JPH0384430A - Infrared detector - Google Patents

Infrared detector

Info

Publication number
JPH0384430A
JPH0384430A JP1222112A JP22211289A JPH0384430A JP H0384430 A JPH0384430 A JP H0384430A JP 1222112 A JP1222112 A JP 1222112A JP 22211289 A JP22211289 A JP 22211289A JP H0384430 A JPH0384430 A JP H0384430A
Authority
JP
Japan
Prior art keywords
temperature
voltage
change
sensing element
photoconductive semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1222112A
Other languages
Japanese (ja)
Inventor
Makoto Ito
眞 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1222112A priority Critical patent/JPH0384430A/en
Publication of JPH0384430A publication Critical patent/JPH0384430A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To suppress a noise caused by temperature change by providing a variable voltage generation means which recognizes the temperature change detected by a temperature sensor and makes the voltage on both ends of a photoconductive semiconductor detecting element constant and a variable gain control and amplification means. CONSTITUTION:The voltage change caused by the change of the resistance of the photoconductive semiconductor detecting element 1 in a range where the temperature change occurs and the voltage change caused by the change of responsivity are previously obtained. The temperature change of the element 1 is detected by the temperature sensor 3 and informs of it to the variable voltage generation means 4 and the variable gain control and amplification means 5. The means 4 previously sets the voltage which is generated to make the voltage on both ends of the element 1 constant and generates the voltage corresponding to the temperature detected by the sensor 3 so as to suppress the noise caused by the change of resistance. Meanwhile, the means 5 selects a gain variable resistance value corresponding to the temperature detected by the sensor 3 to suppress the noise caused by the change of the responsivity.

Description

【発明の詳細な説明】 (概 要) 光伝導型半導体検知素子に直列に高抵抗を接続し、電圧
発生手段にて両端に電圧を印加し定電流を流すようにし
、該光伝導型半導体検知素子に赤外線が入力することに
より発生した信号を増幅器にて増幅して出力する赤外線
検知器に関し、使用温度で1度程度の温度変化があって
も雑音を抑圧出来る赤外線検知器の提供を目的とし、該
光伝導型半導体検知素子の温度変化を遅滞なく検出する
温度センサを設け、 上記電圧発生手段を、 該温度センサにて検出した温度を認識し、温度変化があ
っても、該光伝導型半導体検知素子の両端の電圧を一定
にする電圧を発する可変電圧発生手段とし、 又上記増幅器を、 該温度センサにて検出した温度を認識し、該光伝導型半
導体検知素子の両端の電圧を一定にしても温度変化によ
り発する信号電圧の変化を打ち消す可変利得制御増幅手
段とする横取とする。
[Detailed Description of the Invention] (Summary) A high resistance is connected in series to a photoconductive semiconductor sensing element, and a voltage is applied to both ends by a voltage generating means to cause a constant current to flow. Our objective is to provide an infrared detector that can suppress noise even if there is a temperature change of about 1 degree at the operating temperature, regarding an infrared detector that amplifies the signal generated by inputting infrared rays to the element and outputs the amplified signal. , a temperature sensor that detects a temperature change of the photoconductive semiconductor sensing element without delay is provided, and the voltage generating means recognizes the temperature detected by the temperature sensor, and even if there is a temperature change, the photoconductive type The variable voltage generating means generates a voltage that keeps the voltage across the semiconductor sensing element constant, and the amplifier recognizes the temperature detected by the temperature sensor and keeps the voltage across the photoconductive semiconductor sensing element constant. However, it is preferable to use variable gain control amplification means to cancel out changes in signal voltage caused by temperature changes.

〔産業上の利用分野〕[Industrial application field]

本発明は、撮像素子である光伝導型半導体検知素子に直
列に高抵抗を接続し、電圧発生手段にて両端に電圧を印
加し定電流を流すようにし、該光伝導型半導体検知素子
に赤外線が人力することにより発生した信号を増幅器に
て増幅して出力する赤外線検知器の改良に関する。
The present invention connects a high resistance in series to a photoconductive semiconductor sensing element which is an image sensor, applies a voltage to both ends by voltage generating means to flow a constant current, and infrared rays are applied to the photoconductive semiconductor sensing element. This invention relates to an improvement in an infrared detector that uses an amplifier to amplify and output a signal generated by human input.

赤外線検知器の要部の構成を示すと第4図の如くで、空
洞22を有する円筒状の真空部21の、空洞22の上部
の真空側に光伝導型半導体検知素子1を取りつけ、空洞
22より、液体の寒剤、J−Tクーラ、i環式冷却器等
で冷却し、温度を77〜90に程度に冷却すると共に温
度変化を1度程度以下にするようにしている。
The configuration of the main parts of the infrared detector is shown in FIG. 4, in which the photoconductive semiconductor sensing element 1 is attached to the vacuum side of the upper part of the cavity 22 in a cylindrical vacuum part 21 having a cavity 22. Therefore, liquid cryogen, J-T cooler, i-ring type cooler, etc. are used to cool the temperature to about 77 to 90 degrees Celsius, and the temperature change is kept to about 1 degree or less.

又赤外線透過窓20より赤外線を透過させ、赤外線があ
たると抵抗が変化することを利用し、撮像信号を出力す
るようにしている。
Further, infrared rays are transmitted through the infrared transmitting window 20, and an imaging signal is output by utilizing the fact that the resistance changes when the infrared rays hit.

〔従来の技術〕[Conventional technology]

第5図は従来例の赤外線検知器の要部の回路構成を示す
ブロック図、第3図は1例の光伝導型半導体検知素子の
温度変化に対する抵抗値変化及びレスボンシビティの変
化を示す図である。
FIG. 5 is a block diagram showing the circuit configuration of the main parts of a conventional infrared detector, and FIG. 3 is a diagram showing changes in resistance and responsivity with respect to temperature changes of an example of a photoconductive semiconductor sensing element. .

第5図の場合は、光伝導型半導体検知素子を5個有する
光伝導型半導体検知素子アレー10の場合の例であり、
各光伝導型半導体検知素子1−1光伝導型半導体検知素
子1−1〜1−5に流れる電流を定電流とし、赤外線が
あたると抵抗が変化することを利用し、撮像信号を出力
するようにしている。
The case in FIG. 5 is an example of a photoconductive semiconductor sensing element array 10 having five photoconductive semiconductor sensing elements,
The current flowing through each photoconductive semiconductor sensing element 1-1 and the photoconductive semiconductor sensing elements 1-1 to 1-5 is a constant current, and the resistance changes when infrared rays are applied to output an imaging signal. I have to.

そして、この発生した信号電圧を増幅して出力する為に
、各光伝導型半導体検知素子1−1〜1−5毎に、増幅
器11を設けている。
In order to amplify and output the generated signal voltage, an amplifier 11 is provided for each of the photoconductive semiconductor sensing elements 1-1 to 1-5.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、光伝導型半導体検知素子lの温度は、一
定温度になるように制御しても1度程度は変化する場合
が存在する。
However, even if the temperature of the photoconductive semiconductor sensing element 1 is controlled to be constant, there are cases where the temperature changes by about 1 degree.

一方、光伝導型半導体検知素子lは半導体である為に、
温度が変化すると、キャリア濃度、電子の移動度が変化
し、数十Ωの抵抗が第3図(A)に示す如く、使用温度
77〜90に付近の1度の変化範囲では、温度に対し直
線的に変化する。
On the other hand, since the photoconductive semiconductor sensing element l is a semiconductor,
When the temperature changes, the carrier concentration and the electron mobility change, and as shown in Figure 3 (A), the resistance of several tens of ohms decreases with respect to the temperature in the range of 1 degree change near the operating temperature of 77 to 90. Changes linearly.

抵抗が変化すると光伝導型半導体検知素子lは定電流で
動作しているので、素子1の両端の電圧が変化し雑音発
生となる。
When the resistance changes, since the photoconductive semiconductor sensing element 1 operates with a constant current, the voltage across the element 1 changes and noise is generated.

又温度が変化すると、光伝導型半導体検知素子1の、信
号電圧/入射パワーで示されるレスボンシビティは、使
用温度77〜90に付近では例えば4〜5XlO’ V
/W程度の値を持ち、■度の温度範囲では、その値は直
線的に変化し、雑音発生となる。
Furthermore, when the temperature changes, the responsivity of the photoconductive semiconductor sensing element 1, expressed as the signal voltage/incident power, changes to, for example, 4 to 5 XlO'V at the operating temperature of 77 to 90°C.
/W, and within a temperature range of 1 degree, the value changes linearly, causing noise.

即ち、1度程度の温度変化でも雑音が発生する問題点が
ある。
That is, there is a problem in that noise occurs even when the temperature changes by about 1 degree.

本発明は、使用温度で1度程度の温度変化があっても雑
音を抑圧出来る赤外線検知器の提供を目的としている。
An object of the present invention is to provide an infrared detector that can suppress noise even if there is a temperature change of about 1 degree at the operating temperature.

〔課題を解決するための手段〕[Means to solve the problem]

第1図は本発明の原理図である。 FIG. 1 is a diagram showing the principle of the present invention.

