JPH0393782U - - Google Patents

Info

Publication number
JPH0393782U
JPH0393782U JP151490U JP151490U JPH0393782U JP H0393782 U JPH0393782 U JP H0393782U JP 151490 U JP151490 U JP 151490U JP 151490 U JP151490 U JP 151490U JP H0393782 U JPH0393782 U JP H0393782U
Authority
JP
Japan
Prior art keywords
power supply
board
supply units
cooling fan
air vertically
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP151490U
Other languages
English (en)
Japanese (ja)
Other versions
JPH082627Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP151490U priority Critical patent/JPH082627Y2/ja
Publication of JPH0393782U publication Critical patent/JPH0393782U/ja
Application granted granted Critical
Publication of JPH082627Y2 publication Critical patent/JPH082627Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
JP151490U 1990-01-10 1990-01-10 半導体試験装置の冷却構造 Expired - Lifetime JPH082627Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP151490U JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP151490U JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Publications (2)

Publication Number Publication Date
JPH0393782U true JPH0393782U (sl) 1991-09-25
JPH082627Y2 JPH082627Y2 (ja) 1996-01-29

Family

ID=31505418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP151490U Expired - Lifetime JPH082627Y2 (ja) 1990-01-10 1990-01-10 半導体試験装置の冷却構造

Country Status (1)

Country Link
JP (1) JPH082627Y2 (sl)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7262961B2 (en) 2005-05-31 2007-08-28 Hironori Motoe Information processing apparatus and method for controlling the same
US7293124B2 (en) 2004-05-31 2007-11-06 Kabushiki Kaisha Toshiba Storage device with parallel interface connector
JP2014048201A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置
JP2014048202A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7293124B2 (en) 2004-05-31 2007-11-06 Kabushiki Kaisha Toshiba Storage device with parallel interface connector
US7262961B2 (en) 2005-05-31 2007-08-28 Hironori Motoe Information processing apparatus and method for controlling the same
JP2014048201A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置
JP2014048202A (ja) * 2012-08-31 2014-03-17 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
JPH082627Y2 (ja) 1996-01-29

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term