JPH0374368U - - Google Patents

Info

Publication number
JPH0374368U
JPH0374368U JP13615889U JP13615889U JPH0374368U JP H0374368 U JPH0374368 U JP H0374368U JP 13615889 U JP13615889 U JP 13615889U JP 13615889 U JP13615889 U JP 13615889U JP H0374368 U JPH0374368 U JP H0374368U
Authority
JP
Japan
Prior art keywords
semiconductor device
optical semiconductor
holder
terminal
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13615889U
Other languages
English (en)
Japanese (ja)
Other versions
JPH086303Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13615889U priority Critical patent/JPH086303Y2/ja
Publication of JPH0374368U publication Critical patent/JPH0374368U/ja
Application granted granted Critical
Publication of JPH086303Y2 publication Critical patent/JPH086303Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP13615889U 1989-11-22 1989-11-22 光半導体装置測定装置 Expired - Lifetime JPH086303Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13615889U JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Publications (2)

Publication Number Publication Date
JPH0374368U true JPH0374368U (de) 1991-07-25
JPH086303Y2 JPH086303Y2 (ja) 1996-02-21

Family

ID=31683382

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13615889U Expired - Lifetime JPH086303Y2 (ja) 1989-11-22 1989-11-22 光半導体装置測定装置

Country Status (1)

Country Link
JP (1) JPH086303Y2 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037350A (ja) * 2010-08-06 2012-02-23 Advantest Corp デバイスインターフェイス装置および試験装置
WO2016072264A1 (ja) * 2014-11-06 2016-05-12 オムロン株式会社 端子固定装置および端子固定方法
JP2021096217A (ja) * 2019-12-18 2021-06-24 余芳▲くん▼ 光センサー性能測定器

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037350A (ja) * 2010-08-06 2012-02-23 Advantest Corp デバイスインターフェイス装置および試験装置
WO2016072264A1 (ja) * 2014-11-06 2016-05-12 オムロン株式会社 端子固定装置および端子固定方法
JP2016090423A (ja) * 2014-11-06 2016-05-23 オムロン株式会社 端子固定装置および端子固定方法
JP2021096217A (ja) * 2019-12-18 2021-06-24 余芳▲くん▼ 光センサー性能測定器

Also Published As

Publication number Publication date
JPH086303Y2 (ja) 1996-02-21

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term