JPH0393774U - - Google Patents
Info
- Publication number
- JPH0393774U JPH0393774U JP197190U JP197190U JPH0393774U JP H0393774 U JPH0393774 U JP H0393774U JP 197190 U JP197190 U JP 197190U JP 197190 U JP197190 U JP 197190U JP H0393774 U JPH0393774 U JP H0393774U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- analog
- test element
- addition circuit
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000012806 monitoring device Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP197190U JPH0393774U (ro) | 1990-01-12 | 1990-01-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP197190U JPH0393774U (ro) | 1990-01-12 | 1990-01-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0393774U true JPH0393774U (ro) | 1991-09-25 |
Family
ID=31505855
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP197190U Pending JPH0393774U (ro) | 1990-01-12 | 1990-01-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0393774U (ro) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11271398A (ja) * | 1998-03-25 | 1999-10-08 | Sharp Corp | 半導体集積回路検査装置及びその故障検出方法 |
-
1990
- 1990-01-12 JP JP197190U patent/JPH0393774U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11271398A (ja) * | 1998-03-25 | 1999-10-08 | Sharp Corp | 半導体集積回路検査装置及びその故障検出方法 |