第1図に示す如く、撮像素子である光伝導型半導体検知
素子1に直列に高抵抗2を接続し、電圧発生手段にて両
端に電圧を印加し定電流を流すようにし、該光伝導型半
導体検知素子1に赤外線が入力することにより発生した
信号を増幅器にて増幅して出力する赤外線検知器におい
て、該光伝導型半導体検知素子1の温度変化を遅滞なく
検出する温度センサ3を設け、 上記電圧発生手段を、 該温度センサ3にて検出した温度を認識し、温度変化が
あっても、該光伝導型半導体検知素子lの両端の電圧を
一定にする電圧を発する可変電圧発生手段4とし、 又上記増幅器を、 該温度センサ3にて検出した温度を認識し、該光伝導型
半導体検知素子1の両端の電圧を一定にしても温度変化
により発する、信号電圧の変化を打ち消す可変利得制御
増幅手段5とする。
As shown in FIG. 1, a high resistance 2 is connected in series to a photoconductive semiconductor sensing element 1, which is an image sensor, and a voltage is applied to both ends by a voltage generating means to cause a constant current to flow. In an infrared detector that amplifies and outputs a signal generated by inputting infrared rays to a semiconductor sensing element 1 using an amplifier, a temperature sensor 3 is provided to detect temperature changes of the photoconductive semiconductor sensing element 1 without delay, The voltage generating means is a variable voltage generating means 4 that recognizes the temperature detected by the temperature sensor 3 and generates a voltage that keeps the voltage across the photoconductive semiconductor sensing element l constant even if there is a temperature change. and the amplifier has a variable gain that recognizes the temperature detected by the temperature sensor 3 and cancels changes in the signal voltage caused by temperature changes even if the voltage across the photoconductive semiconductor sensing element 1 is kept constant. This is referred to as control amplification means 5.

〔作 用〕[For production]

本発明では、予め、温度変化の起こる範囲の、光伝導型
半導体検知素子1の抵抗変化による電圧変化及びレスボ
ンシビティの変化による電圧変化を求めておく。
In the present invention, voltage changes due to resistance changes of the photoconductive semiconductor sensing element 1 and voltage changes due to responsivity changes are determined in advance in a range where temperature changes occur.

そして、光伝導型半導体検知素子lの温度変化を温度セ
ンサ3にて遅滞なく検出し、可変電圧発生手段4及び可
変利得制御増幅手段5に知らせる。
The temperature change in the photoconductive semiconductor sensing element 1 is detected without delay by the temperature sensor 3, and is notified to the variable voltage generation means 4 and the variable gain control amplification means 5.

可変電圧発生手段4は、予め求めた上記の抵抗変化によ
る電圧変化により、温度が何度の時、発生電圧をいくら
にすれば、光伝導型半導体検知素子1の両端の電圧は一
定になるかを予め定めておき、温度センサ3にて検出し
た温度に応じ、この定めた電圧を発生するようにするの
で、温度が変又可変利得制御増幅手段5は、予め求めた
上記のレスボンシビティの変化による信号電圧変化によ
り、温度が何度の時、可変利得制御増幅手段5の利得を
いくらにすれば出力は変化しないかの利得を予め定めて
おき、温度センサ3にて検出した温度に応じ、この定め
た利得とするようにするので、温度が変化しても可変利
得制御増幅手段5の出力は一定になるので、レスボンシ
ビティ変化による雑音を抑圧出来る。
The variable voltage generating means 4 determines, at what temperature, how much voltage should be generated to keep the voltage across the photoconductive semiconductor sensing element 1 constant by changing the voltage due to the above resistance change determined in advance. is predetermined and the predetermined voltage is generated in accordance with the temperature detected by the temperature sensor 3. Therefore, when the temperature changes, the variable gain control amplification means 5 will be able to generate the predetermined voltage depending on the change in the responsiveness determined in advance. By changing the signal voltage, the gain of the variable gain control amplification means 5 is determined in advance so that the output does not change at any given temperature. Since the gain is set to a predetermined value, the output of the variable gain control amplification means 5 remains constant even if the temperature changes, so that noise caused by changes in responsivity can be suppressed.

〔実施例〕〔Example〕

第2図は本発明の実施例の赤外線検知器の要部の回路構
成図である。
FIG. 2 is a circuit diagram of a main part of an infrared detector according to an embodiment of the present invention.

