JPH0374374U - - Google Patents

Info

Publication number
JPH0374374U
JPH0374374U JP13568689U JP13568689U JPH0374374U JP H0374374 U JPH0374374 U JP H0374374U JP 13568689 U JP13568689 U JP 13568689U JP 13568689 U JP13568689 U JP 13568689U JP H0374374 U JPH0374374 U JP H0374374U
Authority
JP
Japan
Prior art keywords
semiconductor device
evaluation
microstrip line
jig
device under
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13568689U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13568689U priority Critical patent/JPH0374374U/ja
Publication of JPH0374374U publication Critical patent/JPH0374374U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP13568689U 1989-11-22 1989-11-22 Pending JPH0374374U (US07754267-20100713-C00017.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13568689U JPH0374374U (US07754267-20100713-C00017.png) 1989-11-22 1989-11-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13568689U JPH0374374U (US07754267-20100713-C00017.png) 1989-11-22 1989-11-22

Publications (1)

Publication Number Publication Date
JPH0374374U true JPH0374374U (US07754267-20100713-C00017.png) 1991-07-25

Family

ID=31682937

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13568689U Pending JPH0374374U (US07754267-20100713-C00017.png) 1989-11-22 1989-11-22

Country Status (1)

Country Link
JP (1) JPH0374374U (US07754267-20100713-C00017.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019229798A1 (ja) * 2018-05-28 2019-12-05 三菱電機株式会社 半導体デバイスの電気特性測定装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019229798A1 (ja) * 2018-05-28 2019-12-05 三菱電機株式会社 半導体デバイスの電気特性測定装置
JPWO2019229798A1 (ja) * 2018-05-28 2021-02-12 三菱電機株式会社 半導体デバイスの電気特性測定装置
US11187741B2 (en) 2018-05-28 2021-11-30 Mitsubishi Electric Corporation Electrical characteristic measuring device for semiconductor device
DE112018007669B4 (de) 2018-05-28 2024-01-11 Mitsubishi Electric Corporation Vorrichtung zum Messen elektrischer Eigenschaften für eine Halbleitervorrichtung

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