system running test method for a conventional library device. In the figure, 1 and 10 are test parts, 1a is a monitor, lb. 1
0b is MT[+test section, lc. IOc is the ACC test section, 2 is the central processing unit CPU, 3 is the state table, 4
are channel devices Cl1-CH4, 5 are controllers DIR1 to DIR4, 6 is MTU, 7 is a transfer device, ACC device, 8 is a control unit, 9 is a transfer mechanism, 11
12 is a storage, CTG storage, cell, 20 is a common memory, 2l is a confirmation means, 22 is a processing means, and 30 is a flag. Fig. 3 Block diagram of the test system of the embodiment An explanatory diagram of the system running test method of the conventional library device Fig. 5

Claims (1)

[Claims] In a data processing system equipped with a library device having a plurality of recording/reading devices (6), a storage (12) for media (11), and a transport device (7) for transporting the media. , while monitoring a status table (3) in which the setting and ejection status of the medium in the recording/reading device is stored;
The first test section (10b) tests the set medium and issues an ejection instruction for the medium after the test is completed, and the second test section (10c) tests the transfer of the medium within the library device. A system running test method for a library device in which a recording/reading device in an ejected state is retrieved and a medium is exchanged before the start of each transfer test, the common memory ( 20) and a predetermined flag (3) provided in the first test section (10b) in the common memory (20) when ejecting the medium is instructed.
0) and monitors the flag off, and checks whether the set state is notified within a predetermined time after the flag is turned off; and a second test section (1).
0c), and when the medium exchange process starts, the common memory (20) is referred to and the flag (20) of the target recording/reading device is set.
The first test section (10b) is provided with a processing means (22) for turning off the common memory (20).
The present invention is characterized by detecting the timing at which the second test unit (10c) starts replacing the medium through the flag 0), and checking whether or not the set state of the medium is notified within a predetermined time. System running test method for library equipment.