第2図で第5図の従来例と異なる点は、温度センサ3を
設け、又電圧発生部12を、温度認識部4−1と可変電
圧発生器4−2とし、増幅器11を、抵抗値により利得
が変化する利得可変増幅器5−1と上記抵抗値を変化す
る温度認識利得可変用抵抗値変化部5−2とした点であ
るので、この異なる点を中心に以下説明する。
The difference in FIG. 2 from the conventional example shown in FIG. The difference is that the variable gain amplifier 5-1 whose gain changes according to the above and the temperature-recognized gain variable resistance value changing section 5-2 which changes the resistance value are used, and the following description will focus on these different points.

本発明では、予め、77〜90に付近の使用温度で温度
変化が1度の範囲で変化した時、光伝導型半導体検知素
子1−1の抵抗変化による電圧変化及びレスボンシビテ
ィの変化による信号電圧変化を求めておく。
In the present invention, when the temperature changes in the range of 1 degree at the operating temperature of 77 to 90 degrees, the voltage changes due to the resistance change of the photoconductive semiconductor sensing element 1-1 and the signal voltage changes due to the responsivity change. Let's find out.

温度センサ3は、光伝導型半導体検知素子l−1と同じ
変化速度で温度をモニタ出来るSi等の温度センサ又は
光伝導型半導体検知素子よりなるものとし、第4図に示
す如く光伝導型半導体検知素子1の近傍に取りつけ、モ
ニタした温度値を温度認識部4−1及び温度認識利得可
変用抵抗値変化部5−2に知らせる。
The temperature sensor 3 is composed of a temperature sensor such as Si or a photoconductive semiconductor sensing element that can monitor the temperature at the same rate of change as the photoconductive semiconductor sensing element l-1, and as shown in FIG. It is attached near the sensing element 1, and the monitored temperature value is notified to the temperature recognition section 4-1 and the temperature recognition gain variable resistance value changing section 5-2.

可変電圧発生器4−2としては、予め、77〜90に付
近の使用温度で温度変化が1度の範囲で、例えば0,1
度づつ変化した時、予め求めた上記の抵抗変化による電
圧変化により、発生電圧をいくらにすれば、光伝導型半
導体検知素子1−1の両端の電圧は一定になるかを予め
定めておく。
The variable voltage generator 4-2 is set in advance so that the operating temperature is around 77 to 90 degrees and the temperature change is in the range of 1 degree, for example, 0,1 degree.
It is predetermined in advance how much the generated voltage should be to keep the voltage across the photoconductive semiconductor sensing element 1-1 constant based on the voltage change due to the previously determined resistance change when the voltage changes.

そして、温度認識部4−1にて温度センサ3よりの温度
を認識すると、この温度に対応した、予め定めた電圧を
、可変電圧発生器4−2より発生させ、光伝導型半導体
検知素子1−1の両端の電圧を一定にする。
When the temperature recognition unit 4-1 recognizes the temperature from the temperature sensor 3, a predetermined voltage corresponding to this temperature is generated from the variable voltage generator 4-2, and the photoconductive semiconductor sensing element 1 Keep the voltage across -1 constant.

こうすると、温度が変化しても光伝導型半導体検知素子
i−tの両端の電圧変化は抑圧されるので、抵抗変化に
よる雑音を抑圧出来る。
In this way, even if the temperature changes, voltage changes across the photoconductive semiconductor sensing element it are suppressed, so noise caused by resistance changes can be suppressed.

又使用温度で温度変化が1度の範囲で、例えば0.1度
づつ変化した時、予め求めた上記のレス力は変化しない
かの、利得を変化する抵抗値を予め定めておく。
Further, a resistance value that changes the gain is determined in advance to determine whether the above-determined stress force does not change when the temperature changes within a range of 1 degree, for example, by 0.1 degrees at the operating temperature.

そして、温度認識利得可変用抵抗値変化部5−2では、
温度センサ3よりの温度を認識し、その温度に対応した
、先に定めた抵抗値を選択する。
Then, in the temperature recognition gain variable resistance value changing section 5-2,
The temperature from the temperature sensor 3 is recognized, and a previously determined resistance value corresponding to that temperature is selected.

