JPH0385584U - - Google Patents
Info
- Publication number
- JPH0385584U JPH0385584U JP14671289U JP14671289U JPH0385584U JP H0385584 U JPH0385584 U JP H0385584U JP 14671289 U JP14671289 U JP 14671289U JP 14671289 U JP14671289 U JP 14671289U JP H0385584 U JPH0385584 U JP H0385584U
- Authority
- JP
- Japan
- Prior art keywords
- supply
- elements
- testing device
- supplied
- rows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims 3
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671289U JPH0717026Y2 (ja) | 1989-12-20 | 1989-12-20 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14671289U JPH0717026Y2 (ja) | 1989-12-20 | 1989-12-20 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0385584U true JPH0385584U (cs) | 1991-08-29 |
| JPH0717026Y2 JPH0717026Y2 (ja) | 1995-04-19 |
Family
ID=31693259
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14671289U Expired - Fee Related JPH0717026Y2 (ja) | 1989-12-20 | 1989-12-20 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0717026Y2 (cs) |
-
1989
- 1989-12-20 JP JP14671289U patent/JPH0717026Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0717026Y2 (ja) | 1995-04-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE68909811D1 (de) | IC-Testsonde auf Membranbasis mit präzise positionierten Kontakten. | |
| DE3864093D1 (de) | Messgeraet und verfahren zum beschraenken des durchflusses in einem bohrloch. | |
| JPH0385584U (cs) | ||
| DE58903775D1 (de) | Vorrichtung zum befestigen von backenschienen in weichen. | |
| DE69022925D1 (de) | Halbleiteranordnung und Verfahren zum Test derselben. | |
| JPH0385647U (cs) | ||
| JPH0385583U (cs) | ||
| JPH01159625U (cs) | ||
| JPS59192839U (ja) | ウエハの測定装置 | |
| JPS6153936U (cs) | ||
| DE58907465D1 (de) | Verfahren zum Testen der einzelnen Ventile bei Dampfturbinen und Testeinrichtung zur Durchführung des Verfahrens. | |
| JPS62196339U (cs) | ||
| JPH0199063U (cs) | ||
| ATA291287A (de) | Vorrichtung zum messen von belastungen in verbundkoerpern | |
| JPH0216069U (cs) | ||
| JPS63100839U (cs) | ||
| JPS6448683U (cs) | ||
| JPH03104867U (cs) | ||
| JPS61155775U (cs) | ||
| JPH0195738U (cs) | ||
| JPS61202083U (cs) | ||
| JPS6421377U (cs) | ||
| JPS6284762U (cs) | ||
| JPS6310469U (cs) | ||
| JPS63127132U (cs) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |