JPH0358479A - Solid-state image sensing device - Google Patents

Solid-state image sensing device

Info

Publication number
JPH0358479A
JPH0358479A JP1195102A JP19510289A JPH0358479A JP H0358479 A JPH0358479 A JP H0358479A JP 1195102 A JP1195102 A JP 1195102A JP 19510289 A JP19510289 A JP 19510289A JP H0358479 A JPH0358479 A JP H0358479A
Authority
JP
Japan
Prior art keywords
section
image sensing
drain
shielding film
drain electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1195102A
Other languages
Japanese (ja)
Inventor
Takumi Yamaguchi
琢己 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP1195102A priority Critical patent/JPH0358479A/en
Publication of JPH0358479A publication Critical patent/JPH0358479A/en
Pending legal-status Critical Current

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Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

PURPOSE:To prevent smears from increasing in a disused charge discharging drain region by a method wherein the drain electrode of the disused discharging drain located between an image sensing section and a storing section is made to extend to the image sensing section and the storing section so as to serve as an optical shielding film of them. CONSTITUTION:An image sensing section 1, a storing section 2, an aperture 9 of a photoelectric conversion element provided to the image sensing 1, disused charge discharging drain 8, a drain electrode 11 of the disused charge discharging drain 8 serving also as an optical shielding film, and a vertical CCD 13 of the image sensing section 1 and the storing section 2 are provided. In this case, as the drain electrode 11 of the disused charge discharging drain serving as an optical shielding film is formed extending to the image sensing section 1 and the storing section 2, even if incident light irradiates an isolating part between the drain electrode 11 and the image sensing section 1 and another isolating part between the drain electrode 11 and the storing section 2, the incident light concerned is blocked by the drain electrode 11. By this setup, smearing charges induced by light incident on an isolating part can be prevented.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は固体撮像装置に関するものである。[Detailed description of the invention] Industrial applications The present invention relates to a solid-state imaging device.

従来の技術 近年、固体撮像装置は、その研究開発が進み、性能の点
から見ると、撮像管に匹敵ないし、上回るようになって
いる。そのなかでもフレームインターラインCCD固体
撮像装置(以下、FIT−CCDと略記)は特に優れた
特性を持っており、実用化されている。
BACKGROUND OF THE INVENTION In recent years, research and development of solid-state imaging devices has progressed, and from the point of view of performance, they are no longer comparable to or even superior to image pickup tubes. Among them, a frame interline CCD solid-state imaging device (hereinafter abbreviated as FIT-CCD) has particularly excellent characteristics and has been put into practical use.

以下、図面を参照しながら、FIT−CCDの従来の構
成について説明する。
Hereinafter, a conventional configuration of an FIT-CCD will be described with reference to the drawings.

第2図はF IT−CCDの全体構戒図である。FIG. 2 is an overall configuration diagram of the FIT-CCD.

第2図において、1は撮像部、2は蓄積部、3は光電変
換素子、4は撮像部の垂直CCD、5は蓄積部の垂直C
CD,6は水平CCD、7は出力アンプである。8は不
要電荷掃き出し用のドレインである。光電変換素子3で
発生した電荷のうち画像信号となる信号電荷は撮像部1
の垂直CCD4へ読み出された後、垂直帰線期間に、蓄
積部2へ高速転送される。蓄積部2へ転送された電荷は
、有効走査期間に、一水平ラインごとに水平CCD6に
読み出された後、一ビットごとに出力アンブ7から出力
される。また、光電変換素子3で発生した画像信号電荷
とならない不要電荷すなわち、非画像電荷は、撮像部1
と蓄積部2の間にある不要電荷掃き出し用のドレイン8
へ、撮像部1の垂直CCD4及び蓄積部2の垂直CCD
5により転送されて掃き出される。
In FIG. 2, 1 is an imaging section, 2 is a storage section, 3 is a photoelectric conversion element, 4 is a vertical CCD of the imaging section, and 5 is a vertical CCD of the storage section.
CD, 6 is a horizontal CCD, and 7 is an output amplifier. 8 is a drain for sweeping out unnecessary charges. Of the charges generated in the photoelectric conversion element 3, signal charges that become image signals are transferred to the imaging unit 1.
After being read out to the vertical CCD 4, it is transferred at high speed to the storage section 2 during the vertical retrace period. The charges transferred to the storage section 2 are read out to the horizontal CCD 6 for each horizontal line during the effective scanning period, and then outputted from the output amplifier 7 for each bit. In addition, unnecessary charges that do not become image signal charges generated in the photoelectric conversion element 3, that is, non-image charges, are removed from the imaging unit 1.
and a drain 8 for sweeping out unnecessary charges between the storage section 2 and the storage section 2.
to, the vertical CCD 4 of the imaging section 1 and the vertical CCD of the storage section 2;
Transferred by 5 and swept out.

第3図は従来の不要電荷掃き出し用のドレイン領域の拡
大図である。9は光電変換素子の開口部、10は撮像部
の遮光膜、l1は遮光膜を兼ねた不要電荷掃き出し用の
ドレインの電極、12は蓄積部の遮光膜、13は撮像部
と蓄積部の垂直CCD、14は分離部への入射光である
。撮像部の遮光膜10と遮光膜を兼ねた不要電荷掃き出
し用のドレイン電極11と蓄積部の遮光膜12は、いず
れもアルミニウム層で同時に形成された後、分離するマ
スクを用いてエッチングにより分離される。
FIG. 3 is an enlarged view of a conventional drain region for sweeping out unnecessary charges. 9 is the opening of the photoelectric conversion element, 10 is the light-shielding film of the imaging section, l1 is the drain electrode for sweeping out unnecessary charges that also serves as a light-shielding film, 12 is the light-shielding film of the storage section, and 13 is the vertical line between the imaging section and the storage section. CCD 14 is incident light to the separation section. The light-shielding film 10 of the imaging section, the drain electrode 11 for sweeping out unnecessary charges that also serves as a light-shielding film, and the light-shielding film 12 of the storage section are all formed simultaneously with aluminum layers, and then separated by etching using a separating mask. Ru.

発明が解決しようとする課題 しかしながら上記のような構成では、撮像部の遮光膜1
0と遮光膜を兼ねた不要電荷を掃き出すドレイン電極1
1との間の分離部及び蓄積部の遮光膜12と遮光膜を兼
ねた不要電荷を掃き出すドレイン電極11との間の分離
部への入射光14により撮像部と蓄積部の垂直CCD1
3にスミア電荷が発生したしまう。
Problems to be Solved by the Invention However, in the above configuration, the light shielding film 1 of the imaging section
Drain electrode 1 that sweeps out unnecessary charges and also serves as a light-shielding film
The vertical CCD 1 of the imaging part and the storage part is caused by the incident light 14 to the separation part between the light shielding film 12 of the separation part and the storage part between the imaging part 1 and the drain electrode 11 which also serves as a light shielding film and sweeps out unnecessary charges.
3, a smear charge occurs.

本発明はこのような従来の問題を解決する固体撮像装置
を提供するものである。
The present invention provides a solid-state imaging device that solves these conventional problems.

課題を解決するための手段 上記問題を解決するために、本発明の固体撮像装置は、
光電変換素子の列の間に前記光電変換素子から読み出さ
れた電荷を転送する電荷転送部のある撮像部と、前記光
電変換素子から前記電荷部に読み出された電荷の一部ま
たは全てを蓄積できる蓄積部を持ち、前記撮像部と前記
蓄積部との間に、前記撮像部または前記蓄積部で発生し
た、非画像電荷を排出するためのドレインを持ち、前記
ドレインの電極が前記撮像部及び前記蓄積部へ延在して
前記撮像部及び前記蓄積部の遮光膜を兼ねた構造となっ
ている。
Means for Solving the Problems In order to solve the above problems, the solid-state imaging device of the present invention includes:
an imaging section having a charge transfer section that transfers charges read out from the photoelectric conversion elements between rows of photoelectric conversion elements; and a part or all of the charges read out from the photoelectric conversion elements to the charge section. It has an accumulation section capable of accumulating, and has a drain between the imaging section and the accumulation section for discharging non-image charges generated in the imaging section or the accumulation section, and the electrode of the drain is connected to the imaging section. and extends to the storage section to serve as a light shielding film for the imaging section and the storage section.

作用 この構成によって、撮像部の遮光膜と遮光膜を兼ねた不
要電荷掃き出し用のドレイン電極との間、及び、蓄積部
の遮光膜と遮光膜を兼ねた不要電荷掃き出し用のドレイ
ン電極の間のそれぞれを分離する必要がなくなり、分離
部への入射光14によるスミア電荷の発生を防ぐことが
できる。
Function: With this configuration, there is a gap between the light-shielding film of the imaging section and the drain electrode that also serves as a light-shielding film and for sweeping out unnecessary charges, and between the light-shielding film of the storage section and the drain electrode that also serves as a light-shielding film and for sweeping out unnecessary charges. There is no need to separate them, and it is possible to prevent the generation of smear charges due to the incident light 14 on the separation section.