すると、利得可変増幅器5−1の出力は、レスボンシビ
ティ変化による雑音を抑圧したものとなる。
Then, the output of the variable gain amplifier 5-1 becomes one in which noise due to responsivity changes is suppressed.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明せる如く本発明によれば、使用温度で1
度程度の温度変化があっても雑音を抑圧出来る効果があ
る。
As explained in detail above, according to the present invention, 1
This has the effect of suppressing noise even when there is a temperature change of about 100 degrees.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の原理図、 第2図は本発明の実施例の赤外線検知器の要部の回路構
成図、 第3図は1例の光伝導型半導体検知素子の温度変化に対
する抵抗値変化及びレスボンシビティの変化を示す図、 第4図は1例の赤外線検知器の要部の構造図、第5図は
従来例の赤外線検知器の要部の回路構成を示すブロック
図である。 図において1 .1−1〜1−5は光伝導型半導体検知素子1.2−1
〜2−5は高抵抗、 は温度センサ、 は可変電圧発生手段、 −1は温度認識部、 −2は可変電圧発生器、 は可変利得制御増幅手段、 −1は利得可変増幅器、 −2は温度認識利得可変用抵抗値変化部、Oは光伝導型
半導体検知素子アレー 0は赤外線透過窓、 1は真空部、 2は空洞を示す。 2ド&日月のA?理匹ヨ 濤 配 箔戻尺 温度に□ 第 (2)
Figure 1 is a diagram of the principle of the present invention. Figure 2 is a circuit diagram of the main parts of an infrared detector according to an embodiment of the present invention. Figure 3 is an example of the resistance value of a photoconductive semiconductor sensing element against temperature change. FIG. 4 is a structural diagram of the main parts of an example of an infrared detector, and FIG. 5 is a block diagram showing the circuit configuration of the main parts of a conventional infrared detector. In the figure 1. 1-1 to 1-5 are photoconductive semiconductor sensing elements 1.2-1
~2-5 is a high resistance, is a temperature sensor, is a variable voltage generation means, -1 is a temperature recognition section, -2 is a variable voltage generator, is a variable gain control amplification means, -1 is a variable gain amplifier, -2 is a variable voltage generator 0 is a photoconductive semiconductor sensing element array, 0 is an infrared transmitting window, 1 is a vacuum portion, and 2 is a cavity. 2 C & Sun Moon A? □ Part (2)

Claims (1)

【特許請求の範囲】 撮像素子である光伝導型半導体検知素子(1)に直列に
高抵抗(2)を接続し、電圧発生手段にて両端に電圧を
印加し定電流を流すようにし、該光伝導型半導体検知素
子(1)に赤外線が入力することにより発生した信号を
増幅器にて増幅して出力する赤外線検知器において、 該光伝導型半導体検知素子(1)の温度変化を遅滞なく
検出する温度センサ(3)を設け、 上記電圧発生手段を、 該温度センサ(3)にて検出した温度を認識し、温度変
化があっても、該光伝導型半導体検知素子(1)の両端
の電圧を一定にする電圧を発する可変電圧発生手段(4
)とし、 又上記増幅器を、 該温度センサ(3)にて検出した温度を認識し、該光伝
導型半導体検知素子(1)の両端の電圧を一定にしても
温度変化により発する信号電圧の変化を打ち消す可変利
得制御増幅手段(5)としたことを特徴とする赤外線検
知器。
[Claims] A high resistance (2) is connected in series to a photoconductive semiconductor sensing element (1) which is an image sensor, and a voltage is applied to both ends by a voltage generating means to cause a constant current to flow. In an infrared detector that amplifies a signal generated by inputting infrared rays to a photoconductive semiconductor sensing element (1) using an amplifier and outputs the signal, the temperature change of the photoconductive semiconductor sensing element (1) is detected without delay. A temperature sensor (3) is provided, and the voltage generating means recognizes the temperature detected by the temperature sensor (3), and even if there is a temperature change, the temperature at both ends of the photoconductive semiconductor sensing element (1) is controlled. Variable voltage generation means (4) that generates a voltage that keeps the voltage constant
), and the amplifier recognizes the temperature detected by the temperature sensor (3), and even if the voltage across the photoconductive semiconductor sensing element (1) is kept constant, the signal voltage generated by the temperature change will change. An infrared detector characterized by comprising variable gain control amplification means (5) for canceling out.
JP1222112A 1989-08-29 1989-08-29 Infrared detector Pending JPH0384430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1222112A JPH0384430A (en) 1989-08-29 1989-08-29 Infrared detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1222112A JPH0384430A (en) 1989-08-29 1989-08-29 Infrared detector

Publications (1)

Publication Number Publication Date
JPH0384430A true JPH0384430A (en) 1991-04-10

Family

ID=16777335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1222112A Pending JPH0384430A (en) 1989-08-29 1989-08-29 Infrared detector

Country Status (1)

Country Link
JP (1) JPH0384430A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9980336B2 (en) 2016-09-29 2018-05-22 Asahi Kasei Microdevices Corporation Light receiving device, light emitting device and light receiving/emitting device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9980336B2 (en) 2016-09-29 2018-05-22 Asahi Kasei Microdevices Corporation Light receiving device, light emitting device and light receiving/emitting device

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