JPH0385429A - Spectrophotometer - Google Patents
SpectrophotometerInfo
- Publication number
- JPH0385429A JPH0385429A JP22146989A JP22146989A JPH0385429A JP H0385429 A JPH0385429 A JP H0385429A JP 22146989 A JP22146989 A JP 22146989A JP 22146989 A JP22146989 A JP 22146989A JP H0385429 A JPH0385429 A JP H0385429A
- Authority
- JP
- Japan
- Prior art keywords
- integrating sphere
- light
- measurement
- time
- exit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000004907 flux Effects 0.000 claims abstract description 7
- 238000002834 transmittance Methods 0.000 claims description 7
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 13
- 230000003287 optical effect Effects 0.000 abstract description 9
- 238000012423 maintenance Methods 0.000 abstract description 2
- 238000010276 construction Methods 0.000 abstract 1
- 239000005357 flat glass Substances 0.000 description 6
- 238000012790 confirmation Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、透過率及び反射率測定における光軸位置の確
認に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to confirmation of the optical axis position in transmittance and reflectance measurements.
従来の装置は第8図、第9図に示すように積分球に対し
上方が開閉できるカバー25のようになっているため、
積分球の出口で光束がどの位置にあるかを確認するには
カバー全体を取外すか観視鏡でのぞく方法が知られてい
る。As shown in FIGS. 8 and 9, the conventional device has a cover 25 that can be opened and closed above the integrating sphere.
In order to confirm the position of the light beam at the exit of the integrating sphere, it is known to remove the entire cover or look through it with a viewing mirror.
上記従来技術は、光軸確認に対する配慮がなされておら
ず、カバー全体24を取外す、又は観視鏡を使用するな
どの不便があった。The above-mentioned conventional technology does not take into account the confirmation of the optical axis, and has the inconvenience of having to remove the entire cover 24 or use a viewing mirror.
本発明は、光軸を変化させるような被検体測定時又は保
守サービス時容易に積分球の出口での光束の位置を確認
できるようにし、測定ミスをなくすことにある。The present invention aims to eliminate measurement errors by making it possible to easily confirm the position of the light beam at the exit of an integrating sphere during measurement of a subject that changes the optical axis or during maintenance services.
上記目的を遠戚するために、積分球出口から光の進行方
向に光束の位置を確認できる開閉窓を取り付け、確認時
は開き、測定時は閉じるようにしたものである。In order to achieve the above-mentioned purpose, an opening/closing window is installed in which the position of the light beam can be confirmed from the exit of the integrating sphere in the direction in which the light travels, and is opened for confirmation and closed for measurement.
積分球の出口付近に、光り進行方向に開閉できる観視窓
を付けることによって、被検体を測定ユニットにセット
し被検体より出射した光の位置を積分球出口に薄紙を置
くことによって容易に直視することができるので測定ミ
スを発生することはない。By attaching a viewing window near the exit of the integrating sphere that can be opened and closed in the direction in which the light travels, the object to be examined can be set in the measurement unit and the position of the light emitted from the object can be easily viewed directly by placing a thin piece of paper at the exit of the integrating sphere. This prevents measurement errors from occurring.
以下、本発明の一実施例を第1図〜第4図により説明す
る。1は分光光度源部、2は白色光を単色光に分光する
分光器と対照光BFIと試料光Bsに分割する光学系を
有する分光器、3は対照光BRと試料光Bsを積分球5
に導くためのミラー4は試料光の光束の大きさを被検体
の大きさに応じ可変するマスク、5は、単色光を白板6
で完全拡散し、かつ積分球内の内壁(硫酸バリウム塗布
)でさらに拡散し平均光を積分球の内壁窓10より光電
管9に取込む積分球、6は酸化アルミニュウムの粉体を
圧縮成形した完全拡散板で積分球5の出口に取付は標準
板として使用する。7は分光光度計のカバーで積分球5
の試料光側付近にふた8を取り外すと積分球に入射した
光を確認できる窓を有している。An embodiment of the present invention will be described below with reference to FIGS. 1 to 4. 1 is a spectrophotometric source, 2 is a spectrometer that has a spectrometer that separates white light into monochromatic light and an optical system that divides it into reference light BFI and sample light Bs, and 3 is an integrating sphere 5 that converts reference light BR and sample light Bs into
A mirror 4 for guiding the sample light to a mask changes the size of the luminous flux of the sample light according to the size of the object, and a mirror 5 directs the monochromatic light to a white plate 6.
The integrating sphere is completely diffused by the inner wall of the integrating sphere (coated with barium sulfate), and the average light is taken into the phototube 9 through the inner wall window 10 of the integrating sphere. The diffuser plate attached to the exit of the integrating sphere 5 is used as a standard plate. 7 is the cover of the spectrophotometer and the integrating sphere 5
There is a window near the sample light side where the light incident on the integrating sphere can be confirmed when the lid 8 is removed.
ふた8は、マグネットゴム取付板12に貼付であるマグ
ネットゴム11によって吸着され固定されるが、光を確
認するときは、つまみ13を引くと容易に外れる。The lid 8 is attracted and fixed by the magnetic rubber 11 attached to the magnetic rubber mounting plate 12, but when checking the light, it can be easily removed by pulling the knob 13.
このような構成から或っているので第5図に示す厚い板
ガラス14の透過率測定時の光束の位置15(ベースラ
イン補正時)、16(m定時)の確認、第6図に示す凹
レンズ17の透過率測定時の光束の位置18の位置確認
、さらに第7図に示す積分球5の前方にミラー19,2
1.22から成る厚いガラスの表面及び裏面反射光の同
時測定時の光束の位置23の位置確認が容易にできる。Because of this configuration, it is possible to check the positions 15 (during baseline correction) and 16 (at fixed time) of the light beam when measuring the transmittance of the thick plate glass 14 shown in FIG. 5, and to check the concave lens 17 shown in FIG. 6. In addition, mirrors 19 and 2 are placed in front of the integrating sphere 5 as shown in FIG.