実施例 以下、本発明の一実施例について第1図を参照しながら
説明する。
EXAMPLE Hereinafter, an example of the present invention will be described with reference to FIG.

なお、本実施例においても、FIT−CCDの全体構成
そのものは、第2図に示した従来のものと同様である。
In this embodiment as well, the overall configuration of the FIT-CCD itself is the same as the conventional one shown in FIG.

すなわち、撮像部1には光電変換素子3と垂直ccD4
が設けられ、蓄積部2には垂直CCD5が設けられ,撮
像部1と蓄積部2の間には不要電荷掃き出し用のドレイ
ン8が設けられ、蓄積部2の一端に水千CCDが設けら
れ、その出力側に出力アンブ7か設けられている。した
がって、F IT−CCDとしての基本的な動作も従来
のものと同一である。
That is, the imaging unit 1 includes a photoelectric conversion element 3 and a vertical CCD 4.
is provided, a vertical CCD 5 is provided in the storage section 2, a drain 8 for sweeping out unnecessary charges is provided between the imaging section 1 and the storage section 2, a water CCD is provided at one end of the storage section 2, An output amplifier 7 is provided on the output side. Therefore, the basic operation as a FIT-CCD is also the same as that of the conventional one.

第1図は、そのようなFIT−CCDの不要電荷掃き出
し用のドレイン領域の拡大図である。第1図において、
1は撮像部、2は蓄積部、9は撮像部1に設けた光電変
換素子の開口部、8は不要電荷掃き出し用のドレイン、
11は遮光膜を兼ねた不要電荷掃き出し用のドレイン電
極、13は撮像部1と蓄積部2の垂直CCDである。
FIG. 1 is an enlarged view of the drain region for sweeping out unnecessary charges of such a FIT-CCD. In Figure 1,
1 is an imaging section, 2 is an accumulation section, 9 is an opening of a photoelectric conversion element provided in the imaging section 1, 8 is a drain for sweeping out unnecessary charges,
11 is a drain electrode for sweeping out unnecessary charges which also serves as a light shielding film; 13 is a vertical CCD of the imaging section 1 and the storage section 2;

第1図から明らかなように、本実施例においては、不要
電荷掃き出し用ドレイン8の遮光膜を兼ねるドレイン電
極11が、撮像部1および蓄積部2に延在した状態で形
威されている。このため、撮像部とドレイン電極との間
、およびドレイン電極と蓄積部の間の分離部に入射光(
第3図にお{プる14〉が照射されても、この入射光は
ドし・イン電極11によって遮光される。したがって、
従来のように、分離部への入射光によって、撮像部1と
蓄積部2の垂直CCD13でスミア信号が増加すること
はなく、スミアの増加を防ぐことができる。
As is clear from FIG. 1, in this embodiment, the drain electrode 11, which also serves as a light-shielding film of the drain 8 for sweeping out unnecessary charges, is extended to the imaging section 1 and the storage section 2. Therefore, the incident light (
Even if the beam 14 shown in FIG. 3 is irradiated, this incident light is blocked by the do/in electrode 11. therefore,
Unlike in the prior art, the smear signal does not increase on the vertical CCDs 13 of the imaging section 1 and the storage section 2 due to the light incident on the separating section, and an increase in smear can be prevented.

発明の効果 以上のように、本発明によれば、撮像部と蓄積部との間
にある不要電荷掃き出し用ドレインのドレイン電極を撮
像部及び蓄積部に延在させ、撮像部の遮光膜及び蓄積部
の遮光膜を兼ねるようにしたものであるから、不要電荷
掃き出し用のドレイン領域でのスミアの増加を防ぐこと
ができ、その実用的効果は大である。
Effects of the Invention As described above, according to the present invention, the drain electrode of the drain for sweeping out unnecessary charges located between the imaging section and the storage section is extended to the imaging section and the storage section, and the light shielding film of the imaging section and the storage Since it also serves as a light-shielding film in the area, it is possible to prevent an increase in smear in the drain region for sweeping out unnecessary charges, and its practical effect is great.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例固体撮像装置の不要電荷掃き
出し用のドレイン領域の拡大図、第2図は従来のFIT
−CCDの全体構成図、第3図は従来の不要電荷掃き出
し用のドレイン領域の拡大図である。 1・・・・・・撮像部、2・・・・・・蓄積部、3・・
・・・・光電変換素子、4・・・・・・撮像部の垂直C
CD、5・・・・・・蓄積部の垂直CCD、6・・・・
・・水平CCD、7・・・・・・出力アンプ、8・・・
・・・不要電荷掃き出し用のドレイン、9・・・・・・
光電変換素子の開口部、10・・・・・・撮像部の遮光
膜、11・・・・・・遮光膜を兼ねた不要電荷掃き出し
用のドレイン電極、l2・・・・・・蓄積部の遮光膜、
l3・・・・・・撮像部と蓄積部の垂直CCD、14・
・・・・・分離部への入射光。
FIG. 1 is an enlarged view of the drain region for sweeping out unnecessary charges in a solid-state imaging device according to an embodiment of the present invention, and FIG. 2 is an enlarged view of a conventional FIT.
- An overall configuration diagram of a CCD, and FIG. 3 is an enlarged view of a conventional drain region for sweeping out unnecessary charges. 1...imaging section, 2...accumulation section, 3...
...Photoelectric conversion element, 4... Vertical C of the imaging section
CD, 5... Vertical CCD of storage section, 6...
...Horizontal CCD, 7... Output amplifier, 8...
...Drain for sweeping out unnecessary charges, 9...
Opening of the photoelectric conversion element, 10... Light-shielding film of the imaging section, 11... Drain electrode for sweeping out unnecessary charges that also serves as a light-shielding film, l2...... of the storage section light shielding film,
l3... Vertical CCD of imaging section and storage section, 14.
...Incoming light to the separation section.

Claims (1)

【特許請求の範囲】[Claims] 光電変換素子の列の間に前記光電変換素子から読み出さ
れた電荷を転送する電荷転送部のある撮像部と前記撮像
部の電荷の一部または全てを蓄積できる蓄積部とを持ち
、かつ、前記撮像部と前記蓄積部との間に、前記撮像部
または前記蓄積部で発生した非画像電荷を排出するため
のドレインを持ち、前記ドレインの電極の一部を前記撮
像部及び前記蓄積部に延在させ、前記撮像部及び前記蓄
積部の遮光膜を兼用したことを特徴とする固体撮像装置
an imaging unit having a charge transfer unit that transfers charges read out from the photoelectric conversion elements between rows of photoelectric conversion elements; and an accumulation unit that can accumulate part or all of the charges in the imaging unit; A drain is provided between the imaging section and the storage section for discharging non-image charges generated in the imaging section or the storage section, and a part of the electrode of the drain is connected to the imaging section and the storage section. A solid-state imaging device, characterized in that the solid-state imaging device is extended and serves as a light-shielding film for the imaging section and the storage section.
JP1195102A 1989-07-26 1989-07-26 Solid-state image sensing device Pending JPH0358479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1195102A JPH0358479A (en) 1989-07-26 1989-07-26 Solid-state image sensing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1195102A JPH0358479A (en) 1989-07-26 1989-07-26 Solid-state image sensing device

Publications (1)

Publication Number Publication Date
JPH0358479A true JPH0358479A (en) 1991-03-13

Family

ID=16335556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1195102A Pending JPH0358479A (en) 1989-07-26 1989-07-26 Solid-state image sensing device

Country Status (1)

Country Link
JP (1) JPH0358479A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0774339A (en) * 1993-09-01 1995-03-17 Nec Corp Solid-state image sensing device and driving method therefor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53132286A (en) * 1977-04-22 1978-11-17 Sony Corp Charge transfer device
JPS57109476A (en) * 1980-12-25 1982-07-07 Matsushita Electronics Corp Solid image pickup device
JPS6484749A (en) * 1987-09-28 1989-03-30 Matsushita Electronics Corp Solid-state image sensing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53132286A (en) * 1977-04-22 1978-11-17 Sony Corp Charge transfer device
JPS57109476A (en) * 1980-12-25 1982-07-07 Matsushita Electronics Corp Solid image pickup device
JPS6484749A (en) * 1987-09-28 1989-03-30 Matsushita Electronics Corp Solid-state image sensing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0774339A (en) * 1993-09-01 1995-03-17 Nec Corp Solid-state image sensing device and driving method therefor

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