JPH0354830B2 - - Google Patents
Info
- Publication number
- JPH0354830B2 JPH0354830B2 JP58083391A JP8339183A JPH0354830B2 JP H0354830 B2 JPH0354830 B2 JP H0354830B2 JP 58083391 A JP58083391 A JP 58083391A JP 8339183 A JP8339183 A JP 8339183A JP H0354830 B2 JPH0354830 B2 JP H0354830B2
- Authority
- JP
- Japan
- Prior art keywords
- ion
- magnetic field
- ion beam
- mass
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58083391A JPS59209258A (ja) | 1983-05-12 | 1983-05-12 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58083391A JPS59209258A (ja) | 1983-05-12 | 1983-05-12 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59209258A JPS59209258A (ja) | 1984-11-27 |
JPH0354830B2 true JPH0354830B2 (enrdf_load_stackoverflow) | 1991-08-21 |
Family
ID=13801124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58083391A Granted JPS59209258A (ja) | 1983-05-12 | 1983-05-12 | 質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59209258A (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59160949A (ja) * | 1983-03-01 | 1984-09-11 | Denshi Kagaku Kk | 質量分析装置 |
-
1983
- 1983-05-12 JP JP58083391A patent/JPS59209258A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59209258A (ja) | 1984-11-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0354831B2 (enrdf_load_stackoverflow) | ||
JP2004515882A (ja) | 四重極質量分析器構成を含む質量分析計 | |
SU1600645A3 (ru) | Масс-спектрометр | |
US4174479A (en) | Mass spectrometer | |
Beynon et al. | A novel, double-focusing spectrometer for translational-energy-loss spectroscopy | |
US4924090A (en) | Double focusing mass spectrometer and MS/MS arrangement | |
EP0202117B1 (en) | Double focusing mass spectrometers | |
JP5521255B2 (ja) | 2重集束を有する磁気色消し質量分析計 | |
US5013923A (en) | Mass recombinator for accelerator mass spectrometry | |
JPS5829577B2 (ja) | 二重収束質量分析装置 | |
US6797962B1 (en) | Electrostatic corrector for eliminating the chromatic aberration of particle lenses | |
JP3571523B2 (ja) | オメガ型エネルギーフィルタ | |
US6441378B1 (en) | Magnetic energy filter | |
JPH0354830B2 (enrdf_load_stackoverflow) | ||
JPH0812773B2 (ja) | 同時検出型質量分析装置 | |
CN111276387A (zh) | 双模式离子传输装置及方法 | |
JP2956706B2 (ja) | 質量分析装置 | |
EP0295253B1 (en) | Electron spectrometer | |
JP3153386B2 (ja) | 質量分析装置 | |
JPS61259449A (ja) | 二重収束質量分析装置 | |
Matsuda et al. | A mass spectrograph for the analysis of collisionally activated molecular fragments | |
Yavor et al. | Parasitic aberrations in static sector field mass analyzers and their correction. Part 1. First order approximation | |
GB2631411A (en) | Mass spectrometers comprising a pre-filter | |
JPS6062055A (ja) | 質量分析装置 | |
SU680534A1 (ru) | Электростатический энергоанализатор |