It is possible to easily confirm the position 23 of the light beam when simultaneously measuring the light reflected from the front and back surfaces of a thick glass made of 1.22.
また分光光度計の定期点検での光軸の確認などカバー7
を外すことなく容易にできる。Cover 7 also includes confirmation of the optical axis during periodic inspection of the spectrophotometer.
It can be easily done without removing.
本発明は、以上説明したように構成されているので、第
5図に示す厚い板ガラスの透過率測定時の光束の位置1
5(ベースライン補正時)及び光束の位!!16(測定
時)の位置の確認、第6図に示す凹レンズ17の透過率
測定時の光束の位置18の位置確認、さらに第7図に示
す積分球5の前方にミラー19,21,22から成る厚
い板ガラスの表面及び裏面反射光の同時測定時の光束の
位置23の位置確認が容易にできるので、測定ミスが少
なく、また分光光度計の定期点検で積分球出口での光軸
確認をカバー7を外すことなく迅速にできる。Since the present invention is configured as described above, the position 1 of the light beam when measuring the transmittance of a thick plate glass as shown in FIG.
5 (during baseline correction) and the luminous flux! ! 16 (during measurement), the position of the light beam 18 when measuring the transmittance of the concave lens 17 shown in FIG. 6, and the position of the light beam 18 shown in FIG. Since the position of the light beam 23 can be easily confirmed when simultaneously measuring the front and back reflected light of a thick plate glass, there are fewer measurement errors, and regular inspections of the spectrophotometer cover the optical axis confirmation at the exit of the integrating sphere. This can be done quickly without removing 7.
第1図は本発明を採用した分光光度計の光学系統図、第
2図は本発明を具体的に採用したカバー部分の平面断面
図、第3図は第2図の側面断面図、第4図は第2図の正
面図、第5図は厚い板ガラスの透過率測定における試料
光の光軸変化を示す図、第6図は凹レンズの透過率測定
時における試料光の拡大を示す図、第7図は積分球の前
方に反射率測定ユニットを取り付は厚い板ガラスの表面
反射光及び裏面反射光を測定するときの光束の変化を示
した図、第8図、第9図は従来の装置を示す図である。
l・・・分光光度光源部、2・・・分光器、3・・・ミ
ラー4・・・マスク、5・・・積分球、6・・・白板、
7・・・カバー8・・・ふた、9・・・光電管(ホトマ
ル)、11・・・マグネットゴム、12・・・マグネッ
トゴム取付板、13・・・つまみ、14.20・・・厚
い板ガラス、17・・・凹レンズ、
15゜
16゜
18゜
23・・・ベースライン
第
1
図
8ρ
i2図
第3図
第4図
ワ
第5図
第8図
第9図Fig. 1 is an optical system diagram of a spectrophotometer that adopts the present invention, Fig. 2 is a plan sectional view of a cover portion that specifically adopts the present invention, Fig. 3 is a side sectional view of Fig. 2, and Fig. 4 The figure is a front view of Figure 2, Figure 5 is a diagram showing the change in the optical axis of the sample light when measuring the transmittance of a thick plate glass, Figure 6 is a diagram showing the enlargement of the sample light when measuring the transmittance of a concave lens, Figure 7 shows the change in luminous flux when measuring the front and back reflections of a thick plate glass with a reflectance measuring unit installed in front of the integrating sphere, and Figures 8 and 9 show the conventional device. FIG. l... Spectrophotometric light source section, 2... Spectrometer, 3... Mirror 4... Mask, 5... Integrating sphere, 6... White plate,
7...Cover 8...Lid, 9...Phototube (photomaru), 11...Magnetic rubber, 12...Magnetic rubber mounting plate, 13...Knob, 14.20...Thick plate glass , 17...Concave lens, 15°16°18°23...Baseline 1st Figure 8ρ i2 Figure 3 Figure 4 Figure 5 Figure 8 Figure 9
Claims (1)
を設置し、透過率と、反射率を測定する分光光度計にお
いて、積分球に入射した光束を積分球出口で光束位置を
外部より確認できるように光の進行方向に開閉可能な観
測窓を付けたことを特徴とする分光光度計。1. In a spectrophotometer that uses an integrating sphere as the photoelectric conversion unit and sets the object in front of the integrating sphere to measure transmittance and reflectance, the light flux incident on the integrating sphere is measured at the exit of the integrating sphere. A spectrophotometer characterized by having an observation window that can be opened and closed in the direction of light propagation so that it can be checked from the outside.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22146989A JPH0385429A (en) | 1989-08-30 | 1989-08-30 | Spectrophotometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22146989A JPH0385429A (en) | 1989-08-30 | 1989-08-30 | Spectrophotometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0385429A true JPH0385429A (en) | 1991-04-10 |
Family
ID=16767204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22146989A Pending JPH0385429A (en) | 1989-08-30 | 1989-08-30 | Spectrophotometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0385429A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1329708A2 (en) * | 2002-01-11 | 2003-07-23 | X-Rite, Inc. | Spectrophotometer |
-
1989
- 1989-08-30 JP JP22146989A patent/JPH0385429A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1329708A2 (en) * | 2002-01-11 | 2003-07-23 | X-Rite, Inc. | Spectrophotometer |
EP1329708A3 (en) * | 2002-01-11 | 2003-07-30 | X-Rite, Inc. | Spectrophotometer |
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