JPH0374368U - - Google Patents
Info
- Publication number
- JPH0374368U JPH0374368U JP13615889U JP13615889U JPH0374368U JP H0374368 U JPH0374368 U JP H0374368U JP 13615889 U JP13615889 U JP 13615889U JP 13615889 U JP13615889 U JP 13615889U JP H0374368 U JPH0374368 U JP H0374368U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- optical semiconductor
- holder
- terminal
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims description 7
- 239000013307 optical fiber Substances 0.000 claims description 2
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13615889U JPH086303Y2 (ja) | 1989-11-22 | 1989-11-22 | 光半導体装置測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13615889U JPH086303Y2 (ja) | 1989-11-22 | 1989-11-22 | 光半導体装置測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0374368U true JPH0374368U (es) | 1991-07-25 |
JPH086303Y2 JPH086303Y2 (ja) | 1996-02-21 |
Family
ID=31683382
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13615889U Expired - Lifetime JPH086303Y2 (ja) | 1989-11-22 | 1989-11-22 | 光半導体装置測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH086303Y2 (es) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012037350A (ja) * | 2010-08-06 | 2012-02-23 | Advantest Corp | デバイスインターフェイス装置および試験装置 |
WO2016072264A1 (ja) * | 2014-11-06 | 2016-05-12 | オムロン株式会社 | 端子固定装置および端子固定方法 |
JP2021096217A (ja) * | 2019-12-18 | 2021-06-24 | 余芳▲くん▼ | 光センサー性能測定器 |
-
1989
- 1989-11-22 JP JP13615889U patent/JPH086303Y2/ja not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012037350A (ja) * | 2010-08-06 | 2012-02-23 | Advantest Corp | デバイスインターフェイス装置および試験装置 |
WO2016072264A1 (ja) * | 2014-11-06 | 2016-05-12 | オムロン株式会社 | 端子固定装置および端子固定方法 |
JP2016090423A (ja) * | 2014-11-06 | 2016-05-23 | オムロン株式会社 | 端子固定装置および端子固定方法 |
JP2021096217A (ja) * | 2019-12-18 | 2021-06-24 | 余芳▲くん▼ | 光センサー性能測定器 |
Also Published As
Publication number | Publication date |
---|---|
JPH086303Y2 (ja) | 1996-02-21 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |